NL176711C - Buitenassig catoptrisch optisch afbeeldingsstelsel. - Google Patents

Buitenassig catoptrisch optisch afbeeldingsstelsel.

Info

Publication number
NL176711C
NL176711C NLAANVRAGE7208478,A NL7208478A NL176711C NL 176711 C NL176711 C NL 176711C NL 7208478 A NL7208478 A NL 7208478A NL 176711 C NL176711 C NL 176711C
Authority
NL
Netherlands
Prior art keywords
outside
optical image
image system
catoptric optical
catoptric
Prior art date
Application number
NLAANVRAGE7208478,A
Other languages
English (en)
Other versions
NL176711B (nl
NL7208478A (nl
Original Assignee
Perkin Elmer Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=22553496&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=NL176711(C) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Perkin Elmer Corp filed Critical Perkin Elmer Corp
Publication of NL7208478A publication Critical patent/NL7208478A/xx
Publication of NL176711B publication Critical patent/NL176711B/nl
Application granted granted Critical
Publication of NL176711C publication Critical patent/NL176711C/nl

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70233Optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection systems
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0605Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
    • G02B17/0615Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors off-axis or unobscured systems in wich all of the mirrors share a common axis of rotational symmetry
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0626Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using three curved mirrors
    • G02B17/0636Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using three curved mirrors off-axis or unobscured systems in which all of the mirrors share a common axis of rotational symmetry
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/02Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices involving prisms or mirrors
    • G02B23/06Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices involving prisms or mirrors having a focussing action, e.g. parabolic mirror
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70358Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Astronomy & Astrophysics (AREA)
  • Lenses (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
NLAANVRAGE7208478,A 1971-06-21 1972-06-21 Buitenassig catoptrisch optisch afbeeldingsstelsel. NL176711C (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US15494871A 1971-06-21 1971-06-21

Publications (3)

Publication Number Publication Date
NL7208478A NL7208478A (nl) 1972-12-27
NL176711B NL176711B (nl) 1984-12-17
NL176711C true NL176711C (nl) 1985-05-17

Family

ID=22553496

Family Applications (3)

Application Number Title Priority Date Filing Date
NLAANVRAGE7208478,A NL176711C (nl) 1971-06-21 1972-06-21 Buitenassig catoptrisch optisch afbeeldingsstelsel.
NL8401002A NL8401002A (nl) 1971-06-21 1984-03-29 Buitenassig optisch afbeeldingsstelsel.
NL8401001A NL8401001A (nl) 1971-06-21 1984-03-29 Buitenassig optisch afbeeldingsstelsel.

Family Applications After (2)

Application Number Title Priority Date Filing Date
NL8401002A NL8401002A (nl) 1971-06-21 1984-03-29 Buitenassig optisch afbeeldingsstelsel.
NL8401001A NL8401001A (nl) 1971-06-21 1984-03-29 Buitenassig optisch afbeeldingsstelsel.

Country Status (13)

Country Link
US (1) US3748015A (nl)
JP (3) JPS5751083B1 (nl)
KR (1) KR790000468B1 (nl)
BR (1) BR7203998D0 (nl)
CA (1) CA970611A (nl)
CH (1) CH552222A (nl)
DE (1) DE2230002C2 (nl)
FR (1) FR2143493B1 (nl)
GB (1) GB1401687A (nl)
IL (1) IL39693A (nl)
IT (1) IT956732B (nl)
NL (3) NL176711C (nl)
SE (1) SE383423B (nl)

