KR930022647A - Manufacturing method of laser diode - Google Patents

Manufacturing method of laser diode Download PDF

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Publication number
KR930022647A
KR930022647A KR1019920006445A KR920006445A KR930022647A KR 930022647 A KR930022647 A KR 930022647A KR 1019920006445 A KR1019920006445 A KR 1019920006445A KR 920006445 A KR920006445 A KR 920006445A KR 930022647 A KR930022647 A KR 930022647A
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KR
South Korea
Prior art keywords
layer
forming
manufacturing
active layer
laser diode
Prior art date
Application number
KR1019920006445A
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Korean (ko)
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KR950011996B1 (en
Inventor
박주성
Original Assignee
김광호
삼성전자 주식회사
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Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019920006445A priority Critical patent/KR950011996B1/en
Publication of KR930022647A publication Critical patent/KR930022647A/en
Application granted granted Critical
Publication of KR950011996B1 publication Critical patent/KR950011996B1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

제1클레드층, 활성층, 제2클레드층 및 캡층을 구비하는 LD의 제조방법에 있어서, 활성층에 소량의 In을 첨가하여 활성층의 τcrss를 증가시켜 활성층과 제1 및 제2클레드층 및 캡층내에 전위, 빈격자점 그리고 핀홀등의 결함생성을 방지하였다. 따라서 LD내에서 전자나 정공의 트랩으로 작용하는 전위, 빈격자점 및 핀홀등의 결함이 감소하여 LD의 광효율 및 신뢰성을 향상시킬 수 있다.In the manufacturing method of the LD having the first cladding layer, the active layer, the second cladding layer and the cap layer, by adding a small amount of In to the active layer to increase the τcrss of the active layer to the active layer and the first and second cladding layer and Defects such as dislocations, void lattice points, and pinholes were prevented in the cap layer. Therefore, defects such as potentials, void lattice points, and pinholes acting as traps of electrons or holes in the LD can be reduced, thereby improving the light efficiency and reliability of the LD.

Description

레이저다이오드의 제조방법Manufacturing method of laser diode

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1(a)~(b)도는 종래 레이저다이오드의 제조공정도.1 (a) to (b) is a manufacturing process diagram of a conventional laser diode.

제2(a)~(c)도는 이 발명에 따른 레이저다이오드의 제조 공정도이다.2 (a) to (c) are manufacturing process diagrams of the laser diode according to the present invention.

Claims (4)

제1도전형의 반도체기판상에 제1도전형의 제1클레드층을 형성하는 공정과, 상기 제1클레드층상에 활성층을 형성하는 공정과, 상기 활성층상에 제2도전형의 제2클레드층을 형성하는 공정과, 상기 제2클레드층의 표면에 제2도전형의 캡층을 형성하는 공정과, 상기 캡층의 상부에 절연층을 형성한 후 상기 절연층의 소정부위를 식각하여 캡층의 일부분이 노출되도록 접속창을 형성하는 공정과, 상기 절연층 및 캡층의 표명에 제2도전형의 전극을 형성하는 공정과, 상기 반도체기판의 하부표면에 제1도전형의 전극을 형성하는 공정을 구비하는 레이저다이오드의 제조방법에 있어서, 상기 활성층에 In을 10% 이하의 몰비로 함유시켜 형성하는 레이저다이오드의 제조방법.Forming a first cladding layer of a first conductivity type on a semiconductor substrate of a first conductivity type, forming an active layer on the first cladding layer, and a second conductive type second layer on the active layer Forming a clad layer, forming a cap layer of a second conductivity type on the surface of the second clad layer, and forming an insulating layer on the cap layer, and then etching a predetermined portion of the insulating layer. Forming a connection window so that a portion of the cap layer is exposed; forming a second conductive electrode on the surface of the insulating layer and the cap layer; and forming an electrode of the first conductive type on the lower surface of the semiconductor substrate. A method of manufacturing a laser diode having a step, wherein the active layer is formed by containing In at a molar ratio of 10% or less. 제1항에 있어서, 상기 반도체 기판을 GaAs 기판으로 하고, 상기 제1 및 제2클레드층을 AlGaAs층으로 하며, 활성층을InAlGaAs로 하며, 캡층을 GaAs로 하는 레이저다이오드의 제조방법.The method of manufacturing a laser diode according to claim 1, wherein the semiconductor substrate is a GaAs substrate, the first and second clad layers are AlGaAs layers, the active layer is InAlGaAs, and the cap layer is GaAs. 제1항에 있어서, 상기 절연층을 산화규소 및 질화규소를 이루어지는 균에서 임의로 선택되는 하나의 절연물질로 형성하는 레이저다이오드의 제조방법.The method of manufacturing a laser diode according to claim 1, wherein the insulating layer is formed of one insulating material arbitrarily selected from bacteria comprising silicon oxide and silicon nitride. 제1항에 있어서, 상기 제1클레드층, 활성층, 제2클레드층 및 캡층을 LPE 및 MOCVD로 이루어지는 군에서 임의로 선택되는 하나의 방법으로 형성하는 레이저다이오드의 제조방법.The method of claim 1, wherein the first cladding layer, the active layer, the second cladding layer, and the cap layer are formed by one method arbitrarily selected from the group consisting of LPE and MOCVD. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019920006445A 1992-04-17 1992-04-17 Laser diode manufacturing method KR950011996B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019920006445A KR950011996B1 (en) 1992-04-17 1992-04-17 Laser diode manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019920006445A KR950011996B1 (en) 1992-04-17 1992-04-17 Laser diode manufacturing method

Publications (2)

Publication Number Publication Date
KR930022647A true KR930022647A (en) 1993-11-24
KR950011996B1 KR950011996B1 (en) 1995-10-13

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019920006445A KR950011996B1 (en) 1992-04-17 1992-04-17 Laser diode manufacturing method

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KR950011996B1 (en) 1995-10-13

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