NL7114200A - - Google Patents

Info

Publication number
NL7114200A
NL7114200A NL7114200A NL7114200A NL7114200A NL 7114200 A NL7114200 A NL 7114200A NL 7114200 A NL7114200 A NL 7114200A NL 7114200 A NL7114200 A NL 7114200A NL 7114200 A NL7114200 A NL 7114200A
Authority
NL
Netherlands
Application number
NL7114200A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL7114200A publication Critical patent/NL7114200A/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/282—Static spectrometers using electrostatic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL7114200A 1970-10-19 1971-10-15 NL7114200A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US8195270A 1970-10-19 1970-10-19

Publications (1)

Publication Number Publication Date
NL7114200A true NL7114200A (de) 1972-04-21

Family

ID=22167448

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7114200A NL7114200A (de) 1970-10-19 1971-10-15

Country Status (8)

Country Link
US (1) US3665185A (de)
JP (1) JPS5416236B1 (de)
CA (1) CA943670A (de)
CH (1) CH542440A (de)
DE (1) DE2152467C3 (de)
FR (1) FR2111481A5 (de)
GB (1) GB1365369A (de)
NL (1) NL7114200A (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3920989A (en) * 1974-09-20 1975-11-18 Minnesota Mining & Mfg Ion scattering spectrometer utilizing charge exchange processes
US4249077A (en) * 1978-08-04 1981-02-03 Crawford Charles K Ion charge neutralization for electron beam devices
DE2950330C2 (de) * 1979-12-14 1983-06-01 Leybold-Heraeus GmbH, 5000 Köln Vorrichtung zur chemischen Analyse von Proben
US4361762A (en) * 1980-07-30 1982-11-30 Rca Corporation Apparatus and method for neutralizing the beam in an ion implanter
DE3128814A1 (de) * 1981-07-21 1983-02-10 Siemens AG, 1000 Berlin und 8000 München Elektrisch leitende probenhalterung fuer die analysentechnik der sekundaerionen-massenspektrometrie
FR2542089B1 (fr) * 1983-01-14 1985-11-08 Cameca Procede et dispositif pour l'analyse ionique d'un echantillon isolant
JPS60135846A (ja) * 1983-12-26 1985-07-19 Anelva Corp 二次イオン質量分析方法
US4564758A (en) * 1984-02-01 1986-01-14 Cameca Process and device for the ionic analysis of an insulating sample
US4680467A (en) * 1986-04-08 1987-07-14 Kevex Corporation Electron spectroscopy system for chemical analysis of electrically isolated specimens
GB8703012D0 (en) * 1987-02-10 1987-03-18 Vg Instr Group Secondary ion mass spectrometer
JPH01220350A (ja) * 1988-02-26 1989-09-04 Hitachi Ltd 帯電抑制方法及びその装置を用いた粒子線照射装置
GB9122161D0 (en) * 1991-10-18 1991-11-27 Kratos Analytical Ltd Charged particle energy analysers
US7320733B2 (en) * 2003-05-09 2008-01-22 Sukegawa Electric Co., Ltd. Electron bombardment heating apparatus and temperature controlling apparatus and control method thereof
DE102004014582B4 (de) * 2004-03-25 2009-08-20 Bruker Daltonik Gmbh Ionenoptische Phasenvolumenkomprimierung
DE102014118797A1 (de) * 2014-12-17 2016-06-23 Vorwerk & Co. Interholding Gesellschaft mit beschränkter Haftung Behälter mit einer Akkumulator betriebenen Heißklebepistole sowie Heißklebepistole mit Vorwärmfunktion
CN111383903A (zh) * 2015-11-17 2020-07-07 Atonarp株式会社 分析装置及其控制方法
CN108493091B (zh) * 2018-03-09 2020-03-24 中国计量科学研究院 一种高电子利用率低能电离装置、质谱系统及方法
CN114047215B (zh) * 2021-10-20 2023-08-15 北京科技大学顺德研究生院 一种用于消除被测样品表面不均匀荷电的装置及方法

Also Published As

Publication number Publication date
FR2111481A5 (de) 1972-06-02
DE2152467C3 (de) 1981-01-08
DE2152467A1 (de) 1972-04-20
GB1365369A (en) 1974-09-04
DE2152467B2 (de) 1980-04-17
US3665185A (en) 1972-05-23
CA943670A (en) 1974-03-12
CH542440A (de) 1973-09-30
JPS5416236B1 (de) 1979-06-20

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Legal Events

Date Code Title Description
BB A search report has been drawn up
BV The patent application has lapsed