KR970702992A - 금속의 청정도 평가장치 및 그의 방법(device for evaluating cleanliness of metal and method therefor) - Google Patents

금속의 청정도 평가장치 및 그의 방법(device for evaluating cleanliness of metal and method therefor)

Info

Publication number
KR970702992A
KR970702992A KR1019960706394A KR19960706394A KR970702992A KR 970702992 A KR970702992 A KR 970702992A KR 1019960706394 A KR1019960706394 A KR 1019960706394A KR 19960706394 A KR19960706394 A KR 19960706394A KR 970702992 A KR970702992 A KR 970702992A
Authority
KR
South Korea
Prior art keywords
metal
method therefor
evaluating cleanliness
cleanliness
evaluating
Prior art date
Application number
KR1019960706394A
Other languages
English (en)
Other versions
KR100229096B1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP7121786A external-priority patent/JPH1026618A/ja
Application filed filed Critical
Publication of KR970702992A publication Critical patent/KR970702992A/ko
Application granted granted Critical
Publication of KR100229096B1 publication Critical patent/KR100229096B1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/205—Metals in liquid state, e.g. molten metals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/202—Constituents thereof
    • G01N33/2022—Non-metallic constituents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/20—Oxygen containing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/25—Chemistry: analytical and immunological testing including sample preparation
    • Y10T436/25375—Liberation or purification of sample or separation of material from a sample [e.g., filtering, centrifuging, etc.]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR1019960706394A 1995-03-14 1996-03-14 금속의 청정도 평가장치 및 그의 방법 KR100229096B1 (ko)

Applications Claiming Priority (17)

Application Number Priority Date Filing Date Title
JP5481095 1995-03-14
JP54810/1995 1995-03-14
JP66592/1995 1995-03-24
JP6659295 1995-03-24
JP142456/1995 1995-05-18
JP14245695 1995-05-18
JP121786/1995 1995-05-19
JP7121786A JPH1026618A (ja) 1995-05-19 1995-05-19 金属中介在物の迅速評価方法
JP12370/1996 1996-01-29
JP1237096 1996-01-29
JP1236996 1996-01-29
JP12369/1996 1996-01-29
JP21272/1996 1996-02-07
JP2127396 1996-02-07
JP2127296 1996-02-07
JP21273/1996 1996-02-07
PCT/JP1996/000650 WO1996028729A1 (fr) 1995-03-14 1996-03-14 Dispositif et technique d'evaluation de la proprete du metal

Publications (2)

Publication Number Publication Date
KR970702992A true KR970702992A (ko) 1997-06-10
KR100229096B1 KR100229096B1 (ko) 1999-11-01

Family

ID=27571720

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019960706394A KR100229096B1 (ko) 1995-03-14 1996-03-14 금속의 청정도 평가장치 및 그의 방법

Country Status (8)

Country Link
US (2) US5985674A (ko)
EP (2) EP1361432B1 (ko)
KR (1) KR100229096B1 (ko)
CN (1) CN1112587C (ko)
AU (1) AU686498B2 (ko)
CA (1) CA2190123C (ko)
DE (1) DE69632614T2 (ko)
WO (1) WO1996028729A1 (ko)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2190123C (en) * 1995-03-14 2002-07-02 Kazushige Umezawa Evaluation apparatus for cleanliness of metal and method therefor
US6590200B1 (en) * 1999-04-02 2003-07-08 Worcester Polytechnic Institute Systems for detecting measuring inclusions
US6693443B2 (en) 1999-04-02 2004-02-17 Worcester Polytechnic Institute Systems for detecting and measuring inclusions
KR100681663B1 (ko) 2004-12-20 2007-02-09 재단법인 포항산업과학연구원 Ｘ-선 현미경을 이용한 스테인레스 강판의 개재물 청정도평가방법
US8530790B2 (en) * 2005-09-12 2013-09-10 Lincoln Global, Inc. Method for extracting non-metallic weld metal inclusions
US8384897B2 (en) * 2008-04-25 2013-02-26 Nippon Steel & Sumitomo Metal Corporation Method of analyzing particle size distribution of particles in metal material
JP4737278B2 (ja) * 2008-11-28 2011-07-27 Ｊｆｅスチール株式会社 金属材料中の析出物および／または介在物の分析方法
JP5359244B2 (ja) * 2008-12-17 2013-12-04 Ｊｆｅスチール株式会社 金属試料中の析出物及び／又は介在物の分析方法
DE102012109248A1 (de) * 2012-09-28 2014-04-03 Fluxana GmbH & Co. KG Herstellung von Analyseproben
CN103123329B (zh) * 2012-12-31 2015-07-29 上海大学 金属中非金属夹杂物的快速检测方法及快速检测装置
CN105043098B (zh) * 2015-07-09 2017-04-05 佛山市技新电气有限公司 一种电熔炉
CN106872512A (zh) * 2016-12-29 2017-06-20 中南大学 一种测试金属材料快速凝固行为及凝固热流的方法
JP6992714B2 (ja) * 2017-11-16 2022-01-13 住友金属鉱山株式会社 金属酸化物中における金属単体の定量方法
CN110044763B (zh) * 2019-05-06 2022-05-13 浙江福达合金材料科技有限公司 一种高纯银锭中硝酸不溶物含量的检测方法
FR3114398A1 (fr) * 2020-09-24 2022-03-25 Commissariat A L'energie Atomique Et Aux Energies Alternatives Méthode d’analyse par spectroscopie de rayons X à dispersion d’énergie d’au moins une espèce chimique dans un bain de fusion ou un cordon solidifié produit par un procédé de fabrication additive ou de soudage d’un alliage métallique
IT202100031649A1 (it) * 2021-12-17 2023-06-17 Cogne Acciai Speciali S P A Metodo per analisi chimica di elementi in leghe metalliche con separazione della componente metallica
CN114636802B (zh) * 2022-02-16 2023-11-28 大冶特殊钢有限公司 一种冶炼过程中钢水纯净度的检测方法
CN118134279A (zh) * 2024-03-05 2024-06-04 鞍钢股份有限公司 锌液面渣聚合效果评价方法

