NL187374B - Inrichting voor het detecteren van straling. - Google Patents

Inrichting voor het detecteren van straling.

Info

Publication number
NL187374B
NL187374B NLAANVRAGE8103304,A NL8103304A NL187374B NL 187374 B NL187374 B NL 187374B NL 8103304 A NL8103304 A NL 8103304A NL 187374 B NL187374 B NL 187374B
Authority
NL
Netherlands
Prior art keywords
detecting radiation
radiation
detecting
Prior art date
Application number
NLAANVRAGE8103304,A
Other languages
English (en)
Other versions
NL187374C (nl
NL8103304A (nl
Inventor
Arthur Marie Eugen Hoeberechts
Gerard Eduard Van Rosmalen
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Priority to NLAANVRAGE8103304,A priority Critical patent/NL187374C/nl
Priority to US06/358,542 priority patent/US4469945A/en
Priority to GB08219175A priority patent/GB2102201B/en
Priority to FR8211751A priority patent/FR2509531A1/fr
Priority to AU85690/82A priority patent/AU549417B2/en
Priority to IE1637/82A priority patent/IE53710B1/en
Priority to DE19823225372 priority patent/DE3225372A1/de
Priority to IT22292/82A priority patent/IT1151909B/it
Priority to JP57117885A priority patent/JPS5817665A/ja
Priority to ES513803A priority patent/ES8308451A1/es
Priority to CA000406926A priority patent/CA1194195A/en
Publication of NL8103304A publication Critical patent/NL8103304A/nl
Publication of NL187374B publication Critical patent/NL187374B/nl
Application granted granted Critical
Publication of NL187374C publication Critical patent/NL187374C/nl

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W64/00—Locating users or terminals or network equipment for network management purposes, e.g. mobility management
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/02016—Circuit arrangements of general character for the devices
    • H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02024—Position sensitive and lateral effect photodetectors; Quadrant photodiodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
    • H01L31/03529—Shape of the potential jump barrier or surface barrier
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W36/00—Hand-off or reselection arrangements
    • H04W36/04—Reselecting a cell layer in multi-layered cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
  • Automatic Focus Adjustment (AREA)
  • Solid State Image Pick-Up Elements (AREA)
NLAANVRAGE8103304,A 1981-07-10 1981-07-10 Inrichting voor het detecteren van straling. NL187374C (nl)

Priority Applications (11)

Application Number Priority Date Filing Date Title
NLAANVRAGE8103304,A NL187374C (nl) 1981-07-10 1981-07-10 Inrichting voor het detecteren van straling.
US06/358,542 US4469945A (en) 1981-07-10 1982-03-15 Device for detecting radiation and semiconductor device for use in such a device
GB08219175A GB2102201B (en) 1981-07-10 1982-07-02 Radiation detection apparatus
FR8211751A FR2509531A1 (fr) 1981-07-10 1982-07-05 Dispositif permettant de detecter un rayonnement et dispositif semi-conducteur a appliquer a un tel dispositif
IE1637/82A IE53710B1 (en) 1981-07-10 1982-07-07 Radiation detection apparatus
DE19823225372 DE3225372A1 (de) 1981-07-10 1982-07-07 Vorrichtung zum detektieren von strahlung und halbleiteranordnung zur anwendung in einer derartigen vorrichtung
AU85690/82A AU549417B2 (en) 1981-07-10 1982-07-07 Device for detecting radiation
IT22292/82A IT1151909B (it) 1981-07-10 1982-07-07 Dispositivo per la rivelazione di radiazioni e dispositivo semiconduttore per l'impiego in tale dispositivo
JP57117885A JPS5817665A (ja) 1981-07-10 1982-07-08 放射線検出装置
ES513803A ES8308451A1 (es) 1981-07-10 1982-07-08 "un dispositivo para detectar radiacion".
CA000406926A CA1194195A (en) 1981-07-10 1982-07-08 Device for detecting radiation and semiconductor device for use in such a device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NLAANVRAGE8103304,A NL187374C (nl) 1981-07-10 1981-07-10 Inrichting voor het detecteren van straling.
NL8103304 1981-07-10

Publications (3)

Publication Number Publication Date
NL8103304A NL8103304A (nl) 1983-02-01
NL187374B true NL187374B (nl) 1991-04-02
NL187374C NL187374C (nl) 1991-09-02

Family

ID=19837773

Family Applications (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE8103304,A NL187374C (nl) 1981-07-10 1981-07-10 Inrichting voor het detecteren van straling.

