NL1029115C2 - Systemen die gebruik maken van polarisatie-manipulerende retroreflectoren. - Google Patents

Systemen die gebruik maken van polarisatie-manipulerende retroreflectoren. Download PDF

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Publication number
NL1029115C2
NL1029115C2 NL1029115A NL1029115A NL1029115C2 NL 1029115 C2 NL1029115 C2 NL 1029115C2 NL 1029115 A NL1029115 A NL 1029115A NL 1029115 A NL1029115 A NL 1029115A NL 1029115 C2 NL1029115 C2 NL 1029115C2
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NL
Netherlands
Prior art keywords
polarization
reflector
retro
corner block
cubic corner
Prior art date
Application number
NL1029115A
Other languages
English (en)
Dutch (nl)
Other versions
NL1029115A1 (nl
Inventor
Miao Zhu
John J Bockman
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of NL1029115A1 publication Critical patent/NL1029115A1/nl
Application granted granted Critical
Publication of NL1029115C2 publication Critical patent/NL1029115C2/nl

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02015Interferometers characterised by the beam path configuration
    • G01B9/02017Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02019Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different points on same face of object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02041Interferometers characterised by particular imaging or detection techniques
    • G01B9/02045Interferometers characterised by particular imaging or detection techniques using the Doppler effect
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056Passive reduction of errors
    • G01B9/02059Reducing effect of parasitic reflections, e.g. cyclic errors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/15Cat eye, i.e. reflection always parallel to incoming beam
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Optical Elements Other Than Lenses (AREA)
NL1029115A 2004-05-28 2005-05-24 Systemen die gebruik maken van polarisatie-manipulerende retroreflectoren. NL1029115C2 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US85620404 2004-05-28
US10/856,204 US7193721B2 (en) 2004-05-28 2004-05-28 Systems using polarization-manipulating retroreflectors

Publications (2)

Publication Number Publication Date
NL1029115A1 NL1029115A1 (nl) 2005-11-30
NL1029115C2 true NL1029115C2 (nl) 2007-06-01

Family

ID=35424830

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1029115A NL1029115C2 (nl) 2004-05-28 2005-05-24 Systemen die gebruik maken van polarisatie-manipulerende retroreflectoren.

Country Status (4)

Country Link
US (1) US7193721B2 (enExample)
JP (1) JP2005338076A (enExample)
DE (1) DE102005009064B4 (enExample)
NL (1) NL1029115C2 (enExample)

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US10939826B2 (en) 2012-12-20 2021-03-09 Philips Image Guided Therapy Corporation Aspirating and removing biological material
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US11406498B2 (en) 2012-12-20 2022-08-09 Philips Image Guided Therapy Corporation Implant delivery system and implants
US10413317B2 (en) 2012-12-21 2019-09-17 Volcano Corporation System and method for catheter steering and operation
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US5359415A (en) * 1990-03-02 1994-10-25 Werner Tabarelli Interferometer for determining the position of displacement travel of a movable measuring mirror or the like

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Also Published As

Publication number Publication date
DE102005009064B4 (de) 2008-06-26
DE102005009064A1 (de) 2005-12-22
JP2005338076A (ja) 2005-12-08
NL1029115A1 (nl) 2005-11-30
US20050264823A1 (en) 2005-12-01
US7193721B2 (en) 2007-03-20

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AD1A A request for search or an international type search has been filed
RD2N Patents in respect of which a decision has been taken or a report has been made (novelty report)

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