KR960008320A - O.D.D Detector Test Device - Google Patents

O.D.D Detector Test Device Download PDF

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Publication number
KR960008320A
KR960008320A KR1019940021096A KR19940021096A KR960008320A KR 960008320 A KR960008320 A KR 960008320A KR 1019940021096 A KR1019940021096 A KR 1019940021096A KR 19940021096 A KR19940021096 A KR 19940021096A KR 960008320 A KR960008320 A KR 960008320A
Authority
KR
South Korea
Prior art keywords
detector
test device
currents
operator
converting
Prior art date
Application number
KR1019940021096A
Other languages
Korean (ko)
Other versions
KR960013748B1 (en
Inventor
신준섭
Original Assignee
김주용
현대전자산업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
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Application filed by 김주용, 현대전자산업 주식회사 filed Critical 김주용
Priority to KR1019940021096A priority Critical patent/KR960013748B1/en
Publication of KR960008320A publication Critical patent/KR960008320A/en
Application granted granted Critical
Publication of KR960013748B1 publication Critical patent/KR960013748B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/22—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-emitting devices, e.g. LED, optocouplers

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

1. 발명이 속하는 기술분야1. Field of invention

검파기를 검사하는 오. 디. 디(ODD)Oh check the detector. D. (ODD)

2. 발명이 해결하려고하는 기술적 과제2. The technical problem that the invention is trying to solve

종래에는 오. 디. 디 조립시 단품 상태로 테스트하지 않고 조립된 후에 플래시 및 보조회로를 이용하여 테스트함으로써 검파기와 보조회로간의 접속이 용이하지 않아 작업자로하여금 검파기의 데이타값을 정확하게 얻기 어려운점을 해결하고자 하는 것임.Oh conventionally. D. It is intended to solve the problem that the data value of the detector cannot be obtained accurately because the connection between the detector and the auxiliary circuit is not easy by testing by using the flash and the auxiliary circuit after being assembled without testing in the state of single unit.

3. 발명이 해결하려는 기술적 요지3. The technical gist of the invention

디지탈 팬널미터기내의 검파기 각각에 4개의 전압을 동시에 표시되게하여 작업자가 검파기의 데이타값을 정확하게 측정할 수 있도록 제1도와 같은 오. 디. 디 검파기 테스트장치를 제공하는 것이다.As shown in Figure 1, four voltages are displayed on each detector in the digital panel meter so that the operator can accurately measure the data values of the detector. D. To provide a detector test device.

Description

오.디.디 검파기테스트 장치O.D.D Detector Test Device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 본 발명의 오.디.디 검파기테스트 회로도1 is an O.D. detector test circuit diagram of the present invention.

Claims (3)

검파기를 검사하는 오.디.디(ODD)에 있어서, 레이저 다이오드로부터 발생된 광원을 4분할 조사하는 4분할 검파기(10)와, 조사된 4개의 전류를 출력하는 코넥터(20)와, 코넥터로부터 출력된 4개의 전류를 변환시키는 전류, 전압 변환수단(30)과, 변환된 4개의 전압을 검파기에 각각 입력시켜 작업자로하여금 검파기의 테이타값을 정확하게 측정할 수 있도록 디지탈팬널 미터기수단(40)으로 구성함을 특징으로 하는 오.디.디 검파기테스트 장치.In the O.D.D (ODD) for inspecting a detector, a quadrature detector 10 for dividing a light source generated from a laser diode into four quadrants, a connector 20 for outputting four irradiated currents, and a connector The current and voltage converting means 30 for converting four output currents, and the four converted voltages are respectively input to the detector so that the operator can accurately measure the data of the detector. O.D.D detector test device characterized in that the configuration. 제1항에 있어서, 상기 전류, 전압 변환수단(30)은 4분할 검파기에서 조사된 4개의 전류를 10mv에서 40mv의 전압으로 각각 변환시키는 적어도 4개이상의 증폭기(Amp1∼Amp4)로 구성됨을 특징으로하는 오.디.디 검파기 테스트 장치.According to claim 1, wherein the current, voltage conversion means 30 is composed of at least four amplifiers (Amp 1 ~ Amp 4 ) for converting the four currents irradiated by the four-segment detector from 10mv to 40mv respectively. Featuring an O.D.D detector test device. 제1항에 있어서, 상기 디지탈팬널 미터기수단(40)은 작업자로하여금 검파기의 데이타값을 정확하게 측정할 수 있도록 적어도 4개이상의 검파기(1∼4)로 구성됨을 특징으로하는 오.디.디 검파기 테스트장치.The O.D.D detector according to claim 1, characterized in that the digital panel meter means (40) comprises at least four detectors (1 to 4) so that an operator can accurately measure the data value of the detector. Test equipment. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019940021096A 1994-08-25 1994-08-25 O.d.d. tester KR960013748B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019940021096A KR960013748B1 (en) 1994-08-25 1994-08-25 O.d.d. tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019940021096A KR960013748B1 (en) 1994-08-25 1994-08-25 O.d.d. tester

Publications (2)

Publication Number Publication Date
KR960008320A true KR960008320A (en) 1996-03-22
KR960013748B1 KR960013748B1 (en) 1996-10-10

Family

ID=19391170

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940021096A KR960013748B1 (en) 1994-08-25 1994-08-25 O.d.d. tester

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KR (1) KR960013748B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19901922B4 (en) * 1998-01-20 2004-06-03 Mirae Corp., Chunan Device for loading / unloading a modular IC into or out of a socket of a handle for modular ICs

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19901922B4 (en) * 1998-01-20 2004-06-03 Mirae Corp., Chunan Device for loading / unloading a modular IC into or out of a socket of a handle for modular ICs

Also Published As

Publication number Publication date
KR960013748B1 (en) 1996-10-10

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