Country Status (11)

Country Link
US (1) US4469945A (nl)
JP (1) JPS5817665A (nl)
AU (1) AU549417B2 (nl)
CA (1) CA1194195A (nl)
DE (1) DE3225372A1 (nl)
ES (1) ES8308451A1 (nl)
FR (1) FR2509531A1 (nl)
GB (1) GB2102201B (nl)
IE (1) IE53710B1 (nl)
IT (1) IT1151909B (nl)
NL (1) NL187374C (nl)

Families Citing this family (50)

* Cited by examiner, † Cited by third party
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JPS60145563A (ja) * 1984-01-05 1985-08-01 Matsushita Electric Ind Co Ltd ビデオデイスクプレ−ヤ
JPS60185230A (ja) * 1984-03-02 1985-09-20 Pioneer Electronic Corp 焦点誤差検出装置
WO1986003058A1 (en) * 1984-11-13 1986-05-22 Eastman Kodak Company A solid state light sensing device
KR870001302B1 (ko) * 1984-11-20 1987-07-11 대우중공업 주식회사 CO_2레이저 빔 프로파일(Laser Beam Profile) 측정장치
NL8501489A (nl) * 1985-05-24 1986-12-16 Philips Nv Positie-gevoelige stralingsdetector.
US4703168A (en) * 1985-07-22 1987-10-27 Princeton Applied Research Corporation Multiplexed wedge anode detector
NL8601719A (nl) * 1986-07-02 1988-02-01 Philips Nv Electronisch instelbare positiegevoelige stralingsdetector, focusfoutdetectiestelsel voorzien van een dergelijke stralingsdetector, en optische lees- en/of schrijfinrichting voorzien van een dergelijk focusfoutdetectiestelsel.
US4871914A (en) * 1987-05-05 1989-10-03 Sun Nuclear Corporation Low-cost radon detector
US5479018A (en) * 1989-05-08 1995-12-26 Westinghouse Electric Corp. Back surface illuminated infrared detector
NL8901400A (nl) * 1989-06-02 1991-01-02 Philips Nv Halfgeleiderinrichting met een stralingsgevoelig element.
IL96623A0 (en) * 1989-12-26 1991-09-16 Gen Electric Low capacitance,large area semiconductor photodetector and photodetector system
US5475618A (en) * 1993-01-28 1995-12-12 Advanced Micro Devices Apparatus and method for monitoring and controlling an ion implant device
US6046454A (en) * 1995-10-13 2000-04-04 Digirad Corporation Semiconductor radiation detector with enhanced charge collection
US5834628A (en) * 1995-11-09 1998-11-10 Consultec Scientific, Inc. Activity weighted particle size distribution system
DE102006013460B3 (de) * 2006-03-23 2007-11-08 Prüftechnik Dieter Busch AG Photodetektoranordnung, Messanordnung mit einer Photodetektoranordnung und Verfahren zum Betrieb einer Messanordnung
DE102006013461B3 (de) * 2006-03-23 2007-11-15 Prüftechnik Dieter Busch AG Photodetektoranordnung, Messanordnung mit einer Photodetektoranordnung und Verfahren zum Betrieb einer Messanordnung
US8143584B2 (en) * 2008-02-04 2012-03-27 Radon Technologies, Inc. Radon monitor
US9001029B2 (en) 2011-02-15 2015-04-07 Basf Se Detector for optically detecting at least one object
AU2012219157C1 (en) 2011-02-15 2015-08-20 Basf Se Detector for optically detecting at least one object
US9040929B2 (en) * 2012-07-30 2015-05-26 International Business Machines Corporation Charge sensors using inverted lateral bipolar junction transistors
US9389315B2 (en) 2012-12-19 2016-07-12 Basf Se Detector comprising a transversal optical sensor for detecting a transversal position of a light beam from an object and a longitudinal optical sensor sensing a beam cross-section of the light beam in a sensor region
EP3008421A1 (en) 2013-06-13 2016-04-20 Basf Se Detector for optically detecting an orientation of at least one object
KR102246139B1 (ko) 2013-06-13 2021-04-30 바스프 에스이 적어도 하나의 물체를 광학적으로 검출하기 위한 검출기
KR102252336B1 (ko) 2013-06-13 2021-05-14 바스프 에스이 광학 검출기 및 그의 제조 방법
AU2014310703B2 (en) 2013-08-19 2018-09-27 Basf Se Optical detector
US9665182B2 (en) 2013-08-19 2017-05-30 Basf Se Detector for determining a position of at least one object
WO2016005893A1 (en) 2014-07-08 2016-01-14 Basf Se Detector for determining a position of at least one object
CN106716059B (zh) 2014-09-29 2020-03-13 巴斯夫欧洲公司 用于光学确定至少一个对象的位置的检测器
WO2016092451A1 (en) 2014-12-09 2016-06-16 Basf Se Optical detector
JP6841769B2 (ja) 2015-01-30 2021-03-10 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の物体を光学的に検出する検出器
WO2016146725A1 (en) 2015-03-17 2016-09-22 Basf Se Optical data reader
JP6877418B2 (ja) 2015-07-17 2021-05-26 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の対象物を光学的に検出するための検出器
WO2017046121A1 (en) 2015-09-14 2017-03-23 Trinamix Gmbh 3d camera
WO2017089553A1 (en) 2015-11-25 2017-06-01 Trinamix Gmbh Detector for optically detecting at least one object
KR20180086198A (ko) 2015-11-25 2018-07-30 트리나미엑스 게엠베하 적어도 하나의 물체를 광학적으로 검출하기 위한 검출기
KR20180132809A (ko) 2016-04-06 2018-12-12 트리나미엑스 게엠베하 하나 이상의 물체를 광학적으로 검출하기 위한 검출기
JP2019515288A (ja) 2016-04-28 2019-06-06 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の対象物を光学的に検出するための検出器
WO2017186851A1 (en) 2016-04-28 2017-11-02 Trinamix Gmbh Detector for optically detecting at least one object
US11211513B2 (en) 2016-07-29 2021-12-28 Trinamix Gmbh Optical sensor and detector for an optical detection
EP3532796A1 (en) 2016-10-25 2019-09-04 trinamiX GmbH Nfrared optical detector with integrated filter
EP3532864B1 (en) 2016-10-25 2024-08-28 trinamiX GmbH Detector for an optical detection of at least one object
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
CN109964148B (zh) 2016-11-17 2023-08-01 特里纳米克斯股份有限公司 用于光学检测至少一个对象的检测器
WO2018096083A1 (en) 2016-11-25 2018-05-31 Trinamix Gmbh Optical detector comprising at least one optical waveguide
WO2018167215A1 (en) 2017-03-16 2018-09-20 Trinamix Gmbh Detector for optically detecting at least one object
CN110770555A (zh) 2017-04-20 2020-02-07 特里纳米克斯股份有限公司 光学检测器
EP3645965B1 (en) 2017-06-26 2022-04-27 trinamiX GmbH Detector for determining a position of at least one object
WO2019011803A1 (en) 2017-07-10 2019-01-17 Trinamix Gmbh DETECTOR FOR OPTICALLY DETECTING AT LEAST ONE OBJECT
CN111344592B (zh) 2017-08-28 2023-07-18 特里纳米克斯股份有限公司 确定至少一个对象的位置的检测器
KR102685226B1 (ko) 2017-08-28 2024-07-16 트리나미엑스 게엠베하 적어도 하나의 기하학적 정보를 판정하기 위한 측거기

