CN116930671B - Circuit and method for testing performance of current-driven optical device - Google Patents
Circuit and method for testing performance of current-driven optical device Download PDFInfo
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- CN116930671B CN116930671B CN202311206737.4A CN202311206737A CN116930671B CN 116930671 B CN116930671 B CN 116930671B CN 202311206737 A CN202311206737 A CN 202311206737A CN 116930671 B CN116930671 B CN 116930671B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
Abstract
The invention relates to a circuit and a method for testing performance of a current driven optical device, comprising the following steps: the micro control unit outputs an enabling control signal to the current driving unit; the current driving unit outputs test current to the load interface according to the enabling control signal; the current monitoring unit collects the test current output by the current driving unit and feeds back the monitoring current corresponding to the test current to the micro control unit; the micro control unit compares the enabling control signal with the monitoring current, and when the enabling control signal is not matched with the monitoring current, the enabling control signal is calibrated until the enabling control signal is matched with the monitoring current. According to the invention, the precision of the actually output test current is improved by monitoring the test current output to the load interface in a closed loop manner, so that the accurate current performance test is performed on the optical device connected to the load interface.
Description
Technical Field
The invention relates to the technical field of performance test, in particular to a circuit and a method for testing performance of a current-driven optical device.
Background
When a device, such as an optical device, is designed, performance test needs to be performed together with an optical module produced by a client, often because when debugging and performance test of the optical module are performed simultaneously, an abnormality cannot be immediately located from an optical device part or an optical module part, which results in a long verification period, and more time is required for combining and disassembling the optical device and the optical module.
In addition, the current driving current of the current commonly used light-supplying device adopts a specially integrated high-speed current source in a chip or a current driving built by an operational amplifier and a triode, the schemes are mainly used by clients for producing the light module, a manufacturer of the light module mainly comprises an automatic power control loop (APC), the stability of the output light power is focused, the driving current of the light-supplying device (LD) can be regulated in real time through the feedback of a monitoring back light diode (MPD), the requirement on the precision of the driving current is not high, and only the linearity of the driving current and the output light power is focused. As shown in fig. 4, there are differences and nonlinearities between the current output from the high-speed chip and the actual driving current of the optical device. Therefore, the driving current output during testing the optical device has the problems of low precision and nonlinearity, and the testing result of the optical device is inaccurate.
Disclosure of Invention
The invention aims to improve the precision of the actually output test current by monitoring the test current output to a load interface in a closed loop manner, so that the optical device connected at the load interface is subjected to accurate current performance test, and provides a circuit and a method for testing the performance of a current-driven optical device.
In order to solve the problems of difference and nonlinearity between the current output by the high-speed chip and the actual driving current of the optical device, the embodiment of the invention provides the following technical scheme:
a circuit for testing the performance of current-driven optical device is composed of current driving unit, current monitor unit, micro-control unit and load interface,
the output end of the micro control unit is connected with the input end of the current driving unit and is used for outputting an enabling control signal to the current driving unit; the input end of the micro control unit is connected with the output end of the current monitoring unit and is used for receiving the monitoring current sent by the current monitoring unit, and when the enabling control signal is not matched with the monitoring current, the enabling control signal is calibrated;
the output end of the current driving unit is connected with the load interface and is used for outputting corresponding test current to the load interface according to the enabling control signal sent by the micro control unit;
the input end of the current monitoring unit is connected with the output end of the current driving unit and is used for monitoring the test current output by the current driving unit and feeding back the corresponding monitoring current to the micro-control unit.
In the above scheme, the current monitoring unit is not directly connected with the load interface (connected optical device), unlike the mode of using MPD backlight to monitor LD optical power in the traditional technology, the output of the current driving unit can be greatly improved by the 10-bit DAC of the micro control unit, the current is sampled by the 14-bit ADC of the current monitoring unit, the current precision can be improved, the current monitoring is closed-loop, the current output is open-loop, the output current can be calibrated in real time, and therefore the purposes that the test current output by the current driving unit is equal to the actual test current of the load interface or the deviation is smaller are achieved, and the current performance test of the optical device can be accurately performed.
