KR930005351A - 정전방전 검출 및 클램프 제어회로 - Google Patents

정전방전 검출 및 클램프 제어회로 Download PDF

Info

Publication number
KR930005351A
KR930005351A KR1019920015563A KR920015563A KR930005351A KR 930005351 A KR930005351 A KR 930005351A KR 1019920015563 A KR1019920015563 A KR 1019920015563A KR 920015563 A KR920015563 A KR 920015563A KR 930005351 A KR930005351 A KR 930005351A
Authority
KR
South Korea
Prior art keywords
electrostatic discharge
control circuits
discharge detection
clamp control
integrated circuit
Prior art date
Application number
KR1019920015563A
Other languages
English (en)
Inventor
이. 밀러 윌리암
Original Assignee
존 엠. 클락
내쇼날 세미컨덕터 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 존 엠. 클락, 내쇼날 세미컨덕터 코포레이션 filed Critical 존 엠. 클락
Publication of KR930005351A publication Critical patent/KR930005351A/ko

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
    • H02H9/04—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage
    • H02H9/045—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere
    • H02H9/046—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere responsive to excess voltage appearing at terminals of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Elimination Of Static Electricity (AREA)
  • Electrotherapy Devices (AREA)

Abstract

내용 없음.

Description

정전방전 검출 및 클램프 제어회로
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명을 예시하는 논리 다이어그램,
제3도는 정전방전에 대한 인체 모델을 예시하는 개략적인 회로도.

Claims (1)

  1. 집적회로 특징부를 정전방전(ESD) 펄스로부터 보호하는 집적회로와 함께 사용될 수 있으며, a. 상기 집적회로 특징부로부터 ESD 펄스를 분로시키도록 상기 집적회로에 접속되어 있는 스위칭 수단, b. 상기 스위칭 수단을 활성화시키도록 상기 스위칭 수단에 접속 되어 있으며, 각각이 전형적인 ESD펄스중 선택된 파형특징에 응답하는 복수개의 검출 회로를 포함하는 제어 수단을 포함하는 보호 회로.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019920015563A 1991-08-29 1992-08-28 정전방전 검출 및 클램프 제어회로 KR930005351A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/752,036 US5255146A (en) 1991-08-29 1991-08-29 Electrostatic discharge detection and clamp control circuit
US91-752,036 1991-08-29

Publications (1)

Publication Number Publication Date
KR930005351A true KR930005351A (ko) 1993-03-23

Family

ID=25024578

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019920015563A KR930005351A (ko) 1991-08-29 1992-08-28 정전방전 검출 및 클램프 제어회로

Country Status (4)

Country Link
US (1) US5255146A (ko)
EP (1) EP0533336A1 (ko)
JP (1) JPH05235274A (ko)
KR (1) KR930005351A (ko)

