MD1065Z - Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides - Google Patents

Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides Download PDF

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MD1065Z
MD1065Z MDS20150148A MDS20150148A MD1065Z MD 1065 Z MD1065 Z MD 1065Z MD S20150148 A MDS20150148 A MD S20150148A MD S20150148 A MDS20150148 A MD S20150148A MD 1065 Z MD1065 Z MD 1065Z
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Moldova
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measuring
resistance
sensor
amplifier
voltage source
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MDS20150148A
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Romanian (ro)
Russian (ru)
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Валерий ВЕРЖБИЦКИЙ
Олег ЛУПАН
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Технический университет Молдовы
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Abstract

The invention relates to the field of measuring equipment and can be used in measuring apparatuses that use sensors based on nanostructured semiconductor oxides.The device for measuring the resistance of sensors based on nanostructured semiconductor oxides comprises a reference voltage source (1), connected to a voltmeter (6) and connected in series to the test nanostructured sensor (2) and to an additional resistor (3), to the connecting node point of which to the sensor (2) is connected the input of an amplifier (4). The output of the amplifier (4) is connected to a voltmeter (5), while the resistor (3), the common node points of the reference voltage source (1), the amplifier (4) and the voltmeters (5, 6) are connected to ground.The method for measuring the resistance of sensors based on nanostructured semiconductor oxides consists in that it is measured the U1 voltage of the reference voltage source, is measured the U3 voltage on the additional resistor, is calculated the voltage value that falls on the test sensor according to the formula Ux=U1-U3, and is calculated the amount of current passing through the test sensor according to the formula Ix=U3/R3. Calculation of Rx sensor resistance value is performed in accordance with Ohm's law, using the obtained values Ux and Ix.

Description

Invenţia se referă la domeniul tehnicii de măsurare şi poate fi utilizată în aparate de măsurat, în care se utilizează senzori pe bază de oxizi semiconductori nanostructuraţi. The invention relates to the field of measurement technology and can be used in measuring devices, in which sensors based on nanostructured semiconductor oxides are used.

Este cunoscut un dispozitiv de măsurare a rezistenţei senzorilor bazat pe legea lui Ohm pentru circuite electrice sau punţi de măsurare, care include măsurarea rezistenţei active pe curent continuu cu ajutorul ohmmetrului digital, galvanometrului diferenţial şi potenţiometrului curentului continuu [1]. A sensor resistance measuring device based on Ohm's law for electrical circuits or measuring bridges is known, which includes measuring the active resistance on direct current using a digital ohmmeter, differential galvanometer and direct current potentiometer [1].

Cea mai apropiată soluţie este interfaţa analog-digitală de precizie pentru lucru cu senzorii micro- şi nanorezistivi, care conţin punţi de măsurare, ieşirile diagonalei de putere fiind conectate la sursa de tensiune, iar ieşirile diagonalei de măsurare fiind conectate cu intrările diferenţiale ale amplificatoarelor instrumentale [2]. The closest solution is the precision analog-digital interface for working with micro- and nanoresistive sensors, which contain measurement bridges, the outputs of the power diagonal being connected to the voltage source, and the outputs of the measurement diagonal being connected to the differential inputs of the instrumental amplifiers [2].

Un dezavantaj comun al acestor dispozitive este că pentru măsurarea rezistenţelor cu valori mari ale micro- şi nanostructurilor este necesar de utilizat amplificatoare instrumentale diferenţiale cu rezistenţele de intrare foarte mari (US 8263002 B1 2012.09.11; Oleg Lupan, Guangyu Chai, Lee Chow. Novel hydrogen gas sensor based on single ZnO nanorod, Microelectronic Engineering, Volume 85, Issue 11, November 2008, p. 2220-2225; O. Lupan, V.V. Ursaki, G. Chai, L. Chow. Selective hydrogen gas nanosensor using individual ZnO nanowire with fast response at room temperature, Sensors and Actuators B: Chemical, Volume 144, Issue 1, 29 January 2010, p. 56-66). A common disadvantage of these devices is that for measuring high resistance values of micro- and nanostructures it is necessary to use differential instrumental amplifiers with very high input resistances (US 8263002 B1 2012.09.11; Oleg Lupan, Guangyu Chai, Lee Chow. Novel hydrogen gas sensor based on single ZnO nanorod, Microelectronic Engineering, Volume 85, Issue 11, November 2008, p. 2220-2225; O. Lupan, V.V. Ursaki, G. Chai, L. Chow. Selective hydrogen gas nanosensor using individual ZnO nanowire with fast response at room temperature, Sensors and Actuators B: Chemical, Volume 144, Issue 1, 29 January 2010, p. 56-66).

Problema pe care o rezolvă invenţia constă în elaborarea unui dispozitiv care ar permite de a măsura rezistenţa mare la micro- şi nanostructuri folosind amplificatoare diferenţiale de uz general. The problem solved by the invention consists in developing a device that would allow measuring high resistance in micro- and nanostructures using general-purpose differential amplifiers.

Dispozitivul, conform invenţiei, înlătură dezavantajul menţionat mai sus prin aceea că include o sursă de tensiune de referinţă 1 conectată la un voltmetru 6 şi unită în serie cu senzorul nanostructurat cercetat 2 şi cu un rezistor suplimentar 3, la nodul de conectare a căruia cu senzorul 2 este conectată intrarea unui amplificator 4; ieşirea amplificatorului 4 este conectată la un voltmetru 5, totodată rezistorul 3, nodurile comune ale sursei de tensiune de referinţă 1, amplificatorul 4 şi voltmetrele 5 şi 6 sunt conectate la masă. The device, according to the invention, eliminates the above-mentioned disadvantage by including a reference voltage source 1 connected to a voltmeter 6 and connected in series with the investigated nanostructured sensor 2 and with an additional resistor 3, to the connection node of which the input of an amplifier 4 is connected with the sensor 2; the output of the amplifier 4 is connected to a voltmeter 5, while the resistor 3, the common nodes of the reference voltage source 1, the amplifier 4 and the voltmeters 5 and 6 are connected to ground.

Metoda, conform invenţiei, înlătură dezavantajul menţionat mai sus prin aceea că se măsoară tensiunea U1 a sursei de tensiune de referinţă, se măsoară tensiunea U3 pe rezistorul suplimentar, se calculează valoarea tensiunii, care cade pe senzorul cercetat, conform formulei Ux=U1-U3, şi se calculează valoarea curentului, care trece prin senzorul cercetat, conform formulei Ix=U3/R3, iar calcularea valorii rezistenţei senzorului Rx se efectuează conform legii lui Ohm, utilizând valorile obţinute Ux şi Ix. The method, according to the invention, eliminates the above-mentioned disadvantage by measuring the voltage U1 of the reference voltage source, measuring the voltage U3 on the additional resistor, calculating the value of the voltage that falls on the investigated sensor, according to the formula Ux=U1-U3, and calculating the value of the current that passes through the investigated sensor, according to the formula Ix=U3/R3, and calculating the value of the sensor resistance Rx is performed according to Ohm's law, using the obtained values Ux and Ix.

Rezultatul invenţiei constă în eliminarea influenţei rezistenţelor de intrare ale amplificatoarelor de instrumentaţie asupra rezultatelor măsurate. The result of the invention consists in eliminating the influence of the input resistances of the instrumentation amplifiers on the measured results.

Invenţia se descrie prin desenul din figură, în care este prezentată schema-bloc a dispozitivului de măsurare a rezistenţei senzorilor, realizată cu ajutorul metodei corespunzătoare. Aceasta conţine conectarea în serie a sursei de tensiune de referinţă 1, a senzorului măsurat 2 RX şi a rezistorului suplimentar la nodul de conectare, unde este conectat senzorul nanostructurat cu intrările amplificatorului 4, iar ieşirea lui este conectată cu intrarea voltmetrului 5, voltmetrul 6 este conectat la sursa de tensiune de referinţă, în afară de aceasta, rezistorul 3, nodurile comune ale sursei de tensiune de referinţă 1, amplificatorului 4, voltmetrelor 5 şi 6 sunt conectate la masă. The invention is described by the drawing in the figure, which shows the block diagram of the device for measuring the resistance of sensors, made using the appropriate method. It contains the series connection of the reference voltage source 1, the measured sensor 2 RX and the additional resistor at the connection node, where the nanostructured sensor is connected to the inputs of the amplifier 4, and its output is connected to the input of the voltmeter 5, the voltmeter 6 is connected to the reference voltage source, in addition, the resistor 3, the common nodes of the reference voltage source 1, the amplifier 4, the voltmeters 5 and 6 are connected to the ground.

