MX2014014455A - Aparato para probar electrodos. - Google Patents

Aparato para probar electrodos.

Info

Publication number
MX2014014455A
MX2014014455A MX2014014455A MX2014014455A MX2014014455A MX 2014014455 A MX2014014455 A MX 2014014455A MX 2014014455 A MX2014014455 A MX 2014014455A MX 2014014455 A MX2014014455 A MX 2014014455A MX 2014014455 A MX2014014455 A MX 2014014455A
Authority
MX
Mexico
Prior art keywords
electrode
testing apparatus
electrode testing
signal
resistivity
Prior art date
Application number
MX2014014455A
Other languages
English (en)
Other versions
MX339150B (es
Inventor
Kenneth G Brittain
Sammuel D Herbert
Neil F Diamond
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of MX2014014455A publication Critical patent/MX2014014455A/es
Publication of MX339150B publication Critical patent/MX339150B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G06F3/0446—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • Position Input By Displaying (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Thermistors And Varistors (AREA)
  • Switches That Are Operated By Magnetic Or Electric Fields (AREA)
  • Electronic Switches (AREA)

Abstract

La invención se refiere a un aparato para deducir la resistividad de un electrodo mediante la estimulación del electrodo con una señal capacitivamente acoplada, y el procesamiento de la señal resultante con el sistema de circuitos que produce una señal que tiene una amplitud que es una función de la resistividad del electrodo.
MX2014014455A 2012-05-30 2013-05-20 Aparato para probar electrodos. MX339150B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/483,746 US20130320994A1 (en) 2012-05-30 2012-05-30 Electrode testing apparatus
PCT/US2013/041760 WO2013181003A1 (en) 2012-05-30 2013-05-20 Electrode testing apparatus

Publications (2)

Publication Number Publication Date
MX2014014455A true MX2014014455A (es) 2015-02-12
MX339150B MX339150B (es) 2016-05-13

Family

ID=48577264

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2014014455A MX339150B (es) 2012-05-30 2013-05-20 Aparato para probar electrodos.

Country Status (10)

Country Link
US (1) US20130320994A1 (es)
EP (1) EP2856185B1 (es)
CN (1) CN104718460B (es)
BR (1) BR112014029933A2 (es)
CA (1) CA2874744A1 (es)
MX (1) MX339150B (es)
RU (2) RU2606938C2 (es)
SG (1) SG11201407898WA (es)
TW (1) TWI598597B (es)
WO (1) WO2013181003A1 (es)

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CN103294320A (zh) * 2013-06-06 2013-09-11 敦泰科技有限公司 一种电容式触摸屏及其制作方法
CN103529354B (zh) * 2013-10-31 2016-10-05 京东方科技集团股份有限公司 一种电路测试方法及电路测试系统
TWI527456B (zh) * 2013-11-27 2016-03-21 Univ Nat Chi Nan Array read device, dual function read device and detection circuit
CN116560524B (zh) 2013-12-13 2024-10-01 苹果公司 用于自电容触摸传感器的集成触摸和显示架构
US10936120B2 (en) * 2014-05-22 2021-03-02 Apple Inc. Panel bootstraping architectures for in-cell self-capacitance
EP3175330B1 (en) 2014-09-22 2022-04-20 Apple Inc. Ungrounded user signal compensation for pixelated self-capacitance touch sensor panel
US10712867B2 (en) 2014-10-27 2020-07-14 Apple Inc. Pixelated self-capacitance water rejection
CN104317470B (zh) * 2014-11-14 2017-06-13 深圳市华星光电技术有限公司 互电容式ogs触摸面板及其制造方法
CN107209602B (zh) 2015-02-02 2020-05-26 苹果公司 柔性自电容和互电容触摸感测系统架构
US10488992B2 (en) 2015-03-10 2019-11-26 Apple Inc. Multi-chip touch architecture for scalability
KR20170019740A (ko) * 2015-08-12 2017-02-22 주식회사 동부하이텍 터치 센서 검사 장치
US10365773B2 (en) 2015-09-30 2019-07-30 Apple Inc. Flexible scan plan using coarse mutual capacitance and fully-guarded measurements
KR20170058742A (ko) * 2015-11-19 2017-05-29 현대자동차주식회사 터치 입력장치, 이를 포함하는 차량, 및 그 제조방법
US9727683B2 (en) 2015-12-30 2017-08-08 Taiwan Semiconductor Manufacturing Co., Ltd. Integrated circuit having a plurality of conductive segments
AT518762B1 (de) 2016-05-27 2021-06-15 Leonh Lang Prüfvorrichtung
CN109564485B (zh) 2016-07-29 2022-04-01 苹果公司 具有多电源域芯片配置的触摸传感器面板
AU2017208277B2 (en) * 2016-09-06 2018-12-20 Apple Inc. Back of cover touch sensors
US10386965B2 (en) 2017-04-20 2019-08-20 Apple Inc. Finger tracking in wet environment
CN110531882B (zh) * 2018-05-24 2023-01-06 群创光电股份有限公司 显示装置
US11157109B1 (en) 2019-09-06 2021-10-26 Apple Inc. Touch sensing with water rejection
US11143690B2 (en) * 2019-10-02 2021-10-12 Nanya Technology Corporation Testing structure and testing method
US11662867B1 (en) 2020-05-30 2023-05-30 Apple Inc. Hover detection on a touch sensor panel
JP7406650B2 (ja) * 2020-10-08 2023-12-27 アルプスアルパイン株式会社 静電容量検出装置及び入力装置

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SU1648678A1 (ru) * 1988-05-30 1991-05-15 Проектно-Конструкторское Бюро Министерства Приборостроения, Средств Автоматизации И Систем Управления Ссср Устройство дл контрол сопротивлени участка электрод - электрод машины точечной сварки
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Also Published As

Publication number Publication date
TW201403079A (zh) 2014-01-16
WO2013181003A1 (en) 2013-12-05
CN104718460B (zh) 2018-04-03
CN104718460A (zh) 2015-06-17
SG11201407898WA (en) 2014-12-30
BR112014029933A2 (pt) 2017-06-27
RU2014149282A (ru) 2016-07-20
EP2856185A1 (en) 2015-04-08
CA2874744A1 (en) 2013-12-05
EP2856185B1 (en) 2017-09-27
RU2016134240A (ru) 2018-12-10
RU2606938C2 (ru) 2017-01-10
US20130320994A1 (en) 2013-12-05
TWI598597B (zh) 2017-09-11
RU2016134240A3 (es) 2018-12-10
MX339150B (es) 2016-05-13

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