Families Citing this family (192)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4011011A (en) * 1973-03-09 1977-03-08 The Perkin-Elmer Corporation Optical projection apparatus
US3951546A (en) * 1974-09-26 1976-04-20 The Perkin-Elmer Corporation Three-fold mirror assembly for a scanning projection system
JPS6039205B2 (ja) * 1975-07-02 1985-09-05 キヤノン株式会社 反射光学系
CA1090183A (en) * 1976-09-22 1980-11-25 David A. Markle System for illuminating an annular field
CA1103498A (en) * 1977-02-11 1981-06-23 Abe Offner Wide annulus unit power optical system
US4293186A (en) * 1977-02-11 1981-10-06 The Perkin-Elmer Corporation Restricted off-axis field optical system
JPS5453867A (en) * 1977-10-06 1979-04-27 Canon Inc Printing device
JPS5467443A (en) * 1977-11-09 1979-05-30 Canon Inc Observer
US4241390A (en) * 1978-02-06 1980-12-23 The Perkin-Elmer Corporation System for illuminating an annular field
US4226501A (en) * 1978-10-12 1980-10-07 The Perkin-Elmer Corporation Four mirror unobscurred anastigmatic telescope with all spherical surfaces
US4205902A (en) * 1978-10-12 1980-06-03 The Perkin-Elmer Corporation Laser beam expander
US4240707A (en) * 1978-12-07 1980-12-23 Itek Corporation All-reflective three element objective
US4288148A (en) * 1979-08-29 1981-09-08 The Perkin-Elmer Corporation Beam-splitting optical system
FR2466786A1 (fr) * 1979-10-05 1981-04-10 Thomson Csf Dispositif catadioptre et systeme comportant un tel dispositif
US4331390A (en) * 1979-10-09 1982-05-25 The Perkin-Elmer Corporation Monocentric optical systems
US4272152A (en) * 1979-10-15 1981-06-09 The Perkin-Elmer Corporation Unit magnification relay systems
JPS5677815A (en) * 1979-11-28 1981-06-26 Canon Inc Optical reflection system
US4362384A (en) * 1981-05-01 1982-12-07 The Perkin-Elmer Corporation Means for providing uniform illumination to a light sensitive element
US4425037A (en) 1981-05-15 1984-01-10 General Signal Corporation Apparatus for projecting a series of images onto dies of a semiconductor wafer
US4391494A (en) * 1981-05-15 1983-07-05 General Signal Corporation Apparatus for projecting a series of images onto dies of a semiconductor wafer
JPS57192929A (en) * 1981-05-25 1982-11-27 Hitachi Ltd Projector provided with automatic focusing function
JPS58173836A (ja) * 1982-04-05 1983-10-12 コントロ−ル・デ−タ・コ−ポレ−シヨン 投影整列装置
US4444492A (en) * 1982-05-15 1984-04-24 General Signal Corporation Apparatus for projecting a series of images onto dies of a semiconductor wafer
US4469414A (en) * 1982-06-01 1984-09-04 The Perkin-Elmer Corporation Restrictive off-axis field optical system
JPS6093410A (ja) * 1983-10-27 1985-05-25 Canon Inc 反射光学系
JPS612124A (ja) * 1984-06-14 1986-01-08 Canon Inc 結像光学系
US4812028A (en) * 1984-07-23 1989-03-14 Nikon Corporation Reflection type reduction projection optical system
JPS61110214A (ja) * 1984-11-05 1986-05-28 Yoshida Kogyo Kk <Ykk> 自動扉の開口幅制御装置
US4779966A (en) * 1984-12-21 1988-10-25 The Perkin-Elmer Corporation Single mirror projection optical system
US4711535A (en) * 1985-05-10 1987-12-08 The Perkin-Elmer Corporation Ring field projection system
JPS6235732U (nl) * 1985-08-23 1987-03-03
JPH0524404Y2 (nl) * 1985-08-23 1993-06-22
US4734829A (en) * 1985-11-12 1988-03-29 The Perkin-Elmer Corporation Short arc lamp image transformer
EP0237041B1 (en) * 1986-03-12 1993-08-18 Matsushita Electric Industrial Co., Ltd. Projection optical system for use in precise copy
US4757354A (en) * 1986-05-02 1988-07-12 Matsushita Electrical Industrial Co., Ltd. Projection optical system
US4707711A (en) * 1986-05-15 1987-11-17 Lumonics Inc. Character imaging system
GB8612609D0 (en) * 1986-05-23 1986-07-02 Wynne C G Optical imaging systems
EP0947882B1 (en) * 1986-07-11 2006-03-29 Canon Kabushiki Kaisha X-ray reduction projection exposure system of reflection type