The current driving unit comprises a current driving chip, and the current driving chip comprises a first assignment pin, a second assignment pin and a current output pin;
the micro control unit outputs enabling control signals to a first assignment pin and a second assignment pin of the current driving chip in a register address assignment mode; and the current output pin is respectively connected with the current monitoring unit and the load interface.
In the above scheme, the micro control unit obtains the address of the current driving chip U1 through IIC communication (ic0_sda pin, ic0_scl pin), assigns a value to the register address of the current driving chip U1, which is equivalent to an enable control signal output by the micro control unit to the current driving unit, so as to control the current driving chip U1 to output a test current with a corresponding magnitude, and the control mode is simple without excessive circuit structures.
The current monitoring unit comprises a sampling resistor, a first capacitor and a current monitoring chip, and the current monitoring chip comprises a first input pin, a second output pin and a monitoring current output pin;
the first end of the sampling resistor is respectively connected with the current output pin of the current driving chip and the first input pin of the current monitoring chip, and the second end of the sampling resistor is respectively connected with the second output pin of the current monitoring chip and the load interface;
the first end of the first capacitor is connected with the first end of the sampling resistor, and the second end of the first capacitor is connected with the second end of the sampling resistor;
and a monitoring current output pin of the current monitoring chip is connected with the input end of the micro-control unit.
In the above scheme, the current sampling range can be adjusted by changing the resistance value of the sampling resistor.
The load interface is connected with the optical device.
In the scheme, after the design and development of the optical device are carried out, the current performance test can be carried out without being installed on an optical module produced by a client, so that the performance test period of the optical device is shortened, and the delivery efficiency of an optical device product is improved.
The method for testing the performance of the current-driven optical device is applied to any circuit, and comprises the following steps:
the micro control unit outputs an enabling control signal to the current driving unit;
the current driving unit outputs test current to the load interface according to the enabling control signal;
the current monitoring unit collects the test current output by the current driving unit and feeds back the monitoring current corresponding to the test current to the micro control unit;
the micro control unit compares the enabling control signal with the monitoring current, and when the enabling control signal is not matched with the monitoring current, the enabling control signal is calibrated until the enabling control signal is matched with the monitoring current.
The step of outputting an enabling control signal to the current driving unit by the micro control unit comprises the following steps: the microcontroller outputs an enabling control signal to the current driving unit in a register address assignment mode.
The step that the current driving unit outputs test current to the load interface according to the enabling control signal comprises the following steps:
the test current output by the current driving unit to the load interface is as follows:
i is a test current output by the current driving unit to the load interface; the IDAC is used for assigning a register address of the current driving unit to the micro control unit, wherein the IDAC is less than or equal to 1024; a is a first current control parameter, and the value is 1 or 1/2; b is a second current control parameter, and the value is 0 or 128.
In the above scheme, the test current is initially required to be output by the current driving unit, and the register address of the current driving unit is assigned through the iC0_SDA pin and the iC0_SCL pin of the micro control unit, namely the value of IDAC is changed, so that the control of the test current is realized.
The current monitoring unit collects the test current output by the current driving unit and feeds back the monitoring current corresponding to the test current to the micro control unit, and the method comprises the following steps:
the current monitoring unit collects test current output by the current driving unit through the sampling resistor;
the monitoring current sent by the current monitoring unit to the micro control unit is as follows:
wherein Im is the monitoring current sent by the current monitoring unit to the micro control unit; IADC is an ADC conversion value output by the current monitoring unit and is related to the magnitude of the test current acquired by the sampling resistor; gain is Gain, and the values are 20, 50 and 100; r1 is the resistance of the sampling resistor.
In the scheme, the current monitoring unit collects the test current output by the current driving unit through the sampling resistor, and after internal conversion, the monitoring current corresponding to the test current is fed back to the micro-control unit, namely the IADC value is changed according to the collected test current, so that the accurate monitoring of the test current is completed.
