KR960024768A - 생산 제어용 정보 시스템 - Google Patents

생산 제어용 정보 시스템

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Publication number
KR960024768A
KR960024768A KR1019940060995A KR19950060995A KR960024768A KR 960024768 A KR960024768 A KR 960024768A KR 1019940060995 A KR1019940060995 A KR 1019940060995A KR 19950060995 A KR19950060995 A KR 19950060995A KR 960024768 A KR960024768 A KR 960024768A
Authority
KR
South Korea
Prior art keywords
test
information system
data
message
receiving station
Prior art date
Application number
KR1019940060995A
Other languages
English (en)
Inventor
사마하 모우스타파
Original Assignee
볼프강 자우어
도이취 아이티티 인더스트리스 게젤샤프트 미트 베쉬랭크터 하프퉁
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 볼프강 자우어, 도이취 아이티티 인더스트리스 게젤샤프트 미트 베쉬랭크터 하프퉁 filed Critical 볼프강 자우어
Publication of KR960024768A publication Critical patent/KR960024768A/ko

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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/31—From computer integrated manufacturing till monitoring
    • G05B2219/31323—Database for CIM
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/31—From computer integrated manufacturing till monitoring
    • G05B2219/31365—Send message to most appropriate operator as function of kind of error
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32182—If state of tool, product deviates from standard, adjust system, feedback
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32196—Store audit, history of inspection, control and workpiece data into database
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32207—Action upon failure value, send warning, caution message to terminal
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32209—Stop production line
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/33—Director till display
    • G05B2219/33209—Protocol, mailbox, email, mail system
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/50—Machine tool, machine tool null till machine tool work handling
    • G05B2219/50197—Signature analysis, store working conditions, compare with actual
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Automation & Control Theory (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • General Factory Administration (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Numerical Control (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

특정 생산 데이타나 조립 데이타를 모으고 상기 데이타를 데이타 베이스(2)로 전송하는 장치(1)를 포함하며 특히 반도체 모놀리식 집적회로를 조립하는 동안에 빠른 생산 제어를 위한 정보 시스템, 분석 설비(3)는 데이타 베이스(2)에 접속되고 저장된 데이타(d)는 다수의 프로그램 테스트 프로파일에 의해 분석된다. 만약 테스트 프로파일이 소정의 한계를 초과한다면 전자 메시지(m1,m2,m3)는 각 테스트 프로파일에 할당된 수진국(5,6,7)중 적어도 한 수신국으로 전자 우편 시스템을 통해 즉시 보내지고 테스트 절차나 조립 과정에 대한 점검을 개시화시킨다.

Description

생산 제어용 정보 시스템
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
도면은 정보 시스템의 블럭도.

Claims (4)

  1. 특정 생산 데이타나 조립 데이타를 모아 상기 데이타를 데이타 베이스(2)로 전송하는 장치(1)와, 상기 데이타를 분석하는 분석 장치(3)를 포함하며, 특히 반도체 모놀리식 집적 회로를 조립하는 동안에 빠른 생산제어를 위한 정보 시스템에 있어서, 데이타 베이스(2)에 저장된 데이타는 다수의 프로그램 테스트 프로파일에 의해서 분석 장치(3)에서 분석되고, 만약 상기 테스트 프로파일이 소정의 한계를 넘어섰다면 메세지(m1,m1,m3)는 전자 우편 시스템을 통해서 현재 및/또는 후의 생산 작동에 있어서 각각의 테스트 절차, 작업 절차 혹은 처리에 대한 점검을 개시화 시키기 위해서 각각 테스트 프로파일에 할당된 수신국(5,6,7)중 적어도 한 수신국에 즉시 전송되는 것을 특징으로 하는 생산 제어용 정보 시스템.
  2. 제1항에 있어서, 제1수신국(5)에 대한 제1메시지(m1)는 최종 테스트 부분에서 즉시 점검을 개시화시키는 것을 특징으로 하는 정보 시스템.
  3. 제1항에 있어서, 제2수신국에 대응하는 제2메시지(m2)는 예비 및/또는 중간 테스트 부분 그리고/또는 생산 부분에 있어서 즉시 점검을 개시화시키는 것을 특징으로 하는 정보 시스템.
  4. 제1항 내지 제3항 중 어느 한 항에 있어서, 제3수신국에 대한 제3메시지(m3)는 각각의 테스트 프로그램 그리고/또는 테스트 프로파일을 응답하는 엔지니어링 부분에서 즉시 점검을 개시화시키는 것을 특징으로 하는 정보 시스템.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019940060995A 1994-12-28 1995-12-28 생산 제어용 정보 시스템 KR960024768A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DEP4446966.7 1994-12-28
DE4446966A DE4446966A1 (de) 1994-12-28 1994-12-28 Informationssystem zur Produktionskontrolle

