KR970059759A - Output resistance meter and measuring method of driver IC - Google Patents

Output resistance meter and measuring method of driver IC Download PDF

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Publication number
KR970059759A
KR970059759A KR1019970000971A KR19970000971A KR970059759A KR 970059759 A KR970059759 A KR 970059759A KR 1019970000971 A KR1019970000971 A KR 1019970000971A KR 19970000971 A KR19970000971 A KR 19970000971A KR 970059759 A KR970059759 A KR 970059759A
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South Korea
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output
pin
dut
group
voltage
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KR1019970000971A
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Korean (ko)
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KR100248918B1 (en
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마사토 나가시마
요시오 나가토
무네노리 오노
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오우라 히로시
가부시키가이샤 아드반테스트
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

다수핀을 갖는 드라이버 IC의 출력 저항을, 고정밀도로, 비교적 고속으로, 비교적 염가로 구성할 수 있는 드라이버 IC의 출력 저항 측정기나 측정 방법을 제공한다. 이를 위해서, DUT의 다수의 출력핀으로부터의 출력 전압을 다수의 입력단자를 갖는 고속 스캐너로 받아서 1대의 전압 측정기로 순차적으로 전압 측정하여 출력저항을 구하도록, 상기 출력핀과 입력 단자 사이에 각각 설치하는 프로그램가능 부하 PL을 출력 전압보다 일정 전압 높은 전압을 설정할 수 있는 임계 전압원 VT1군과 일정 전압 낮은 전압을 설정할 수 있는 임계 전압원 VT2군의 2계통의 전압을 설정하여, 일정 부하 전류를 VT1군에서는 유출하고, VT2군에서는 흡인하는 프로그램가능 부하 PL군을 갖는 구성으로 한다.Provided are an output resistance measuring device and a measuring method of a driver IC which can configure the output resistance of a driver IC having a plurality of pins with high precision, relatively high speed, and relatively low cost. To this end, the output voltage from a plurality of output pins of the DUT is received by a high-speed scanner having a plurality of input terminals, respectively installed between the output pin and the input terminal to obtain the output resistance by measuring the voltage sequentially with one voltage meter The programmable load PL is set to two system voltages: the threshold voltage source VT1 group that can set the voltage higher than the output voltage and the threshold voltage source VT2 group that can set the voltage lower than the constant voltage. It is set as the structure which has the programmable load PL group which flows out and sucks in a VT2 group.

Description

드라이버 IC의 출력 저항 측정기 및 측정 방법Output resistance meter and measuring method of driver IC

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 본 발명의 일실시예의 구성도를 나타내는 도면.1 is a view showing the configuration of an embodiment of the present invention.

Claims (5)

다수 출력핀을 갖는 드라이버 IC인 DUT(10)의 직류 특성을 측정하는 출력 저항 측정기에 있어서, DUT(10)의 각 출력핀 OUTi에 각각 접속하는 입력 단자를 갖는 고속 스캐너(16)와,; 상기 고속 스캐너(16)의 각 입력 단자의 전압을 순차적으로 측정하는 전압측정기(17)와: 상기 DUT(10)의 각 출력핀 OUTi와 상기 고속 스캐너(16)의 각 입력 단자의 사이에 각각 설치되며, 임계 전압이 DUT(10)의 출력 전압보다도 일정 전압 높은 전압을 설정할 수 있는 임계 전압원 VT1군과 일정 전압 낮은 전압을 설정할 수 있는 임계 전압원 VT2군의 2계통의 전압을 설정할 수 있는 프로그램가능 부하 PL(20i)군을 구비하는 것을 특징으로 하는 드라이버 IC의 출력 저항 측정기.An output resistance measuring device for measuring the DC characteristics of the DUT 10, which is a driver IC having a plurality of output pins, comprising: a high speed scanner 16 having an input terminal connected to each output pin OUTi of the DUT 10; A voltage measuring device 17 that sequentially measures the voltage of each input terminal of the high speed scanner 16; and between each output pin OUTi of the DUT 10 and each input terminal of the high speed scanner 16, respectively. Programmable load capable of setting voltages of two systems, the threshold voltage source VT1 group capable of setting a constant voltage higher than the output voltage of the DUT 10 and the threshold voltage source VT2 group capable of setting a constant voltage lower than the output voltage of the DUT 10. An output resistance measuring instrument of a driver IC comprising a PL (20i) group. 제1항에 있어서, 상기 프로그램가능 부하 PL(20i)군은, 임계 전압과 VT1과 VT2가 DUT(10)의 각 출력핀 OUTi의 배열순으로 교대로 배열되어 있는 2계통의 프로그램가능 부하 PL(20i)군인 것을 특징으로 하는 드라이버 IC의 출력 저항 측정기.The programmable load PL (20i) group according to claim 1, wherein the group of programmable loads PL (20i) includes two systems of programmable loads PL (with threshold voltages and VT1 and VT2 alternately arranged in the arrangement order of the respective output pins OUTi of the DUT 10). 20i) group, the output resistance measuring device of the driver IC. 제1항에 있어서, 상기 프로그램가능 부하 PL(20i)군은 정전류원 ILL 및 ILH가 출력 전류가 다른 2계통(ILL1,ILH1과 ILL2, ILH2) 이상인 정전류원을 가지는 있는 것을 특징으로 하는 드라이버 IC의 출력 저항 측정기.The method of claim 1, wherein the programmable load PL (20i) group of the driver IC, characterized in that the constant current source ILL and ILH has a constant current source of at least two systems (ILL1, ILH1 and ILL2, ILH2) with different output currents. Output resistance meter. 다수 출력핀을 갖는 드라이버 IC인 DUT(10)의 직류 특성을 측정하는 출력 저항 측정 방법에 있어서, 임계 전압이 DUT와 출력 전압보다도 일정 전압 높은 VT1을 프로그램가능 부하용으로 설정하는 단계(단계101)와: 임계 전압이 DUT의 출력 전압보다도 일정 전압 낮은 VT2를 프로그램가능 부하용으로 설정하는 단계(단계102)와: 주목핀에 VT1의 PL을 접속하고, 다른 핀에 VT2와 VT1을 임의로 접속하는데, 단 VT1와 총수와 VT2군의 총수를 일치시키며, 이 상태에서 주목핀의 출력 저항을 측정하는 단계(단계103)와; 주목핀에 VT2의 PL을 접속하는, 다른 핀에 VT1와 VT2을 임의로 접속하는데, 단 VT2군의 총수와 VT1군의 총수을 일치시키며, 이 상태에서 주목핀의 출력 저항을 측정하는 단계(단계104)와; 주목핀을 다른 핀에 할당하여 변경하고 상기 단계(103-104)의 측정을 행하며, 이것을 반복하여, 모든 주목핀에 관하여 출력 저항의 측정을 행하는 단계(단계105)와; 상기의 단계에 의해 DUT(10)에 있어서 흡인되는 일정 부하 전류와 유출되는 일정 부하 전류가 동일양인 상태에서 드라이버의 IC의 출력 저항을 측정하는 단계를 포함하는 것을 특징으로 하는 드라이버 IC의 출력 저항 측정 방법.In the output resistance measuring method for measuring the direct current characteristics of the DUT 10, which is a driver IC having a plurality of output pins, setting the threshold voltage VT1 higher than the output voltage and the DUT for a programmable load (step 101). And: setting VT2 for the programmable load with a threshold voltage lower than the output voltage of the DUT for a programmable load (step 102); connecting PL of VT1 to the pin of interest and VT2 and VT1 arbitrarily connected to other pins, Measuring the output resistance of the pin of interest in this state (step 103) to match the total number of VT1 and the total number of the VT2 group; VT1 and VT2 are arbitrarily connected to another pin connecting PL of VT2 to the pin of interest, except that the total number of the VT2 group and the total number of VT1 group are matched, and the output resistance of the pin of interest is measured in this state (step 104). Wow; Assigning the pin of interest to another pin to change it and performing the measurement of steps 103-104, and repeating this to measure output resistance with respect to all of the pins of interest (step 105); Measuring output resistance of the driver IC in a state in which the constant load current sucked in the DUT 10 and the constant load current flowing out by the above steps are equal to each other; Way. 다수 출력핀을 갖는 드라이버 IC인 DUT(10)의 직류 특성을 측정하는 출력 저항 측정 방법에 있어서, 임계 전압이 DUT와 출력 전압보다도 일정 전압 높은 VT1를 DC 측정 유닛에 설정하는 단계(단계201)와; 임계 전압이 DUT의 출력 전압보다도 일정 전압 낮은 VT2를 DC 측정 유닛에 설정하는 단계(단계22)와; 주목핀에 VT1를 접속하고, 다른 핀에 VT2와 VT1을 임의로 접속하는데, 단 VT1군의 총수와 VT2군의 총수를 일치시키며, 이 상태에서 주목핀의 출력 저항을 측정하는 단계(단계203)와; 주목핀에 VT2를 접속하고, 다른 핀에 VT1와 VT2를 임의로 접속하는데, 단, VT2군의 총수와 VT1군의 총수를 일치시키며, 이 상태에서 주목핀의 출력저항을 측정하는 단계(단계204)와; 주목핀을 다른 핀에 할당하여 변경하고 상기 단계(203-204)의 측정을 행하며, 이것을 반복하여, 모든 주목핀에 관해서 출력저항의 측정을 행하는 단계(단계205)와; 상기의 단계에 의해, DUT(10)에 있어서 흡인되는 일정 부하 전류와 유출되는 일정부하 전류가 동일양인 상태에서 드라이버의 IC의 출력 저항을 측정하는 단계를 포함하는 것을 특징으로 하는 드라이버 IC의 출력 저항 측정 방법.In the output resistance measuring method for measuring the direct current characteristics of the DUT 10, which is a driver IC having a plurality of output pins, the method comprising the steps of: setting VT1 in the DC measurement unit with a threshold voltage higher than the DUT and the output voltage by a certain voltage (step 201); ; Setting VT2 in the DC measurement unit whose threshold voltage is lower than the output voltage of the DUT by a constant voltage (step 22); VT1 is connected to the pin of interest, and VT2 and VT1 are arbitrarily connected to the other pin, except that the total number of the VT1 group and the total number of the VT2 group are matched, and in this state, the output resistance of the pin of interest is measured (step 203) and ; VT2 is connected to the pin of interest, and VT1 and VT2 are arbitrarily connected to the other pin, except that the total number of the VT2 group and the total number of the VT1 group are matched, and the output resistance of the pin of interest is measured in this state (step 204). Wow; Assigning the pin of interest to another pin, changing the pin, and performing the measurement of steps 203-204, and repeating this to measure the output resistance of all the pins of interest (step 205); The output resistance of the driver IC comprising the step of measuring the output resistance of the IC of the driver in a state in which the constant load current drawn in the DUT 10 and the constant load current flowing out in the DUT 10 are equal to each other. How to measure. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019970000971A 1996-01-22 1997-01-15 Device and method for measuring output resistance of driver ic KR100248918B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP02732996A JP3638697B2 (en) 1996-01-22 1996-01-22 Driver IC output resistance measuring instrument
JP96-27329 1996-01-22

