KR940022483A - 발광소자의 발광위치 검출방법 - Google Patents
발광소자의 발광위치 검출방법 Download PDFInfo
- Publication number
- KR940022483A KR940022483A KR1019940004527A KR19940004527A KR940022483A KR 940022483 A KR940022483 A KR 940022483A KR 1019940004527 A KR1019940004527 A KR 1019940004527A KR 19940004527 A KR19940004527 A KR 19940004527A KR 940022483 A KR940022483 A KR 940022483A
- Authority
- KR
- South Korea
- Prior art keywords
- light emitting
- emitting element
- light
- imaging device
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000001514 detection method Methods 0.000 title 1
- 238000000034 method Methods 0.000 claims abstract description 9
- 238000003384 imaging method Methods 0.000 claims abstract 8
- 230000003287 optical effect Effects 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 claims 1
- 230000001050 lubricating effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 4
- 238000005070 sampling Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/95—Circuit arrangements
- H10F77/953—Circuit arrangements for devices having potential barriers
- H10F77/957—Circuit arrangements for devices having potential barriers for position-sensitive photodetectors, e.g. lateral-effect photodiodes or quadrant photodiodes
Landscapes
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP93-050738 | 1993-03-11 | ||
| JP5073893A JPH06268261A (ja) | 1993-03-11 | 1993-03-11 | 発光素子の発光位置検出方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR940022483A true KR940022483A (ko) | 1994-10-21 |
Family
ID=12867184
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019940004527A Withdrawn KR940022483A (ko) | 1993-03-11 | 1994-03-09 | 발광소자의 발광위치 검출방법 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPH06268261A (enExample) |
| KR (1) | KR940022483A (enExample) |
| TW (1) | TW273027B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101276924B1 (ko) * | 2009-10-07 | 2013-06-19 | 세이코 엡슨 가부시키가이샤 | 위치 검출 기능을 갖는 투사형 투영 장치 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005235955A (ja) * | 2004-02-18 | 2005-09-02 | Sharp Corp | 光学素子の位置検査方法および位置検査装置ならびにダイボンド方法およびダイボンド装置 |
-
1993
- 1993-03-11 JP JP5073893A patent/JPH06268261A/ja active Pending
-
1994
- 1994-03-01 TW TW083101766A patent/TW273027B/zh active
- 1994-03-09 KR KR1019940004527A patent/KR940022483A/ko not_active Withdrawn
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101276924B1 (ko) * | 2009-10-07 | 2013-06-19 | 세이코 엡슨 가부시키가이샤 | 위치 검출 기능을 갖는 투사형 투영 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH06268261A (ja) | 1994-09-22 |
| TW273027B (enExample) | 1996-03-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19940309 |
|
| PG1501 | Laying open of application | ||
| PC1203 | Withdrawal of no request for examination | ||
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |