KR930015330U - 아이씨 테스트 회로 - Google Patents

아이씨 테스트 회로

Info

Publication number
KR930015330U
KR930015330U KR2019910022101U KR910022101U KR930015330U KR 930015330 U KR930015330 U KR 930015330U KR 2019910022101 U KR2019910022101 U KR 2019910022101U KR 910022101 U KR910022101 U KR 910022101U KR 930015330 U KR930015330 U KR 930015330U
Authority
KR
South Korea
Prior art keywords
test circuit
test
circuit
Prior art date
Application number
KR2019910022101U
Other languages
English (en)
Other versions
KR950007245Y1 (ko
Inventor
김영일
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019910022101U priority Critical patent/KR950007245Y1/ko
Publication of KR930015330U publication Critical patent/KR930015330U/ko
Application granted granted Critical
Publication of KR950007245Y1 publication Critical patent/KR950007245Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318321—Generation of test inputs, e.g. test vectors, patterns or sequences for combinational circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019910022101U 1991-12-12 1991-12-12 아이씨 테스트 회로 KR950007245Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910022101U KR950007245Y1 (ko) 1991-12-12 1991-12-12 아이씨 테스트 회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910022101U KR950007245Y1 (ko) 1991-12-12 1991-12-12 아이씨 테스트 회로

Publications (2)

Publication Number Publication Date
KR930015330U true KR930015330U (ko) 1993-07-28
KR950007245Y1 KR950007245Y1 (ko) 1995-09-04

Family

ID=19324115

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910022101U KR950007245Y1 (ko) 1991-12-12 1991-12-12 아이씨 테스트 회로

Country Status (1)

Country Link
KR (1) KR950007245Y1 (ko)

Also Published As

Publication number Publication date
KR950007245Y1 (ko) 1995-09-04

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