NL179097C - Werkwijze en inrichting voor het toetsen van de juiste werking van een geheugen. - Google Patents

Werkwijze en inrichting voor het toetsen van de juiste werking van een geheugen.

Info

Publication number
NL179097C
NL179097C NLAANVRAGE7610819,A NL7610819A NL179097C NL 179097 C NL179097 C NL 179097C NL 7610819 A NL7610819 A NL 7610819A NL 179097 C NL179097 C NL 179097C
Authority
NL
Netherlands
Prior art keywords
cycle
inverter
words
memory
inverters
Prior art date
Application number
NLAANVRAGE7610819,A
Other languages
English (en)
Dutch (nl)
Other versions
NL179097B (nl
NL7610819A (nl
Original Assignee
Cselt Centro Studi Lab Telecom
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cselt Centro Studi Lab Telecom filed Critical Cselt Centro Studi Lab Telecom
Publication of NL7610819A publication Critical patent/NL7610819A/
Publication of NL179097B publication Critical patent/NL179097B/xx
Application granted granted Critical
Publication of NL179097C publication Critical patent/NL179097C/xx

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/32—Serial access; Scan testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters

Landscapes

  • Time-Division Multiplex Systems (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
NLAANVRAGE7610819,A 1975-10-08 1976-09-30 Werkwijze en inrichting voor het toetsen van de juiste werking van een geheugen. NL179097C (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT69494/75A IT1047437B (it) 1975-10-08 1975-10-08 Procedimento e dispositivo per il controllo in linea di memorie logiche sequenziali operanti a divisione di tempo

Publications (3)

Publication Number Publication Date
NL7610819A NL7610819A (nl) 1977-04-13
NL179097B NL179097B (nl) 1986-02-03
NL179097C true NL179097C (nl) 1986-07-01

Family

ID=11312257

Family Applications (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE7610819,A NL179097C (nl) 1975-10-08 1976-09-30 Werkwijze en inrichting voor het toetsen van de juiste werking van een geheugen.

Country Status (4)

Country Link
US (1) US4049956A (xx)
DE (1) DE2644733C3 (xx)
IT (1) IT1047437B (xx)
NL (1) NL179097C (xx)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4360915A (en) * 1979-02-07 1982-11-23 The Warner & Swasey Company Error detection means
US4360917A (en) * 1979-02-07 1982-11-23 The Warner & Swasey Company Parity fault locating means
US4412327A (en) * 1981-02-25 1983-10-25 Western Electric Company, Inc. Test circuit for checking memory output state continuously during time window
US4528666A (en) * 1983-01-03 1985-07-09 Texas Instruments Incorporated Memory system with built in parity
US4593393A (en) * 1984-02-06 1986-06-03 Motorola, Inc. Quasi parallel cyclic redundancy checker
US4608669A (en) * 1984-05-18 1986-08-26 International Business Machines Corporation Self contained array timing
US4827476A (en) * 1987-04-16 1989-05-02 Tandem Computers Incorporated Scan test apparatus for digital systems having dynamic random access memory
JPS6489823A (en) * 1987-09-30 1989-04-05 Toshiba Corp Control circuit for radio equipment
JPH02260200A (ja) * 1989-03-30 1990-10-22 Sharp Corp 複数ビット並列テスト機能を有する半導体記憶装置における複数ビット並列機能テスト方法
US5951703A (en) * 1993-06-28 1999-09-14 Tandem Computers Incorporated System and method for performing improved pseudo-random testing of systems having multi driver buses
EP0643350B1 (de) * 1993-08-10 1998-03-04 Siemens Aktiengesellschaft Verfahren zum Erkennen von Adressierungsfehlern bei Speichern für digitale binärcodierte Datenwörter
US5355377A (en) * 1993-11-23 1994-10-11 Tetra Assoc. Inc. Auto-selectable self-parity generator
SE502576C2 (sv) * 1993-11-26 1995-11-13 Ellemtel Utvecklings Ab Feltolerant kösystem
EP0744755A1 (en) * 1995-05-25 1996-11-27 International Business Machines Corporation Test method and device for embedded memories on semiconductor substrates
FR2751461B1 (fr) * 1996-07-22 1998-11-06 Sgs Thomson Microelectronics Dispositif de controle de finalite de test
US6134684A (en) * 1998-02-25 2000-10-17 International Business Machines Corporation Method and system for error detection in test units utilizing pseudo-random data
EP1515345A1 (en) * 1999-02-02 2005-03-16 Fujitsu Limited Test method and test circuit for electronic device
DE69902221T2 (de) 1999-02-23 2003-03-06 Taiwan Semiconductor Mfg. Co., Ltd. Speicherschaltungen mit eingebautem Selbsttest
EP1031995B1 (en) * 1999-02-23 2002-05-22 Taiwan Semiconductor Manufacturing Co., Ltd. Built-in self-test circuit for memory
US8997255B2 (en) 2006-07-31 2015-03-31 Inside Secure Verifying data integrity in a data storage device
US8352752B2 (en) * 2006-09-01 2013-01-08 Inside Secure Detecting radiation-based attacks

