KR950008248Y1 - Manual socket for testing - Google Patents

Manual socket for testing Download PDF

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Publication number
KR950008248Y1
KR950008248Y1 KR2019900002766U KR900002766U KR950008248Y1 KR 950008248 Y1 KR950008248 Y1 KR 950008248Y1 KR 2019900002766 U KR2019900002766 U KR 2019900002766U KR 900002766 U KR900002766 U KR 900002766U KR 950008248 Y1 KR950008248 Y1 KR 950008248Y1
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KR
South Korea
Prior art keywords
socket
contact
manual
testing
manual socket
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Application number
KR2019900002766U
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Korean (ko)
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KR910017399U (en
Inventor
염기복
Original Assignee
금성일렉트론 주식회사
문정환
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Priority to KR2019900002766U priority Critical patent/KR950008248Y1/en
Publication of KR910017399U publication Critical patent/KR910017399U/en
Application granted granted Critical
Publication of KR950008248Y1 publication Critical patent/KR950008248Y1/en

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/10—Sockets for co-operation with pins or blades

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  • Measuring Leads Or Probes (AREA)

Abstract

내용 없음.No content.

Description

디바이스 분석용 매뉴얼 소켓Manual socket for device analysis

제1a도는 종래의 매뉴얼 소켓 평면도, b도는 종래의 접촉핀 정면도.Figure 1a is a conventional manual socket plan view, b is a conventional contact pin front view.

제2a, b도는 본 고안의 매뉴얼 소켓의 평면도 및 정면도, c도는 본 고안의 접촉핀과 접촉링의 정면도.2a, b is a plan view and a front view of the manual socket of the present invention, c is a front view of the contact pin and the contact ring of the present invention.

* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings

2 : 접촉핀 3 : 접촉링2: contact pin 3: contact ring

3a : 연결용 구멍 4 : 소켓몸체3a: connection hole 4: socket body

본 고안은 디바이스 분석용 매뉴얼 소켓에 관한 것으로, 특히 오실로스코프의 프로브(probe)와 소켓접촉핀의 연결에 적당하도록 한 디바이스 분석용 매뉴얼 소켓에 관한 것이다.The present invention relates to a manual socket for device analysis, and more particularly, to a manual socket for device analysis that is suitable for connecting a probe and a socket contact pin of an oscilloscope.

일반적으로 디바이스(Device)의 특성을 분석하기 위하여는 디바이스를 매뉴얼 소켓에 끼우고 오실로스코프의 프로브를 측정핀에 연결하는 방법을 사용하고 있다.In general, in order to analyze the characteristics of a device, a device is inserted into a manual socket and an oscilloscope probe is connected to a measurement pin.

종래 이러한 디바이스 분석용 매뉴얼 소켓은 제1도에 도시한 바와 같이 소켓몸체(4')에 다수개의 접촉핀(2')을 설치하고 그 상부에 같은 폭의 동판으로 된 접촉링(3')을 설치한 구조로 되어 있다.Conventionally, such a socket for analyzing a device has a plurality of contact pins 2 'installed on the socket body 4', as shown in FIG. 1, and a contact ring 3 'made of copper plate of the same width on the upper portion thereof. It is installed structure.

그러나 이러한 종래의 매뉴얼 소켓에서는 강제적으로 리드선을 뽑아주기 전에는 오실로스코프(도시되지 않음)의 프로브를 연결할 부위가 없으며 선을 통하여 연결한다고 하더라도 접촉 및 접지상태가 불완전하여 정확하게 연결되지 않게 되어 디바이스의 특성분석을 정확하게 수행할 수 없게 되는 문제점이 있었다.However, in such a conventional manual socket, there is no place to connect the probe of an oscilloscope (not shown) before forcibly pulling out the lead, and even if the wire is connected through the wire, the contact and ground state are incomplete and the device is not connected correctly. There was a problem that cannot be performed correctly.

본 고안은 이러한 종래의 문제점을 해결하기 위하여 안출된 것으로, 접촉링의 상부를 소켓몸체의 외부로 연장형성하여 리드선을 사용하지 않고서도 오실로스코프의 프로브를 정확하게 연결할 수 있도록 함으로써 디바이스의 특성분석을 정확히 수행할 수 있도록 한 디바이스 분석용 매뉴얼 소켓을 제공함을 목적으로 하는 것이다.The present invention was devised to solve such a conventional problem, and the upper part of the contact ring is extended to the outside of the socket body so that the probe of the oscilloscope can be accurately connected without using a lead wire. The goal is to provide a manual socket for device analysis.

이하 본 고안을 첨부도면에 도시한 실시예에 따라 상세히 설명한다. 제2a, b도는 본 고안의 매뉴얼 소켓의 평면도 및 정면도이고, 제2c도는 접촉핀과 정면도로서, 이에 도시한 바와 같이 소켓몸체(4)에 다수개의 접촉핀(2)을 설치하고, 그 상부에 설치되는 동판으로 된 접촉링(3)을 소켓몸체(4)의 외부로 돌출되도록 연장형성한 것이다.Hereinafter, the present invention will be described in detail according to the embodiment shown in the accompanying drawings. Figure 2a, b is a plan view and a front view of the manual socket of the present invention, Figure 2c is a front view and a contact pin, as shown therein is installed a plurality of contact pins (2) on the socket body 4, the upper part The copper ring is installed to extend the contact ring (3) to protrude to the outside of the socket body (4).

도면에서 미설명 부호 1은 접촉손잡이이다. 이러한 구성으로 이루어진 매뉴얼 소켓은 접촉손잡이(1)를 누르면 접촉핀(2)이 디바이스(Dvice)핀에 접촉된다.Reference numeral 1 in the drawings is a contact handle. In the manual socket having such a configuration, when the contact handle 1 is pressed, the contact pin 2 contacts the device pin.

이 상태에서 오실로스코프의 프로브를 접촉핀(2)의 상부에서 소켓몸체(4)의 외부로 연장된 접촉링(3)의 돌출부에 연결시킴으로써 별도의 리드선을 사용하지 않고서도 접촉핀과 정확하게 연결할 수 있게 된다.In this state, by connecting the probe of the oscilloscope to the protrusion of the contact ring (3) extending from the upper portion of the contact pin (2) to the outside of the socket body (4) so that it can be accurately connected to the contact pin without using a separate lead wire do.

또한 제2b, c도와 같이 접촉링(3)의 연장부에 연결용 구멍(3a)을 천공함으로써 프로브의 연결을 더욱 확실하게 할 수 있다.Further, as shown in Figs. 2B and 2C, the connection of the probe can be more secured by drilling the connection hole 3a in the extension portion of the contact ring 3.

이상과 같이 본 고안은 디바이스 분석시 스코프의 프로브를 접촉핀과 완전하게 연결할 수 있게 되어 디바이스의 특성을 정확하게 분석할 수 있게 되는 것이다.As described above, the present invention enables the probe of the scope to be completely connected to the contact pin when the device is analyzed, thereby accurately analyzing the characteristics of the device.

Claims (2)

반도체 디바이스 테스트용 매뉴얼 소켓에 있어서, 디바이스의 리드부와 접촉되는 접촉링(3)의 윗부분을 소켓 몸체의 외부로 돌출되게 연장형성한 것을 특징으로 하는 디바이스 분석용 매뉴얼 소켓.A manual socket for testing a semiconductor device, wherein the upper portion of the contact ring (3) in contact with the lead portion of the device is extended to protrude out of the socket body. 제1항에 있어서, 상기 접촉링(3)의 연장돌출부에 연결용 구멍(3a)을 형성한 것을 특징으로 하는 디바이스 분석용 매뉴얼 소켓.The manual socket for device analysis according to claim 1, wherein a connection hole (3a) is formed in the extension protrusion of the contact ring (3).
KR2019900002766U 1990-03-09 1990-03-09 Manual socket for testing KR950008248Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900002766U KR950008248Y1 (en) 1990-03-09 1990-03-09 Manual socket for testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900002766U KR950008248Y1 (en) 1990-03-09 1990-03-09 Manual socket for testing

Publications (2)

Publication Number Publication Date
KR910017399U KR910017399U (en) 1991-10-28
KR950008248Y1 true KR950008248Y1 (en) 1995-10-06

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900002766U KR950008248Y1 (en) 1990-03-09 1990-03-09 Manual socket for testing

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Publication number Publication date
KR910017399U (en) 1991-10-28

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