KR910020489A - 감광성 수지조성물 - Google Patents
감광성 수지조성물 Download PDFInfo
- Publication number
- KR910020489A KR910020489A KR1019910007405A KR910007405A KR910020489A KR 910020489 A KR910020489 A KR 910020489A KR 1019910007405 A KR1019910007405 A KR 1019910007405A KR 910007405 A KR910007405 A KR 910007405A KR 910020489 A KR910020489 A KR 910020489A
- Authority
- KR
- South Korea
- Prior art keywords
- resin composition
- photosensitive resin
- halogen atom
- acid catalyst
- catalyst generator
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/04—Chromates
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/146—Laser beam
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Materials For Photolithography (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
Claims (2)
- 베이스 수지, 산가교제(酸架橋劑) 및 광반응성 산촉매(酸觸媒)발생제가 혼합되어 이루어지는 감광성 수지 조성물에 있어서, 상기 광반응성 산촉매발생제가 다음의 구조식 Ⅰ〔단, X1, X2, X3은 할로겐원자 또는 수소원자를 표시하며, 이들중 최소한 하나는 할로겐원자임〕으로 표현되는 테트라키스-1,2,4,5-(폴리할로메틸)벤젠인 것을 특징으로 하는 감광성 수지 조성물.
- 베이스 수지, 산가교제및 광반응성 산촉매 발생제가 혼합되어 이루어지는 감광성 수지조성물에 있어서, 상기 광반응성 산촉매발생제가 다음의 구조식 Ⅱ〔단, X4, X5, X6은 할로겐원자 또는 수소원자를 표시하며, 이들중 최소한 하나는 할로겐원자임〕으로 표현되는 트리스(폴리할로메틸)벤젠인 것을 특징으로 하는 감광성 수지 조성물.※ 참고사항 : 최초출원 내용에 의하여 공개되는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2123000A JP2861253B2 (ja) | 1990-05-15 | 1990-05-15 | 感光性樹脂組成物 |
JP2-123000 | 1990-05-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR910020489A true KR910020489A (ko) | 1991-12-20 |
Family
ID=14849789
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910007405A KR910020489A (ko) | 1990-05-15 | 1991-05-08 | 감광성 수지조성물 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5208133A (ko) |
JP (1) | JP2861253B2 (ko) |
KR (1) | KR910020489A (ko) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04107560A (ja) * | 1990-08-29 | 1992-04-09 | Mitsubishi Kasei Corp | ネガ型感光性組成物 |
EP0537524A1 (en) | 1991-10-17 | 1993-04-21 | Shipley Company Inc. | Radiation sensitive compositions and methods |
EP0599779A1 (de) * | 1992-10-29 | 1994-06-01 | OCG Microelectronic Materials AG | Hochauflösender negativ arbeitender Photoresist mit grossem Prozessspielraum |
TW288112B (ko) * | 1993-06-02 | 1996-10-11 | Sumitomo Chemical Co | |
US5691101A (en) | 1994-03-15 | 1997-11-25 | Kabushiki Kaisha Toshiba | Photosensitive composition |
JPH08152716A (ja) * | 1994-11-28 | 1996-06-11 | Mitsubishi Electric Corp | ネガ型レジスト及びレジストパターンの形成方法 |
US6323287B1 (en) * | 1999-03-12 | 2001-11-27 | Arch Specialty Chemicals, Inc. | Hydroxy-amino thermally cured undercoat for 193 NM lithography |
US6819427B1 (en) | 2001-10-10 | 2004-11-16 | Advanced Micro Devices, Inc. | Apparatus of monitoring and optimizing the development of a photoresist material |
US6634805B1 (en) | 2001-10-10 | 2003-10-21 | Advanced Micro Devices, Inc. | Parallel plate development |
JP4586920B2 (ja) * | 2006-04-24 | 2010-11-24 | Jsr株式会社 | 感光性樹脂組成物 |
CN106030711B (zh) * | 2013-12-20 | 2019-02-22 | 科思创德国股份有限公司 | 具有改进的光敏性的全息介质 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3515552A (en) * | 1966-09-16 | 1970-06-02 | Minnesota Mining & Mfg | Light-sensitive imaging sheet and method of using |
US4113497A (en) * | 1973-06-11 | 1978-09-12 | American Can Company | Compositions with organohalogen compound and diazonium salts as photoinitiators of epoxy compounds in photo-polymerization |
CA1307695C (en) * | 1986-01-13 | 1992-09-22 | Wayne Edmund Feely | Photosensitive compounds and thermally stable and aqueous developablenegative images |
JPH03102355A (ja) * | 1989-09-18 | 1991-04-26 | Sony Corp | 感光性樹脂組成物 |
JP2660352B2 (ja) * | 1989-09-20 | 1997-10-08 | 日本ゼオン株式会社 | レジスト組成物 |
-
1990
- 1990-05-15 JP JP2123000A patent/JP2861253B2/ja not_active Expired - Fee Related
-
1991
- 1991-05-08 KR KR1019910007405A patent/KR910020489A/ko not_active Application Discontinuation
- 1991-05-15 US US07/700,469 patent/US5208133A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2861253B2 (ja) | 1999-02-24 |
US5208133A (en) | 1993-05-04 |
JPH0419666A (ja) | 1992-01-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |