MD1065Y - Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides - Google Patents

Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides Download PDF

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Publication number
MD1065Y
MD1065Y MDS20150148A MDS20150148A MD1065Y MD 1065 Y MD1065 Y MD 1065Y MD S20150148 A MDS20150148 A MD S20150148A MD S20150148 A MDS20150148 A MD S20150148A MD 1065 Y MD1065 Y MD 1065Y
Authority
MD
Moldova
Prior art keywords
measuring
resistance
sensors based
semiconductor oxides
nanostructured semiconductor
Prior art date
Application number
MDS20150148A
Other languages
Romanian (ro)
Russian (ru)
Inventor
Валерий ВЕРЖБИЦКИЙ
Олег ЛУПАН
Original Assignee
Технический университет Молдовы
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Технический университет Молдовы filed Critical Технический университет Молдовы
Priority to MDS20150148A priority Critical patent/MD1065Z/en
Publication of MD1065Y publication Critical patent/MD1065Y/en
Publication of MD1065Z publication Critical patent/MD1065Z/en

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  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The invention relates to the field of measuring equipment and can be used in measuring apparatuses that use sensors based on nanostructured semiconductor oxides.The device for measuring the resistance of sensors based on nanostructured semiconductor oxides comprises a reference voltage source (1), connected to a voltmeter (6) and connected in series to the test nanostructured sensor (2) and to an additional resistor (3), to the connecting node point of which to the sensor (2) is connected the input of an amplifier (4). The output of the amplifier (4) is connected to a voltmeter (5), while the resistor (3), the common node points of the reference voltage source (1), the amplifier (4) and the voltmeters (5, 6) are connected to ground.The method for measuring the resistance of sensors based on nanostructured semiconductor oxides consists in that it is measured the U1 voltage of the reference voltage source, is measured the U3 voltage on the additional resistor, is calculated the voltage value that falls on the test sensor according to the formula Ux=U1-U3, and is calculated the amount of current passing through the test sensor according to the formula Ix=U3/R3. Calculation of Rx sensor resistance value is performed in accordance with Ohm's law, using the obtained values Ux and Ix.
MDS20150148A 2015-11-09 2015-11-09 Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides MD1065Z (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
MDS20150148A MD1065Z (en) 2015-11-09 2015-11-09 Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MDS20150148A MD1065Z (en) 2015-11-09 2015-11-09 Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides

Publications (2)

Publication Number Publication Date
MD1065Y true MD1065Y (en) 2016-08-31
MD1065Z MD1065Z (en) 2017-03-31

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Family Applications (1)

Application Number Title Priority Date Filing Date
MDS20150148A MD1065Z (en) 2015-11-09 2015-11-09 Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides

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MD (1) MD1065Z (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1597802A1 (en) * 1987-04-17 1990-10-07 Институт радиофизики и электроники АН АрмССР Apparatus for measuring parameters of power supply sources
RU19420U1 (en) * 2001-05-18 2001-08-27 Общество с ограниченной ответственностью "Связьприбор" DEVICE FOR MEASURING ELECTRICAL PARAMETERS AND DETERMINING THE PLACE OF DAMAGE TO CABLE LINES
US8263002B1 (en) * 2008-05-16 2012-09-11 University Of Central Florida Research Foundation, Inc. Fabrication of ZnO nanorod-based hydrogen gas nanosensor
RU2541723C1 (en) * 2013-09-17 2015-02-20 Федеральное Государственное Бюджетное Образовательное Учреждение Высшего Профессионального Образования "Донской Государственный Технический Университет" (Дгту) Precision analogue-digital interface for working with resistive micro- and nanospheres

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Publication number Publication date
MD1065Z (en) 2017-03-31

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KA4Y Short-term patent lapsed due to non-payment of fees (with right of restoration)