Publications (1)

Publication Number Publication Date
KR960024768A true KR960024768A (ko) 1996-07-20

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ID=6537355

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (5)

Country Link
US (1) US5787021A (ko)
EP (1) EP0720074B1 (ko)
JP (1) JPH08235265A (ko)
KR (1) KR960024768A (ko)
DE (2) DE4446966A1 (ko)

Families Citing this family (57)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5896292A (en) * 1995-06-05 1999-04-20 Canon Kabushiki Kaisha Automated system for production facility
DE29610058U1 (de) * 1996-06-07 1996-08-29 Schimitzek, Peter, Dr., 52511 Geilenkirchen Anordnung zur Integration von betriebswirtschaftlichen heterogenen Kennwerterfassungseinheiten von für die Gütererstellung benötigten Kenngrößen und zur Steuerung der Gütererstellung
DE19633602A1 (de) * 1996-08-21 1998-02-26 Ghh Borsig Turbomaschinen Gmbh Verfahren zur ferngesteuerten Inbetriebnahme von Maschinenanlagen, insbesondere Verdichtern und Turbinen
US6038517A (en) * 1997-01-03 2000-03-14 Ncr Corporation Computer system and method for dynamically assessing the market readiness of a product under development
US5978751A (en) * 1997-02-25 1999-11-02 International Business Machines Corporation Variegated manufacturing process test method and apparatus
US6526326B2 (en) 1997-03-31 2003-02-25 Hitachi, Ltd. Fraction defective estimating method and system for estimating an assembly fraction defective of an article
US6108586A (en) 1997-03-31 2000-08-22 Hitachi, Ltd. Fraction defective estimating method, system for carrying out the same and recording medium
KR100216066B1 (ko) * 1997-05-20 1999-08-16 윤종용 반도체 집적회로 소자 검사공정 제어 시스템 및 제어방법
EP0932194A1 (en) * 1997-12-30 1999-07-28 International Business Machines Corporation Method and system for semiconductor wafer fabrication process real-time in-situ interactive supervision
EP0932195A1 (en) * 1997-12-30 1999-07-28 International Business Machines Corporation Method and system for semiconductor wafer fabrication process real-time in-situ supervision
US6175812B1 (en) * 1998-02-26 2001-01-16 Micron Technology, Inc. Method and system for dynamic duration burn-in
US6446021B1 (en) * 1998-02-27 2002-09-03 Micron Technology, Inc. Method and apparatus to display processing parameter
JPH11260931A (ja) 1998-03-15 1999-09-24 Toshiba Microelectronics Corp 半導体集積回路装置の市場故障率推定方法、半導体集積回路装置の製造方法及びテスト用半導体集積回路装置
US6301515B1 (en) * 1998-04-07 2001-10-09 Tmmm, Ltd. System for establishing optimal critical characteristics of manufactured products
WO1999067067A1 (fr) * 1998-06-23 1999-12-29 Sony Corporation Robot et systeme de traitement d'information
US6366824B1 (en) * 1998-09-30 2002-04-02 Advanced Micro Devices, Inc. Manufacturing reference database
US7069101B1 (en) 1999-07-29 2006-06-27 Applied Materials, Inc. Computer integrated manufacturing techniques
JP2002117107A (ja) * 1999-09-02 2002-04-19 Ricoh Co Ltd 生産管理システム、生産管理システムにおけるクライアント、生産管理システムにおける生産管理方法、生産管理システムにおけるデータ検索方法、およびその方法を実行させるためのプログラムを記録したコンピュータが読取可能な記録媒体
JP3732053B2 (ja) 1999-09-27 2006-01-05 株式会社日立製作所 製造職場の不良の起こし易さ評価方法及びその装置、製品の組立作業不良率評価方法及びその装置並びに記録媒体
KR100583154B1 (ko) * 1999-10-30 2006-05-24 주식회사 하이닉스반도체 반도체 장비서버의 프로그램 소스 및 헤더 파일 정의방법
KR100533968B1 (ko) * 1999-10-30 2005-12-07 주식회사 하이닉스반도체 반도체 라인 관리용 통합 자동화 시스템에서 서버사이의 통신 테스트 시스템
US6640151B1 (en) 1999-12-22 2003-10-28 Applied Materials, Inc. Multi-tool control system, method and medium
US6708074B1 (en) 2000-08-11 2004-03-16 Applied Materials, Inc. Generic interface builder
US7188142B2 (en) 2000-11-30 2007-03-06 Applied Materials, Inc. Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility
US6675129B1 (en) 2000-12-28 2004-01-06 General Electric Company Internet based supplier process reliability system
US7101799B2 (en) 2001-06-19 2006-09-05 Applied Materials, Inc. Feedforward and feedback control for conditioning of chemical mechanical polishing pad