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3727039A (en) * 1971-08-02 1973-04-10 Ibm Single select line storage system address check
US3719929A (en) * 1971-08-11 1973-03-06 Litton Systems Inc Memory analyzers
US3768071A (en) * 1972-01-24 1973-10-23 Ibm Compensation for defective storage positions
US3789204A (en) * 1972-06-06 1974-01-29 Honeywell Inf Systems Self-checking digital storage system
FR2257213A5 (xx) * 1973-12-04 1975-08-01 Cii

Also Published As

Publication number Publication date
NL179097B (nl) 1986-02-03
NL7610819A (nl) 1977-04-13
DE2644733C3 (de) 1979-03-29
DE2644733B2 (de) 1978-07-20
US4049956A (en) 1977-09-20
IT1047437B (it) 1980-09-10
DE2644733A1 (de) 1977-04-14

Similar Documents

Publication Publication Date Title
NL179097C (nl) Werkwijze en inrichting voor het toetsen van de juiste werking van een geheugen.
US3026419A (en) Overlap detector
DE68914322D1 (de) Dynamische Rückkopplungsvorrichtung für einen Verschleierungsschlüsselgenerator.
US3587043A (en) Character parity synchronizer
NL7511877A (nl) Werkwijze en inrichting voor het genereren van brandbare gassen, vloeibare koolwaterstoffen en stoom met hoge spanning uit kolen.
EP0234038A3 (en) Apparatus for identifying the lru storage unit in a memory
US3199446A (en) Overprinting apparatus for printing a character and an accent
GB1287238A (en) Error detection and correction apparatus
JPS5476104A (en) Retrieval control system of information track positions
ES422629A1 (es) Un metodo de control para realizar una comprobacion conti- nua de los resultados de salida del proceso de la informa- cion.
US3291994A (en) Sprocket signal generator with novel aperture arrangement for precise timing of signals
ES292329A1 (es) Un aparato para reunir y distribuir caracteres que tienen todos elementos variables e invariables mezclados
GB1025300A (en) Improvements in or relating to digital signal detector circuits
US3248570A (en) Signal discriminator circuit
US3555518A (en) Recording transducer selection limiter
JPS5279629A (en) Information processing unit
JPS4952547A (xx)
SU922741A1 (ru) Устройство дл программного управлени
US3473163A (en) Clock track recorder
SU453672A1 (ru) Программная следящая система
JPS56153434A (en) Contact detecting circuit for keyboard
SU849194A1 (ru) Устройство дл ввода информации
SU506030A1 (ru) Блок управлени перемещением бумаги дл печатающего устройства
JPS5637892A (en) Memory unit
SU720718A1 (ru) Преобразователь напр жение-код

Legal Events

Date Code Title Description
A85 Still pending on 85-01-01
V1 Lapsed because of non-payment of the annual fee