NL263015A - - Google Patents
Info
- Publication number
- NL263015A NL263015A NL263015DA NL263015A NL 263015 A NL263015 A NL 263015A NL 263015D A NL263015D A NL 263015DA NL 263015 A NL263015 A NL 263015A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
- H01J37/222—Image processing arrangements associated with the tube
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
- H01J37/224—Luminescent screens or photographic plates for imaging; Apparatus specially adapted therefor, e. g. cameras, TV-cameras, photographic equipment or exposure control; Optical subsystems specially adapted therefor, e. g. microscopes for observing image on luminescent screen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB12361/60A GB918297A (en) | 1960-04-07 | 1960-04-07 | Improvements in electron microscopes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL263015A true NL263015A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1964-05-25 |
Family
ID=10003117
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL263015D NL263015A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1960-04-07 | 1961-01-30 |
Country Status (5)
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH451331A (de) * | 1965-12-13 | 1968-05-15 | Heinz Steigerwald Karl | Elektronenstrahl-Erzeugungssystem |
| CA935568A (en) * | 1970-03-20 | 1973-10-16 | Houtman Eliberthus | Device for examining material by x-ray fluorescence |
| FR2542089B1 (fr) * | 1983-01-14 | 1985-11-08 | Cameca | Procede et dispositif pour l'analyse ionique d'un echantillon isolant |
| US4564758A (en) * | 1984-02-01 | 1986-01-14 | Cameca | Process and device for the ionic analysis of an insulating sample |
| US5362964A (en) * | 1993-07-30 | 1994-11-08 | Electroscan Corporation | Environmental scanning electron microscope |
| US5412211A (en) * | 1993-07-30 | 1995-05-02 | Electroscan Corporation | Environmental scanning electron microscope |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE692336C (de) * | 1934-12-07 | 1940-06-18 | Bodo V Borries Dr Ing | Verfahren zur Abbildung von Flaechen mittels Korpuskularstrahlen |
| US2356633A (en) * | 1939-10-19 | 1944-08-22 | Ardenne Manfred Von | Electronic microscope |
| DE748680C (de) * | 1939-10-19 | 1944-11-08 | Elektronenmikroskop | |
| DE761663C (de) * | 1942-01-21 | 1953-10-12 | Aeg | Elektronenmikroskop, insbesondere UEbermikroskop, mit einer als Elektronenspiegel wirkenden Projektionslinse |
| DE893104C (de) * | 1943-01-04 | 1953-10-12 | Siemens Ag | Vorrichtung zur Querverstellung des Objektes im Strahlengang von Korpuskularstrahlapparaten |
| NL98715C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1953-09-04 | |||
| US2890342A (en) * | 1954-09-29 | 1959-06-09 | Gen Electric | System for charge neutralization |
| DE1133841B (de) * | 1957-09-11 | 1962-07-26 | Leitz Ernst Gmbh | Elektronenmikroskop zur direkten Abbildung von Oberflaechen durch Sekundaerelektronen, Verfahren zur Untersuchung von Nichtleitern oder Halbleitern und Anordnung zur Durchfuehrung des Verfahrens |
| US3049618A (en) * | 1959-05-13 | 1962-08-14 | Commissariat Energie Atomique | Methods and devices for performing spectrum analysis, in particular in the far ultraviolet region |
| DE1099102B (de) * | 1959-05-26 | 1961-02-09 | Siemens Ag | Blendenanordnung fuer Elektronenmikroskope mit Zusatzeinrichtung zur Roentgenspektroskopie durchstrahlbarer Praeparate |
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1960
- 1960-04-07 GB GB12361/60A patent/GB918297A/en not_active Expired
-
1961
- 1961-01-30 NL NL263015D patent/NL263015A/xx unknown
- 1961-03-24 US US112139A patent/US3155827A/en not_active Expired - Lifetime
- 1961-03-29 FR FR17807A patent/FR1285063A/fr not_active Expired
- 1961-04-05 DE DEN19846A patent/DE1204350B/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| FR1285063A (fr) | 1962-02-16 |
| US3155827A (en) | 1964-11-03 |
| GB918297A (en) | 1963-02-13 |
| DE1204350B (de) | 1965-11-04 |