US7698012B2 (en) 2001-06-19 2010-04-13 Applied Materials, Inc. Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
US6913938B2 (en) 2001-06-19 2005-07-05 Applied Materials, Inc. Feedback control of plasma-enhanced chemical vapor deposition processes
US7160739B2 (en) 2001-06-19 2007-01-09 Applied Materials, Inc. Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
US6910947B2 (en) 2001-06-19 2005-06-28 Applied Materials, Inc. Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life
US7201936B2 (en) 2001-06-19 2007-04-10 Applied Materials, Inc. Method of feedback control of sub-atmospheric chemical vapor deposition processes
US7082345B2 (en) 2001-06-19 2006-07-25 Applied Materials, Inc. Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities
US7337019B2 (en) 2001-07-16 2008-02-26 Applied Materials, Inc. Integration of fault detection with run-to-run control
US6586265B2 (en) * 2001-07-26 2003-07-01 Promos Technologies Inc. Method and apparatus of tool matching for a semiconductor manufacturing process
US6950716B2 (en) * 2001-08-13 2005-09-27 Applied Materials, Inc. Dynamic control of wafer processing paths in semiconductor manufacturing processes
US6549864B1 (en) 2001-08-13 2003-04-15 General Electric Company Multivariate statistical process analysis systems and methods for the production of melt polycarbonate
US6984198B2 (en) 2001-08-14 2006-01-10 Applied Materials, Inc. Experiment management system, method and medium
US20030199112A1 (en) 2002-03-22 2003-10-23 Applied Materials, Inc. Copper wiring module control
US6672716B2 (en) * 2002-04-29 2004-01-06 Xerox Corporation Multiple portion solid ink stick
US6999836B2 (en) 2002-08-01 2006-02-14 Applied Materials, Inc. Method, system, and medium for handling misrepresentative metrology data within an advanced process control system
US6845278B2 (en) 2002-08-07 2005-01-18 Kimberly-Clark Worldwide, Inc. Product attribute data mining in connection with a web converting manufacturing process
CN1720490B (zh) 2002-11-15 2010-12-08 应用材料有限公司 用于控制具有多变量输入参数的制造工艺的方法和系统
TWI284846B (en) * 2002-12-24 2007-08-01 Powerchip Semiconductor Corp Semiconductor automation system for a daily check and method thereof
US7333871B2 (en) 2003-01-21 2008-02-19 Applied Materials, Inc. Automated design and execution of experiments with integrated model creation for semiconductor manufacturing tools
US7205228B2 (en) 2003-06-03 2007-04-17 Applied Materials, Inc. Selective metal encapsulation schemes
US7354332B2 (en) 2003-08-04 2008-04-08 Applied Materials, Inc. Technique for process-qualifying a semiconductor manufacturing tool using metrology data
US20050096782A1 (en) * 2003-10-30 2005-05-05 T-Chun Chen Automated sorter system and method thereof
US6904370B1 (en) 2003-12-30 2005-06-07 Compliance Software Solutions Corp. System, method, and computer-readable medium for collection of environmental data and generation of user report for compliance with FDA requirements
US7356377B2 (en) 2004-01-29 2008-04-08 Applied Materials, Inc. System, method, and medium for monitoring performance of an advanced process control system
US6961626B1 (en) 2004-05-28 2005-11-01 Applied Materials, Inc Dynamic offset and feedback threshold
US7096085B2 (en) 2004-05-28 2006-08-22 Applied Materials Process control by distinguishing a white noise component of a process variance
JP2005345201A (ja) * 2004-06-01 2005-12-15 Denso Corp 走行軌跡表示装置及びプログラム
US7657339B1 (en) 2005-10-14 2010-02-02 GlobalFoundries, Inc. Product-related feedback for process control
US7454312B2 (en) 2006-03-15 2008-11-18 Applied Materials, Inc. Tool health information monitoring and tool performance analysis in semiconductor processing
CN105955235A (zh) * 2016-05-19 2016-09-21 株洲中车时代电气股份有限公司 一种列车网络控制系统的测试方法、装置及系统
US10505931B2 (en) 2017-06-02 2019-12-10 Nxp B.V. Method for authenticating an integrated circuit device
WO2019170243A1 (de) * 2018-03-08 2019-09-12 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zur qualitätssicherung und/oder zur qualitätsverbesserung