The micro control unit compares the enabling control signal with the monitoring current, and when the enabling control signal is not matched with the monitoring current, the step of calibrating the enabling control signal comprises the following steps:
after the micro control unit calibrates the enabling control signal, the current at the output end of the current driving unit is as follows:
the method comprises the steps that (1) Iout is a test current output by a current driving unit to a load interface after a micro control unit calibrates an enabling control signal; c is a second order slope, D is a first order slope, E is an intercept, all determined by a micro control unit.
In the scheme, when the micro control unit compares the enabling control signal with the monitoring current, the value of C, D, E is changed to calibrate the test current output by the current driving unit, meanwhile, the current monitoring unit collects the test current in real time and feeds back the monitoring current to the micro control unit until the test current output by the current driving unit to the load interface is accurate, and therefore accuracy of current performance test of the optical device is guaranteed.
The enabling control signal is matched with the monitoring current, namely, the absolute value of the difference value between the testing current corresponding to the enabling control signal and the monitoring current is in a preset range;
or, the absolute value of the difference value between the test current corresponding to the enabling control signal and the monitoring current is in a preset range after the test current is subjected to x-time gain;
or, the absolute value of the difference value of the test current and the monitor current corresponding to the enable control signal after the y-time gain is within a preset range.
Compared with the prior art, the invention has the beneficial effects that:
the scheme adopts a current mode for output, the output current is controlled by a micro control unit through the output of a 10-bit DAC, and the accuracy can reach 0.125mA; the 14-bit ADC is adopted to monitor the sampling current, and the current precision can reach uA level; and the output of the driving current (test current) is calibrated in real time through current monitoring, the output process is compensated in real time, which is equivalent to open-loop output of the current, and the current monitoring is closed-loop monitoring, so that the whole circuit structure of the scheme is simple, the area of the performance test board can be reduced, and the design cost and the whole power consumption are reduced.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a block diagram of a circuit unit of the present invention;
FIG. 2 is a schematic circuit diagram of the present invention;
FIG. 3 is a flow chart of the method of the present invention;
fig. 4 is a schematic diagram showing the difference and nonlinearity between the current output by the prior art high-speed chip and the actual driving current of the optical device.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by a person skilled in the art without making any inventive effort, are intended to be within the scope of the present invention.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures. Also, in the description of the present invention, the terms "first," "second," and the like are used merely to distinguish one from another, and are not to be construed as indicating or implying a relative importance or implying any actual such relationship or order between such entities or operations. In addition, the terms "connected," "coupled," and the like may be used to denote a direct connection between elements, or an indirect connection via other elements.
Example 1:
the invention is realized by the following technical scheme, as shown in fig. 1, a circuit for testing the performance of a current driven optical device comprises a current driving unit, a current monitoring unit, a micro control unit and a load interface, wherein the output end of the micro control unit is connected with the input end of the current driving unit, the output end of the current driving unit is respectively connected with the input end of the current monitoring unit and the load interface, and the output end of the current monitoring unit is connected with the input end of the micro control unit.
The micro control unit is used for outputting an enabling control signal to the current driving unit; the current driving unit is used for outputting corresponding test current to the load interface according to the enabling control signal sent by the micro control unit; the current monitoring unit is used for monitoring the test current output by the current driving unit and feeding back the corresponding monitoring current to the micro control unit; the micro control unit compares the enabling control signal with the monitoring current, and when the enabling control signal is not matched with the monitoring current, the enabling control signal is calibrated until the enabling control signal is matched with the monitoring current.