US4747678A (en) * 1986-12-17 1988-05-31 The Perkin-Elmer Corporation Optical relay system with magnification
US4746205A (en) * 1987-01-30 1988-05-24 Westinghouse Electric Corp. High energy laser beam replica producing method and system
JPS6450004U (nl) * 1987-09-24 1989-03-28
JPH01226684A (ja) * 1988-03-04 1989-09-11 Toshiba Corp エレベーター装置
US4913524A (en) * 1988-05-12 1990-04-03 The Perkin-Elmer Corporation Synthetic imaging technique
US4933714A (en) * 1988-05-31 1990-06-12 The Perkin-Elmer Corporation Apparatus and method for reproducing a pattern in an annular area
US4964705A (en) * 1988-11-07 1990-10-23 General Signal Corporation Unit magnification optical system
US5040882A (en) * 1988-11-07 1991-08-20 General Signal Corporation Unit magnification optical system with improved reflective reticle
US5078502A (en) * 1990-08-06 1992-01-07 Hughes Aircraft Company Compact afocal reimaging and image derotation device
US5315629A (en) * 1990-10-10 1994-05-24 At&T Bell Laboratories Ringfield lithography
US5212588A (en) * 1991-04-09 1993-05-18 The United States Of America As Represented By The United States Department Of Energy Reflective optical imaging system for extreme ultraviolet wavelengths
JPH04333011A (ja) * 1991-05-09 1992-11-20 Nikon Corp 反射縮小投影光学装置
US5298939A (en) * 1991-11-04 1994-03-29 Swanson Paul A Method and apparatus for transfer of a reticle pattern onto a substrate by scanning
JPH06118341A (ja) * 1991-11-11 1994-04-28 Topcon Corp 走査型投影装置
US5255114A (en) * 1991-11-12 1993-10-19 Eastman Kodak Company High resolution scanner
US5221975A (en) * 1991-11-12 1993-06-22 Eastman Kodak Company High resolution scanner
US5225678A (en) * 1991-11-13 1993-07-06 Connecticut Instrument Corporation Spectoscopic sampling accessory having dual measuring and viewing systems
JPH05249379A (ja) * 1992-03-04 1993-09-28 Topcon Corp 広フィールド露光光学系
IL101570A0 (en) * 1992-04-10 1992-12-30 Amir Alon Method and apparatus for reading data
US5822042A (en) * 1992-11-12 1998-10-13 International Business Machines Corporation Three dimensional imaging system
US5323263A (en) * 1993-02-01 1994-06-21 Nikon Precision Inc. Off-axis catadioptric projection system
IL106009A0 (en) * 1993-06-14 1993-10-20 Amir Alon Method and apparatus for the simultaneous writing of data on an optical disk
JPH0756090A (ja) * 1993-08-17 1995-03-03 Topcon Corp 走査型投影光学系
IL107181A0 (en) * 1993-10-04 1994-01-25 Nogatech Ltd Optical disk reader
US5515207A (en) * 1993-11-03 1996-05-07 Nikon Precision Inc. Multiple mirror catadioptric optical system
JPH07191274A (ja) * 1993-12-27 1995-07-28 Canon Inc 画像表示装置
IL113789A (en) * 1994-05-23 1999-01-26 Hughes Aircraft Co A non-focusing device with three hinged mirrors and a corrective mirror
US5625448A (en) * 1995-03-16 1997-04-29 Printrak International, Inc. Fingerprint imaging
US5548394A (en) * 1995-03-16 1996-08-20 Printrak International Inc. Scanning fingerprint reading
JP2565149B2 (ja) * 1995-04-05 1996-12-18 キヤノン株式会社 回路の製造方法及び露光装置
US5512759A (en) * 1995-06-06 1996-04-30 Sweatt; William C. Condenser for illuminating a ringfield camera with synchrotron emission light
US7304737B1 (en) 1995-09-20 2007-12-04 J.A. Woollam Co., Inc Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidence
US7317530B2 (en) * 2003-08-28 2008-01-08 J.A. Woollam Co., Inc. Combined spatial filter and relay systems
US7245376B2 (en) * 1995-09-20 2007-07-17 J. A. Woollam Co., Inc. Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter
US7317529B1 (en) 1999-10-18 2008-01-08 J.A. Woollam Co., Inc. Aspects of producing, directing, conditioning, impinging and detecting spectroscopic electromagnetic radiation from small spots on samples
US7304792B1 (en) 2003-08-25 2007-12-04 J.A. Woollam Co., Inc. System for sequentially providing aberation corrected electromagnetic radiation to a spot on a sample at multiple angles of incidence
US5805365A (en) * 1995-10-12 1998-09-08 Sandia Corporation Ringfield lithographic camera
US5883703A (en) * 1996-02-08 1999-03-16 Megapanel Corporation Methods and apparatus for detecting and compensating for focus errors in a photolithography tool
US5748365A (en) * 1996-03-26 1998-05-05 Hughes Electronics Catadioptric one-to-one telecentric image combining system
US5717518A (en) * 1996-07-22 1998-02-10 Kla Instruments Corporation Broad spectrum ultraviolet catadioptric imaging system
US6403124B1 (en) * 1997-04-16 2002-06-11 Sigma-Tau Industrie Farmaceutiche Riunite S.P.A. Storage and maintenance of blood products including red blood cells and platelets
US5960016A (en) * 1997-06-05 1999-09-28 The Regents Of The University Of California Aberration-free, all-reflective laser pulse stretcher
US5956192A (en) * 1997-09-18 1999-09-21 Svg Lithography Systems, Inc. Four mirror EUV projection optics
US5917594A (en) 1998-04-08 1999-06-29 Kla-Tencor Corporation Spectroscopic measurement system using an off-axis spherical mirror and refractive elements
US6577443B2 (en) 1998-05-30 2003-06-10 Carl-Zeiss Stiftung Reduction objective for extreme ultraviolet lithography
DE19923609A1 (de) * 1998-05-30 1999-12-02 Zeiss Carl Fa Ringfeld-4-Spiegelsysteme mit konvexem Primärspiegel für die EUV-Lithographie
US6331904B1 (en) 1998-07-16 2001-12-18 Siros Technologies, Inc. Reflection optics reference beam telescope
US6104511A (en) * 1998-07-16 2000-08-15 Siros Technologies, Inc. Reflector-based off-axis optical system for holographic storage
US6426506B1 (en) * 1999-05-27 2002-07-30 The Regents Of The University Of California Compact multi-bounce projection system for extreme ultraviolet projection lithography
US6304315B2 (en) 1999-08-31 2001-10-16 Eastman Kodak Company High speed high resolution continuous optical film printer for duplicating motion films
US6542307B2 (en) 2000-10-20 2003-04-01 Three-Five Systems, Inc. Compact near-eye illumination system
US6563648B2 (en) 2000-10-20 2003-05-13 Three-Five Systems, Inc. Compact wide field of view imaging system
US6522403B2 (en) 2000-12-04 2003-02-18 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Computed tomography imaging spectrometer (CTIS) with 2D reflective grating for ultraviolet to long-wave infrared detection especially useful for surveying transient events
US6416181B1 (en) 2000-12-15 2002-07-09 Eastman Kodak Company Monocentric autostereoscopic optical apparatus and method
US6552852B2 (en) 2000-12-21 2003-04-22 Zetetic Institute Catoptric and catadioptric imaging systems
DE10115875A1 (de) * 2001-03-30 2002-10-10 Heidelberger Druckmasch Ag Bebilderungseinrichtung für eine Druckform mit einer Makrooptik vom Offner-Typ
NZ511257A (en) * 2001-04-20 2003-05-30 Ind Res Ltd Imaging system having a dual cassegrain-like format
US6752498B2 (en) 2001-05-14 2004-06-22 Eastman Kodak Company Adaptive autostereoscopic display system
US6702442B2 (en) * 2002-03-08 2004-03-09 Eastman Kodak Company Monocentric autostereoscopic optical apparatus using resonant fiber-optic image generation
US6550918B1 (en) * 2002-03-19 2003-04-22 Eastman Kodak Company Monocentric autostereoscopic viewing apparatus using resonant fiber-optic image generation
US6768585B2 (en) 2002-05-02 2004-07-27 Eastman Kodak Company Monocentric autostereoscopic optical apparatus using a scanned linear electromechanical modulator
JP2004004256A (ja) * 2002-05-31 2004-01-08 Sony Corp 光走査装置及び2次元画像形成装置
US20030226968A1 (en) * 2002-06-10 2003-12-11 Steve Montellese Apparatus and method for inputting data
US6779892B2 (en) * 2002-07-26 2004-08-24 Eastman Kodak Company Monocentric autostereoscopic optical display having an expanded color gamut
US6678308B1 (en) 2002-09-06 2004-01-13 The Boeing Company Laser resonator system using offner relay
DE10245559A1 (de) * 2002-09-30 2004-04-08 Carl Zeiss Jena Gmbh Kamera
US7199876B2 (en) * 2002-12-31 2007-04-03 Wavefront Research, Inc. Compact hyperspectral imager
US7061611B2 (en) * 2002-12-31 2006-06-13 Wavefront Research, Inc. Refractive relay spectrometer
US7084983B2 (en) * 2003-01-27 2006-08-01 Zetetic Institute Interferometric confocal microscopy incorporating a pinhole array beam-splitter
KR20050098268A (ko) * 2003-01-27 2005-10-11 제테틱 인스티튜트 트렌치의 특성을 측정하는 간섭 공초점 현미경에 사용되는누설 유도파 모드
WO2004070434A2 (en) * 2003-02-04 2004-08-19 Zetetic Institute Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy
US6717736B1 (en) 2003-02-13 2004-04-06 Zetetic Institute Catoptric and catadioptric imaging systems
EP1595107A4 (en) * 2003-02-19 2007-01-24 Zetetic Inst METHOD AND APPARATUS FOR INTERFEROMETRIC CONFOCAL MICROSCOPY ON A DARK BACKGROUND
US7133139B2 (en) * 2003-02-19 2006-11-07 Zetetic Institute Longitudinal differential interferometric confocal microscopy
WO2004090465A2 (en) * 2003-04-01 2004-10-21 Zetetic Institute Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry
US7054077B2 (en) 2003-04-01 2006-05-30 Zetetic Institute Method for constructing a catadioptric lens system
EP1608933A4 (en) * 2003-04-03 2007-03-21 Zetetic Inst DEVICE AND METHOD FOR MEASURING FIELDS OF RETRO-REGULATED AND FORWARD-RADIATED OR BIN. REFLECTED RADIATION THROUGH AN OBJECT IN INTERFEROMETRY
US6940645B2 (en) * 2003-04-22 2005-09-06 Eastman Kodak Company Monocentric autostereoscopic optical apparatus with a spherical gradient-index ball lens
US7130020B2 (en) * 2003-04-30 2006-10-31 Whitney Theodore R Roll printer with decomposed raster scan and X-Y distortion correction
US7158215B2 (en) 2003-06-30 2007-01-02 Asml Holding N.V. Large field of view protection optical system with aberration correctability for flat panel displays
US7324209B2 (en) * 2003-07-07 2008-01-29 Zetetic Institute Apparatus and method for ellipsometric measurements with high spatial resolution
WO2005008334A2 (en) 2003-07-07 2005-01-27 Zetetic Institute Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology
US7355722B2 (en) * 2003-09-10 2008-04-08 Zetetic Institute Catoptric and catadioptric imaging systems with adaptive catoptric surfaces
US20050111007A1 (en) * 2003-09-26 2005-05-26 Zetetic Institute Catoptric and catadioptric imaging system with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces
WO2005033747A2 (en) * 2003-10-01 2005-04-14 Zetetic Institute Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy
US7245408B1 (en) 2003-10-10 2007-07-17 Zebra Imaging, Inc. Systems and methods for producing wide field-of-view holographic displays
TW200538703A (en) * 2004-05-06 2005-12-01 Zetetic Inst Apparatus and methods for measurement of critical dimensions of features and detection of defects in UV, VUV, and EUV lithography masks
WO2005114095A2 (en) * 2004-05-21 2005-12-01 Zetetic Institute Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry
FR2872592B1 (fr) * 2004-07-02 2006-09-15 Thales Sa Chaine amplificatrice pour la generation d'impulsions lumineuses ultracourtes de durees d'impulsions differentes
WO2006023406A2 (en) * 2004-08-16 2006-03-02 Zetetic Institute Apparatus and method for joint and time delayed measurements of components of conjugated quadratures of fields of reflected/scattered and transmitted/scattered beams by an object in interferometry
WO2006023612A2 (en) * 2004-08-19 2006-03-02 Zetetic Institute Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers
US7315352B2 (en) * 2004-09-02 2008-01-01 Avago Technologies General Ip (Singapore) Pte. Ltd. Offner imaging system with reduced-diameter reflectors
US7173686B2 (en) * 2004-09-02 2007-02-06 Agilent Technologies, Inc. Offner imaging system with reduced-diameter reflectors
WO2006034065A2 (en) * 2004-09-20 2006-03-30 Zetetic Institute Catoptric imaging systems comprising pellicle and/or aperture-array beam-splitters and non-adaptive and /or adaptive catoptric surfaces
US7199877B2 (en) * 2004-10-20 2007-04-03 Resonon Inc. Scalable imaging spectrometer
US7184124B2 (en) * 2004-10-28 2007-02-27 Asml Holding N.V. Lithographic apparatus having an adjustable projection system and device manufacturing method
CN100386662C (zh) * 2005-03-14 2008-05-07 上海理工大学 全息凸面光栅光刻光路设计方法
US7359050B1 (en) 2005-04-08 2008-04-15 Wavefront Research, Inc. Compact triple pass hyperspectral imager
US7330258B2 (en) * 2005-05-27 2008-02-12 Innovative Technical Solutions, Inc. Spectrometer designs
US7722824B2 (en) * 2005-08-02 2010-05-25 Wisconsin Alumni Research Foundation Synthesis of arrays of oligonucleotides and other chain molecules
US7545446B2 (en) * 2005-08-27 2009-06-09 Hewlett-Packard Development Company, L.P. Offner relay for projection system
DE102005044910B3 (de) * 2005-09-14 2007-03-15 Jena-Optronik Gmbh Schiefspiegler-Teleskop mit drei Spiegelflächen
US20070109520A1 (en) * 2005-11-17 2007-05-17 Whitney Theodore R Modular illuminator for a scanning printer
US8203710B1 (en) 2006-06-12 2012-06-19 Wavefront Research, Inc. Compact wide field fast hyperspectral imager
DE102007033967A1 (de) * 2007-07-19 2009-01-29 Carl Zeiss Smt Ag Projektionsobjektiv
DE102008049588B4 (de) * 2008-09-30 2018-04-05 Carl Zeiss Smt Gmbh Optische Abbildungseinrichtung, Mikroskop und Abbildungsverfahren für die Mikroskopie
DE102008049589A1 (de) * 2008-09-30 2010-04-08 Carl Zeiss Smt Ag Optische Abbildungseinrichtung und Abbildungsverfahren für die Mikroskopie
US8531750B2 (en) 2009-02-15 2013-09-10 Kessler Optics & Photonics Solutions, Ltd. Afocal beam relay
US8274720B2 (en) * 2009-02-15 2012-09-25 Kessler Optics and Photonics Solutions, Ltd. Concentric afocal beam relay
US7929129B2 (en) * 2009-05-22 2011-04-19 Corning Incorporated Inspection systems for glass sheets
US8780440B2 (en) * 2009-08-03 2014-07-15 Lawrence Livermore National Security, Llc Dispersion compensation in chirped pulse amplification systems
US8271120B2 (en) * 2009-08-03 2012-09-18 Lawrence Livermore National Security, Llc Method and system for processing optical elements using magnetorheological finishing
DE102009037815B4 (de) 2009-08-18 2016-06-09 Sintermask Gmbh Verfahren und Vorrichtung zur Herstellung eines dreidimensionalen Objektes
DE102009050163A1 (de) * 2009-10-21 2011-04-28 Lfk-Lenkflugkörpersysteme Gmbh Optische Einrichtung für ein Visier
US7933067B1 (en) 2010-03-09 2011-04-26 Raytheon Company Flat field Schmidt telescope with extended field of view
US8139289B2 (en) 2010-07-27 2012-03-20 Corning Incorporated Precision optical mount
US8493670B2 (en) 2010-09-10 2013-07-23 Coherent, Inc. Large-field unit-magnification catadioptric projection system
GB201019181D0 (en) * 2010-11-12 2010-12-29 Univ Leicester Improved optical arrangement
WO2012073178A2 (en) * 2010-12-01 2012-06-07 Koninklijke Philips Electronics N.V. Sensor device with double telecentric optical system
US10095016B2 (en) 2011-01-04 2018-10-09 Nlight, Inc. High power laser system
US9429742B1 (en) * 2011-01-04 2016-08-30 Nlight, Inc. High power laser imaging systems
US9409255B1 (en) * 2011-01-04 2016-08-09 Nlight, Inc. High power laser imaging systems
US8823932B2 (en) 2011-04-04 2014-09-02 Corning Incorporated Multi field of view hyperspectral imaging device and method for using same
