CN116413539A - Photoelectric coupler test system - Google Patents
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
A optocoupler test system comprising: control unit and test current generation unit, wherein: the control unit is suitable for outputting a control signal to the test current generating unit; the test current generation unit is suitable for receiving the control signal, generating a test current corresponding to the control signal and outputting the test current to the photoelectric coupler to be tested; the control signal is used for indicating the waveform and/or the current amplitude of the test current. According to the scheme, the test of the photoelectric coupler can be realized under the condition that no optical signal is input.
Description
Technical Field
The invention relates to the technical field of photoelectricity, in particular to a photoelectric coupler testing system.
Background
The photoelectric coupler is generally composed of a light emitting device, a photoelectric detector, a signal receiving amplifying and outputting control circuit and the like. The light emitting device is typically an infrared light emitting diode (IR LED), the photodetector is typically a photodiode, and the signal receiving amplification and output control circuit is typically composed of a transimpedance amplifier, a comparator, and an output stage circuit. Light emitted from the light emitting device is irradiated onto the photodiode, and the photodiode converts the light signal into an electrical signal.
In general, the photoelectric detector, the signal receiving amplifying and output control circuit are integrated on the same chip and then integrated with the light emitting device in a packaging mode, namely, the photoelectric coupler of the packaged finished product comprises the light emitting device, but the photoelectric coupler chip does not comprise the light emitting device.
Under the condition of no light emitting device, namely under the condition of no optical signal input, the test of the photoelectric coupler cannot be realized.
Disclosure of Invention
The embodiment of the invention solves the problem of realizing the test of the photoelectric coupler under the condition of no optical signal input.
In order to solve the above technical problems, an embodiment of the present invention provides a testing system for an optoelectronic coupler, including: control unit and test current generation unit, wherein: the control unit is suitable for outputting a control signal to the test current generating unit; the test current generation unit is suitable for receiving the control signal, generating a test current corresponding to the control signal and outputting the test current to the photoelectric coupler to be tested; the control signal is used for indicating the waveform and/or the current amplitude of the test current.
Optionally, the control signal includes: an enable signal and an amplitude adjustment signal; the test current generation unit includes: an amplitude input port and an enable port; wherein the enable port inputs the enable signal; the amplitude input port inputs the amplitude adjustment signal; the current amplitude of the test current is determined by the amplitude adjustment signal.
Optionally, the optocoupler test system further includes: the first end of the variable resistor is coupled with the amplitude input port, the second end of the variable resistor is grounded, and the control end of the variable resistor inputs the amplitude adjustment signal; the current amplitude of the test current is related to the resistance of the variable resistor.
Optionally, the optocoupler test system further includes: the first end of the waveform adjusting unit is coupled with the enabling port, the second end of the waveform adjusting unit is grounded, and the first end of the waveform adjusting unit outputs a waveform adjusting signal; the waveform of the test current is related to the waveform adjustment signal.
Optionally, when the enable signal is a low level signal, the test current generating unit stops working.
Optionally, the test current is a direct current or a pulse current.
Optionally, the photocoupler includes: a differential transimpedance amplification unit, a first photodiode, and a second photodiode, wherein: the anode of the first photodiode is coupled with the first input end of the differential transimpedance amplifying unit, and the cathode of the first photodiode is connected with a first power supply voltage; the anode of the second photodiode is coupled with the second input end of the differential transimpedance amplifying unit, and the cathode of the second photodiode is connected with the first power supply voltage; the differential transimpedance amplifying unit has a first output end outputting a first current and a second output end outputting a second current; the first current is generated by the first photodiode and the second current is generated by the second photodiode.
Optionally, the optocoupler test system further includes: and the power supply testing unit is suitable for testing the first power supply voltage and the second power supply voltage output by the linear voltage stabilizing source in the photoelectric coupler to be tested.
Optionally, the power supply test unit includes: a second follower, a second inverter, a nand gate, an or gate, a level shift circuit, a first switching unit, and a second switching unit, wherein: the second follower is provided with an input end for inputting an enabling signal, and an output end of the second follower is coupled with the first input end of the NAND gate circuit; the second inverter has an input end for inputting the enable signal and an output end coupled with the first input end of the OR gate; the second input end of the NAND gate circuit inputs a power supply test signal, and the output end of the NAND gate circuit outputs a first test enabling signal; the second input end of the OR gate circuit inputs the power supply test signal, and the output end of the OR gate circuit is coupled with the input end of the level shift circuit; the output end of the level shift circuit outputs a second test enabling signal; the first switch unit is provided with a first end for inputting the first power supply voltage, a control end for inputting the first test enabling signal and a second end coupled with the output end of the power supply test unit; the first end of the second switch unit inputs the second power supply voltage, the control end of the second switch unit inputs the second test enabling signal, and the second end of the second switch unit is coupled with the output end of the power supply test unit.
Compared with the prior art, the technical scheme of the embodiment of the invention has the following beneficial effects:
and generating and outputting a control signal through the control unit, generating corresponding test current according to the received control signal by the test current generating unit, and testing the photoelectric coupler to be tested through the test current. The waveform and/or the current amplitude of the test current are indicated by the control signal, so that the current generated in the working process of the photoelectric detector is simulated, the problem that the test cannot be performed due to no optical signal input can be effectively solved, and the circuit structure is simple.
Further, the photoelectric coupler testing system further comprises a power supply testing unit, and the power supply output by the linear voltage stabilizing source of the photoelectric coupler is tested, so that the power supply reliability test of the photoelectric coupler is realized.
Drawings
FIG. 1 is a schematic diagram of a circuit configuration of a photo-coupler according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a testing system for an optocoupler according to an embodiment of the invention;
FIG. 3 is a schematic circuit diagram of a test current generating unit according to an embodiment of the present invention;
fig. 4 is a schematic circuit diagram of a power test unit according to an embodiment of the invention.
Detailed Description
Under the condition of no light emitting device, namely under the condition of no optical signal input, the test of the photoelectric coupler cannot be realized.
In the embodiment of the invention, the control unit generates and outputs the control signal, the test current generating unit generates the corresponding test current according to the received control signal, and the photoelectric coupler to be tested is tested through the test current. The waveform and/or the current amplitude of the test current are indicated by the control signal, so that the current generated in the working process of the photoelectric detector is simulated, the problem that the test cannot be performed due to no optical signal input can be effectively solved, and the circuit structure is simple.
In order to make the above objects, features and advantages of the present invention more comprehensible, embodiments accompanied with figures are described in detail below.
The embodiment of the invention provides a photoelectric coupler testing system which is used for testing a photoelectric coupler. Referring to fig. 1, a schematic diagram of a part of a circuit structure of an optocoupler according to an embodiment of the present invention is given. The above-described partial circuit configuration means that the circuit configuration shown in fig. 1 is only a partial circuit configuration of the photocoupler.
In a specific implementation, the optocoupler may include: a differential transimpedance amplification unit, a first photodiode PD-D, and a second photodiode PD-L, wherein:
the positive electrode of the first photodiode PD-D is coupled with the first input end of the differential transimpedance amplifier, and the negative electrode of the first photodiode PD-D is connected with a first power supply voltage VDD_L;
the anode of the second photodiode PD-L is coupled with the first input end of the differential transimpedance amplifier, and the cathode of the second photodiode PD-L is connected with the first power supply voltage VDD_L;
the first input end of the differential transimpedance amplifier is coupled with the positive electrode of the first photodiode PD-D, the second input end of the differential transimpedance amplifier is coupled with the positive electrode of the second photodiode PD-L, the first output end of the differential transimpedance amplifier outputs a first current, and the second output end of the differential transimpedance amplifier outputs a second current, wherein: the first current is generated by the first photodiode PD-D and the second current is generated by the second photodiode PD-L.
In an embodiment, when the photo-coupler is in use, if the second photodiode PD-L is irradiated by light emitted by the light emitting device (e.g., infrared LED), the second current generated by the second photodiode PD-L includes a photocurrent and a second dark current.
The first photodiode PD-D is a reference photodiode, which cannot receive light emitted from the light emitting device, so it does not generate photocurrent. Thus, the current generated by the first photodiode PD-D is the first dark current.
In particular applications, the first photodiode PD-D may be encapsulated in a light-tight structure. For example, the top of the first photodiode PD-D may be covered with thick aluminum. It will be appreciated that the particular arrangement of the first photodiode PD-D is not limited to the example described above in which the top is covered by thick aluminium. Other forms of disposing the first photodiode PD-D are also possible, and will not be described here.
In a specific implementation, when the photocoupler is in a working state, the first output end of the differential transimpedance amplifying unit outputs a first dark current, and the second output end outputs a second dark current and a photocurrent. The two output terminals of the differential transimpedance amplifying unit may be respectively coupled to two input terminals of a differential amplifier through which the second dark current in the second current is canceled by the first dark current. The specific working principle of the optocoupler is known to those skilled in the art from the prior art and will not be explained here.
In a specific implementation, the light emitting device is in an off state when the optocoupler is tested. To Test the optocoupler, a Test current (TIA Test as shown in fig. 1) needs to be input to the second input terminal of the differential transimpedance amplifying unit to simulate the photocurrent signal generated by the second photodiode PD-L when in an operating state.
In a specific implementation, the differential transimpedance operational amplification unit may be composed of a resistor, an NPN triode, a current source, a capacitor, and the like.
Specifically, as shown in fig. 1, the differential transimpedance operational amplification unit may include a resistor R1, a resistor R2, a resistor R3, a resistor R4, a transistor N1, a transistor N2, a transistor N3, a transistor N4, a transistor N5, a transistor N6, a current source I1, a current source I2, a current source I3, a current source I4, and the like. The differential transimpedance operational amplification unit may further include two gain resistors R5 and R6. In addition, the differential transimpedance operational amplification unit further comprises a capacitor C1 and a capacitor C2, and the capacitor C1 and the capacitor C2 play a role in compensating loop stability.
Specifically, the circuit structure of each component in the differential transimpedance operational amplification unit may refer to fig. 1.
Those skilled in the art will appreciate that the circuit configuration of the transimpedance operational amplification unit shown in fig. 1 is merely one specific implementation, and is used as an exemplary illustration in the embodiments of the present invention. In practical applications, there may be transimpedance operational amplification units of other circuit structures. The photoelectric coupler in the embodiment of the invention can also use a transimpedance operational amplification unit with other circuit structures.
That is, the specific circuit structure of the transimpedance operational amplifier unit does not affect the protection of the embodiment of the present invention.
In an embodiment of the present invention, the photo coupler test system may include a control unit 11 and a test current generation unit 12. Referring to fig. 2, a schematic structural diagram of a testing system for an optical coupler according to an embodiment of the present invention is provided. The following description is made with reference to fig. 1 and 2.
In a specific implementation, the control unit 11 may be adapted to output a control signal to the test current generating unit 12;
the test current generating unit 12 may be adapted to receive the control signal, generate a test current corresponding to the control signal and output to the photocoupler to be tested.
In the embodiment of the invention, the waveform of the test current, the current amplitude of the test current or both the waveform of the test current and the current amplitude of the test current can be controlled by the control signal.
In an implementation, the control signal may include an enable signal and an amplitude adjustment signal, where the enable signal and the amplitude adjustment signal may be two signals that are independent of each other. Accordingly, the test current generating unit 12 may include two input ports: amplitude input port and enable port, wherein: the amplitude input port may input an amplitude adjustment signal and the enable port may input an enable signal. The current amplitude of the test current may be determined by the amplitude adjustment signal.
In particular, the optocoupler test system may include a variable resistor. A first terminal of the variable resistor may be coupled to the amplitude input port of the test current generating unit 12, a second terminal of the variable resistor is grounded, and a control terminal of the variable resistor inputs an amplitude adjustment signal. And adjusting the resistance value of the variable resistor through the amplitude adjustment signal, and further adjusting the current amplitude of the test current.
In implementations, the variable resistor may be a sliding varistor, or other device capable of changing the resistance.
The optocoupler test system may further comprise an ammeter a. And displaying the current amplitude of the corresponding test current after the resistance value of the variable resistor is adjusted through the ammeter A.
In a specific implementation, the optocoupler test system may further comprise a waveform adjustment unit 13. A first end of the waveform adjusting unit 13 is coupled with an enabling port of the test current generating unit 12, and outputs a waveform adjusting signal; the second terminal of the waveform adjusting unit 13 is grounded. The waveform of the test current is correlated with the waveform adjustment signal.
The waveform adjusting signal may be a dc signal, and correspondingly, the test current may be a dc current, that is, the waveform of the test current is a dc waveform. The waveform adjusting signal may be a pulse signal, and correspondingly, the test current may be a pulse current, that is, the waveform of the test current is a pulse waveform.
In a specific implementation, when the enable signal is at a low level, the test current generating unit 12 may be in an off state, enter a low power consumption mode, and consume little quiescent current.
The working principle of the photoelectric coupler test system is described below.
In performing the test, the control unit 11 may be coupled to the test current generating unit 12 through two test PADs (PADs), respectively: test PAD1 and Test PAD2.Test PAD1 circumscribes the slide rheostat. The slide rheostat is connected in series with the ammeter A, so that the wanted current amplitude can be obtained.
The Test PAD2 is low (i.e., the enable signal is low or no enable signal) in the non-Test state, so that the Test current generating unit 12 can be in the off state, enter the low power mode, and consume almost no quiescent current.
When the Test PAD2 is high (i.e., the enable signal is a high signal), the Test current generating unit 12 is enabled. The amplitude adjustment signal is used for adjusting the sliding rheostat, so that the current amplitude adjustment of the test current is realized.
When the signal output by the waveform adjusting unit 13 is a dc signal and the Test PAD2 is at a high level (i.e., the enable signal is a high level signal), the current amplitude of the Test current is adjusted by adjusting the resistance value of the slide rheostat, so as to realize the Test of the operational characteristics inside the photocoupler, including the threshold value of the input current, the hysteresis characteristics of the input current, and the like.
When the signal output from the waveform adjusting unit 13 is a pulse signal, the enable signal is modulated into a pulse signal. Accordingly, the test current generated by the test current generating unit 12 is a pulse signal of the same frequency, and the dynamic characteristics of the photocoupler can be tested and verified, including the response time of input and output, the output rise time (tr), the output fall time (tf), and the like.
In a specific implementation, referring to fig. 3, a schematic circuit structure of a test current generating unit 12 in an embodiment of the present invention is given.
In fig. 3, the test current generating unit 12 may include a first follower FO1, a first inverter INV1, a seventh resistor R7, an eighth resistor R8, and MOS transistors M1 to M11, wherein: MOS tubes M1 to M6 are PMOS tubes, and MOS tubes M7 to M11 are NMOS tubes.
Specifically, the connection relationship between the components may correspond to fig. 3.
In summary, the control unit generates and outputs a control signal, and the test current generating unit 12 generates a corresponding test current according to the received control signal, and tests the photoelectric coupler to be tested through the test current. The waveform and/or the current amplitude of the test current are indicated by the control signal, so that the current generated in the working process of the photoelectric detector is simulated, the problem that the test cannot be performed due to no optical signal input can be effectively solved, and the circuit structure is simple
In a specific implementation, the testing system of the photoelectric coupler can also test the linear voltage stabilizing source in the photoelectric coupler so as to test whether the linear voltage stabilizing source in the photoelectric coupler can normally output voltage with corresponding value.
In a specific application, the linear voltage stabilizing source inside the photocoupler can output a first power voltage and a second power voltage, wherein the first power voltage is different from the second power voltage. In particular, the first supply voltage may be a voltage difference relative to ground, which may be generally characterized by vdd_l; the second supply voltage may be a voltage difference relative to the supply voltage powering the optocoupler, and may typically be vdd_h.
In a specific implementation, the optocoupler test system may implement a test of the first supply voltage and the second supply voltage.
Referring to fig. 4, a schematic circuit structure of a power supply test unit according to an embodiment of the present invention is shown. The power test unit includes a second follower FO2, a second inverter INV2, a NAND gate NAND, an OR gate OR, a level shift circuit 40, a first switching unit, and a second switching unit, wherein:
an input terminal of the second follower FO2 may input an enable signal, and an output terminal of the second follower FO2 may be coupled with the NAND gate NAND first input terminal;
an input end of the second inverter INV2 may input an enable signal, and an output end of the second inverter INV2 may be coupled to a first input end of the OR circuit OR;
a first input end of the NAND gate circuit NAND inputs an enable signal, a second input end of the NAND gate circuit NAND inputs a power supply test signal, and an output end of the NAND gate circuit NAND outputs a first test enable signal VDD_L_EN;
the first input end of the OR circuit inputs an enable signal, the second input end of the OR circuit inputs a power supply test signal, and the output end of the OR circuit is coupled with the input end of the level shift circuit 40;
the output terminal of the level shift circuit 40 outputs a second test enable signal vdd_h_en; level shifting the signal output from the OR output of the OR circuit by the level shifting circuit 40;
the first end of the first switch unit inputs a first power supply voltage VDD_L, the control end of the first switch unit inputs a first test enable signal VDD_L_EN, and the second end of the first switch unit is coupled with the output end of the power supply test unit;
the first end of the second switch unit inputs a second power voltage VDD_H, the control end of the second switch unit inputs a second test enable signal VDD_H_EN, and the second end of the second switch unit is coupled with the output end of the power test unit.
In an implementation, the second follower FO2, the second inverter INV2, the NAND gate NAND, OR the OR gate OR may be powered by the first power supply voltage.
In an implementation, a Test PAD for inputting an enable signal may be provided in the optocoupler Test system, where the Test PAD is coupled to the input of the second follower FO2 and the input of the second inverter INV2, such as Test PAD3 in fig. 4.
In the optocoupler test system, another test PAD is set, which is used for inputting a power supply test signal. The Test PAD may be coupled to both the second input of the OR gate OR, the second input of the NAND gate NAND, as v_test PAD4 in fig. 4.
The output terminal of the NAND gate circuit NAND outputs the first test enable signal vdd_l_en, and the output terminal of the level shift circuit 40 outputs the second test enable signal vdd_h_en. The output voltage of the OR circuit OR is raised from the first power supply voltage vdd_l to the second power supply voltage vdd_h by the level shift circuit 40.
The first switch unit may be a PMOS tube MP1, where: the source electrode of the PMOS tube MP1 is input with a first power supply voltage VDD_L, the control end of the PMOS tube MP1 can be input with a first test enabling signal VDD_L_EN, and the drain electrode of the PMOS tube MP1 is coupled with the output end of the power supply test unit;
the second switch unit may also be a PMOS MP2, where: the source of the PMOS transistor MP2 is input with the second power supply voltage vdd_h, the control terminal of the PMOS transistor MP2 may input the second test enable signal vdd_h_en, and the drain of the PMOS transistor MP2 is coupled to the output terminal of the power supply test unit.
In a specific implementation, a test PAD may be further configured in the optocoupler test unit, and the test PAD is configured to receive a test signal output by an output end of the power supply test unit. Specifically, the PAD may be a v_test PAD shown in fig. 4.
In a specific application, the voltage on the v_test PAD will change under the combined action of the enable signal and the power Test signal. If the linear voltage stabilizing source of the photoelectric coupler works normally, the voltage on the V_Test PAD is switched between the first power supply voltage and the second power supply voltage.
In a specific implementation, a current limiting resistor can be further arranged between the power supply Test unit and the V_test PAD, and the current limiting resistor mainly plays a role in protecting a port of the V_test PAD.
The operation principle of the power supply test unit provided in the above embodiment of the present invention will be described below.
When the Test PAD3 is suspended or the Test PAD3 inputs a low-level signal (i.e., the enable signal is in a low-level state), the Test function of the power Test unit is in an off state. Typically, a pull-down resistor may be added between Test PAD3 and ground, so that in the default state Test PAD3 inputs a low level signal. When the Test PAD3 inputs a high-level signal (i.e., the enable signal is in a high-level state), the Test function of the power Test unit is turned on.
When the Test PAD3 inputs a high level signal and the Test PAD4 inputs a high level signal (i.e., the power supply Test signal is a high level signal), the first Test enable signal vdd_l_en is a low level signal and the second Test enable signal vdd_h_en is a high level signal. At this time, the PMOS transistor M1 is turned on, and the signal output on the v_test PAD is the first power supply voltage vdd_l. And measuring whether the voltage value of the first power supply voltage VDD_L is equal to a first theoretical voltage value (such as 5V) by using a voltmeter or other instruments. If the voltage value of the first power supply voltage VDD_L is larger than the first theoretical voltage value, determining that the linear voltage stabilizing source of the photoelectric coupler has faults.
When the Test PAD3 inputs a high level signal and the Test PAD4 inputs a low level signal (i.e., the power supply Test signal is a low level signal), the first Test enable signal vdd_l_en is a high level signal and the second Test enable signal vdd_h_en is a low level signal. At this time, the PMOS transistor M2 is turned on, and the signal output on the v_test PAD is the second power supply voltage vdd_d. And measuring whether the voltage value of the second power supply voltage VDD_D is equal to a second theoretical voltage value (e.g. 12V) by using a voltmeter or other instruments. If the voltage value of the second power supply voltage VDD_D is larger than the second theoretical voltage value, determining that the linear voltage stabilizing source of the photoelectric coupler has faults.
It is to be understood that the specific values of the first theoretical voltage value and the second theoretical voltage value are only exemplary, and the corresponding first theoretical voltage value and the second theoretical voltage value may be other values for different photo-couplers.
Therefore, the power supply test unit provided by the embodiment of the invention can test the linear voltage stabilizing source inside the photoelectric coupler.
Although the present invention is disclosed above, the present invention is not limited thereto. Various changes and modifications may be made by one skilled in the art without departing from the spirit and scope of the invention, and the scope of the invention should be assessed accordingly to that of the appended claims.
Claims (10)
1. A optocoupler test system, comprising: control unit and test current generation unit, wherein:
the control unit is suitable for outputting a control signal to the test current generating unit;
the test current generation unit is suitable for receiving the control signal, generating a test current corresponding to the control signal and outputting the test current to the photoelectric coupler to be tested; the control signal is used for indicating the waveform and/or the current amplitude of the test current.
2. The optocoupler test system of claim 1, wherein the control signal comprises: an enable signal and an amplitude adjustment signal;
the test current generation unit includes: an amplitude input port and an enable port; the enabling port inputs the enabling signal, the amplitude input port inputs the amplitude adjustment signal, and the current amplitude of the test current is determined by the amplitude adjustment signal.
3. The optocoupler test system of claim 2, further comprising: the first end of the variable resistor is coupled with the amplitude input port, the second end of the variable resistor is grounded, and the control end of the variable resistor inputs the amplitude adjustment signal; the current amplitude of the test current is related to the resistance of the variable resistor.
4. The optocoupler test system of claim 2, further comprising: the first end of the waveform adjusting unit is coupled with the enabling port, the second end of the waveform adjusting unit is grounded, and the first end of the waveform adjusting unit outputs a waveform adjusting signal; the waveform of the test current is related to the waveform adjustment signal.
5. The optocoupler test system of claim 2, wherein the test current generation unit stops operating when the enable signal is a low level signal.
6. The optocoupler test system of claim 1, wherein the test current is a direct current or a pulsed current.
7. The optocoupler test system of claim 1, wherein the optocoupler comprises: a differential transimpedance amplification unit, a first photodiode, and a second photodiode, wherein:
the anode of the first photodiode is coupled with the first input end of the differential transimpedance amplifying unit, and the cathode of the first photodiode is connected with a first power supply voltage;
the anode of the second photodiode is coupled with the second input end of the differential transimpedance amplifying unit, and the cathode of the second photodiode is connected with the first power supply voltage;
the differential transimpedance amplifying unit has a first output end outputting a first current and a second output end outputting a second current; the first current is generated by the first photodiode and the second current is generated by the second photodiode.
8. The optocoupler test system of claim 7, wherein the test current is input to a second input of the differential transimpedance amplification unit.
9. The optocoupler test system of claim 1, further comprising: and the power supply testing unit is suitable for testing the first power supply voltage and the second power supply voltage output by the linear voltage stabilizing source in the photoelectric coupler to be tested.
10. The optocoupler test system of claim 9, wherein the power supply test unit comprises: a second follower, a second inverter, a nand gate, an or gate, a level shift circuit, a first switching unit, and a second switching unit, wherein:
the second follower is provided with an input end for inputting an enabling signal, and an output end of the second follower is coupled with the first input end of the NAND gate circuit;
the second inverter has an input end for inputting the enable signal and an output end coupled with the first input end of the OR gate;
the second input end of the NAND gate circuit inputs a power supply test signal, and the output end of the NAND gate circuit outputs a first test enabling signal;
the second input end of the OR gate circuit inputs the power supply test signal, and the output end of the OR gate circuit is coupled with the input end of the level shift circuit;
the output end of the level shift circuit outputs a second test enabling signal;
the first switch unit is provided with a first end for inputting the first power supply voltage, a control end for inputting the first test enabling signal and a second end coupled with the output end of the power supply test unit;
the first end of the second switch unit inputs the second power supply voltage, the control end of the second switch unit inputs the second test enabling signal, and the second end of the second switch unit is coupled with the output end of the power supply test unit.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202310281764.1A CN116413539A (en) | 2023-03-20 | 2023-03-20 | Photoelectric coupler test system |
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| CN202310281764.1A CN116413539A (en) | 2023-03-20 | 2023-03-20 | Photoelectric coupler test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116930671A (en) * | 2023-09-19 | 2023-10-24 | 成都光创联科技有限公司 | Circuit and method for testing performance of current-driven optical device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116930671A (en) * | 2023-09-19 | 2023-10-24 | 成都光创联科技有限公司 | Circuit and method for testing performance of current-driven optical device |
| CN116930671B (en) * | 2023-09-19 | 2023-11-21 | 成都光创联科技有限公司 | Circuit and method for testing performance of current-driven optical device |
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