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1166509B (it) * 1982-06-01 1987-05-06 British American Tobacco Co Perfezionamenti relativi a macchine per la fabbricazione di sigarette
US4593369A (en) * 1983-01-12 1986-06-03 Adolph Coors Company Monitoring system for a container testing machine
US4858102A (en) * 1985-07-19 1989-08-15 El Paso Technologies Company Distributed logic control system and method
JPH01106111A (ja) * 1987-10-19 1989-04-24 Fuji Photo Film Co Ltd シーケンス監視方法
US4819176A (en) * 1987-02-06 1989-04-04 Treasure Isle, Inc. Process control and data collection system
JPH0616475B2 (ja) * 1987-04-03 1994-03-02 三菱電機株式会社 物品の製造システム及び物品の製造方法
US4939665A (en) * 1988-07-14 1990-07-03 Adolph Coors Company Monitor and control assembly for use with a can end press
JP2559847B2 (ja) * 1989-04-27 1996-12-04 日産自動車株式会社 生産ラインの管理方法
US5086397A (en) * 1989-07-18 1992-02-04 Schuster Pamela K Method and apparatus for data collection of testing and inspection of products made on a production assembly line
US5134574A (en) * 1990-02-27 1992-07-28 The Foxboro Company Performance control apparatus and method in a processing plant
US5161110A (en) * 1990-02-27 1992-11-03 Atlantic Richfield Company Hierarchical process control system and method
US5245704A (en) * 1990-03-22 1993-09-14 Square D Company System for sharing data between microprocessor based devices
US5339257A (en) * 1991-05-15 1994-08-16 Automated Technology Associates Inc. Real-time statistical process monitoring system
US5284164A (en) * 1991-11-07 1994-02-08 Brown & Williamson Tobacco Corporation Method for improving the quality of products produced in the cigarette manufacturing process
US5355320A (en) * 1992-03-06 1994-10-11 Vlsi Technology, Inc. System for controlling an integrated product process for semiconductor wafers and packages
WO1993025945A1 (en) * 1992-06-12 1993-12-23 The Dow Chemical Company Stealth interface for process control computers
DE4230790A1 (de) * 1992-09-15 1994-03-17 Deutsche Aerospace Verfahren zur Überwachung mehrerer technischer Anlagen
US5311759A (en) * 1992-12-14 1994-05-17 Ford Motor Company Method and system for real-time statistical process monitoring
JPH07141005A (ja) * 1993-06-21 1995-06-02 Hitachi Ltd 半導体集積回路装置の製造方法および製造装置
US5416725A (en) * 1993-08-18 1995-05-16 P.C. Sentry, Inc. Computer-based notification system having redundant sensor alarm determination and associated computer-implemented method for issuing notification of events
US5408405A (en) * 1993-09-20 1995-04-18 Texas Instruments Incorporated Multi-variable statistical process controller for discrete manufacturing
US5442562A (en) * 1993-12-10 1995-08-15 Eastman Kodak Company Method of controlling a manufacturing process using multivariate analysis
US5440478A (en) * 1994-02-22 1995-08-08 Mercer Forge Company Process control method for improving manufacturing operations

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JPH08235265A (ja) 1996-09-13
EP0720074B1 (de) 1998-08-26
DE4446966A1 (de) 1996-07-04
US5787021A (en) 1998-07-28
DE59503335D1 (de) 1998-10-01
EP0720074A1 (de) 1996-07-03

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