KR920009928U - 반도체 검사용 핸들러의 접촉핑거장치 - Google Patents

반도체 검사용 핸들러의 접촉핑거장치

Info

Publication number
KR920009928U
KR920009928U KR2019900017133U KR900017133U KR920009928U KR 920009928 U KR920009928 U KR 920009928U KR 2019900017133 U KR2019900017133 U KR 2019900017133U KR 900017133 U KR900017133 U KR 900017133U KR 920009928 U KR920009928 U KR 920009928U
Authority
KR
South Korea
Prior art keywords
contact finger
semiconductor inspection
finger device
inspection handler
handler
Prior art date
Application number
KR2019900017133U
Other languages
English (en)
Other versions
KR950009613Y1 (ko
Inventor
안종기
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019900017133U priority Critical patent/KR950009613Y1/ko
Publication of KR920009928U publication Critical patent/KR920009928U/ko
Application granted granted Critical
Publication of KR950009613Y1 publication Critical patent/KR950009613Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019900017133U 1990-11-09 1990-11-09 반도체 검사용 핸들러의 접촉핑거장치 KR950009613Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900017133U KR950009613Y1 (ko) 1990-11-09 1990-11-09 반도체 검사용 핸들러의 접촉핑거장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900017133U KR950009613Y1 (ko) 1990-11-09 1990-11-09 반도체 검사용 핸들러의 접촉핑거장치

Publications (2)

Publication Number Publication Date
KR920009928U true KR920009928U (ko) 1992-06-17
KR950009613Y1 KR950009613Y1 (ko) 1995-11-08

Family

ID=19305166

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900017133U KR950009613Y1 (ko) 1990-11-09 1990-11-09 반도체 검사용 핸들러의 접촉핑거장치

Country Status (1)

Country Link
KR (1) KR950009613Y1 (ko)

Also Published As

Publication number Publication date
KR950009613Y1 (ko) 1995-11-08

Similar Documents

Publication Publication Date Title
KR900010988A (ko) 반도체 집적회로장치
KR900008673A (ko) 반도체집적회로장치
DE69132354D1 (de) Halbleitervorrichtung
KR890017789A (ko) 반도체 집적회로장치
KR900017269A (ko) 반도체 집적회로 장치
KR890004421A (ko) 반도체집적회로장치
DE69033594D1 (de) Struktur für Halbleitersubstrat verwendet für IC-Hochleistungsanordnung
KR890012388A (ko) Mis형 반도체 집적회로장치
DE69131118D1 (de) Halbleitereinheit
BR8806583A (pt) Dispositivo de memoria de semicondutor e circuito de restauracao
DE69127494D1 (de) Halbleiteranordnung
DE69033794D1 (de) Halbleiteranordnung
KR900011093A (ko) 집적 회로형 반도체 소자
DE69029226D1 (de) Halbleiteranordnung
DE68929131D1 (de) LSI-Halbleiteranordnung
KR920009928U (ko) 반도체 검사용 핸들러의 접촉핑거장치
DE69027586D1 (de) Halbleiteranordnung
DE69025825D1 (de) Halbleiteranordnung
KR900011014A (ko) 반도체 집적회로장치
KR900012356A (ko) 반도체장치
KR920009927U (ko) 반도체 소자 검사기의 핑거
KR910005447A (ko) 웨이퍼 스캐일(scale) 집적회로 장치
KR910013564A (ko) 반도체장치
KR900019258A (ko) 반도체장치
KR920003412U (ko) 반도체소자 시험용 디유티보드

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20041108

Year of fee payment: 10

EXPY Expiration of term