KR920010376U - 열처리 장치 - Google Patents

열처리 장치

Info

Publication number
KR920010376U
KR920010376U KR2019910018975U KR910018975U KR920010376U KR 920010376 U KR920010376 U KR 920010376U KR 2019910018975 U KR2019910018975 U KR 2019910018975U KR 910018975 U KR910018975 U KR 910018975U KR 920010376 U KR920010376 U KR 920010376U
Authority
KR
South Korea
Prior art keywords
heat treatment
treatment device
heat
treatment
Prior art date
Application number
KR2019910018975U
Other languages
English (en)
Other versions
KR0129363Y1 (ko
Inventor
요시노부 우치다
Original Assignee
도오교오 에레구토론 사가미 가부시끼 가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 도오교오 에레구토론 사가미 가부시끼 가이샤 filed Critical 도오교오 에레구토론 사가미 가부시끼 가이샤
Publication of KR920010376U publication Critical patent/KR920010376U/ko
Application granted granted Critical
Publication of KR0129363Y1 publication Critical patent/KR0129363Y1/ko

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67098—Apparatus for thermal treatment
    • H01L21/67115—Apparatus for thermal treatment mainly by radiation
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02—Epitaxial-layer growth
    • C30B25/10—Heating of the reaction chamber or the substrate
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B31/00—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
    • C30B31/06—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion material in the gaseous state
    • C30B31/12—Heating of the reaction chamber
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B3/00—Ohmic-resistance heating
    • H05B3/62—Heating elements specially adapted for furnaces
    • H05B3/66—Supports or mountings for heaters on or in the wall or roof

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Mechanical Engineering (AREA)
  • Furnace Details (AREA)
KR2019910018975U 1990-11-13 1991-11-08 열처리 장치 KR0129363Y1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP1990118791U JPH079036Y2 (ja) 1990-11-13 1990-11-13 縦型熱処理炉
JP90-118791 1990-11-13

Publications (2)

Publication Number Publication Date
KR920010376U true KR920010376U (ko) 1992-06-17
KR0129363Y1 KR0129363Y1 (ko) 1999-02-01

Family

ID=14745190

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910018975U KR0129363Y1 (ko) 1990-11-13 1991-11-08 열처리 장치

Country Status (3)

Country Link
US (1) US5187771A (ko)
JP (1) JPH079036Y2 (ko)
KR (1) KR0129363Y1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100483457B1 (ko) * 1997-02-18 2005-08-29 동경 엘렉트론 주식회사 열처리장치

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3380988B2 (ja) * 1993-04-21 2003-02-24 東京エレクトロン株式会社 熱処理装置
US5592581A (en) * 1993-07-19 1997-01-07 Tokyo Electron Kabushiki Kaisha Heat treatment apparatus
US5506389A (en) * 1993-11-10 1996-04-09 Tokyo Electron Kabushiki Kaisha Thermal processing furnace and fabrication method thereof
US5578232A (en) * 1995-05-04 1996-11-26 Hart & Cooley, Inc. Open-coil heater assembly and insulator therefor
US6005225A (en) * 1997-03-28 1999-12-21 Silicon Valley Group, Inc. Thermal processing apparatus
JP3848442B2 (ja) * 1997-08-20 2006-11-22 株式会社日立国際電気 ヒータ支持装置及び半導体製造装置及び半導体装置の製造方法
US6059567A (en) * 1998-02-10 2000-05-09 Silicon Valley Group, Inc. Semiconductor thermal processor with recirculating heater exhaust cooling system
US6807220B1 (en) * 2003-05-23 2004-10-19 Mrl Industries Retention mechanism for heating coil of high temperature diffusion furnace
NL1028057C2 (nl) * 2005-01-18 2006-07-19 Tempress Systems Inrichting voor het op zijn plaats houden van verhittingsdraden in een horizontale oven.
US8023806B2 (en) * 2007-03-20 2011-09-20 Tokyo Electron Limited Heat processing furnace and vertical-type heat processing apparatus
DE102008007354B4 (de) * 2008-01-29 2009-11-19 Stiftung Alfred-Wegener-Institut Für Polar- Und Meeresforschung Hochtemperatur-Rohrofen für die Pyrolyse
JP5096182B2 (ja) * 2008-01-31 2012-12-12 東京エレクトロン株式会社 熱処理炉
JP5544121B2 (ja) * 2009-07-21 2014-07-09 株式会社日立国際電気 加熱装置、基板処理装置、及び半導体装置の製造方法
KR101096602B1 (ko) * 2009-07-21 2011-12-20 가부시키가이샤 히다치 고쿠사이 덴키 가열 장치, 기판 처리 장치 및 반도체 장치의 제조 방법
US9064912B2 (en) * 2009-07-21 2015-06-23 Hitachi Kokusai Electric, Inc. Heating device, substrate processing apparatus, and method of manufacturing semiconductor device
JP5787563B2 (ja) * 2010-05-11 2015-09-30 株式会社日立国際電気 ヒータ支持装置及び加熱装置及び基板処理装置及び半導体装置の製造方法及び基板の製造方法及び保持用ピース
TWI565367B (zh) 2010-06-25 2017-01-01 山特維克熱傳動公司 用於加熱元件線圈之支撐結構
US20120061377A1 (en) * 2010-09-10 2012-03-15 Mitch Agamohamadi Thermal processing apparatus with optimized structural support mechanism
US8987641B2 (en) * 2011-06-20 2015-03-24 Arsalan Emami High performance heater
JP5868619B2 (ja) * 2011-06-21 2016-02-24 ニチアス株式会社 熱処理炉及び熱処理装置
US9958302B2 (en) 2011-08-20 2018-05-01 Reno Technologies, Inc. Flow control system, method, and apparatus
US9188989B1 (en) 2011-08-20 2015-11-17 Daniel T. Mudd Flow node to deliver process gas using a remote pressure measurement device
US20140166640A1 (en) * 2012-12-13 2014-06-19 Sandvik Thermal Process Inc Support for resisting radial creep of a heating element coil
JP2015021598A (ja) * 2013-07-23 2015-02-02 東京エレクトロン株式会社 断熱ユニット及びそれを備えた熱処理装置
US9497803B2 (en) * 2014-02-03 2016-11-15 Plansee Se Supporting system for a heating element and heating system
CN105789084B (zh) * 2014-12-17 2019-04-23 北京北方华创微电子装备有限公司 加热腔室以及半导体加工设备
WO2017156503A1 (en) 2016-03-10 2017-09-14 Arsalan Emami Improved industrial heater
US10679880B2 (en) 2016-09-27 2020-06-09 Ichor Systems, Inc. Method of achieving improved transient response in apparatus for controlling flow and system for accomplishing same
US11144075B2 (en) 2016-06-30 2021-10-12 Ichor Systems, Inc. Flow control system, method, and apparatus
US10838437B2 (en) 2018-02-22 2020-11-17 Ichor Systems, Inc. Apparatus for splitting flow of process gas and method of operating same
US10303189B2 (en) 2016-06-30 2019-05-28 Reno Technologies, Inc. Flow control system, method, and apparatus
US10663337B2 (en) 2016-12-30 2020-05-26 Ichor Systems, Inc. Apparatus for controlling flow and method of calibrating same
DE102017102276B3 (de) 2017-02-06 2018-08-02 Benteler Automobiltechnik Gmbh Elektrisches Widerstandsgerät und Verwendung eines elektrischen Widerstandsgeräts
WO2022186971A1 (en) 2021-03-03 2022-09-09 Ichor Systems, Inc. Fluid flow control system comprising a manifold assembly

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US635133A (en) * 1898-01-31 1899-10-17 Edward E Gold Electric heater.
US1649925A (en) * 1925-05-18 1927-11-22 Holcroft & Co Electric heating device
GB1123606A (en) * 1965-09-03 1968-08-14 Atomic Energy Of Australia Improvements in electric resistance furnaces
JPH0110921Y2 (ko) * 1984-11-05 1989-03-29
JPS62170186A (ja) * 1986-01-23 1987-07-27 東京エレクトロン相模株式会社 熱処理装置
US4849608A (en) * 1987-02-14 1989-07-18 Dainippon Screen Mfg. Co., Ltd. Apparatus for heat-treating wafers
JPH047598Y2 (ko) * 1987-03-16 1992-02-27
US5038019A (en) * 1990-02-06 1991-08-06 Thermtec, Inc. High temperature diffusion furnace

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100483457B1 (ko) * 1997-02-18 2005-08-29 동경 엘렉트론 주식회사 열처리장치

Also Published As

Publication number Publication date
KR0129363Y1 (ko) 1999-02-01
JPH079036Y2 (ja) 1995-03-06
US5187771A (en) 1993-02-16
JPH0474299U (ko) 1992-06-29

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