KR960035941A - Scan type photoorganic current analysis device capable of detecting photoorganic currents in samples in non-biased state - Google Patents
Scan type photoorganic current analysis device capable of detecting photoorganic currents in samples in non-biased state Download PDFInfo
- Publication number
- KR960035941A KR960035941A KR1019950005493A KR19950005493A KR960035941A KR 960035941 A KR960035941 A KR 960035941A KR 1019950005493 A KR1019950005493 A KR 1019950005493A KR 19950005493 A KR19950005493 A KR 19950005493A KR 960035941 A KR960035941 A KR 960035941A
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- South Korea
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- current
- photoorganic
- scanning
- laser light
- sample
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
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- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
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- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
이 광유기전류 해석장치에서는, 피측정 시료(6)인 반도체 집적회로 배선의 한쪽 가장자리는, 예를 들면, 접지전위에 접속되어 있고, 그 다른쪽 가장 자리는 전류 업(10)을 끼워서 상기 접지전위와 접속하고 있다.In this photoorganic current analysis device, one edge of the semiconductor integrated circuit wiring, which is the sample 6 to be measured, is connected to, for example, a ground potential, and the other edge thereof is connected to the ground-up current 10 through the ground. It is connected to the potential.
상기 배선상에서 레이져 광이 주사되는 경우,레이져 광이 배선의 열전도가 나쁜부분, 예를 들면, 배선중에 보이드가 있는 부분에 조사되면, 배선중의 온도분포에 국소적인 불균형이 생긴다.When the laser light is scanned on the wiring, when the laser light is irradiated to a portion of the wiring with poor thermal conductivity, for example, a portion having voids in the wiring, a local imbalance occurs in the temperature distribution in the wiring.
이 온도분포의 불균형에 따라, 배선 중에 제이 백 효과에 따라서 자기 발생적인 열기 전력이 생기고 전류가 유기된다.As a result of this temperature distribution imbalance, self-generated thermal power is generated and current is induced in accordance with the J-Back effect during wiring.
이 유기전류가 전류 업(10)에 따라 증폭되고, 화상정보 변환장치(12)에 있어서, 레이져 광의 주사와 동기한 화상정보에 변환되어 출력된다.This induced current is amplified in accordance with the current up 10, and is converted and output by the image information converting apparatus 12 into image information synchronized with the scanning of the laser light.
이 때문에, 피측정 시료(6)에 전류 바이어스를 흘리지 않는 상태에서, 광유기전류를 측정할 수 있기 때문에, 고저항인 피측정 시료(6)에 대해서도, 광유기전류에 대응하는 전류상 이미지가 얻어져, 보이드의 위치를 특별히 정할 수 있다.For this reason, since the photoorganic current can be measured in a state in which no current bias is applied to the sample 6 under test, the current image image corresponding to the photoorganic current also appears in the sample 6 having high resistance. Can be obtained, and the position of the void can be determined in particular.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.
제1도는 이 발명의 제1의 실시예에 의한 주사형 광유기 전류 해석 장치의 개략 블럭도이다. 제2도는 피측정물을 포함하는 제1의 실시예의 주요 부분 계략도이다. 제3도는 제1의 실시예의 동작을 나타낸 개략도이다.(a) 는 레이져의 주사 영역에 대한 피측정물의 단면도. (b)는 레이져 광을 주사했을 때의 전류값의 변화를 나타낸 파형도.(c)는 (d)의 파형도에 기초해서 출력되는 화상 이미지를 나타낸다.1 is a schematic block diagram of a scanning type photoorganic current analyzing apparatus according to a first embodiment of the present invention. 2 is a schematic view of the main part of the first embodiment including an object to be measured. 3 is a schematic view showing the operation of the first embodiment. (A) is a cross-sectional view of the object to be measured with respect to the scanning area of the laser. (b) is a waveform diagram which shows the change of the electric current value at the time of scanning laser light. (c) shows the image image output based on the waveform diagram of (d).
Claims (15)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950005493A KR0169158B1 (en) | 1995-03-16 | 1995-03-16 | Apparatus for analyzing optical beam induced current of sample |
US08/503,567 US5708371A (en) | 1995-03-16 | 1995-07-18 | Scanning photoinduced current analyzer capable of detecting photoinduced current in nonbiased specimen |
JP25093195A JP3649784B2 (en) | 1995-03-16 | 1995-09-28 | Scanning photo-induced current analyzer |
TW084112826A TW279929B (en) | 1995-03-16 | 1995-12-01 | Scanning type photo-induced current analyzer |
DE19609521A DE19609521C2 (en) | 1995-03-16 | 1996-03-11 | Photo-induced current scanning analyzer capable of detecting photo-induced current in non-biased samples |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950005493A KR0169158B1 (en) | 1995-03-16 | 1995-03-16 | Apparatus for analyzing optical beam induced current of sample |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960035941A true KR960035941A (en) | 1996-10-28 |
KR0169158B1 KR0169158B1 (en) | 1999-02-01 |
Family
ID=19409919
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950005493A KR0169158B1 (en) | 1995-03-16 | 1995-03-16 | Apparatus for analyzing optical beam induced current of sample |
Country Status (2)
Country | Link |
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KR (1) | KR0169158B1 (en) |
TW (1) | TW279929B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100711922B1 (en) * | 2005-12-14 | 2007-04-27 | 동부일렉트로닉스 주식회사 | Method for monitoring a void |
-
1995
- 1995-03-16 KR KR1019950005493A patent/KR0169158B1/en not_active IP Right Cessation
- 1995-12-01 TW TW084112826A patent/TW279929B/en active
Also Published As
Publication number | Publication date |
---|---|
KR0169158B1 (en) | 1999-02-01 |
TW279929B (en) | 1996-07-01 |
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