KR940022483A - 발광소자의 발광위치 검출방법 - Google Patents

발광소자의 발광위치 검출방법 Download PDF

Info

Publication number
KR940022483A
KR940022483A KR1019940004527A KR19940004527A KR940022483A KR 940022483 A KR940022483 A KR 940022483A KR 1019940004527 A KR1019940004527 A KR 1019940004527A KR 19940004527 A KR19940004527 A KR 19940004527A KR 940022483 A KR940022483 A KR 940022483A
Authority
KR
South Korea
Prior art keywords
light emitting
emitting element
light
imaging device
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1019940004527A
Other languages
English (en)
Korean (ko)
Inventor
고키 오카와우치
Original Assignee
오오가 노리오
소니 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오오가 노리오, 소니 가부시끼가이샤 filed Critical 오오가 노리오
Publication of KR940022483A publication Critical patent/KR940022483A/ko
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/95Circuit arrangements
    • H10F77/953Circuit arrangements for devices having potential barriers
    • H10F77/957Circuit arrangements for devices having potential barriers for position-sensitive photodetectors, e.g. lateral-effect photodiodes or quadrant photodiodes

Landscapes

  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1019940004527A 1993-03-11 1994-03-09 발광소자의 발광위치 검출방법 Withdrawn KR940022483A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP93-050738 1993-03-11
JP5073893A JPH06268261A (ja) 1993-03-11 1993-03-11 発光素子の発光位置検出方法

Publications (1)

Publication Number Publication Date
KR940022483A true KR940022483A (ko) 1994-10-21

Family

ID=12867184

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940004527A Withdrawn KR940022483A (ko) 1993-03-11 1994-03-09 발광소자의 발광위치 검출방법

Country Status (3)

Country Link
JP (1) JPH06268261A (enExample)
KR (1) KR940022483A (enExample)
TW (1) TW273027B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101276924B1 (ko) * 2009-10-07 2013-06-19 세이코 엡슨 가부시키가이샤 위치 검출 기능을 갖는 투사형 투영 장치

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005235955A (ja) * 2004-02-18 2005-09-02 Sharp Corp 光学素子の位置検査方法および位置検査装置ならびにダイボンド方法およびダイボンド装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101276924B1 (ko) * 2009-10-07 2013-06-19 세이코 엡슨 가부시키가이샤 위치 검출 기능을 갖는 투사형 투영 장치

Also Published As

Publication number Publication date
JPH06268261A (ja) 1994-09-22
TW273027B (enExample) 1996-03-21

Similar Documents

Publication Publication Date Title
KR102408322B1 (ko) 자동-초점 시스템
EP0501683A2 (en) Technique for enhanced two-dimensional imaging
KR20000071087A (ko) 옥외용 거리 계측 장치
ATE503982T1 (de) Vorrichtung zur oct bildaufnahme mit axialem linienfokus für verbesserte auflösung und tiefenschärfe
CN101050952A (zh) 同步光学测量和探伤方法及装置
ES2077865T3 (es) Sistema de caracterizacion de superficies por vision mecanizada.
KR930010527A (ko) 조사를 이용한 표면상태 검사방법 및 그 장치
KR960005092B1 (ko) 본딩와이어 검사방법
JPH03180709A (ja) 3次元画像形成方法とその装置
NO920725L (no) Maalerinnretning
ATE370799T1 (de) Vorrichtung zur abgabe eines fluids
US20020031250A1 (en) Method and apparatus for examining through holes
KR950703728A (ko) 물체의 치수측정 방법 및 장치(process and assembly for measuring an article's dimensions)
US4097750A (en) Method of orienting objects using optically smeared images
JP2633718B2 (ja) 形状認識装置
JP2000292366A (ja) レーザ光による欠陥検出方法
EP0939294B1 (en) Determining topographical values
JP3202089B2 (ja) 周期性パターンの表面欠陥検査方法
JPH0236339A (ja) 光による欠点検査装置
KR830001829B1 (ko) 결합 검출용 검사장치
JPH0540158A (ja) 集積回路の電界測定用プローブ位置決め方法および位置決め装置
JPS6288906A (ja) 立体形状の測定方法
JP2911619B2 (ja) 周期性パターンの表面欠陥検査方法および装置
JP2801916B2 (ja) 欠陥検査装置
JPH04337404A (ja) 位置測定装置

Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19940309

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid