RU2016134240A - Устройство для тестирования электродов - Google Patents

Устройство для тестирования электродов Download PDF

Info

Publication number
RU2016134240A
RU2016134240A RU2016134240A RU2016134240A RU2016134240A RU 2016134240 A RU2016134240 A RU 2016134240A RU 2016134240 A RU2016134240 A RU 2016134240A RU 2016134240 A RU2016134240 A RU 2016134240A RU 2016134240 A RU2016134240 A RU 2016134240A
Authority
RU
Russia
Prior art keywords
electrode
electrical connection
matrix
physical electrical
virtual earth
Prior art date
Application number
RU2016134240A
Other languages
English (en)
Other versions
RU2016134240A3 (ru
Inventor
Кеннет Г. БРИТТЕН
Саммуэль Д. ГЕРБЕРТ
Нил Ф. ДИАМОНД
Original Assignee
3М Инновейтив Пропертиз Компани
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3М Инновейтив Пропертиз Компани filed Critical 3М Инновейтив Пропертиз Компани
Publication of RU2016134240A3 publication Critical patent/RU2016134240A3/ru
Publication of RU2016134240A publication Critical patent/RU2016134240A/ru

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14Measuring resistance by measuring current or voltage obtained from a reference source
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416Control or interface arrangements specially adapted for digitisers
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G06F3/0446Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813Checking the presence, location, orientation or value, e.g. resistance, of components or conductors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829Testing of circuits in sensor or actuator systems

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • Position Input By Displaying (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Switches That Are Operated By Magnetic Or Electric Fields (AREA)
  • Electronic Switches (AREA)
  • Thermistors And Varistors (AREA)

Claims (6)

1. Устройство для тестирования сенсорных панелей, определяющее удельное сопротивление, по меньшей мере, некоторых электродов взаимно-емкостной сенсорной панели, имеющей первую и вторую матрицы электродов, разделенные диэлектриком, и в котором электрические сигналы, подведенные к электроду любой из матриц за счет емкостной связи, наводятся на электроды другой матрицы, содержащее:
генератор сигнала возбуждения, электрически соединенный с электродом первой матрицы;
измерительную схему, имеющую физическое электрическое соединение, по меньшей мере, с одним электродом второй матрицы, причем измерительная схема содержит:
усилитель с виртуальной землей, имеющий точку виртуальной земли, при этом точка виртуальной земли имеет физическое электрическое соединение, по меньшей мере, с одним электродом.
2. Устройство для тестирования сенсорных панелей по п. 1, в котором физическое электрическое соединение характеризуется отсутствием резистора между, по меньшей мере, одним электродом и точкой виртуальной земли.
3. Устройство для тестирования сенсорных панелей по п. 1, в котором непосредственное физическое электрическое соединение содержит аналоговую электрическую схему, состоящую только из одного или более резисторов весьма малой величины между точкой виртуальной земли и, по меньшей мере, одним электродом.
RU2016134240A 2012-05-30 2013-05-20 Устройство для тестирования электродов RU2016134240A (ru)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/483,746 US20130320994A1 (en) 2012-05-30 2012-05-30 Electrode testing apparatus
US13/483,746 2012-05-30

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
RU2014149282A Division RU2606938C2 (ru) 2012-05-30 2013-05-20 Устройство для тестирования электродов

Publications (2)

Publication Number Publication Date
RU2016134240A3 RU2016134240A3 (ru) 2018-12-10
RU2016134240A true RU2016134240A (ru) 2018-12-10

Family

ID=48577264

Family Applications (2)

Application Number Title Priority Date Filing Date
RU2016134240A RU2016134240A (ru) 2012-05-30 2013-05-20 Устройство для тестирования электродов
RU2014149282A RU2606938C2 (ru) 2012-05-30 2013-05-20 Устройство для тестирования электродов

Family Applications After (1)

Application Number Title Priority Date Filing Date
RU2014149282A RU2606938C2 (ru) 2012-05-30 2013-05-20 Устройство для тестирования электродов

Country Status (10)

Country Link
US (1) US20130320994A1 (ru)
EP (1) EP2856185B1 (ru)
CN (1) CN104718460B (ru)
BR (1) BR112014029933A2 (ru)
CA (1) CA2874744A1 (ru)
MX (1) MX339150B (ru)
RU (2) RU2016134240A (ru)
SG (1) SG11201407898WA (ru)
TW (1) TWI598597B (ru)
WO (1) WO2013181003A1 (ru)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090174676A1 (en) 2008-01-04 2009-07-09 Apple Inc. Motion component dominance factors for motion locking of touch sensor data
US9336723B2 (en) 2013-02-13 2016-05-10 Apple Inc. In-cell touch for LED
CN103294320A (zh) * 2013-06-06 2013-09-11 敦泰科技有限公司 一种电容式触摸屏及其制作方法
CN103529354B (zh) * 2013-10-31 2016-10-05 京东方科技集团股份有限公司 一种电路测试方法及电路测试系统
TWI527456B (zh) * 2013-11-27 2016-03-21 Univ Nat Chi Nan Array read device, dual function read device and detection circuit
EP3060968B1 (en) 2013-12-13 2020-11-11 Apple Inc. Integrated touch and display architectures for self-capacitive touch sensors
WO2015178920A1 (en) * 2014-05-22 2015-11-26 Onamp Research Llc Panel bootstrapping architectures for in-cell self-capacitance
US10705658B2 (en) 2014-09-22 2020-07-07 Apple Inc. Ungrounded user signal compensation for pixelated self-capacitance touch sensor panel
CN107077262B (zh) 2014-10-27 2020-11-10 苹果公司 像素化自电容水排斥
CN104317470B (zh) * 2014-11-14 2017-06-13 深圳市华星光电技术有限公司 互电容式ogs触摸面板及其制造方法
WO2016126525A1 (en) 2015-02-02 2016-08-11 Apple Inc. Flexible self-capacitance and mutual capacitance touch sensing system architecture
US10488992B2 (en) 2015-03-10 2019-11-26 Apple Inc. Multi-chip touch architecture for scalability
KR20170019740A (ko) * 2015-08-12 2017-02-22 주식회사 동부하이텍 터치 센서 검사 장치
US10365773B2 (en) 2015-09-30 2019-07-30 Apple Inc. Flexible scan plan using coarse mutual capacitance and fully-guarded measurements
KR20170058742A (ko) * 2015-11-19 2017-05-29 현대자동차주식회사 터치 입력장치, 이를 포함하는 차량, 및 그 제조방법
US9727683B2 (en) * 2015-12-30 2017-08-08 Taiwan Semiconductor Manufacturing Co., Ltd. Integrated circuit having a plurality of conductive segments
AT518762B1 (de) 2016-05-27 2021-06-15 Leonh Lang Prüfvorrichtung
CN114779956A (zh) 2016-07-29 2022-07-22 苹果公司 具有多电源域芯片配置的触摸传感器面板
AU2017208277B2 (en) * 2016-09-06 2018-12-20 Apple Inc. Back of cover touch sensors
US10642418B2 (en) 2017-04-20 2020-05-05 Apple Inc. Finger tracking in wet environment
CN110531882B (zh) * 2018-05-24 2023-01-06 群创光电股份有限公司 显示装置
US11157109B1 (en) 2019-09-06 2021-10-26 Apple Inc. Touch sensing with water rejection
US11143690B2 (en) * 2019-10-02 2021-10-12 Nanya Technology Corporation Testing structure and testing method
US11662867B1 (en) 2020-05-30 2023-05-30 Apple Inc. Hover detection on a touch sensor panel
CN116235021A (zh) * 2020-10-08 2023-06-06 阿尔卑斯阿尔派株式会社 静电容检测装置以及输入装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4370616A (en) * 1980-08-15 1983-01-25 Williams Bruce T Low impedance electrostatic detector
SU1648678A1 (ru) * 1988-05-30 1991-05-15 Проектно-Конструкторское Бюро Министерства Приборостроения, Средств Автоматизации И Систем Управления Ссср Устройство дл контрол сопротивлени участка электрод - электрод машины точечной сварки
US6933931B2 (en) * 2002-08-23 2005-08-23 Ceronix, Inc. Method and apparatus of position location
KR100460194B1 (ko) * 2004-07-22 2004-12-04 (주)디지텍시스템스 터치 패널 제어 장치
US8279180B2 (en) * 2006-05-02 2012-10-02 Apple Inc. Multipoint touch surface controller
KR100799161B1 (ko) * 2006-07-20 2008-01-29 마이크로 인스펙션 주식회사 비접촉 싱글사이드 프로브와 이를 이용한 패턴전극의 단선및 단락 검사장치 및 그 방법
CN104636016B (zh) 2008-02-28 2018-12-18 3M创新有限公司 触屏传感器
JP2010108501A (ja) * 2008-10-30 2010-05-13 Samsung Electronics Co Ltd センシング感度を向上させたタッチスクリーンコントローラ、タッチスクリーンコントローラを備えるディスプレイ駆動回路、ディスプレイ装置及びシステム
TWI431362B (zh) * 2009-05-29 2014-03-21 Japan Display West Inc 觸控感測器、顯示器及電子裝置
KR100971220B1 (ko) * 2009-08-17 2010-07-20 주식회사 에프티랩 Lc공진주파수 변이를 이용한 정전용량방식 터치스크린패널의 검사방법
US8411066B2 (en) * 2010-01-05 2013-04-02 3M Innovative Properties Company High speed noise tolerant multi-touch touch device and controller therefor
TWI478018B (zh) * 2011-01-21 2015-03-21 Egalax Empia Technology Inc 觸控面板感測器斷線檢測方法及裝置

Also Published As

Publication number Publication date
SG11201407898WA (en) 2014-12-30
MX339150B (es) 2016-05-13
RU2016134240A3 (ru) 2018-12-10
MX2014014455A (es) 2015-02-12
CA2874744A1 (en) 2013-12-05
CN104718460B (zh) 2018-04-03
EP2856185A1 (en) 2015-04-08
RU2014149282A (ru) 2016-07-20
BR112014029933A2 (pt) 2017-06-27
RU2606938C2 (ru) 2017-01-10
WO2013181003A1 (en) 2013-12-05
EP2856185B1 (en) 2017-09-27
TW201403079A (zh) 2014-01-16
CN104718460A (zh) 2015-06-17
TWI598597B (zh) 2017-09-11
US20130320994A1 (en) 2013-12-05

Similar Documents

Publication Publication Date Title
RU2016134240A (ru) Устройство для тестирования электродов
GB2488610B (en) A Sensor array
WO2012175580A3 (en) Printed circuit board comprising an electrode configuration of an capacitive sensor
TWI512566B (zh) 觸控偵測裝置及觸控偵測方法
WO2015181770A3 (en) A sensor for detecting the level of a medium
JP2017524192A5 (ru)
WO2010117946A3 (en) Input device with deflectable electrode
WO2010135072A3 (en) Device with proximity detection capability
WO2014072733A3 (en) Voltage measurement
KR101368971B1 (ko) 극미한 임피던스 변화 탐지기
EA201291424A1 (ru) Бытовой прибор и сенсорное устройство ввода для бытового прибора
JP2015522197A5 (ru)
WO2010036545A3 (en) Mutual capacitance measuring circuits and methods
WO2014114669A3 (de) Kapazitiver näherungssensor
ATE543110T1 (de) Vorrichtung zum ausgleich der impedanz eines widerstandsmesswerkzeugs
WO2014039990A3 (en) Electrode padset
EP2811370A3 (en) Inductive touch screen and in cell inductive touch screen
EP2645075A3 (en) Reading Device in Wired Communication With a Probe Having An Embedded Memory Device
BR112018009434A2 (pt) imageamento de resistividade usando sensores capacitivos e indutivos de combinação
EP2799477A3 (en) Composite structure
TWI545467B (zh) 檢測感測器、指示體位置檢測裝置及檢測感測器之製造方法
WO2010135388A3 (en) Active material circuit protector
TWM490056U (en) Touch panel with conductive protection layer
WO2013179050A3 (en) Multi-touch sensing arrangement
JP2015528600A5 (ru)

Legal Events

Date Code Title Description
FA94 Acknowledgement of application withdrawn (non-payment of fees)

Effective date: 20190218