In detail, referring to fig. 2, the current driving unit includes a current driving chip U1, a ferrite bead FB2, a resistor R3, a resistor R4, a resistor R5, a resistor R6, a resistor R7, a capacitor C4, a capacitor C5, a capacitor C6, and a capacitor C7; the VDD pin of the current driving chip U1 is respectively connected with the first end of the capacitor C4, the first end of the capacitor C6 and the first end of the ferrite bead FB1, and the second end of the ferrite bead FB1 is connected with an external 1.8V power supply; the VCC pin of the current driving chip U1 is respectively connected with the first end of the capacitor C5, the first end of the capacitor C7 and the first end of the ferrite bead FB2, and the second end of the ferrite bead FB2 is connected with an external 3.3V power supply; the second end of the capacitor C4, the second end of the capacitor C5, the second end of the capacitor C6 and the second end of the capacitor C7 are all grounded. The ferrite beads FB1 and FB2 are used for inhibiting high-frequency noise and peak interference of a signal or power line, and have the capacity of absorbing electrostatic pulses, so that ripple waves are reduced.
The DIS_LD pin of the current driving chip U1 is respectively connected with the first end of the resistor R3 and the LD_EN pin of the micro control unit, the SDA pin (first assignment pin) of the current driving chip U1 is respectively connected with the first end of the resistor R4 and the IC0_SDA pin of the micro control unit, the SCL pin (second assignment pin) of the current driving chip U1 is respectively connected with one end of the resistor R5 and the IC0_SCL pin of the micro control unit, and the second end of the resistor R4, the second end of the resistor R5 and the second end of the resistor R6 are all grounded.
The SDA pin and the SCL pin of the current driving chip U1 are respectively connected with the interface J2 and can be used for connecting external devices. The MON pin of the current driving chip U1 is connected with the first end of the resistor R6, and the second end of the resistor R6 is grounded. The pin A0 of the current driving chip U1 is connected with the first end of the resistor R7, and the second end of the resistor R7 is grounded. The resistor R3 is used for enabling control over the DIS_LD pin of the current driving chip U1, and output abnormality caused by unstable state in the power-on process is prevented. The resistor R4 and the resistor R5 are IIC communication pull-up resistors. The J2 interface is a PIN needle, so that the signal quality of the IIC can be conveniently tested. The resistor R7 is used for selecting the address of the current driving chip U2, and different resistance addresses are different.
The current monitoring unit comprises a current monitoring chip U2, a sampling resistor R1, a resistor R2, a capacitor C1, a capacitor C2 and a capacitor C3; the first end of the sampling resistor R1 is respectively connected with an LD pin (current output pin) of the current driving chip U1 and an IN+ pin (first input pin) of the current monitoring chip U2; the second end of the sampling resistor R1 is respectively connected with an IN-pin (second input pin) of the current monitoring chip U2 and the load interface J1. The first end of the capacitor C1 is connected with the first end of the sampling resistor R1, and the second end of the capacitor C1 is connected with the second end of the sampling resistor R1. The capacitor C1 mainly plays a role in transient response, and is connected with the sampling resistor R1 in parallel to form a low-pass filter. The resistance of the sampling resistor R1 is controlled by the sampling precision and range.
The OUT pin of the current monitoring chip U2 is connected with the first end of a resistor R2, the second end of the resistor R2 is respectively connected with the first end of a capacitor C2 and the LD-ADC pin of the microcontroller, and the second end of the capacitor C2 is grounded. The VS pin of the current monitoring chip U2 is connected with the first end of the onion C3, and the second end of the capacitor C3 is grounded. The capacitor C3, the capacitor C4, the capacitor C5, the capacitor C6, the capacitor C7, the capacitor C8 and the capacitor C9 function as decoupling filtering. The resistor R2 and the capacitor C2 filter the ADC signal output by the OUT pin of the current monitoring chip U2.
The load interface J1 is connected with the optical device LD and can also be connected with PD, EA, TEC-, TEC+ and RTH.
Based on the above circuit, please refer to fig. 3, the present disclosure proposes a method for testing performance of a current driven optical device, which includes the following steps:
step 1, the micro control unit outputs an enabling control signal to the current driving unit.
The micro control unit obtains the address of the current driving chip U1 through IIC communication (an IC0_SDA pin and an IC0_SCL pin), assigns a value to the register address of the current driving chip U1, and is equivalent to an enabling control signal output by the micro control unit to the current driving unit so as to control the current driving chip U1 to output test current with corresponding size.
And 2, the current driving unit outputs test current to the load interface according to the enabling control signal.
The current driving chip U1 outputs test current with corresponding magnitude according to assignment of the micro control unit to the register address:
i is a test current output by the current driving chip U1 to the load interface J1; the IDAC is used for assigning a value to a register address of the current driving chip U1 by the micro control unit, wherein the IDAC is less than or equal to 1024; a is a first current control parameter, and the value is 1 or 1/2; b is a second current control parameter, and the value is 0 or 128, so that the range of the test current I is 0-256 mA and the output is adjustable.
And step 3, the current monitoring unit collects the test current output by the current driving unit and feeds back the monitoring current corresponding to the test current to the micro-control unit.
The current monitoring chip U2 collects the test current I output by the current driving unit U1 through the sampling resistor R1, and after internal conversion of the current monitoring chip U2, the monitoring current corresponding to the test current I is output to the micro control unit:
wherein Im is the monitoring current sent by the current monitoring chip U2 to the micro control unit; IADC is an ADC conversion value corresponding to the test current I by the current monitoring chip U2 and is related to the test current I acquired by the sampling resistor R1; gain is Gain, and the values are 20, 50 and 100; r1 is the resistance of the sampling resistor.
And 4, comparing the enabling control signal with the monitoring current by the micro control unit, and calibrating the enabling control signal when the enabling control signal is not matched with the monitoring current until the enabling control signal is matched with the monitoring current.
The enabling control signal is matched with the monitoring current, namely, the absolute value of the difference value between the testing current corresponding to the enabling control signal and the monitoring current is in a preset range; or, the absolute value of the difference value between the test current corresponding to the enabling control signal and the monitoring current is in a preset range after the test current is subjected to x-time gain; or, the absolute value of the difference value of the test current and the monitor current corresponding to the enable control signal after the y-time gain is within a preset range.
If the enabling control signal is not matched with the monitoring current, the micro control unit calibrates the enabling control signal, and the current at the output end of the calibrated current driving chip U1 is as follows:
the output end of the load interface J1 is connected with the current driving chip U1 through an LD pin of the output end of the load interface J1; c is a second order slope, D is a first order slope, E is an intercept, and C, D, E are determined by the micro control unit.
In the prior art, the driving current of the common light-supplying device in the background technology is driven by a specially integrated high-speed current source in a chip or a current built by an operational amplifier and a triode alone. The scheme adopts a current mode for output, the output current is controlled by a micro control unit through the output of a 10-bit DAC, and the accuracy can reach 0.125mA; the 14-bit ADC is adopted to monitor the sampling current, and the current precision can reach uA level; and the output of the driving current (test current) is calibrated in real time through current monitoring, the output process is compensated in real time, which is equivalent to open-loop output of the current, and the current monitoring is closed-loop monitoring, so that the whole circuit structure of the scheme is simple, the area of the performance test board can be reduced, and the design cost and the whole power consumption are reduced.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (6)
1. A method for performance testing of a current driven optical device, comprising: the device comprises a current driving unit, a current monitoring unit, a micro control unit and a load interface; the method comprises the following steps:
the micro control unit outputs an enabling control signal to the current driving unit;
the step of outputting an enabling control signal to the current driving unit by the micro control unit comprises the following steps: the microcontroller outputs an enabling control signal to the current driving unit in a register address assignment mode;
the current driving unit outputs test current to the load interface according to the enabling control signal;
the step that the current driving unit outputs test current to the load interface according to the enabling control signal comprises the following steps:
the test current output by the current driving unit to the load interface is as follows:
i is a test current output by the current driving unit to the load interface; the IDAC is used for assigning a register address of the current driving unit to the micro control unit, wherein the IDAC is less than or equal to 1024; a is a first current control parameter, and the value is 1 or 1/2; b is a second current control parameter, and the value is 0 or 128;
the current monitoring unit collects the test current output by the current driving unit and feeds back the monitoring current corresponding to the test current to the micro control unit;
the current monitoring unit collects the test current output by the current driving unit and feeds back the monitoring current corresponding to the test current to the micro control unit, and the method comprises the following steps:
the current monitoring unit collects test current output by the current driving unit through the sampling resistor;
the monitoring current sent by the current monitoring unit to the micro control unit is as follows:
wherein Im is the monitoring current sent by the current monitoring unit to the micro control unit; IADC is an ADC conversion value output by the current monitoring unit and is related to the magnitude of the test current acquired by the sampling resistor; gain is Gain, and the values are 20, 50 and 100; r1 is the resistance of the sampling resistor;
the micro control unit compares the enabling control signal with the monitoring current, and when the enabling control signal is not matched with the monitoring current, the enabling control signal is calibrated until the enabling control signal is matched with the monitoring current;
the micro control unit compares the enabling control signal with the monitoring current, and when the enabling control signal is not matched with the monitoring current, the step of calibrating the enabling control signal comprises the following steps:
after the micro control unit calibrates the enabling control signal, the current at the output end of the current driving unit is as follows:
the method comprises the steps that (1) Iout is a test current output by a current driving unit to a load interface after a micro control unit calibrates an enabling control signal; c is a second-order slope, D is a first-order slope, E is an intercept, and all the slopes are determined by the micro control unit after calibration.
2. A method for current driven optical device performance testing according to claim 1, wherein: the enabling control signal is matched with the monitoring current, namely, the absolute value of the difference value between the testing current corresponding to the enabling control signal and the monitoring current is in a preset range;
or, the absolute value of the difference value between the test current corresponding to the enabling control signal and the monitoring current is in a preset range after the test current is subjected to x-time gain;
or, the absolute value of the difference value of the test current and the monitor current corresponding to the enable control signal after the y-time gain is within a preset range.
3. A circuit for performance testing of a current driven optical device implementing the method of claim 1 or 2, characterized by: comprises a current driving unit, a current monitoring unit, a micro-control unit and a load interface, wherein,
the output end of the micro control unit is connected with the input end of the current driving unit and is used for outputting an enabling control signal to the current driving unit; the input end of the micro control unit is connected with the output end of the current monitoring unit and is used for receiving the monitoring current sent by the current monitoring unit, and when the enabling control signal is not matched with the monitoring current, the enabling control signal is calibrated;
the output end of the current driving unit is connected with the load interface and is used for outputting corresponding test current to the load interface according to the enabling control signal sent by the micro control unit;
the input end of the current monitoring unit is connected with the output end of the current driving unit and is used for monitoring the test current output by the current driving unit and feeding back the corresponding monitoring current to the micro-control unit.
4. A circuit for current-driven optical device performance testing according to claim 3, wherein: the current driving unit comprises a current driving chip, and the current driving chip comprises a first assignment pin, a second assignment pin and a current output pin;
the micro control unit outputs enabling control signals to a first assignment pin and a second assignment pin of the current driving chip in a register address assignment mode; and the current output pin is respectively connected with the current monitoring unit and the load interface.
5. A circuit for current-driven optical device performance testing according to claim 4, wherein: the current monitoring unit comprises a sampling resistor, a first capacitor and a current monitoring chip, and the current monitoring chip comprises a first input pin, a second output pin and a monitoring current output pin;
the first end of the sampling resistor is respectively connected with the current output pin of the current driving chip and the first input pin of the current monitoring chip, and the second end of the sampling resistor is respectively connected with the second output pin of the current monitoring chip and the load interface;
the first end of the first capacitor is connected with the first end of the sampling resistor, and the second end of the first capacitor is connected with the second end of the sampling resistor;
and a monitoring current output pin of the current monitoring chip is connected with the input end of the micro-control unit.
6. A circuit for current-driven optical device performance testing according to claim 3, wherein: the load interface is connected with the optical device.
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