NL6410514A - - Google Patents

Info

Publication number
NL6410514A
NL6410514A NL6410514A NL6410514A NL6410514A NL 6410514 A NL6410514 A NL 6410514A NL 6410514 A NL6410514 A NL 6410514A NL 6410514 A NL6410514 A NL 6410514A NL 6410514 A NL6410514 A NL 6410514A
Authority
NL
Netherlands
Application number
NL6410514A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to NL6410514A priority Critical patent/NL6410514A/xx
Priority to US484907A priority patent/US3439163A/en
Priority to DE1598850A priority patent/DE1598850C3/de
Priority to AT816665A priority patent/AT257212B/de
Priority to CH1243065A priority patent/CH441813A/de
Priority to GB38161/65A priority patent/GB1089714A/en
Priority to BE669377A priority patent/BE669377A/xx
Publication of NL6410514A publication Critical patent/NL6410514A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/315—Accessories, mechanical or electrical features monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067—Construction details

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL6410514A 1964-09-10 1964-09-10 NL6410514A (fr)

Priority Applications (7)

Application Number Priority Date Filing Date Title
NL6410514A NL6410514A (fr) 1964-09-10 1964-09-10
US484907A US3439163A (en) 1964-09-10 1965-09-03 X-ray crystal monochromator with a reflecting surface that conforms to part of a logarithmic spiral
DE1598850A DE1598850C3 (de) 1964-09-10 1965-09-07 Auftreffplatte für Röntgenstrahlenbeugung
AT816665A AT257212B (de) 1964-09-10 1965-09-07 Auftreffplatte für Röntgenstrahlenanalysatoren
CH1243065A CH441813A (de) 1964-09-10 1965-09-07 Auftreffplatte für Röntgenstrahlenbeugung
GB38161/65A GB1089714A (en) 1964-09-10 1965-09-07 Improvements in or relating to x-ray analyzers
BE669377A BE669377A (fr) 1964-09-10 1965-09-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL6410514A NL6410514A (fr) 1964-09-10 1964-09-10

Publications (1)

Publication Number Publication Date
NL6410514A true NL6410514A (fr) 1966-03-11

Family

ID=19790980

Family Applications (1)

Application Number Title Priority Date Filing Date
NL6410514A NL6410514A (fr) 1964-09-10 1964-09-10

Country Status (7)

Country Link
US (1) US3439163A (fr)
AT (1) AT257212B (fr)
BE (1) BE669377A (fr)
CH (1) CH441813A (fr)
DE (1) DE1598850C3 (fr)
GB (1) GB1089714A (fr)
NL (1) NL6410514A (fr)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4132653A (en) * 1977-06-29 1979-01-02 Samson James A R Polarization analyzer for vacuum ultraviolet and x-ray radiation
DE3071231D1 (en) * 1979-08-28 1985-12-19 Gec Avionics X-ray diffraction apparatus
NL8300421A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen onderzoek apparaat met dubbel focusserend kristal.
NL8302263A (nl) * 1983-06-27 1985-01-16 Philips Nv Roentgen analyse apparaat met dubbel gebogen monochromator kristal.
US4599741A (en) * 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4752945A (en) * 1985-11-04 1988-06-21 North American Philips Corp. Double crystal X-ray spectrometer
NL8801019A (nl) * 1988-04-20 1989-11-16 Philips Nv Roentgen spectrometer met dubbel gebogen kristal.
JPH10502741A (ja) * 1995-04-26 1998-03-10 フィリップス エレクトロニクス ネムローゼ フェンノートシャップ Ｘ線分析装置用のｘ線光学素子の製造方法
DE69728258T2 (de) * 1996-12-20 2004-12-30 Panalytical B.V. Röntgenstrahlspektrometer mit kristallanalysator mit teilweise konstantem und ilweise variablem krümmungsradius
US6038285A (en) * 1998-02-02 2000-03-14 Zhong; Zhong Method and apparatus for producing monochromatic radiography with a bent laue crystal
US6259763B1 (en) * 1999-05-21 2001-07-10 The United States Of America As Represented By The United States Department Of Energy X-ray imaging crystal spectrometer for extended X-ray sources
CN101520423B (zh) * 2003-03-27 2011-01-19 株式会社理学 荧光x射线分析装置
US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
US7330530B2 (en) * 2004-10-04 2008-02-12 Illinois Institute Of Technology Diffraction enhanced imaging method using a line x-ray source
JP2007093581A (ja) * 2005-09-01 2007-04-12 Jeol Ltd 波長分散型ｘ線分光器
US7469037B2 (en) * 2007-04-03 2008-12-23 Illinois Institute Of Technology Method for detecting a mass density image of an object
CN102460135A (zh) * 2009-06-03 2012-05-16 特莫尼托恩分析仪器股份有限公司 检测器位于聚焦元件内部的x射线系统和方法
JP2013096750A (ja) * 2011-10-28 2013-05-20 Hamamatsu Photonics Kk Ｘ線分光検出装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2853617A (en) * 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture

Also Published As

Publication number Publication date
CH441813A (de) 1967-08-15
GB1089714A (en) 1967-11-08
AT257212B (de) 1967-09-25
US3439163A (en) 1969-04-15
DE1598850B2 (de) 1974-01-24
DE1598850C3 (de) 1974-08-08
BE669377A (fr) 1966-03-08
DE1598850A1 (de) 1970-07-30

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