MX2016006295A - Fuente de ion de ionizacion de susperficie apci concentrica, guia de ion, y metodo de uso. - Google Patents

Fuente de ion de ionizacion de susperficie apci concentrica, guia de ion, y metodo de uso.

Info

Publication number
MX2016006295A
MX2016006295A MX2016006295A MX2016006295A MX2016006295A MX 2016006295 A MX2016006295 A MX 2016006295A MX 2016006295 A MX2016006295 A MX 2016006295A MX 2016006295 A MX2016006295 A MX 2016006295A MX 2016006295 A MX2016006295 A MX 2016006295A
Authority
MX
Mexico
Prior art keywords
surface ionization
tube
concentric
apci surface
concentric apci
Prior art date
Application number
MX2016006295A
Other languages
English (en)
Other versions
MX365638B (es
Inventor
Hendrikse Jan
Romanov Vladimir
Original Assignee
Smiths Detection Montreal Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smiths Detection Montreal Inc filed Critical Smiths Detection Montreal Inc
Publication of MX2016006295A publication Critical patent/MX2016006295A/es
Publication of MX365638B publication Critical patent/MX365638B/es

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0022—Portable spectrometers, e.g. devices comprising independent power supply, constructional details relating to portability
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0404—Capillaries used for transferring samples or ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
    • G01N33/0057—Warfare agents or explosives

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

Se describe una sonda de ionización de superficie APCI cocentrica, tubo de muestreo supersónico, y método para usar la sonda de ionización de superficie APCI concéntrica y tubo de muestreo supersónico. En una modalidad, la sonda de ionización de superficie APCI concéntrica incluye un tubo externo, un capilar interno, y una fuente de voltaje acoplada al tubo externo y el capilar interno. El capilar interno se aloja dentro y concéntrico con el tubo externo tal que el gas ionizado (por ejemplo, aire) viaja fuera del tubo externo, reacciona con una muestra y los iones resultantes de analitos se succionan en el capilar interno. Un tubo de muestreo supersónico puede incluir un tubo acoplado a un espectrómetro de masas y/o sonda de ionización de superficie APCI concéntrica, donde el tubo incluye al menos una boquilla de Laval.
MX2016006295A 2013-11-15 2014-11-14 Fuente de ion de ionizacion de superficie apci concéntrica, guía de ion, y método de uso. MX365638B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361904794P 2013-11-15 2013-11-15
PCT/CA2014/051095 WO2015070352A1 (en) 2013-11-15 2014-11-14 Concentric apci surface ionization ion source, ion guide, and method of use

Publications (2)

Publication Number Publication Date
MX2016006295A true MX2016006295A (es) 2016-10-07
MX365638B MX365638B (es) 2019-06-10

Family

ID=53056583

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2016006295A MX365638B (es) 2013-11-15 2014-11-14 Fuente de ion de ionizacion de superficie apci concéntrica, guía de ion, y método de uso.

Country Status (10)

Country Link
US (2) US9728389B2 (es)
EP (1) EP3069375B1 (es)
JP (1) JP6526656B2 (es)
KR (1) KR102351210B1 (es)
CN (2) CN108417473B (es)
CA (1) CA2930642A1 (es)
MX (1) MX365638B (es)
PL (1) PL3069375T3 (es)
RU (1) RU2673670C1 (es)
WO (1) WO2015070352A1 (es)

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US9953817B2 (en) * 2016-04-22 2018-04-24 Smiths Detection Inc. Ion transfer tube with sheath gas flow
US9786477B1 (en) * 2016-06-30 2017-10-10 Smiths Detection Inc. Gas flow assisted ion transfer system with improved transfer efficiency
US10096456B2 (en) * 2016-07-29 2018-10-09 Smiths Detection Inc. Low temperature plasma probe with auxiliary heated gas jet
US10103014B2 (en) * 2016-09-05 2018-10-16 Agilent Technologies, Inc. Ion transfer device for mass spectrometry
WO2019234708A1 (en) * 2018-06-07 2019-12-12 Dh Technologies Development Pte. Ltd. Sampling interface for a mass spectrometer
CN109264835B (zh) * 2018-10-09 2021-08-06 天津科技大学 一种连续式电化学元素提取系统
CN111199861B (zh) * 2018-11-20 2020-12-15 中国科学院大连化学物理研究所 一种毛细管微反应电离源
CN110289203B (zh) * 2019-06-03 2021-03-09 清华大学深圳研究生院 一种电晕放电电离源结构及离子迁移谱仪
CN110729167B (zh) * 2019-10-15 2022-05-06 顺泰医疗器材(深圳)有限公司 一种离子探头
CN110729169B (zh) * 2019-10-15 2022-01-18 宁波谱秀医疗设备有限责任公司 一种便携式质谱仪
CN110729170B (zh) * 2019-10-17 2022-04-26 浙江品玉精密科技有限公司 一种离子源
CN110729168B (zh) * 2019-10-17 2022-04-26 南京品生医疗科技有限公司 一种小型质谱仪
GB2589853B (en) * 2019-12-06 2023-06-21 Microsaic Systems Plc A system and method for detecting analytes dissolved in liquids by plasma ionisation mass spectrometry
CN111540665A (zh) * 2020-04-20 2020-08-14 清华大学深圳国际研究生院 一种离子化装置及其应用
CN113793795B (zh) * 2021-09-16 2024-02-13 维科托（北京）科技有限公司 解吸电离探针以及样品剥蚀扫描方法

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US5750988A (en) 1994-07-11 1998-05-12 Hewlett-Packard Company Orthogonal ion sampling for APCI mass spectrometry
DE19515271C2 (de) * 1995-04-26 1999-09-02 Bruker Daltonik Gmbh Vorrichtung für den gasgeführten Transport von Ionen durch ein Kapillarrohr
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Also Published As

Publication number Publication date
MX365638B (es) 2019-06-10
CN105874561A (zh) 2016-08-17
RU2673670C1 (ru) 2018-11-29
KR102351210B1 (ko) 2022-01-13
US20160268116A1 (en) 2016-09-15
KR20160086361A (ko) 2016-07-19
US20170365455A1 (en) 2017-12-21
JP2016538691A (ja) 2016-12-08
CN108417473B (zh) 2020-06-19
CN108417473A (zh) 2018-08-17
EP3069375A1 (en) 2016-09-21
WO2015070352A1 (en) 2015-05-21
US9728389B2 (en) 2017-08-08
US9972482B2 (en) 2018-05-15
CN105874561B (zh) 2018-03-23
EP3069375A4 (en) 2017-11-29
RU2016121637A (ru) 2017-12-20
CA2930642A1 (en) 2015-05-21
EP3069375B1 (en) 2018-12-26
PL3069375T3 (pl) 2019-05-31
JP6526656B2 (ja) 2019-06-05

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