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3432753A (en) * 1966-09-30 1969-03-11 Gen Electric Method of analyzing materials to determine the impurity content thereof
US3507144A (en) * 1968-03-21 1970-04-21 Westinghouse Electric Corp Gas content analysis with a metal levitation system
JPS511235B2 (ko) * 1972-05-11 1976-01-14
DE2549735A1 (de) * 1975-11-06 1977-11-03 G F Paul Mueller Ingenieur Bue Vorrichtung und verfahren zur bestimmung von duennen fremdschichten und schichtdicken auf stoffen
FR2381303A1 (fr) * 1977-02-21 1978-09-15 Siderurgie Fse Inst Rech Appareil pour la preparation automatique d'echantillons destines a l'analyse par fluorescence x
JPS58172596A (ja) * 1982-04-05 1983-10-11 株式会社東芝 軽水炉接水部構造体の接水部表面処理方法
FR2556095B1 (fr) * 1983-12-02 1986-09-05 Philips Ind Commerciale Procede automatique de dosage d'echantillon et machine automatique pour doser et analyser
US4612042A (en) * 1984-03-01 1986-09-16 Stelco Inc. Method for automatically fluxing and casting samples
USH135H (en) * 1984-06-19 1986-09-02 Electromagnetic levitation casting apparatus having improved levitation coil assembly
US5257302A (en) * 1987-08-31 1993-10-26 Ngk Insulators, Ltd. Fluorescent X-ray analyzing system
JPH02216444A (ja) * 1988-06-30 1990-08-29 Mitsui Petrochem Ind Ltd 金属試料の組成分析方法
FR2647196B1 (fr) * 1989-05-19 1991-06-28 Cezus Co Europ Zirconium Creuset froid a vidange par le fond
US5269827A (en) * 1991-03-01 1993-12-14 Leco Corporation Analytical sample preparation system
JP2838172B2 (ja) * 1991-05-03 1998-12-16 株式会社 堀場製作所 蛍光ｘ線分析装置
US5369275A (en) * 1991-07-11 1994-11-29 International Superconductivity Technology Center Apparatus for solid surface analysis using X-ray spectroscopy
JP2967092B2 (ja) 1991-12-20 1999-10-25 科学技術庁金属材料技術研究所長 浮上溶解装置
JP2730406B2 (ja) * 1992-06-15 1998-03-25 日本鋼管株式会社 金属材の清浄度判定方法
US5427952A (en) * 1993-01-11 1995-06-27 Dow Corning Corporation Analytical method for nonmetallic contaminates in silicon
US5315091A (en) * 1993-03-02 1994-05-24 Leco Corporation Resistively heated sample preparation apparatus
JP3051013B2 (ja) * 1993-12-21 2000-06-12 株式会社東芝 不純物分析方法
JPH07239327A (ja) * 1994-02-28 1995-09-12 Nippon Steel Corp 金属の清浄度評価方法
CA2190123C (en) * 1995-03-14 2002-07-02 Kazushige Umezawa Evaluation apparatus for cleanliness of metal and method therefor
IL120429A (en) * 1997-03-12 2000-09-28 Jordan Valley Applied Radiation Ltd X-ray fluorescence analyzer
US6012325A (en) * 1997-11-05 2000-01-11 The Boc Group, Inc. (A Delaware Corporation) Method and apparatus for measuring metallic impurities contained within a fluid
US6266390B1 (en) * 1998-09-21 2001-07-24 Spectramet, Llc High speed materials sorting using x-ray fluorescence

Also Published As

Publication number Publication date
CN1150839A (zh) 1997-05-28
DE69632614D1 (de) 2004-07-08
CA2190123A1 (en) 1996-09-19
EP1361432A3 (en) 2004-11-17
EP0760480A4 (en) 1997-06-18
CA2190123C (en) 2002-07-02
WO1996028729A1 (fr) 1996-09-19
DE69632614T2 (de) 2005-06-09
AU686498B2 (en) 1998-02-05
US6555063B1 (en) 2003-04-29
EP1361432A2 (en) 2003-11-12
AU4954396A (en) 1996-10-02
EP0760480B1 (en) 2004-06-02
EP1361432B1 (en) 2012-02-22
KR100229096B1 (ko) 1999-11-01
EP0760480A1 (en) 1997-03-05
US5985674A (en) 1999-11-16
CN1112587C (zh) 2003-06-25

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