JPS5523510B2 - - Google Patents

Info

Publication number
JPS5523510B2
JPS5523510B2 JP9254873A JP9254873A JPS5523510B2 JP S5523510 B2 JPS5523510 B2 JP S5523510B2 JP 9254873 A JP9254873 A JP 9254873A JP 9254873 A JP9254873 A JP 9254873A JP S5523510 B2 JPS5523510 B2 JP S5523510B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9254873A
Other languages
Japanese (ja)
Other versions
JPS5042720A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9254873A priority Critical patent/JPS5523510B2/ja
Priority to NL7411128A priority patent/NL7411128A/en
Publication of JPS5042720A publication Critical patent/JPS5042720A/ja
Publication of JPS5523510B2 publication Critical patent/JPS5523510B2/ja
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/24Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Details Of Television Scanning (AREA)
  • Radar Systems Or Details Thereof (AREA)
JP9254873A 1973-08-20 1973-08-20 Expired JPS5523510B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP9254873A JPS5523510B2 (en) 1973-08-20 1973-08-20
NL7411128A NL7411128A (en) 1973-08-20 1974-08-20 Electron beam tube arrangement - is for vertical deflection response control in industrial TV or electron microscope systems

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9254873A JPS5523510B2 (en) 1973-08-20 1973-08-20

Publications (2)

Publication Number Publication Date
JPS5042720A JPS5042720A (en) 1975-04-18
JPS5523510B2 true JPS5523510B2 (en) 1980-06-23

Family

ID=14057437

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9254873A Expired JPS5523510B2 (en) 1973-08-20 1973-08-20

Country Status (2)

Country Link
JP (1) JPS5523510B2 (en)
NL (1) NL7411128A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2534586C3 (en) * 1975-08-02 1979-03-29 Pusch, Guenter, Dr.-Ing., 6903 Neckargemuend Method and device for scanning and electronic processing of thermal images

Also Published As

Publication number Publication date
JPS5042720A (en) 1975-04-18
NL7411128A (en) 1975-02-24

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