Procesul de măsurare a rezistenţei senzorului micro- şi nanostructurat se efectuează în felul următor: la prima etapă se măsoară tensiunea pe rezistorul suplimentar 3, Ur3, care este egală cu tensiunea măsurată de voltmetrul 4, Uv4, împărţită la coeficientul de amplificare a amplificatorului 4, Ku4: The process of measuring the resistance of the micro- and nanostructured sensor is performed as follows: in the first stage, the voltage on the additional resistor 3, Ur3, is measured, which is equal to the voltage measured by the voltmeter 4, Uv4, divided by the amplification coefficient of the amplifier 4, Ku4:

Ur3=Uv4/Ku4 (1) Ur3=Uv4/Ku4 (1)

La etapa a doua se măsoară tensiunea pe senzorul nanostructurat, care este egală cu tensiunea sursei de tensiune de referinţă 1 măsurată cu voltmetrul 6, U6, cu scăderea tensiunii pe rezistorul suplimentar 3: In the second stage, the voltage on the nanostructured sensor is measured, which is equal to the voltage of the reference voltage source 1 measured with voltmeter 6, U6, with the voltage drop across the additional resistor 3:

Urx=U6-Ur3 (2) Urx=U6-Ur3 (2)

La etapa a treia se calculează valoarea curentului, care trece prin senzorul nanostructurat: In the third stage, the value of the current passing through the nanostructured sensor is calculated:

Irx=Ur3/R3 (3) Irx=Ur3/R3 (3)

La etapa a patra se calculează valoarea rezistenţei senzorului nanostructurat: In the fourth step, the resistance value of the nanostructured sensor is calculated:

Rx=Urx/Irx=(U6-Ur3)·R4/Ur3=(Uv6·Ku4-Uv5)·R3/Uv5 (4) Rx=Urx/Irx=(U6-Ur3)·R4/Ur3=(Uv6·Ku4-Uv5)·R3/Uv5 (4)

În calitate de exemplu de utilizare în practică se poate folosi punerea în aplicare a cazului cu următorii parametri ai elementelor: valoarea sursei de tensiune de referinţă U6=30 V, rezistenţa rezistorului suplimentar 3, R3=1000 Ω, datele voltmetrului 5, U5=20 V, datele voltmetrului 6, U6=29,98 V: As an example of practical use, the implementation of the case with the following parameters of the elements can be used: the value of the reference voltage source U6=30 V, the resistance of the additional resistor 3, R3=1000 Ω, the data of the voltmeter 5, U5=20 V, the data of the voltmeter 6, U6=29.98 V:

Rx=(29,98·1000-20)·1000/20=1498000 Ω Rx=(29.98·1000-20)·1000/20=1498000 Ω

1. Лозицкий Б.Н., Мельниченко И. И. Радиотехника, Электрорадиоизмерения, Энергия, Москва, 1976, с.193-194 1. Лозицкий Б.Н., Мельниченко И. Радиотехника, Електрорадиоизмерия, Москва, 1976, p.193-194

2. RU 2541723 C1 2015.02.20 2. RU 2541723 C1 2015.02.20

Claims (2)

