ES513803A0 - "un dispositivo para detectar radiacion". - Google Patents
"un dispositivo para detectar radiacion".Info
- Publication number
- ES513803A0 ES513803A0 ES513803A ES513803A ES513803A0 ES 513803 A0 ES513803 A0 ES 513803A0 ES 513803 A ES513803 A ES 513803A ES 513803 A ES513803 A ES 513803A ES 513803 A0 ES513803 A0 ES 513803A0
- Authority
- ES
- Spain
- Prior art keywords
- detect radiation
- radiation
- detect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W64/00—Locating users or terminals or network equipment for network management purposes, e.g. mobility management
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/02016—Circuit arrangements of general character for the devices
- H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02024—Position sensitive and lateral effect photodetectors; Quadrant photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
- H01L31/03529—Shape of the potential jump barrier or surface barrier
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W36/00—Hand-off or reselection arrangements
- H04W36/04—Reselecting a cell layer in multi-layered cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Automatic Focus Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PT76393A PT76393B (de) | 1982-07-08 | 1983-03-15 | Improved impact grinding machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NLAANVRAGE8103304,A NL187374C (nl) | 1981-07-10 | 1981-07-10 | Inrichting voor het detecteren van straling. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| ES8308451A1 ES8308451A1 (es) | 1983-08-16 |
| ES513803A0 true ES513803A0 (es) | 1983-08-16 |
Family
ID=19837773
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES513803A Granted ES513803A0 (es) | 1981-07-10 | 1982-07-08 | "un dispositivo para detectar radiacion". |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US4469945A (es) |
| JP (1) | JPS5817665A (es) |
| AU (1) | AU549417B2 (es) |
| CA (1) | CA1194195A (es) |
| DE (1) | DE3225372A1 (es) |
| ES (1) | ES513803A0 (es) |
| FR (1) | FR2509531A1 (es) |
| GB (1) | GB2102201B (es) |
| IE (1) | IE53710B1 (es) |
| IT (1) | IT1151909B (es) |
| NL (1) | NL187374C (es) |
Families Citing this family (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60145563A (ja) * | 1984-01-05 | 1985-08-01 | Matsushita Electric Ind Co Ltd | ビデオデイスクプレ−ヤ |
| JPS60185230A (ja) * | 1984-03-02 | 1985-09-20 | Pioneer Electronic Corp | 焦点誤差検出装置 |
| WO1986003058A1 (en) * | 1984-11-13 | 1986-05-22 | Eastman Kodak Company | A solid state light sensing device |
| KR870001302B1 (ko) * | 1984-11-20 | 1987-07-11 | 대우중공업 주식회사 | CO_2레이저 빔 프로파일(Laser Beam Profile) 측정장치 |
| NL8501489A (nl) * | 1985-05-24 | 1986-12-16 | Philips Nv | Positie-gevoelige stralingsdetector. |
| US4703168A (en) * | 1985-07-22 | 1987-10-27 | Princeton Applied Research Corporation | Multiplexed wedge anode detector |
| NL8601719A (nl) * | 1986-07-02 | 1988-02-01 | Philips Nv | Electronisch instelbare positiegevoelige stralingsdetector, focusfoutdetectiestelsel voorzien van een dergelijke stralingsdetector, en optische lees- en/of schrijfinrichting voorzien van een dergelijk focusfoutdetectiestelsel. |
| US4871914A (en) * | 1987-05-05 | 1989-10-03 | Sun Nuclear Corporation | Low-cost radon detector |
| US5479018A (en) * | 1989-05-08 | 1995-12-26 | Westinghouse Electric Corp. | Back surface illuminated infrared detector |
| NL8901400A (nl) * | 1989-06-02 | 1991-01-02 | Philips Nv | Halfgeleiderinrichting met een stralingsgevoelig element. |
| IL96623A0 (en) * | 1989-12-26 | 1991-09-16 | Gen Electric | Low capacitance,large area semiconductor photodetector and photodetector system |
| US5475618A (en) * | 1993-01-28 | 1995-12-12 | Advanced Micro Devices | Apparatus and method for monitoring and controlling an ion implant device |
| US6046454A (en) * | 1995-10-13 | 2000-04-04 | Digirad Corporation | Semiconductor radiation detector with enhanced charge collection |
| US5834628A (en) * | 1995-11-09 | 1998-11-10 | Consultec Scientific, Inc. | Activity weighted particle size distribution system |
| DE102006013460B3 (de) * | 2006-03-23 | 2007-11-08 | Prüftechnik Dieter Busch AG | Photodetektoranordnung, Messanordnung mit einer Photodetektoranordnung und Verfahren zum Betrieb einer Messanordnung |
| DE102006013461B3 (de) * | 2006-03-23 | 2007-11-15 | Prüftechnik Dieter Busch AG | Photodetektoranordnung, Messanordnung mit einer Photodetektoranordnung und Verfahren zum Betrieb einer Messanordnung |
| US8143584B2 (en) * | 2008-02-04 | 2012-03-27 | Radon Technologies, Inc. | Radon monitor |
| CN106019305B (zh) | 2011-02-15 | 2019-10-11 | 巴斯夫欧洲公司 | 用于光学检测至少一种物体的检测器 |
| US9001029B2 (en) | 2011-02-15 | 2015-04-07 | Basf Se | Detector for optically detecting at least one object |
| US9040929B2 (en) | 2012-07-30 | 2015-05-26 | International Business Machines Corporation | Charge sensors using inverted lateral bipolar junction transistors |
| JP6415447B2 (ja) | 2012-12-19 | 2018-10-31 | ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ | １つ以上の物体を光学的に検出するための検出器 |
| KR102252336B1 (ko) | 2013-06-13 | 2021-05-14 | 바스프 에스이 | 광학 검출기 및 그의 제조 방법 |
| JP2016529474A (ja) | 2013-06-13 | 2016-09-23 | ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ | 少なくとも１つの物体を光学的に検出する検出器 |
| JP6440696B2 (ja) | 2013-06-13 | 2018-12-19 | ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ | 少なくとも１つの物体の方位を光学的に検出する検出器 |
| CN105637320B (zh) | 2013-08-19 | 2018-12-14 | 巴斯夫欧洲公司 | 光学检测器 |
| JP6483127B2 (ja) | 2013-08-19 | 2019-03-13 | ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ | 少なくとも１つの対象物の位置を求めるための検出器 |
| KR102397527B1 (ko) | 2014-07-08 | 2022-05-13 | 바스프 에스이 | 하나 이상의 물체의 위치를 결정하기 위한 검출기 |
| WO2016051323A1 (en) | 2014-09-29 | 2016-04-07 | Basf Se | Detector for optically determining a position of at least one object |
| EP3230841B1 (en) | 2014-12-09 | 2019-07-03 | Basf Se | Optical detector |
| KR102496245B1 (ko) | 2015-01-30 | 2023-02-06 | 트리나미엑스 게엠베하 | 하나 이상의 물체의 광학적 검출을 위한 검출기 |
| WO2016146725A1 (en) | 2015-03-17 | 2016-09-22 | Basf Se | Optical data reader |
| US10955936B2 (en) | 2015-07-17 | 2021-03-23 | Trinamix Gmbh | Detector for optically detecting at least one object |
| KR102539263B1 (ko) | 2015-09-14 | 2023-06-05 | 트리나미엑스 게엠베하 | 적어도 하나의 물체의 적어도 하나의 이미지를 기록하는 카메라 |
| WO2017089553A1 (en) | 2015-11-25 | 2017-06-01 | Trinamix Gmbh | Detector for optically detecting at least one object |
| JP2019502905A (ja) | 2015-11-25 | 2019-01-31 | トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 少なくとも１個の物体を光学的に検出する検出器 |
| KR20180132809A (ko) | 2016-04-06 | 2018-12-12 | 트리나미엑스 게엠베하 | 하나 이상의 물체를 광학적으로 검출하기 위한 검출기 |
| KR20190002488A (ko) | 2016-04-28 | 2019-01-08 | 트리나미엑스 게엠베하 | 적어도 하나의 물체를 광학적으로 검출하기 위한 검출기 |
| WO2017186851A1 (en) | 2016-04-28 | 2017-11-02 | Trinamix Gmbh | Detector for optically detecting at least one object |
| US11211513B2 (en) | 2016-07-29 | 2021-12-28 | Trinamix Gmbh | Optical sensor and detector for an optical detection |
