NL192322C - Inrichting voor het tot een minimum beperken van artefakten veroorzaakt door niet-coplanairiteit tussen de bronmiddelen en de detectiemiddelen bij CT aftasters. - Google Patents

Inrichting voor het tot een minimum beperken van artefakten veroorzaakt door niet-coplanairiteit tussen de bronmiddelen en de detectiemiddelen bij CT aftasters. Download PDF

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Publication number
NL192322C
NL192322C NL8402630A NL8402630A NL192322C NL 192322 C NL192322 C NL 192322C NL 8402630 A NL8402630 A NL 8402630A NL 8402630 A NL8402630 A NL 8402630A NL 192322 C NL192322 C NL 192322C
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NL
Netherlands
Prior art keywords
data
projection
coplanarity
source
artifacts
Prior art date
Application number
NL8402630A
Other languages
English (en)
Dutch (nl)
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NL192322B (nl
NL8402630A (nl
Original Assignee
Elscint Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Elscint Ltd filed Critical Elscint Ltd
Publication of NL8402630A publication Critical patent/NL8402630A/nl
Publication of NL192322B publication Critical patent/NL192322B/xx
Application granted granted Critical
Publication of NL192322C publication Critical patent/NL192322C/nl

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S378/00—X-ray or gamma ray systems or devices
    • Y10S378/901—Computer tomography program or processor

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  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL8402630A 1983-08-29 1984-08-29 Inrichting voor het tot een minimum beperken van artefakten veroorzaakt door niet-coplanairiteit tussen de bronmiddelen en de detectiemiddelen bij CT aftasters. NL192322C (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US52747283 1983-08-29
US06/527,472 US4578753A (en) 1983-08-29 1983-08-29 Systems and methods for minimizing noncoplanarity artifacts

Publications (3)

Publication Number Publication Date
NL8402630A NL8402630A (nl) 1985-03-18
NL192322B NL192322B (nl) 1997-02-03
NL192322C true NL192322C (nl) 1997-06-04

Family

ID=24101600

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8402630A NL192322C (nl) 1983-08-29 1984-08-29 Inrichting voor het tot een minimum beperken van artefakten veroorzaakt door niet-coplanairiteit tussen de bronmiddelen en de detectiemiddelen bij CT aftasters.

Country Status (6)

Country Link
US (1) US4578753A (cs)
JP (1) JPS6099235A (cs)
DE (1) DE3429155C2 (cs)
FR (1) FR2551211B1 (cs)
IL (1) IL72663A (cs)
NL (1) NL192322C (cs)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4907157A (en) * 1984-09-05 1990-03-06 Kabushiki Kaisha Toshiba Method and system for allowing imaging of any size object through use of separate source and detector unit
GB2181330B (en) * 1985-09-26 1990-05-09 Toshiba Kk X-ray inspection apparatus
FR2615619B1 (fr) * 1987-05-21 1991-07-19 Commissariat Energie Atomique Procede et dispositif d'imagerie tridimentionnelle a partir de mesures bidimensionnelles de l'attenuation d'un rayonnement
US5651047A (en) * 1993-01-25 1997-07-22 Cardiac Mariners, Incorporated Maneuverable and locateable catheters
US5446799A (en) * 1993-11-01 1995-08-29 Picker International, Inc. CT Scanner with improved processing efficiency 180 degrees+ fan angle reconstruction system
EP1685390A1 (en) * 2003-11-11 2006-08-02 Philips Intellectual Property & Standards GmbH Computed examination of an object by using coherent-scattered radiation
US8218720B2 (en) * 2007-03-12 2012-07-10 Varian Medical Systems, Inc. Method and apparatus to facilitate reconstructing an image using fan-beam data

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1493594A (en) * 1974-01-31 1977-11-30 Emi Ltd Radiography
NL7607976A (nl) * 1976-07-19 1978-01-23 Optische Ind De Oude Delft Nv Inrichting voor tomografie met voorzieningen waardoor signaalprofielen afgeleid van een di- vergerende stralingsbundel kunnen worden gere- construeerd in signaalprofielen die elk corre- sponderen met een bundel van evenwijdig inval- lende stralen.
DE2658533C2 (de) * 1976-12-23 1987-02-26 Siemens AG, 1000 Berlin und 8000 München Vorrichtung zur Darstellung von Körperlängsschichten
DE2700364A1 (de) * 1977-01-07 1978-07-13 Agfa Gevaert Ag Tomographisches verfahren
CA1104727A (en) * 1977-08-18 1981-07-07 Godfrey N. Hounsfield Rotation-only ct scanner with beam deflection
US4293912A (en) * 1977-09-30 1981-10-06 Technicare Corporation Tomographic apparatus
US4145613A (en) * 1977-10-25 1979-03-20 Cgr Medical Corporation Motorized X-ray tube assembly
DE2754361C2 (de) * 1977-12-07 1983-07-14 N.V. Philips' Gloeilampenfabrieken, 5621 Eindhoven Verfahren zur Verminderung von Bildfehlern in Computer-Tomographiebildern
US4222104A (en) * 1978-11-02 1980-09-09 E M I Limited Radiography
JPS5599240A (en) * 1979-01-22 1980-07-29 Tokyo Shibaura Electric Co Ct scanner
US4418387A (en) * 1979-09-18 1983-11-29 The President Of Tokyo Institute Of Technology Method of reconstructing a computed tomographic image from a single X-ray projection
JPS6058504B2 (ja) * 1980-11-17 1985-12-20 株式会社東芝 再構成装置
US4472823A (en) * 1982-03-17 1984-09-18 U.S. Philips Corporation Computed tomography apparatus with detector sensitivity correction

Also Published As

Publication number Publication date
FR2551211B1 (fr) 1988-11-04
DE3429155A1 (de) 1985-04-18
US4578753A (en) 1986-03-25
NL192322B (nl) 1997-02-03
DE3429155C2 (de) 1994-01-13
NL8402630A (nl) 1985-03-18
FR2551211A1 (fr) 1985-03-01
JPH0566128B2 (cs) 1993-09-21
IL72663A (en) 1988-10-31
JPS6099235A (ja) 1985-06-03

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BA A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
V1 Lapsed because of non-payment of the annual fee

Effective date: 19980301