1. Dispozitiv de măsurare a rezistenţei senzorilor pe bază de oxizi semiconductori nanostructuraţi, care include o sursă de tensiune de referinţă (1) conectată la un voltmetru (6) şi unită în serie cu senzorul nanostructurat cercetat (2) şi cu un rezistor suplimentar (3), la nodul de conectare a căruia cu senzorul (2) este conectată intrarea unui amplificator (4); ieşirea amplificatorului (4) este conectată la un voltmetru (5), totodată rezistorul (3), nodurile comune ale sursei de tensiune de referinţă (1), amplificatorul (4) şi voltmetrele (5 şi 6) sunt conectate la masă.1. A device for measuring the resistance of sensors based on nanostructured semiconductor oxides, which includes a reference voltage source (1) connected to a voltmeter (6) and connected in series with the investigated nanostructured sensor (2) and with an additional resistor (3), to the connection node of which the input of an amplifier (4) is connected with the sensor (2); the output of the amplifier (4) is connected to a voltmeter (5), while the resistor (3), the common nodes of the reference voltage source (1), the amplifier (4) and the voltmeters (5 and 6) are connected to ground. 2. Metodă de măsurare a rezistenţei senzorilor pe bază de oxizi semiconductori nanostructuraţi, care constă în aceea că se măsoară tensiunea U1 a sursei de tensiune de referinţă, se măsoară tensiunea U3 pe rezistorul suplimentar, se calculează valoarea tensiunii care cade pe senzorul cercetat conform formulei Ux=U1-U3, şi se calculează valoarea curentului care trece prin senzorul cercetat conform formulei Ix=U3/R3, iar calcularea valorii rezistenţei senzorului Rx se efectuează conform legii lui Ohm, utilizând valorile obţinute Ux şi Ix.2. Method for measuring the resistance of sensors based on nanostructured semiconductor oxides, which consists in measuring the voltage U1 of the reference voltage source, measuring the voltage U3 on the additional resistor, calculating the value of the voltage that falls on the sensor under investigation according to the formula Ux=U1-U3, and calculating the value of the current that passes through the sensor under investigation according to the formula Ix=U3/R3, and calculating the value of the sensor resistance Rx is performed according to Ohm's law, using the obtained values Ux and Ix.
MDS20150148A 2015-11-09 2015-11-09 Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides MD1065Z (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1597802A1 (en) * 1987-04-17 1990-10-07 Институт радиофизики и электроники АН АрмССР Apparatus for measuring parameters of power supply sources
RU19420U1 (en) * 2001-05-18 2001-08-27 Общество с ограниченной ответственностью "Связьприбор" DEVICE FOR MEASURING ELECTRICAL PARAMETERS AND DETERMINING THE PLACE OF DAMAGE TO CABLE LINES
US8263002B1 (en) * 2008-05-16 2012-09-11 University Of Central Florida Research Foundation, Inc. Fabrication of ZnO nanorod-based hydrogen gas nanosensor
RU2541723C1 (en) * 2013-09-17 2015-02-20 Федеральное Государственное Бюджетное Образовательное Учреждение Высшего Профессионального Образования "Донской Государственный Технический Университет" (Дгту) Precision analogue-digital interface for working with resistive micro- and nanospheres

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1597802A1 (en) * 1987-04-17 1990-10-07 Институт радиофизики и электроники АН АрмССР Apparatus for measuring parameters of power supply sources
RU19420U1 (en) * 2001-05-18 2001-08-27 Общество с ограниченной ответственностью "Связьприбор" DEVICE FOR MEASURING ELECTRICAL PARAMETERS AND DETERMINING THE PLACE OF DAMAGE TO CABLE LINES
US8263002B1 (en) * 2008-05-16 2012-09-11 University Of Central Florida Research Foundation, Inc. Fabrication of ZnO nanorod-based hydrogen gas nanosensor
RU2541723C1 (en) * 2013-09-17 2015-02-20 Федеральное Государственное Бюджетное Образовательное Учреждение Высшего Профессионального Образования "Донской Государственный Технический Университет" (Дгту) Precision analogue-digital interface for working with resistive micro- and nanospheres

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
O. Lupan, V.V. Ursaki, G. Chai, L. Chow. Selective hydrogen gas nanosensor using individual ZnO nanowire with fast response at room temperature, Sensors and Actuators B: Chemical, Volume 144, Issue 1, 29 January 2010, Pages 56–66 *
Oleg Lupan, Guangyu Chai, Lee Chow. Novel hydrogen gas sensor based on single ZnO nanorod, Microelectronic Engineering, Volume 85, Issue 11, November 2008, Pages 2220-2225 *
Лозицкий Б.Н., Мельниченко И. И. Радиотехника, Электрорадиоизмерения, Энергия, Москва, 1976, с.193-194 *

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