Publications (2)

Publication Number Publication Date
KR970059759A true KR970059759A (en) 1997-08-12
KR100248918B1 KR100248918B1 (en) 2000-03-15

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KR (1) KR100248918B1 (en)
CN (1) CN1115565C (en)
TW (1) TW315417B (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5046448B2 (en) * 2001-08-10 2012-10-10 株式会社アドバンテスト Semiconductor test apparatus and test method thereof
US6940301B2 (en) * 2003-12-12 2005-09-06 Au Optronics Corporation Test pad array for contact resistance measuring of ACF bonds on a liquid crystal display panel
JP2005265756A (en) * 2004-03-22 2005-09-29 Yokogawa Electric Corp Ic tester
JP4596264B2 (en) * 2005-10-11 2010-12-08 横河電機株式会社 IC tester
JP5028953B2 (en) * 2006-10-25 2012-09-19 横河電機株式会社 IC tester
JP6765125B2 (en) * 2017-09-27 2020-10-07 日本電産リード株式会社 Resistance measuring device, substrate inspection device, and resistance measuring method

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JPH09196998A (en) 1997-07-31
CN1115565C (en) 2003-07-23
JP3638697B2 (en) 2005-04-13
CN1164649A (en) 1997-11-12
KR100248918B1 (en) 2000-03-15
TW315417B (en) 1997-09-11

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