MA49568A - Dispositif et procédé de détection de défauts de surface - Google Patents

Dispositif et procédé de détection de défauts de surface

Info

Publication number
MA49568A
MA49568A MA049568A MA49568A MA49568A MA 49568 A MA49568 A MA 49568A MA 049568 A MA049568 A MA 049568A MA 49568 A MA49568 A MA 49568A MA 49568 A MA49568 A MA 49568A
Authority
MA
Morocco
Prior art keywords
detection device
defect detection
surface defect
detection
defect
Prior art date
Application number
MA049568A
Other languages
English (en)
French (fr)
Inventor
Nisco Bruno De
Girolamo Alessandro Di
Original Assignee
Tekno Idea S R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tekno Idea S R L filed Critical Tekno Idea S R L
Publication of MA49568A publication Critical patent/MA49568A/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
MA049568A 2017-07-10 2018-07-09 Dispositif et procédé de détection de défauts de surface MA49568A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102017000077459A IT201700077459A1 (it) 2017-07-10 2017-07-10 Dispositivo e procedimento per la rilevazione di difetti superficiali

Publications (1)

Publication Number Publication Date
MA49568A true MA49568A (fr) 2020-05-20

Family

ID=61005905

Family Applications (1)

Application Number Title Priority Date Filing Date
MA049568A MA49568A (fr) 2017-07-10 2018-07-09 Dispositif et procédé de détection de défauts de surface

Country Status (7)

Country Link
US (2) US11105614B2 (enExample)
EP (1) EP3652524B1 (enExample)
JP (2) JP2020527728A (enExample)
ES (1) ES2977710T3 (enExample)
IT (1) IT201700077459A1 (enExample)
MA (1) MA49568A (enExample)
WO (1) WO2019012404A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT201700077459A1 (it) * 2017-07-10 2019-01-10 Tekno Idea Srl Dispositivo e procedimento per la rilevazione di difetti superficiali
CN111189854B (zh) * 2020-04-13 2020-08-07 征图新视(江苏)科技股份有限公司 玻璃盖板自动检测系统缺陷分层检测方法
US12175654B2 (en) 2020-11-06 2024-12-24 Carl Zeiss Metrology Llc Surface inspection system and method for differentiating particulate contamination from defects on a surface of a specimen

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4629319A (en) 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
US5237404A (en) * 1990-06-28 1993-08-17 Mazda Motor Corporation Inspection apparatus with improved detection of surface defects over large and curved surfaces
JPH05322543A (ja) 1992-05-22 1993-12-07 Mazda Motor Corp 表面欠陥検査装置
EP1108197A1 (de) * 1998-09-04 2001-06-20 Siemens Aktiengesellschaft Anordnung und verfahren zur ermittlung einer tiefen- und farbinformation eines aufzunehmenden objekts
JP2001242092A (ja) * 2000-03-02 2001-09-07 Mitsubishi Electric Corp 評価装置
DE10110994B4 (de) 2000-03-09 2012-11-29 Isra Vision Systems Ag Vorrichtung zur Bildabtastung eines Objektes
WO2003016819A1 (de) * 2001-08-14 2003-02-27 Metronom Gmbh Industrial Measurement Verfahren zur vermessung von oberflächenstrukturen
GB0500570D0 (en) * 2005-01-12 2005-02-16 Enfis Ltd Sensing in meat products and the like
JP2008249397A (ja) * 2007-03-29 2008-10-16 Toyota Motor Corp 表面検査装置
JP5110977B2 (ja) * 2007-06-22 2012-12-26 株式会社日立ハイテクノロジーズ 欠陥観察装置及びその方法
JP2009133725A (ja) * 2007-11-30 2009-06-18 Sumitomo Chemical Co Ltd 樹脂塗布フィルムの塗膜欠陥の検査方法
EP2335047A4 (en) * 2008-09-12 2012-02-22 Ceramicam Ltd SURFACE SCANNING DEVICE
JP4719284B2 (ja) * 2008-10-10 2011-07-06 トヨタ自動車株式会社 表面検査装置
JP2011232265A (ja) * 2010-04-30 2011-11-17 Honda Motor Co Ltd 表面検査装置及び表面検査方法
US20130057678A1 (en) 2010-05-17 2013-03-07 Ford Espana S.L. Inspection system and method of defect detection on specular surfaces
JP5994419B2 (ja) * 2012-06-21 2016-09-21 富士通株式会社 検査方法及び検査装置
US8823930B2 (en) * 2012-08-07 2014-09-02 Carl Zeiss Industrielle Messtechnik Gmbh Apparatus and method for inspecting an object
EP2799810A1 (de) * 2013-04-30 2014-11-05 Aimess Services GmbH Vorrichtung und Verfahren zum simultanen dreidimensionalen Vermessen von Oberflächen mit mehreren Wellenlängen
WO2017001897A1 (pt) * 2015-06-30 2017-01-05 Bosch Car Multimedia Portugal, S.A. Dispositivo e método para deteção de defeitos em superfícies especulares com luz difusa estruturada
JP2017116487A (ja) * 2015-12-25 2017-06-29 凸版印刷株式会社 ウェブ欠陥検査装置
IT201700077459A1 (it) * 2017-07-10 2019-01-10 Tekno Idea Srl Dispositivo e procedimento per la rilevazione di difetti superficiali
US11328380B2 (en) * 2018-10-27 2022-05-10 Gilbert Pinter Machine vision systems, illumination sources for use in machine vision systems, and components for use in the illumination sources

Also Published As

Publication number Publication date
US20210348917A1 (en) 2021-11-11
WO2019012404A1 (en) 2019-01-17
ES2977710T3 (es) 2024-08-29
EP3652524A1 (en) 2020-05-20
JP2020527728A (ja) 2020-09-10
JP2023106529A (ja) 2023-08-01
US20200173771A1 (en) 2020-06-04
US11105614B2 (en) 2021-08-31
EP3652524C0 (en) 2024-02-14
US11629953B2 (en) 2023-04-18
EP3652524B1 (en) 2024-02-14
IT201700077459A1 (it) 2019-01-10
BR112020000286A2 (pt) 2020-07-14

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