Families Citing this family (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5361185A (en) * 1993-02-19 1994-11-01 Advanced Micro Devices, Inc. Distributed VCC/VSS ESD clamp structure
US5508649A (en) * 1994-07-21 1996-04-16 National Semiconductor Corporation Voltage level triggered ESD protection circuit
US5559659A (en) * 1995-03-23 1996-09-24 Lucent Technologies Inc. Enhanced RC coupled electrostatic discharge protection
US5745323A (en) * 1995-06-30 1998-04-28 Analog Devices, Inc. Electrostatic discharge protection circuit for protecting CMOS transistors on integrated circuit processes
US5825603A (en) * 1995-12-21 1998-10-20 Intel Corporaiton Method and apparatus for providing electrostatic discharge protection for high voltage inputs
US6609928B1 (en) 1996-06-14 2003-08-26 Intel Corporation Stack universal serial bus connector
US5744842A (en) * 1996-08-15 1998-04-28 Industrial Technology Research Institute Area-efficient VDD-to-VSS ESD protection circuit
US5877927A (en) * 1996-10-01 1999-03-02 Intel Corporation Method and apparatus for providing electrostatic discharge protection for high voltage inputs
US6008684A (en) * 1996-10-23 1999-12-28 Industrial Technology Research Institute CMOS output buffer with CMOS-controlled lateral SCR devices
US5838146A (en) * 1996-11-12 1998-11-17 Analog Devices, Inc. Method and apparatus for providing ESD/EOS protection for IC power supply pins
US5910873A (en) * 1997-02-19 1999-06-08 National Semiconductor Corporation Field oxide transistor based feedback circuit for electrical overstress protection
US6211554B1 (en) * 1998-12-08 2001-04-03 Littelfuse, Inc. Protection of an integrated circuit with voltage variable materials
JP2001060663A (ja) * 1999-08-20 2001-03-06 Nec Corp 半導体集積回路装置
US6249410B1 (en) 1999-08-23 2001-06-19 Taiwan Semiconductor Manufacturing Company ESD protection circuit without overstress gate-driven effect
US6912109B1 (en) 2000-06-26 2005-06-28 Taiwan Semiconductor Manufacturing Co., Ltd. Power-rail ESD clamp circuits with well-triggered PMOS
US6552886B1 (en) 2000-06-29 2003-04-22 Pericom Semiconductor Corp. Active Vcc-to-Vss ESD clamp with hystersis for low supply chips
US6624992B1 (en) * 2000-10-06 2003-09-23 Qualcomm, Incorporated Electro-static discharge protection circuit
US6690555B1 (en) * 2001-03-25 2004-02-10 National Semiconductor Corporation Electrostatic discharge protection circuit with cascoded trigger-switch suitable for use with over-voltage tolerant CMOS input/output buffers
JP2002305254A (ja) * 2001-04-05 2002-10-18 Mitsubishi Electric Corp 半導体装置およびその製造方法
US6801416B2 (en) * 2001-08-23 2004-10-05 Institute Of Microelectronics ESD protection system for high frequency applications
JP2003234647A (ja) * 2002-02-13 2003-08-22 Allied Tereshisu Kk 半導体デバイス用誤動作抑制回路
US7164565B2 (en) * 2002-11-29 2007-01-16 Sigmatel, Inc. ESD protection circuit
US7187530B2 (en) 2002-12-27 2007-03-06 T-Ram Semiconductor, Inc. Electrostatic discharge protection circuit
US7224560B2 (en) * 2003-02-13 2007-05-29 Medtronic, Inc. Destructive electrical transient protection
US7304827B2 (en) * 2003-05-02 2007-12-04 Zi-Ping Chen ESD protection circuits for mixed-voltage buffers
US6989979B1 (en) 2003-09-22 2006-01-24 Pericom Semiconductor Corp. Active ESD shunt with transistor feedback to reduce latch-up susceptibility
US7129589B2 (en) * 2003-10-22 2006-10-31 Broadcom Corporation Use of an internal on-chip inductor for electrostatic discharge protection of circuits which use bond wire inductance as their load
US7292421B2 (en) * 2004-11-12 2007-11-06 Texas Instruments Incorporated Local ESD power rail clamp which implements switchable I/O decoupling capacitance function
JP4647294B2 (ja) * 2004-11-26 2011-03-09 ルネサスエレクトロニクス株式会社 半導体装置
TWI258071B (en) * 2004-12-13 2006-07-11 Via Tech Inc Mainboard and power control device thereof
JP4504850B2 (ja) * 2005-03-17 2010-07-14 パナソニック株式会社 半導体集積回路装置
US7301741B2 (en) * 2005-05-17 2007-11-27 Freescale Semiconductor, Inc. Integrated circuit with multiple independent gate field effect transistor (MIGFET) rail clamp circuit
ATE489670T1 (de) * 2005-10-14 2010-12-15 Research In Motion Ltd Mobiles kommunikationsgerät mit einem intelligenten batteriesystem
CA2564021C (en) 2005-10-14 2010-12-07 Research In Motion Limited Mobile device with a smart battery
EP1938170B1 (en) * 2005-10-14 2014-02-26 BlackBerry Limited Battery pack authentication for a mobile device
US7593202B2 (en) * 2005-11-01 2009-09-22 Freescale Semiconductor, Inc. Electrostatic discharge (ESD) protection circuit for multiple power domain integrated circuit
US7453676B2 (en) * 2005-11-16 2008-11-18 Huh Yoon J RC-triggered ESD power clamp circuit and method for providing ESD protection
CN100544205C (zh) * 2005-12-07 2009-09-23 群康科技(深圳)有限公司 防治静电放电导致电子装置复位的方法
TWI300291B (en) * 2006-03-16 2008-08-21 Novatek Microelectronics Corp Logic-latching apparatus for improving system-level electrostatic discharge robustness
WO2007124079A2 (en) * 2006-04-21 2007-11-01 Sarnoff Corporation Esd clamp control by detection of power state
TW200742223A (en) * 2006-04-26 2007-11-01 Novatek Microelectronics Corp Logic-keeping apparatus for improving system-level electrostatic discharge robustness
US7589945B2 (en) * 2006-08-31 2009-09-15 Freescale Semiconductor, Inc. Distributed electrostatic discharge protection circuit with varying clamp size
DE102006052949A1 (de) * 2006-11-09 2008-05-15 Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH Beleuchtungsvorrichtung mit einer Lichtquelle und einer Tastvorrichtung
US7929263B1 (en) * 2007-08-01 2011-04-19 Rf Micro Devices, Inc. Unlatch feature for latching ESD protection circuit
US7868620B2 (en) * 2007-08-29 2011-01-11 Seagate Technology Llc Data integrity management responsive to an electrostatic event
US7777998B2 (en) 2007-09-10 2010-08-17 Freescale Semiconductor, Inc. Electrostatic discharge circuit and method therefor
WO2009085363A2 (en) * 2007-10-05 2009-07-09 Arizona Board Of Regents For And On Behalf Of Arizona State University Ic disabling circuit
US7817387B2 (en) * 2008-01-09 2010-10-19 Freescale Semiconductor, Inc. MIGFET circuit with ESD protection
US7826187B2 (en) * 2008-04-23 2010-11-02 Himax Technologies Limited Transient detection circuit
US8116047B2 (en) * 2008-12-18 2012-02-14 Sandisk Technologies Inc. Electrostatic discharge protective circuit having rise time detector and discharge sustaining circuitry
US8456784B2 (en) * 2010-05-03 2013-06-04 Freescale Semiconductor, Inc. Overvoltage protection circuit for an integrated circuit
US8514533B2 (en) * 2010-06-24 2013-08-20 Intel Corporation Method, apparatus, and system for protecting supply nodes from electrostatic discharge
US9013842B2 (en) 2011-01-10 2015-04-21 Infineon Technologies Ag Semiconductor ESD circuit and method
US8413101B2 (en) 2011-07-15 2013-04-02 Infineon Technologies Ag System and method for detecting parasitic thyristors in an integrated circuit
DE102011109596B4 (de) * 2011-08-05 2018-05-09 Austriamicrosystems Ag Schaltungsanordnung zum Schutz gegen elektrostatische Entladungen
US9263882B2 (en) * 2012-05-03 2016-02-16 Mediatek Inc. Output circuits with electrostatic discharge protection
US9438030B2 (en) 2012-11-20 2016-09-06 Freescale Semiconductor, Inc. Trigger circuit and method for improved transient immunity
US9679891B2 (en) * 2014-03-20 2017-06-13 Apple Inc. Optimized ESD clamp circuitry
US9608429B2 (en) * 2014-03-27 2017-03-28 Texas Instruments Incorporated Logging ESD events
EP3246784B1 (en) 2016-05-19 2020-01-01 NXP USA, Inc. A compensation circuit
CN108254644B (zh) * 2018-02-08 2020-06-26 芯颖科技有限公司 Esd检测装置、系统及方法
US10826291B2 (en) 2018-09-12 2020-11-03 CoolStar Technology, Inc. Electrostatic discharge transient power clamp
CN110907727A (zh) * 2019-11-25 2020-03-24 伯恩光学(惠州)有限公司 一种esd防护用品的检测系统及方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4363068A (en) * 1980-08-18 1982-12-07 Sundstrand Corporation Power FET short circuit protection
JPS6150358A (ja) * 1984-08-20 1986-03-12 Toshiba Corp 半導体集積回路
JPH0683042B2 (ja) * 1986-03-31 1994-10-19 株式会社東芝 出力ドライバ回路
FR2623018B1 (fr) * 1987-11-06 1990-02-09 Thomson Semiconducteurs Circuit integre protege contre les decharges electrostatiques avec seuil de protection variable

