KR960015049B1 - 비접촉식 위치검출장치 - Google Patents

비접촉식 위치검출장치 Download PDF

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Publication number
KR960015049B1
KR960015049B1 KR1019930003558A KR930003558A KR960015049B1 KR 960015049 B1 KR960015049 B1 KR 960015049B1 KR 1019930003558 A KR1019930003558 A KR 1019930003558A KR 930003558 A KR930003558 A KR 930003558A KR 960015049 B1 KR960015049 B1 KR 960015049B1
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KR
South Korea
Prior art keywords
laser unit
laser
arm
axis
needle
Prior art date
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Expired - Fee Related
Application number
KR1019930003558A
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English (en)
Korean (ko)
Other versions
KR930022066A (ko
Inventor
기요시 다카기
도시오 구리하라
쇼이치 구와하타
가즈오 오모리
아츠미 도야마
다케시 오바
Original Assignee
혼다기켄고교 가부시키가이샤
가와모토 노부히코
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Publication of KR930022066A publication Critical patent/KR930022066A/ko
Application granted granted Critical
Publication of KR960015049B1 publication Critical patent/KR960015049B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
KR1019930003558A 1992-04-07 1993-03-10 비접촉식 위치검출장치 Expired - Fee Related KR960015049B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP4113954A JPH05288516A (ja) 1992-04-07 1992-04-07 非接触式位置検出装置
JP92-113954 1992-04-07

Publications (2)

Publication Number Publication Date
KR930022066A KR930022066A (ko) 1993-11-23
KR960015049B1 true KR960015049B1 (ko) 1996-10-24

Family

ID=14625373

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019930003558A Expired - Fee Related KR960015049B1 (ko) 1992-04-07 1993-03-10 비접촉식 위치검출장치

Country Status (6)

Country Link
US (1) US5430547A (https=)
EP (1) EP0565357B1 (https=)
JP (1) JPH05288516A (https=)
KR (1) KR960015049B1 (https=)
CN (1) CN1038530C (https=)
DE (1) DE69313336T2 (https=)

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US6141105A (en) * 1995-11-17 2000-10-31 Minolta Co., Ltd. Three-dimensional measuring device and three-dimensional measuring method
US5671055A (en) * 1996-01-23 1997-09-23 Acushnet Company Apparatus, system and method for laser measurement of an object shape
US5729345A (en) * 1996-09-11 1998-03-17 Caterpillar Inc. Apparatus and method for determining distortion of a welded member
WO1998057120A1 (en) * 1997-06-09 1998-12-17 Aman James A Portable system for inventory identification and control
CA2242179C (en) * 1997-07-07 2006-10-03 Takao Shibayama Method of, and apparatus for, measuring position of hole
US5948997A (en) * 1997-09-02 1999-09-07 Intriplex Technologies, Inc. Swaged connection testing apparatus
MXPA01005430A (es) * 1999-01-11 2003-03-27 Thyssenkrupp Technologies Ag Dispositivo para sujetar y soldar laminas metalicas.
CN1188659C (zh) 1999-06-10 2005-02-09 Mpt米特韦达精密技术股份有限公司 无接触式三维测量物体的装置和确定测量点坐标的坐标系统的方法
JP2001304816A (ja) * 2000-04-26 2001-10-31 Kenichiro Kobayashi レーザ反射光による粒状斑点模様を利用した移動量測定方式とその装置
US7881896B2 (en) 2002-02-14 2011-02-01 Faro Technologies, Inc. Portable coordinate measurement machine with integrated line laser scanner
JP4582446B2 (ja) * 2004-11-18 2010-11-17 株式会社東京精密 測定装置
US7440120B2 (en) * 2006-06-27 2008-10-21 Barbara E. Parlour Internal and external measuring device
JP2008185543A (ja) * 2007-01-31 2008-08-14 Toyota Motor Corp 非接触３次元座標測定装置の測定ヘッド保持機構
DE102007024197B4 (de) * 2007-05-24 2017-01-05 Robert Bosch Gmbh Vorrichtung und Verfahren zur Formmessung von Freiform-Flächen
WO2009116508A1 (ja) * 2008-03-19 2009-09-24 株式会社安川電機 形状計測装置とこれを備えたロボット装置
JP4998409B2 (ja) * 2008-08-22 2012-08-15 トヨタ自動車株式会社 レーザ照射装置および方法
JP5630208B2 (ja) * 2010-10-25 2014-11-26 株式会社安川電機 形状計測装置、ロボットシステムおよび形状計測方法
CN103528513B (zh) * 2013-09-30 2016-08-17 上海大学 Oled玻璃基板对准方法及装置
FR3012215B1 (fr) * 2013-10-18 2018-01-19 Hexagon Metrology Sas Scanner a pointage facilite
JP6450552B2 (ja) * 2014-10-02 2019-01-09 株式会社ミツトヨ 形状測定装置、形状測定方法およびポイントセンサの位置合わせ手段
GB2545496B (en) * 2015-12-18 2020-06-03 Teraview Ltd A Test System
DE102016103557B4 (de) * 2016-02-29 2018-05-30 Carl Zeiss Industrielle Messtechnik Gmbh Koordinatenmessgerät
JP6925816B2 (ja) * 2017-02-09 2021-08-25 株式会社小松製作所 位置計測システム、作業機械、及び位置計測方法
CN106767442A (zh) * 2017-03-30 2017-05-31 李良杰 长度测量笔
CN107116554B (zh) * 2017-05-25 2021-05-04 北京理工大学 一种仿生灵巧手确定目标物体形状和位置的装置与方法
US10006757B1 (en) * 2017-06-16 2018-06-26 Mitutoyo Corporation Optical configuration for measurement device using emitter material configuration with quadrant photodetectors
CN110487210B (zh) * 2019-09-03 2020-12-11 大连理工大学 蜂窝芯表面轮廓测量方法
CN114993204B (zh) * 2022-06-07 2023-03-14 上海交通大学 大尺寸构件轮廓动态测量与辅助特征定位方法及系统
CN117232438B (zh) * 2023-11-13 2024-03-15 成都飞机工业（集团）有限责任公司 一种飞机活动翼面偏角测量装置、校准装置及校准方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2008948C3 (de) * 1970-02-26 1979-04-12 C. Stiefelmayer Kg, 7300 Esslingen Gerät zum Messen oder Anreißen von Werkstücken
US3678584A (en) * 1970-08-13 1972-07-25 Gen Motors Corp Measuring probe assembly
DE2609670C3 (de) * 1976-03-09 1978-08-24 C. Stiefelmayer Kg, 7300 Esslingen Geradführung für ein MeB- und/oder Anreißgerät
DE2613451C3 (de) * 1976-03-30 1978-11-30 C. Stiefelmayer Kg, 7300 Esslingen Meß- und/oder Anreißgerät
US4838696A (en) * 1983-01-28 1989-06-13 Diffracto Ltd. Pulsed robotic inspection
JPS59190607A (ja) * 1983-04-13 1984-10-29 Hitachi Ltd 物体形状の非接触測定装置
JPS6129710A (ja) * 1984-07-20 1986-02-10 Hitachi Zosen Corp 測定方法
DE3743363A1 (de) * 1987-12-21 1989-07-06 Zeiss Carl Fa Verfahren und einrichtung zur regelung der emissionslichtmenge in einem optischen tastkopf
US5118192A (en) * 1990-07-11 1992-06-02 Robotic Vision Systems, Inc. System for 3-D inspection of objects
US5238054A (en) * 1990-11-26 1993-08-24 Westinghouse Electric Corp. Steam generator nozzle dam
DE4109483A1 (de) * 1991-03-22 1992-09-24 Zeiss Carl Fa Verfahren und einrichtung zur detektion von kanten und bohrungen mit einem optischen tastkopf
JPH05164525A (ja) * 1991-12-16 1993-06-29 Tokyo Boeki Kk レーザ式座標測定装置の測定ヘッド
JPH09190607A (ja) * 1996-01-10 1997-07-22 Japan Energy Corp 浮上型磁気ヘッド及びその製造方法

Also Published As

Publication number Publication date
EP0565357A3 (https=) 1994-01-26
DE69313336T2 (de) 1998-02-05
EP0565357A2 (en) 1993-10-13
DE69313336D1 (de) 1997-10-02
US5430547A (en) 1995-07-04
JPH05288516A (ja) 1993-11-02
KR930022066A (ko) 1993-11-23
CN1078550A (zh) 1993-11-17
CN1038530C (zh) 1998-05-27
EP0565357B1 (en) 1997-08-27

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