Family Cites Families (6)

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FR2271590B1 (nl) * 1974-01-15 1978-12-01 Thomson Brandt
NL7803969A (nl) * 1978-04-14 1979-10-16 Philips Nv Opto-elektronisch fokusfout-detektiestelsel.
JPS54162989A (en) * 1978-06-15 1979-12-25 Sony Corp Solid-state pickup unit
US4228354A (en) * 1979-07-13 1980-10-14 Ari Lehto Method for detecting radiation
DE2939518A1 (de) * 1979-09-28 1981-04-16 Siemens AG, 1000 Berlin und 8000 München Monolithisch integrierte schaltung zur zeilenweisen bildabtastung
US4360732A (en) * 1980-06-16 1982-11-23 Texas Instruments Incorporated Infrared charge transfer device (CTD) system

Also Published As

Publication number Publication date
FR2509531A1 (fr) 1983-01-14
DE3225372A1 (de) 1983-02-17
GB2102201B (en) 1985-03-06
AU8569082A (en) 1983-01-13
US4469945A (en) 1984-09-04
DE3225372C2 (nl) 1991-12-19
FR2509531B1 (nl) 1985-05-17
IT8222292A0 (it) 1982-07-07
IT1151909B (it) 1986-12-24
IE53710B1 (en) 1989-01-18
GB2102201A (en) 1983-01-26
IE821637L (en) 1983-01-10
NL187374C (nl) 1991-09-02
NL8103304A (nl) 1983-02-01
JPS5817665A (ja) 1983-02-01
ES513803A0 (es) 1983-08-16
CA1194195A (en) 1985-09-24
AU549417B2 (en) 1986-01-23
ES8308451A1 (es) 1983-08-16
JPH037148B2 (nl) 1991-01-31

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Legal Events

Date Code Title Description
A1B A search report has been drawn up
A85 Still pending on 85-01-01
BC A request for examination has been filed
V2 Lapsed due to non-payment of the last due maintenance fee for the patent application