NL7411128A - Electron beam tube arrangement - is for vertical deflection response control in industrial TV or electron microscope systems - Google Patents
Electron beam tube arrangement - is for vertical deflection response control in industrial TV or electron microscope systemsInfo
- Publication number
- NL7411128A NL7411128A NL7411128A NL7411128A NL7411128A NL 7411128 A NL7411128 A NL 7411128A NL 7411128 A NL7411128 A NL 7411128A NL 7411128 A NL7411128 A NL 7411128A NL 7411128 A NL7411128 A NL 7411128A
- Authority
- NL
- Netherlands
- Prior art keywords
- industrial
- electron beam
- vertical deflection
- electron
- response control
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Details Of Television Scanning (AREA)
- Radar Systems Or Details Thereof (AREA)
Abstract
The system relates to the vertical scan deflection of electron beam tubes of the type used in industrial visual display units and electron microscopes. The waveform of the time base function using a triangular waveform with uniform discrete steps is modified by the superimposition of a ripple function involving two small steps each of which is shorter in time than the basic stop, so that the beam vertical voltage deflection control reverses the scan deflection a small step before continuing with the main trend. This is achieved by two separate voltage generators operating in synchronism.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9254873A JPS5523510B2 (en) | 1973-08-20 | 1973-08-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL7411128A true NL7411128A (en) | 1975-02-24 |
Family
ID=14057437
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7411128A NL7411128A (en) | 1973-08-20 | 1974-08-20 | Electron beam tube arrangement - is for vertical deflection response control in industrial TV or electron microscope systems |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS5523510B2 (en) |
NL (1) | NL7411128A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2320673A1 (en) * | 1975-08-02 | 1977-03-04 | Pusch Gunter | METHOD AND DEVICE FOR ANALYSIS AND ELECTRONIC PROCESSING OF THERMAL IMAGES |
-
1973
- 1973-08-20 JP JP9254873A patent/JPS5523510B2/ja not_active Expired
-
1974
- 1974-08-20 NL NL7411128A patent/NL7411128A/en unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2320673A1 (en) * | 1975-08-02 | 1977-03-04 | Pusch Gunter | METHOD AND DEVICE FOR ANALYSIS AND ELECTRONIC PROCESSING OF THERMAL IMAGES |
Also Published As
Publication number | Publication date |
---|---|
JPS5042720A (en) | 1975-04-18 |
JPS5523510B2 (en) | 1980-06-23 |
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