US8659823B2 (en) 2011-04-22 2014-02-25 Coherent, Inc. Unit-magnification catadioptric and catoptric projection optical systems
US9720244B1 (en) 2011-09-30 2017-08-01 Nlight, Inc. Intensity distribution management system and method in pixel imaging
US8830580B2 (en) 2011-10-27 2014-09-09 Eastman Kodak Company Low thermal stress catadioptric imaging optics
US8786943B2 (en) 2011-10-27 2014-07-22 Eastman Kodak Company Low thermal stress catadioptric imaging system
DE102012200851B3 (de) * 2012-01-20 2013-07-25 Bruker Optik Gmbh Infrarot(=IR)-Mikroskop mit Bildfeldkrümmungs-Kompensation und zusätzlicher Ausleuchtungsoptimierung im Beobachtunqsstrahlenqang des sichtbaren Lichts
JP5650157B2 (ja) * 2012-05-23 2015-01-07 東芝テック株式会社 結像素子アレイ及び画像形成装置
US9594201B2 (en) 2012-07-13 2017-03-14 The University Of North Carolina At Chapel Hill Curved volume phase holographic (VPH) diffraction grating with tilted fringes and spectrographs using same
US9310248B2 (en) 2013-03-14 2016-04-12 Nlight, Inc. Active monitoring of multi-laser systems
DE102013105205B4 (de) 2013-05-22 2020-06-10 Carl Zeiss Jena Gmbh Abbildungsoptik für Laserstrahlen, Vorrichtung zur Werkstückbearbeitung sowie Verfahren zur Herstellung einer Abbildungsoptik
EP2857810A1 (en) * 2013-10-02 2015-04-08 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Monolith spectrometer
KR102099722B1 (ko) 2014-02-05 2020-05-18 엔라이트 인크. 단일-이미터 라인 빔 시스템
JP6344933B2 (ja) 2014-03-03 2018-06-20 株式会社ミツトヨ 光電式エンコーダ
DE102014005790A1 (de) 2014-04-16 2015-10-22 Carl Zeiss Ag Abbildungsoptik für Laserstrahlen
DE102014118880A1 (de) 2014-12-17 2016-06-23 Rofin-Baasel Lasertech Gmbh & Co. Kg Optische Einrichtung zur Modulation der spektralen Phase von Laserpulsen
GB2543592B (en) 2016-03-30 2018-08-01 The Science And Tech Facilities Council Imaging a retina of an eye
US20170329113A1 (en) * 2016-05-12 2017-11-16 Raytheon Company Compact five-reflection optical system as a unity magnification finite conjugate relay
JP6635904B2 (ja) * 2016-10-14 2020-01-29 キヤノン株式会社 投影光学系、露光装置及び物品の製造方法
US10816795B2 (en) 2016-11-28 2020-10-27 Amalgamated Vision, Llc Wearable display for near-to-eye viewing
US10345562B2 (en) 2017-02-07 2019-07-09 Raytheon Company All-reflective solar coronagraph sensor and thermal control subsystem
US10845582B2 (en) 2018-06-07 2020-11-24 Raytheon Company All-reflective solar coronagraph sensor and thermal control subsystem
GB201811903D0 (en) 2018-07-20 2018-09-05 Univ Oxford Innovation Ltd Scanning laser ophthalmoscopes
DE102019203560A1 (de) * 2019-03-15 2020-09-17 Bruker Optik Gmbh IR-Mikroskop
US11340451B2 (en) 2019-06-19 2022-05-24 Amalgamated Vision, Llc Wearable display for near-to-eye viewing with expanded beam
US11719576B2 (en) 2019-11-01 2023-08-08 California Institute Of Technology Mid-wave and long-wave infrared point spectrometer
US11762181B2 (en) 2019-12-26 2023-09-19 Kessler Optics and Photonics Solutions Ltd. Scanning microscope with enhanced FOV and NA
EP4091012A4 (en) 2020-01-16 2023-07-26 Magic Leap, Inc. SCANNING MIRROR SYSTEMS AND METHODS OF MANUFACTURING
DE102020122449A1 (de) 2020-08-27 2022-03-03 Carl Zeiss Ag Vorrichtung und Verfahren zum Erzeugen von Abbildern eines Lichtquellenarrays
DE102020216123A1 (de) 2020-12-17 2022-06-23 Carl Zeiss Ag Belichtungseinrichtung, Vorrichtung und Verfahren zur additiven Fertigung eines Werkstücks
KR20230161498A (ko) 2021-03-30 2023-11-27 키옵티크 포토닉스 게엠베하 운트 콤파니 카게 패널을 검사하기 위한 패널 검사 디바이스 및 방법
DE102021111728A1 (de) 2021-05-05 2022-11-10 General Atomics Synopta GmbH Sphärisches Spiegelsystem für eine Freiraumkommunikation mit Satelliten mit beugungsbegrenzter Abbildungsqualität und hoher Transmission
DE102022201002A1 (de) 2022-01-31 2023-08-03 Carl Zeiss Smt Gmbh Projektionsobjektiv, Projektionsbelichtungsanlage und Projektionsbelichtungsverfahren

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3062101A (en) * 1959-05-29 1962-11-06 Perkin Elmer Corp Anastigmatic catoptric systems
US3190171A (en) * 1960-06-07 1965-06-22 Oxford Corp Viewing device having optical arrangement producing virtual image at infinity
US3527526A (en) * 1965-05-26 1970-09-08 Ernest W Silvertooth Catoptric image-forming system in which light is reflected twice from each surface
NL6701520A (nl) * 1967-02-01 1968-08-02
US3508813A (en) * 1967-03-24 1970-04-28 Instrumentation Labor Inc Adjustable slit system for use in spectroanalysis apparatus

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JPS5751083B1 (nl) 1982-10-30
JPS5817933B2 (ja) 1983-04-11
US3748015A (en) 1973-07-24
IT956732B (it) 1973-10-10
CA970611A (en) 1975-07-08
NL176711B (nl) 1984-12-17
JPS5817932B2 (ja) 1983-04-11
DE2230002A1 (de) 1973-01-11
SE383423B (sv) 1976-03-08
JPS5517196A (en) 1980-02-06
FR2143493A1 (nl) 1973-02-02
GB1401687A (en) 1975-07-30
KR790000468B1 (en) 1979-05-20
BR7203998D0 (pt) 1973-06-05
FR2143493B1 (nl) 1977-12-23
NL8401002A (nl) 1984-07-02
IL39693A (en) 1975-02-10
IL39693A0 (en) 1972-08-30
DE2230002C2 (de) 1984-11-22
CH552222A (de) 1974-07-31
JPS5517197A (en) 1980-02-06
NL7208478A (nl) 1972-12-27
NL8401001A (nl) 1984-07-02

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