KR960024509A

KR960024509A - Defect inspection method of liquid crystal display device

Info

Publication number: KR960024509A
Application number: KR1019940035576A
Authority: KR
Inventors: 송인덕
Original assignee: 구자홍; Lg 전자 주식회사
Priority date: 1994-12-21
Filing date: 1994-12-21
Publication date: 1996-07-20
Also published as: KR100294682B1

Abstract

본 발명은 액정표시소자의 결함 검사방법에 관한 것으로서 보다 상세하게는 패널의 온/오프검사시 포인트결함을 보다 효과적으로 검출하는데 적당하도록 한 것이다.The present invention relates to a defect inspection method of a liquid crystal display device, and more particularly, to be suitable for more effectively detecting point defects during on / off inspection of a panel.

특징적인 구성으로는 박막 트랜지스터의 게이트와 소오스를 각각 홀수게이트와 짝수게이트 및 홀수소오스와 짝수소오스로 나누고 상기 홀수게이트와 짝수게이트 및 홀수소오스와 짝수소오스, 공통전극 각각에 액정표시 소자에 인가되는 신호를 동시에 인가하여 각 신호라인의 단선과 단락, 화이트점 결함을 검사하는 제1과정과, 상기 제1과정에서 나누어진 홀수게이트와 짝수게이트 및 공통전극에 동시에 신호를 인가하고 홀수소오스와 짝수소오스를 공통전극에 단락시킨 후 저장 캐패시터부분의 수직단락 점 결함을 검출하는 제2과정과, 상기 홀수게이트와 짝수게이트 및 홀수소오스와 공통전극 각각에 동시에 신호를 인가하고 짝수소오스를 공통전극에 단락시켜 소오스라인과 화소, 화소와 화소간 수평단락 점 결함을 검출하는 제3과정과, 상기 홀수게이트와 짝수게이트 및 짝수소오스와 공통전극 각각에 동시에 신호를 인가하고 홀수소오스를 공통전극에 단락시켜 소오스라인과 화소, 화소와 화소간 수평단락 점 결함을 검출하는 제4과정을 포함하여 상기 제작된 액정표시소자의 결함을 검출하는 과정으로 이루어짐에 있다.A characteristic configuration is a signal applied to a liquid crystal display by dividing a gate and a source of a thin film transistor into an odd gate, an even gate, an odd source, and an even source, and applying the odd gate, even gate, odd source, even source, and common electrode, respectively. The first step of checking the disconnection, short-circuit, and white point defect of each signal line by simultaneously applying the signal, and simultaneously applying the signal to the odd gate, even gate and common electrode divided in the first step A second process of detecting a short-circuit point defect in the storage capacitor portion after shorting to the common electrode, and simultaneously applying a signal to each of the odd gate, the even gate, the odd source, and the common electrode, and shorting the even source to the common electrode A third step of detecting a line and pixel, a horizontal short point defect between the pixel and the pixel, and the hole And a fourth process of simultaneously applying a signal to each of the gate, the even gate, the even source, and the common electrode, and shorting the odd source to the common electrode to detect a horizontal short point defect between the source line and the pixel, the pixel, and the pixel. It is made of a process for detecting a defect of the liquid crystal display device.

Description

Defect inspection method of liquid crystal display device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 본 발명에서 사용되는 부가 방식의 액정표시소자 구동회로도, 제3도는 본 발명에 의한 부가방식 액정표시소자의 박막트랜지스터의 구성을 보인 단면도.1 is a circuit diagram of an additional type liquid crystal display element driving circuit used in the present invention, and FIG.

Claims

After fabricating a bottom plate constituting a thin film transistor with a gate and a source line pixel and a top plate having a corresponding common electrode, the top plate is bonded to the bottom plate and a liquid crystal is injected into the bottom plate to fabricate a liquid crystal display device, and the liquid crystal display device is inspected. The method may include dividing a gate and a source of the thin film transistor into an odd gate, an even gate, an odd source, and an even source, and applying the odd gate, the even gate, the odd source, the even source, and the common electrode to a liquid crystal display device, respectively. The first step of checking the white point of the thin film transistor and the disconnection and short circuit defect of each signal line by simultaneously applying the signal, and simultaneously applying the signal to the odd gate, even gate and common electrode divided in the first process Storage capacitor section after shorting source and even source to common electrode A second process of detecting a vertical short point defect, and simultaneously applying a signal to each of the odd gate, the even gate, the odd source, and the common electrode, and shorting the even source to the common electrode so that the horizontal line between the source line and the pixel, the pixel, and the pixel A third step of detecting a point defect, and simultaneously applying a signal to each of the odd gate, the even gate, the even source, and the common electrode, and shorting the odd source to the common electrode, thereby causing a horizontal short point defect between the source line and the pixel, the pixel, and the pixel And a fourth process of detecting the defect as a defect of the manufactured liquid crystal display device.

※ Note: The disclosure is based on the initial application.