KR970049170A - In-line handler for automated testing - Google Patents
In-line handler for automated testing Download PDFInfo
- Publication number
- KR970049170A KR970049170A KR1019950068129A KR19950068129A KR970049170A KR 970049170 A KR970049170 A KR 970049170A KR 1019950068129 A KR1019950068129 A KR 1019950068129A KR 19950068129 A KR19950068129 A KR 19950068129A KR 970049170 A KR970049170 A KR 970049170A
- Authority
- KR
- South Korea
- Prior art keywords
- line handler
- testing
- package
- automated testing
- unloader
- Prior art date
Links
- 238000007689 inspection Methods 0.000 claims abstract 3
- 238000000034 method Methods 0.000 abstract 2
- 238000004806 packaging method and process Methods 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Abstract
본 발명은 테스트를 위한 자동 핸들러 장치에 관한 것으로, 반도체 패키지의 테스트 공정을 번인→테스트→마킹→패키지 검사→포장의 흐름으로 자동화하여 상기의 일련의 공정을 한 대의 장치에서 모두 진행할 수 있는 자동화 설비를 구현할 수있는 특징을 갖는다.The present invention relates to an automatic handler device for testing, and to automated the test process of the semiconductor package in the flow of burn-in → test → marking → package inspection → packaging, automated equipment that can proceed the above series of processes in one device Has the features to implement.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.
제2도는 본 발명에 의한 테스트 트레이의 이동 흐름을 개략적으로 나타내는 도면,2 is a view schematically showing the flow of movement of a test tray according to the present invention;
제3도는 본 발명에 의한 자동 테스트를 위한 인 라인 장치를 개략적으로 나타내는 도면.3 is a schematic representation of an in-line device for automated testing according to the present invention.
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950068129A KR970049170A (en) | 1995-12-30 | 1995-12-30 | In-line handler for automated testing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950068129A KR970049170A (en) | 1995-12-30 | 1995-12-30 | In-line handler for automated testing |
Publications (1)
Publication Number | Publication Date |
---|---|
KR970049170A true KR970049170A (en) | 1997-07-29 |
Family
ID=66637511
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950068129A KR970049170A (en) | 1995-12-30 | 1995-12-30 | In-line handler for automated testing |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR970049170A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100481297B1 (en) * | 1997-10-27 | 2005-07-07 | 삼성전자주식회사 | Semiconductor packaging system and packaging method |
US9134365B2 (en) | 2012-12-14 | 2015-09-15 | Samsung Electronics Co., Ltd. | System for testing semiconductor modules |
-
1995
- 1995-12-30 KR KR1019950068129A patent/KR970049170A/en not_active Application Discontinuation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100481297B1 (en) * | 1997-10-27 | 2005-07-07 | 삼성전자주식회사 | Semiconductor packaging system and packaging method |
US9134365B2 (en) | 2012-12-14 | 2015-09-15 | Samsung Electronics Co., Ltd. | System for testing semiconductor modules |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WITN | Withdrawal due to no request for examination |