| US11428787B2 (en) | 2016-10-25 | 2022-08-30 | Trinamix Gmbh | Detector for an optical detection of at least one object |
| WO2018077870A1 (en) | 2016-10-25 | 2018-05-03 | Trinamix Gmbh | Nfrared optical detector with integrated filter |
| KR102502094B1 (ko) | 2016-11-17 | 2023-02-21 | 트리나미엑스 게엠베하 | 적어도 하나의 피사체를 광학적으로 검출하기 위한 검출기 |
| US11860292B2 (en) | 2016-11-17 | 2024-01-02 | Trinamix Gmbh | Detector and methods for authenticating at least one object |
| WO2018096083A1 (en) | 2016-11-25 | 2018-05-31 | Trinamix Gmbh | Optical detector comprising at least one optical waveguide |
| CN110392844B (zh) | 2017-03-16 | 2024-03-12 | 特里纳米克斯股份有限公司 | 用于光学检测至少一个对象的检测器 |
| JP7204667B2 (ja) | 2017-04-20 | 2023-01-16 | トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 光検出器 |
| CN110998223B (zh) | 2017-06-26 | 2021-10-29 | 特里纳米克斯股份有限公司 | 用于确定至少一个对像的位置的检测器 |
| WO2019011803A1 (en) | 2017-07-10 | 2019-01-17 | Trinamix Gmbh | DETECTOR FOR OPTICALLY DETECTING AT LEAST ONE OBJECT |
| JP2020531848A (ja) | 2017-08-28 | 2020-11-05 | トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 少なくとも一つの幾何学情報を決定するためのレンジファインダ |
| JP7179051B2 (ja) | 2017-08-28 | 2022-11-28 | トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 少なくとも１つの物体の位置を決定するための検出器 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2271590B1 (es) * | 1974-01-15 | 1978-12-01 | Thomson Brandt | |
| NL7803969A (nl) * | 1978-04-14 | 1979-10-16 | Philips Nv | Opto-elektronisch fokusfout-detektiestelsel. |
| JPS54162989A (en) * | 1978-06-15 | 1979-12-25 | Sony Corp | Solid-state pickup unit |
| US4228354A (en) * | 1979-07-13 | 1980-10-14 | Ari Lehto | Method for detecting radiation |
| DE2939518A1 (de) * | 1979-09-28 | 1981-04-16 | Siemens AG, 1000 Berlin und 8000 München | Monolithisch integrierte schaltung zur zeilenweisen bildabtastung |
| US4360732A (en) * | 1980-06-16 | 1982-11-23 | Texas Instruments Incorporated | Infrared charge transfer device (CTD) system |
-
1981
- 1981-07-10 NL NLAANVRAGE8103304,A patent/NL187374C/xx not_active IP Right Cessation
-
1982
- 1982-03-15 US US06/358,542 patent/US4469945A/en not_active Expired - Fee Related
- 1982-07-02 GB GB08219175A patent/GB2102201B/en not_active Expired
- 1982-07-05 FR FR8211751A patent/FR2509531A1/fr active Granted
- 1982-07-07 IT IT22292/82A patent/IT1151909B/it active
- 1982-07-07 AU AU85690/82A patent/AU549417B2/en not_active Ceased
- 1982-07-07 IE IE1637/82A patent/IE53710B1/en unknown
- 1982-07-07 DE DE19823225372 patent/DE3225372A1/de active Granted
- 1982-07-08 JP JP57117885A patent/JPS5817665A/ja active Granted
- 1982-07-08 CA CA000406926A patent/CA1194195A/en not_active Expired
- 1982-07-08 ES ES513803A patent/ES513803A0/es active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| ES8308451A1 (es) | 1983-08-16 |
| IE53710B1 (en) | 1989-01-18 |
| JPS5817665A (ja) | 1983-02-01 |
| NL187374C (nl) | 1991-09-02 |
| DE3225372C2 (es) | 1991-12-19 |
| IE821637L (en) | 1983-01-10 |
| DE3225372A1 (de) | 1983-02-17 |
| AU8569082A (en) | 1983-01-13 |
| GB2102201A (en) | 1983-01-26 |
| AU549417B2 (en) | 1986-01-23 |
| JPH037148B2 (es) | 1991-01-31 |
| IT8222292A0 (it) | 1982-07-07 |
| NL187374B (nl) | 1991-04-02 |
| FR2509531B1 (es) | 1985-05-17 |
| FR2509531A1 (fr) | 1983-01-14 |
| GB2102201B (en) | 1985-03-06 |
| US4469945A (en) | 1984-09-04 |
| NL8103304A (nl) | 1983-02-01 |
| CA1194195A (en) | 1985-09-24 |
| IT1151909B (it) | 1986-12-24 |
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