KR960008524B1 - Multi-layer metal-wiring method - Google Patents
Multi-layer metal-wiring method Download PDFInfo
- Publication number
- KR960008524B1 KR960008524B1 KR93012888A KR930012888A KR960008524B1 KR 960008524 B1 KR960008524 B1 KR 960008524B1 KR 93012888 A KR93012888 A KR 93012888A KR 930012888 A KR930012888 A KR 930012888A KR 960008524 B1 KR960008524 B1 KR 960008524B1
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- metal layer
- flattening
- wiring method
- metal
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
The multi-layer metal wiring method comprises the steps of: formating a barrier layer on a surface where steps are formed by a device separating layer and a poly gate; stacking first aluminum metal layer and a flattening metal layer, and applying a PR on the surface; flattening the upper surface of the PR layer and the flattening metal surface by etching with a same ratio(etch back process); depositing second aluminum metal layer; formating a low metal wiring layer by etching a part of the second aluminum metal layer, metal layer and first aluminum metal layer (patterning process); thereby increasing a step coverage of the device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR93012888A KR960008524B1 (en) | 1993-07-09 | 1993-07-09 | Multi-layer metal-wiring method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR93012888A KR960008524B1 (en) | 1993-07-09 | 1993-07-09 | Multi-layer metal-wiring method |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950004497A KR950004497A (en) | 1995-02-18 |
KR960008524B1 true KR960008524B1 (en) | 1996-06-26 |
Family
ID=19359004
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR93012888A KR960008524B1 (en) | 1993-07-09 | 1993-07-09 | Multi-layer metal-wiring method |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR960008524B1 (en) |
-
1993
- 1993-07-09 KR KR93012888A patent/KR960008524B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR950004497A (en) | 1995-02-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0401688A3 (en) | Method of forming electrical contact between interconnection layers located at different layer levels | |
TW337035B (en) | Semiconductor device and method of manufacturing the same | |
EP0269211A3 (en) | Semiconductor device having a metallic layer | |
WO2002067319A3 (en) | Copper interconnect structure having diffusion barrier | |
TW356572B (en) | Method for forming metal wiring of semiconductor devices | |
TW358237B (en) | Manufacturing method of a semiconductor device | |
EP0365854A3 (en) | Semiconductor device having a multi-layered wiring structure | |
TW346664B (en) | Mixed-mode IC separated spacer structure and process for producing the same | |
KR960008524B1 (en) | Multi-layer metal-wiring method | |
SG142108A1 (en) | PROCESS FOR BORDERLESS STOP IN TiN VIA FORMATION | |
TW324110B (en) | Method for fabrication metal wire of semiconductor device | |
TW356586B (en) | Semiconductor device having conductive layer and manufacturing method thereof | |
JPS53107285A (en) | Production of wiring structural body | |
WO2002013240A3 (en) | Method for forming aluminum lines over aluminum-filled vias in a semiconductor substrate | |
KR100336654B1 (en) | Method for forming stacked via hole in semiconductor device | |
JPS6484722A (en) | Manufacture of semiconductor device | |
KR980005442A (en) | Metal wiring formation method | |
KR940003565B1 (en) | Metal wiring method for semiconductor device | |
TW429473B (en) | Method for forming dielectric layer with capability to resist the diffusion of copper | |
TW332338B (en) | The method for forming protection layer of metal interconnects in semiconductor device | |
TW350088B (en) | Method of adding effective space of rugged polysilicon layers | |
TW249294B (en) | Process for preventing shift tunnelling of multi-layer metal via | |
KR970018038A (en) | Wiring Formation Method for Highly Integrated Semiconductor Devices | |
TW290716B (en) | Method of making capacitor by etching technique | |
KR970052389A (en) | Contact hole formation method of semiconductor device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20050524 Year of fee payment: 10 |
|
LAPS | Lapse due to unpaid annual fee |