KR920022608A - Manufacturing method of laser diode - Google Patents

Manufacturing method of laser diode Download PDF

Info

Publication number
KR920022608A
KR920022608A KR1019910008727A KR910008727A KR920022608A KR 920022608 A KR920022608 A KR 920022608A KR 1019910008727 A KR1019910008727 A KR 1019910008727A KR 910008727 A KR910008727 A KR 910008727A KR 920022608 A KR920022608 A KR 920022608A
Authority
KR
South Korea
Prior art keywords
forming
type
layer
conductivity type
conductive
Prior art date
Application number
KR1019910008727A
Other languages
Korean (ko)
Other versions
KR940010165B1 (en
Inventor
김종렬
김준영
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019910008727A priority Critical patent/KR940010165B1/en
Publication of KR920022608A publication Critical patent/KR920022608A/en
Application granted granted Critical
Publication of KR940010165B1 publication Critical patent/KR940010165B1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region

Abstract

내용 없음.No content.

Description

레이저 다이오드의 제조방법Manufacturing method of laser diode

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제2(가)~(다)도는 이 발명에 따른 VSIS형 레이저 다이오드의 제조방법이다.2 (a) to (c) are manufacturing methods of the VSIS laser diode according to the present invention.

Claims (6)

레이저 다이오드의 제조방법에 있어서, 제1도전형의 화합물 반도체 기판상에 제2도전형의 확산영역을 형성하는 공정과, 상기 확산영역의 상부를 에칭하여 V-채널을 형성하는 공정과, 상기 구조의 전표면에 제1도전형의 제1클래드층을 형성하는 공정과, 상기 제1클래드층의 상부에 제2도전형의 활성층을 형성하는 공정과, 상기 활성층의 상부에 제2도전형의 제2클래드층을 형성하는 공정과, 상기 제2클래드층의 상부에 제2도전형의 캡층을 형성하는 공정과, 상기 캡층의 상부에 산화막을 증착하여 형성하는 공정과, 상기 산화막의 소정부분을 제거하고 제2도전형의 전극을 형성하는 공정과, 상기 화합물 반도체 기판의 하부에 제1도전형의 전극을 형성하는 공정으로 이루어지는 레이저 다이오드의 제조방법.A method of manufacturing a laser diode, comprising: forming a diffusion region of a second conductivity type on a compound semiconductor substrate of a first conductivity type, forming a V-channel by etching an upper portion of the diffusion region, and the structure Forming a first cladding layer of a first conductivity type on the entire surface of the film, forming an active layer of a second conductivity type on top of the first cladding layer, and forming a second conductive type layer on top of the active layer Forming a cladding layer, forming a cap layer of a second conductivity type on top of the second cladding layer, depositing an oxide film on top of the cap layer, and removing a predetermined portion of the oxide film. And forming a second conductive electrode and forming a first conductive electrode under the compound semiconductor substrate. 제1항에 있어서, 상기 제1도전형은 N형이고 제2도전형은 P형인 레이저 다이오드의 제조방법.The method of claim 1, wherein the first conductive type is N type and the second conductive type is P type. 제1항에 있어서, 상기 제1도전형의 화합물 반도체 기판은 GaAs인 레이저 다이오드의 제조방법.The method of claim 1, wherein the compound semiconductor substrate of the first conductive type is GaAs. 제1항에 있어서, 상기 층들은 700~800℃의 온도로 LPE방법을 이용하여 형성하는 레이저 다이오드의 제조방법.The method of claim 1, wherein the layers are formed using an LPE method at a temperature of 700 to 800 ° C. 제1항에 있어서, 상기 P+형 확산영역은 전류제한층으로 이용되며, P형 불순물인 Zn등의 물질로 확산하며 불순물이 1x10/㎠ 정도의 고농도로 도우핑되어 1㎛정도의 두께로 형성된 레이저 다이오드의 제조방법.The laser beam of claim 1, wherein the P + type diffusion region is used as a current limiting layer and diffuses into a material such as Zn, which is a P type impurity, and is doped at a high concentration of about 1 × 10 / cm 2 to form a laser having a thickness of about 1 μm. Method of manufacturing a diode. 제1항에 있어서, 상기 V-채널은 폭~2.5㎛, 깊이~1.5㎛정도로 형성된 레이저 다이오드의 제조방법.The method of claim 1, wherein the V-channel has a width of about 2.5 μm and a depth of about 1.5 μm. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019910008727A 1991-05-28 1991-05-28 Manufacturing method of laser diode KR940010165B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019910008727A KR940010165B1 (en) 1991-05-28 1991-05-28 Manufacturing method of laser diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019910008727A KR940010165B1 (en) 1991-05-28 1991-05-28 Manufacturing method of laser diode

Publications (2)

Publication Number Publication Date
KR920022608A true KR920022608A (en) 1992-12-19
KR940010165B1 KR940010165B1 (en) 1994-10-22

Family

ID=19315055

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910008727A KR940010165B1 (en) 1991-05-28 1991-05-28 Manufacturing method of laser diode

Country Status (1)

Country Link
KR (1) KR940010165B1 (en)

Also Published As

Publication number Publication date
KR940010165B1 (en) 1994-10-22

Similar Documents

Publication Publication Date Title
KR890004441A (en) Compound Semiconductor Device and Manufacturing Method Thereof
KR910008875A (en) Semiconductor light emitting device
KR920017309A (en) Laser diode array and its manufacturing method
KR910008841A (en) Semiconductor device with overvoltage protection function and manufacturing method thereof
KR860006851A (en) Semiconductor laser
KR870009506A (en) Semiconductor laser device and manufacturing method thereof
KR920022608A (en) Manufacturing method of laser diode
CA1089571A (en) Contacting structure on a semiconductor arrangement
KR880008479A (en) Manufacturing method of semiconductor laser device
KR960026252A (en) Semiconductor Device Having Ohmic Electrode and Manufacturing Method
KR920702052A (en) Semiconductor light emitting device
KR920013831A (en) Semiconductor laser diode and manufacturing method thereof
JPS62152184A (en) Photodiode
KR920013824A (en) Laser diode manufacturing method
KR920013833A (en) Semiconductor laser diode and manufacturing method thereof
KR920013827A (en) Laser diode and manufacturing method thereof
KR920013822A (en) Semiconductor laser diode and manufacturing method thereof
KR940003096A (en) High electron mobility transistor and manufacturing method
KR920020796A (en) Manufacturing method of laser diode
KR920013796A (en) Compound Semiconductor Device and Manufacturing Method Thereof
KR930022647A (en) Manufacturing method of laser diode
KR890017834A (en) Semiconductor laser and manufacturing method
KR930020786A (en) Laser diode and manufacturing method
KR920013795A (en) Compound Semiconductor Device and Manufacturing Method Thereof
KR930020792A (en) Array Method of Laser Diode

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20040920

Year of fee payment: 11

LAPS Lapse due to unpaid annual fee