KR920017025U - 다중핀 디지탈 ic 시험회로 - Google Patents

다중핀 디지탈 ic 시험회로

Info

Publication number
KR920017025U
KR920017025U KR2019910002229U KR910002229U KR920017025U KR 920017025 U KR920017025 U KR 920017025U KR 2019910002229 U KR2019910002229 U KR 2019910002229U KR 910002229 U KR910002229 U KR 910002229U KR 920017025 U KR920017025 U KR 920017025U
Authority
KR
South Korea
Prior art keywords
test circuit
pin digital
pin
digital
test
Prior art date
Application number
KR2019910002229U
Other languages
English (en)
Other versions
KR940002724Y1 (ko
Inventor
배정환
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019910002229U priority Critical patent/KR940002724Y1/ko
Publication of KR920017025U publication Critical patent/KR920017025U/ko
Application granted granted Critical
Publication of KR940002724Y1 publication Critical patent/KR940002724Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019910002229U 1991-02-13 1991-02-13 다중핀 디지탈 ic 시험회로 KR940002724Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910002229U KR940002724Y1 (ko) 1991-02-13 1991-02-13 다중핀 디지탈 ic 시험회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910002229U KR940002724Y1 (ko) 1991-02-13 1991-02-13 다중핀 디지탈 ic 시험회로

Publications (2)

Publication Number Publication Date
KR920017025U true KR920017025U (ko) 1992-09-17
KR940002724Y1 KR940002724Y1 (ko) 1994-04-23

Family

ID=19310959

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910002229U KR940002724Y1 (ko) 1991-02-13 1991-02-13 다중핀 디지탈 ic 시험회로

Country Status (1)

Country Link
KR (1) KR940002724Y1 (ko)

Also Published As

Publication number Publication date
KR940002724Y1 (ko) 1994-04-23

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