DE69220522T2 - Bidirektionaler Boundary-Scan-Schaltkreis - Google Patents
Bidirektionaler Boundary-Scan-SchaltkreisInfo
- Publication number
- DE69220522T2 DE69220522T2 DE1992620522 DE69220522T DE69220522T2 DE 69220522 T2 DE69220522 T2 DE 69220522T2 DE 1992620522 DE1992620522 DE 1992620522 DE 69220522 T DE69220522 T DE 69220522T DE 69220522 T2 DE69220522 T2 DE 69220522T2
- Authority
- DE
- Germany
- Prior art keywords
- boundary scan
- scan circuit
- directional boundary
- directional
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/27—Built-in tests
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US66853191A | 1991-03-13 | 1991-03-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69220522D1 DE69220522D1 (de) | 1997-07-31 |
DE69220522T2 true DE69220522T2 (de) | 1997-12-18 |
Family
ID=24682689
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE1992620522 Expired - Fee Related DE69220522T2 (de) | 1991-03-13 | 1992-03-11 | Bidirektionaler Boundary-Scan-Schaltkreis |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0503926B1 (de) |
JP (1) | JPH06180351A (de) |
DE (1) | DE69220522T2 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2671817B2 (ja) * | 1994-08-26 | 1997-11-05 | 日本電気株式会社 | 半導体集積回路の検査方法 |
WO2006117588A1 (en) * | 2005-05-04 | 2006-11-09 | Freescale Semiconductor, Inc. | An integrated circuit and a method for designing a boundary scan super-cell |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63182585A (ja) * | 1987-01-26 | 1988-07-27 | Toshiba Corp | テスト容易化機能を備えた論理回路 |
EP0358376B1 (de) * | 1988-09-07 | 1995-02-22 | Texas Instruments Incorporated | Integrierte Prüfschaltung |
-
1992
- 1992-03-11 JP JP4086573A patent/JPH06180351A/ja active Pending
- 1992-03-11 EP EP92302089A patent/EP0503926B1/de not_active Expired - Lifetime
- 1992-03-11 DE DE1992620522 patent/DE69220522T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0503926A2 (de) | 1992-09-16 |
DE69220522D1 (de) | 1997-07-31 |
EP0503926A3 (en) | 1992-10-21 |
JPH06180351A (ja) | 1994-06-28 |
EP0503926B1 (de) | 1997-06-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Free format text: V. BEZOLD & SOZIEN, 80799 MUENCHEN |
|
8339 | Ceased/non-payment of the annual fee |