NL154329B - Inrichting voor het detecteren en/of meten van straling. - Google Patents
Inrichting voor het detecteren en/of meten van straling.Info
- Publication number
- NL154329B NL154329B NL666602606A NL6602606A NL154329B NL 154329 B NL154329 B NL 154329B NL 666602606 A NL666602606 A NL 666602606A NL 6602606 A NL6602606 A NL 6602606A NL 154329 B NL154329 B NL 154329B
- Authority
- NL
- Netherlands
- Prior art keywords
- detecting
- measuring radiation
- radiation
- measuring
- Prior art date
Links
- 230000005855 radiation Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/115—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation
- H01L31/118—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation of the surface barrier or shallow PN junction detector type, e.g. surface barrier alpha-particle detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/482—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
- H01L29/045—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes by their particular orientation of crystalline planes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/115—Orientation
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- High Energy & Nuclear Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Priority Applications (17)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL666602606A NL154329B (nl) | 1966-03-01 | 1966-03-01 | Inrichting voor het detecteren en/of meten van straling. |
GB8984/67A GB1171395A (en) | 1966-03-01 | 1967-02-24 | Improvements in Semiconductor Devices |
DE1967N0030065 DE1614222B2 (de) | 1966-03-01 | 1967-02-25 | Halbleitervorrichtung zum detektieren und/oder messen von strahlung |
JP1175267A JPS4415502B1 (pt) | 1966-03-01 | 1967-02-25 | |
BE694727D BE694727A (pt) | 1966-03-01 | 1967-02-27 | |
CH283767A CH471440A (de) | 1966-03-01 | 1967-02-27 | Halbleitervorrichtung zum Detektieren und/oder Messen von Strahlung |
CH283867A CH460962A (de) | 1966-03-01 | 1967-02-27 | Halbleitervorrichtung zum Nachweisen und/oder Messen von Strahlung |
US619466A US3529159A (en) | 1966-03-01 | 1967-02-28 | Semiconductor device for detecting and/or measuring radiation |
JP1232567A JPS5512746B1 (pt) | 1966-03-01 | 1967-02-28 | |
SE02734/67A SE333613B (pt) | 1966-03-01 | 1967-02-28 | |
SE02736/67A SE327478B (pt) | 1966-03-01 | 1967-02-28 | |
US619465A US3529161A (en) | 1966-03-01 | 1967-02-28 | Semiconductor device for detecting and/or measuring radiation |
GB9348/67A GB1173507A (en) | 1966-03-01 | 1967-02-28 | Improvements in and relating to Semiconductor Devices. |
DE19671614223 DE1614223A1 (de) | 1966-03-01 | 1967-02-28 | Halbleitervorrichtung zum Detektieren und/oder Messen von Strahlung |
FR96980A FR1512887A (fr) | 1966-03-01 | 1967-03-01 | Dispositif semi-conducteur pour détecter un rayonnement et en mesurer l'intensité |
BE694869D BE694869A (pt) | 1966-03-01 | 1967-03-01 | |
FR96981A FR1524189A (fr) | 1966-03-01 | 1967-03-01 | Dispositif semi-conducteur permettant de détecter un rayonnement et d'en mesurer l'intensité |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL666602606A NL154329B (nl) | 1966-03-01 | 1966-03-01 | Inrichting voor het detecteren en/of meten van straling. |
Publications (2)
Publication Number | Publication Date |
---|---|
NL6602606A NL6602606A (pt) | 1967-09-04 |
NL154329B true NL154329B (nl) | 1977-08-15 |
Family
ID=19795864
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL666602606A NL154329B (nl) | 1966-03-01 | 1966-03-01 | Inrichting voor het detecteren en/of meten van straling. |
Country Status (9)
Country | Link |
---|---|
US (2) | US3529161A (pt) |
JP (2) | JPS4415502B1 (pt) |
BE (2) | BE694727A (pt) |
CH (2) | CH460962A (pt) |
DE (2) | DE1614222B2 (pt) |
FR (2) | FR1512887A (pt) |
GB (2) | GB1171395A (pt) |
NL (1) | NL154329B (pt) |
SE (2) | SE333613B (pt) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3824680A (en) * | 1968-03-28 | 1974-07-23 | Levina Fizichesky I I Lebedeva | Nuclear radiation detector and method of manufacturing same |
FR1593679A (pt) * | 1968-11-27 | 1970-06-01 | ||
US3622844A (en) * | 1969-08-18 | 1971-11-23 | Texas Instruments Inc | Avalanche photodiode utilizing schottky-barrier configurations |
US3715590A (en) * | 1971-03-26 | 1973-02-06 | Nasa | Micrometeoroid analyzer |
GB1431053A (en) * | 1972-05-18 | 1976-04-07 | Nat Res Dev | Radiation detectors |
DE2239953A1 (de) * | 1972-08-14 | 1974-02-28 | Siemens Ag | Detektoranordnung |
DE2255095C2 (de) * | 1972-11-10 | 1986-04-17 | Siemens AG, 1000 Berlin und 8000 München | Detektor für ionisierende Strahlung |
US3790794A (en) * | 1972-12-21 | 1974-02-05 | Us Navy | Absolute calorimetric dosimeter |
US3859521A (en) * | 1973-01-23 | 1975-01-07 | Mc Donnell Douglas Corp | Grid lateral photodetector |
US3842276A (en) * | 1973-06-15 | 1974-10-15 | Rca Corp | Thermal radiation detector |
US3870887A (en) * | 1973-10-10 | 1975-03-11 | Mc Donnell Douglas Corp | Optical image position indicator means using time and phase delay sensing |
DE2442276A1 (de) * | 1974-09-04 | 1976-03-25 | Siemens Ag | Elektrooptischer wandler |
JPS52105856A (en) * | 1976-03-03 | 1977-09-05 | Toyo Glass Co Ltd | Detector for eccentricity of opening of bottle |
US4070578A (en) * | 1976-07-30 | 1978-01-24 | Timothy John G | Detector array and method |
FR2375602A1 (fr) * | 1976-12-23 | 1978-07-21 | Thomson Csf | Dispositif de detection du signal de deviation du faisceau electronique d'un canon a electrons, notamment pour oscillographe cathodique, et oscillographe comportant un tel dispositif |
US4472728A (en) * | 1982-02-19 | 1984-09-18 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Imaging X-ray spectrometer |
GB2125217B (en) * | 1982-08-06 | 1986-01-02 | Secr Defence | Infra red detector arrays |
US4513201A (en) * | 1983-07-21 | 1985-04-23 | Ball Corporation | Thermocouple detector |
US5125016B1 (en) * | 1983-09-22 | 1998-02-24 | Outokumpu Oy | Procedure and measuring apparatus based on x-ray diffraction for measuring stresses |
US4688067A (en) * | 1984-02-24 | 1987-08-18 | The United States Of America As Represented By The Department Of Energy | Carrier transport and collection in fully depleted semiconductors by a combined action of the space charge field and the field due to electrode voltages |
JPH01315231A (ja) * | 1988-06-14 | 1989-12-20 | Fanuc Ltd | 交流モータのコイル巻設構造 |
US5028971A (en) * | 1990-06-04 | 1991-07-02 | The United States Of America As Represented By The Secretary Of The Army | High power photoconductor bulk GaAs switch |
US5592523A (en) * | 1994-12-06 | 1997-01-07 | Picker International, Inc. | Two dimensional detector array for CT scanners |
US5930330A (en) * | 1995-09-29 | 1999-07-27 | New Mexico Biophysics | Method and apparatus for multitaxis scanning system |
US6332590B1 (en) * | 1998-12-23 | 2001-12-25 | Space Systems/Loral, Inc. | Photoemission based spacecraft charging sensor |
US6455858B1 (en) | 2000-08-13 | 2002-09-24 | Photon Imaging, Inc. | Semiconductor radiation detector |
FR2939968B1 (fr) * | 2008-12-17 | 2013-06-07 | Eads Europ Aeronautic Defence | Generateur electrique excite par rayonnements cosmiques. |
FR2948200B1 (fr) * | 2009-07-16 | 2013-02-08 | Commissariat Energie Atomique | Dispositif de detection de rayonnement a agencement ameliore |
GB2475063A (en) * | 2009-11-04 | 2011-05-11 | Univ Leicester | Charge detector for photons or particles. |
US11677040B2 (en) * | 2019-11-21 | 2023-06-13 | Raytheon Company | Method and apparatus for enhanced photoconductivity of semiconductor |
US11927616B2 (en) | 2021-03-30 | 2024-03-12 | International Business Machines Corporation | Evaluation of wafer carcass alpha particle emission |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3207902A (en) * | 1963-06-20 | 1965-09-21 | Nuclear Diodes Inc | Radiation position detector |
US3415992A (en) * | 1965-12-28 | 1968-12-10 | Nasa | Extended area semiconductor radiation detectors and a novel readout arrangement |
-
1966
- 1966-03-01 NL NL666602606A patent/NL154329B/xx not_active IP Right Cessation
-
1967
- 1967-02-24 GB GB8984/67A patent/GB1171395A/en not_active Expired
- 1967-02-25 DE DE1967N0030065 patent/DE1614222B2/de active Granted
- 1967-02-25 JP JP1175267A patent/JPS4415502B1/ja active Pending
- 1967-02-27 BE BE694727D patent/BE694727A/xx unknown
- 1967-02-27 CH CH283867A patent/CH460962A/de not_active IP Right Cessation
- 1967-02-27 CH CH283767A patent/CH471440A/de not_active IP Right Cessation
- 1967-02-28 JP JP1232567A patent/JPS5512746B1/ja active Pending
- 1967-02-28 SE SE02734/67A patent/SE333613B/xx unknown
- 1967-02-28 GB GB9348/67A patent/GB1173507A/en not_active Expired
- 1967-02-28 US US619465A patent/US3529161A/en not_active Expired - Lifetime
- 1967-02-28 DE DE19671614223 patent/DE1614223A1/de active Pending
- 1967-02-28 US US619466A patent/US3529159A/en not_active Expired - Lifetime
- 1967-02-28 SE SE02736/67A patent/SE327478B/xx unknown
- 1967-03-01 FR FR96980A patent/FR1512887A/fr not_active Expired
- 1967-03-01 FR FR96981A patent/FR1524189A/fr not_active Expired
- 1967-03-01 BE BE694869D patent/BE694869A/xx unknown
Also Published As
Publication number | Publication date |
---|---|
JPS4415502B1 (pt) | 1968-07-09 |
JPS5512746B1 (pt) | 1980-04-03 |
SE327478B (pt) | 1970-08-24 |
DE1614222B2 (de) | 1977-02-10 |
CH460962A (de) | 1968-08-15 |
US3529161A (en) | 1970-09-15 |
GB1173507A (en) | 1969-12-10 |
CH471440A (de) | 1969-04-15 |
DE1614223A1 (de) | 1970-05-27 |
SE333613B (pt) | 1971-03-22 |
FR1512887A (fr) | 1968-02-09 |
US3529159A (en) | 1970-09-15 |
BE694869A (pt) | 1967-09-01 |
NL6602606A (pt) | 1967-09-04 |
FR1524189A (fr) | 1968-05-10 |
DE1614222A1 (de) | 1970-02-26 |
GB1171395A (en) | 1969-11-19 |
BE694727A (pt) | 1967-08-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
V1 | Lapsed because of non-payment of the annual fee | ||
NL80 | Information provided on patent owner name for an already discontinued patent |
Owner name: PHILIPS |