Also Published As

Publication number Publication date
JPH05235274A (ja) 1993-09-10
US5255146A (en) 1993-10-19
EP0533336A1 (en) 1993-03-24

Similar Documents

Publication Publication Date Title
KR930005351A (ko) 정전방전 검출 및 클램프 제어회로
KR920015584A (ko) Esd 면역성을 개선시키는 기술
KR910013531A (ko) 집적회로용 정전 방전 보호 회로
KR890012385A (ko) 반도체 집적회로
KR880005746A (ko) 반도체집적회로
KR910003898A (ko) 전원용 모놀리식집적회로
NO902819L (no) Omformer med generering av er-verdi for stroem.
CA2129923A1 (en) Protection System for Thyristor Valve
DE68924493D1 (de) Schutzschaltung gegen transiente Überspannungen.
KR890013768A (ko) BiCMOS 전력전이 회로
KR890016760A (ko) 펄스발생회로
ATE300112T1 (de) Schutzschaltung
KR890015285A (ko) 반도체집적회로의 오동작방지회로
EP0372673A3 (en) Telephone protection circuit
MX9404304A (es) Aparato para la proteccion de un sobrevoltaje de lineas telefonicas.
KR890013848A (ko) Ic과전압 방지회로
JPS5780826A (en) Waveform shaping circuit
KR910003888A (ko) 제어회로와 관계있는 전력장치를 포함하는 집적회로의 파워 서플라이에 인가되는 음의 과잉전압에 대한 보호회로
KR930011029A (ko) 접점의 아－크방전 소거회로
ES2060946T3 (es) Circuito de vigilancia.
KR920015677A (ko) 전원전압 레벨 다중 검출회로
KR960027338A (ko) 암 쇼트 보호장치
KR910015957A (ko) El 구동회로
KR940010369A (ko) 트라이악(triac)의 구동방법
KR910003887A (ko) 과전압 검출 및 보호회로

Legal Events

Date Code Title Description
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid