KR880700970A - 폴트 허용 메모리 시스템 - Google Patents

폴트 허용 메모리 시스템

Info

Publication number
KR880700970A
KR880700970A KR870700729A KR870700729A KR880700970A KR 880700970 A KR880700970 A KR 880700970A KR 870700729 A KR870700729 A KR 870700729A KR 870700729 A KR870700729 A KR 870700729A KR 880700970 A KR880700970 A KR 880700970A
Authority
KR
South Korea
Prior art keywords
memory system
fault tolerant
tolerant memory
fault
tolerant
Prior art date
Application number
KR870700729A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of KR880700970A publication Critical patent/KR880700970A/ko

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/006—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation at wafer scale level, i.e. wafer scale integration [WSI]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/86—Masking faults in memories by using spares or by reconfiguring in serial access memories, e.g. shift registers, CCDs, bubble memories

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
KR870700729A 1985-12-13 1987-08-13 폴트 허용 메모리 시스템 KR880700970A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8530770A GB2184268B (en) 1985-12-13 1985-12-13 Fault tolerant memory system
PCT/GB1986/000760 WO1987003716A2 (en) 1985-12-13 1986-12-12 Fault tolerant memory system

Publications (1)

Publication Number Publication Date
KR880700970A true KR880700970A (ko) 1988-04-13

Family

ID=10589724

Family Applications (1)

Application Number Title Priority Date Filing Date
KR870700729A KR880700970A (ko) 1985-12-13 1987-08-13 폴트 허용 메모리 시스템

Country Status (6)

Country Link
US (1) US4868789A (ko)
EP (1) EP0248875A1 (ko)
JP (1) JPS63502147A (ko)
KR (1) KR880700970A (ko)
GB (1) GB2184268B (ko)
WO (1) WO1987003716A2 (ko)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2184268B (en) * 1985-12-13 1989-11-22 Anamartic Ltd Fault tolerant memory system
DE3887335T2 (de) * 1987-07-17 1994-08-25 Ivor Catt Integrierte schaltungen.
US5146571A (en) * 1988-03-28 1992-09-08 Emc Corporation Remapping defects in a storage system through the use of a tree structure
JPH0290816A (ja) * 1988-09-28 1990-03-30 Hitachi Ltd 誤り訂正方法および回路
GB8903180D0 (en) * 1989-02-13 1989-03-30 Anamartic Ltd Fault masking in semiconductor memories
EP0389203A3 (en) * 1989-03-20 1993-05-26 Fujitsu Limited Semiconductor memory device having information indicative of presence of defective memory cells
US5077737A (en) * 1989-08-18 1991-12-31 Micron Technology, Inc. Method and apparatus for storing digital data in off-specification dynamic random access memory devices
JP2617026B2 (ja) * 1989-12-22 1997-06-04 インターナショナル・ビジネス・マシーンズ・コーポレーション 障害余裕性メモリ・システム
US5105425A (en) * 1989-12-29 1992-04-14 Westinghouse Electric Corp. Adaptive or fault tolerant full wafer nonvolatile memory
JPH03214500A (ja) * 1990-01-18 1991-09-19 Sony Corp メモリ装置
US5128737A (en) * 1990-03-02 1992-07-07 Silicon Dynamics, Inc. Semiconductor integrated circuit fabrication yield improvements
JP2781658B2 (ja) * 1990-11-19 1998-07-30 日本電気アイシーマイコンシステム株式会社 アドレス生成回路とそれを用いたｃｄ―ｒｏｍ装置
US5377148A (en) * 1990-11-29 1994-12-27 Case Western Reserve University Apparatus and method to test random access memories for a plurality of possible types of faults
GB9305801D0 (en) * 1993-03-19 1993-05-05 Deans Alexander R Semiconductor memory system
JP3059076B2 (ja) * 1995-06-19 2000-07-04 シャープ株式会社 不揮発性半導体記憶装置
FR2754100B1 (fr) * 1996-09-30 1998-11-20 Sgs Thomson Microelectronics Memoire a acces serie avec securisation de l'ecriture

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1377859A (en) * 1972-08-03 1974-12-18 Catt I Digital integrated circuits
JPS5528160B2 (ko) * 1974-12-16 1980-07-25
US4070651A (en) * 1975-07-10 1978-01-24 Texas Instruments Incorporated Magnetic domain minor loop redundancy system
US4066880A (en) * 1976-03-30 1978-01-03 Engineered Systems, Inc. System for pretesting electronic memory locations and automatically identifying faulty memory sections
JPS5925307B2 (ja) * 1978-02-17 1984-06-16 株式会社日立製作所 記憶装置
GB2083929B (en) * 1980-08-21 1984-03-07 Burroughs Corp Branched labyrinth wafer scale integrated circuit
GB2089536B (en) * 1980-12-12 1984-05-23 Burroughs Corp Improvement in or relating to wafer scale integrated circuits
JPS59214952A (ja) * 1983-05-20 1984-12-04 Nec Corp 障害処理方式
GB2166273A (en) * 1984-10-29 1986-04-30 Thesys Memory Products Corp Fault avoidance in semiconductor memories
US4706216A (en) * 1985-02-27 1987-11-10 Xilinx, Inc. Configurable logic element
GB2177825B (en) * 1985-07-12 1989-07-26 Anamartic Ltd Control system for chained circuit modules
GB2181870B (en) * 1985-10-14 1988-11-23 Anamartic Ltd Control circuit for chained circuit modules
GB2184268B (en) * 1985-12-13 1989-11-22 Anamartic Ltd Fault tolerant memory system

Also Published As

Publication number Publication date
JPS63502147A (ja) 1988-08-18
GB2184268A (en) 1987-06-17
GB8530770D0 (en) 1986-01-22
WO1987003716A3 (en) 1987-07-16
US4868789A (en) 1989-09-19
WO1987003716A2 (en) 1987-06-18
GB2184268B (en) 1989-11-22
EP0248875A1 (en) 1987-12-16

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Legal Events

Date Code Title Description
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid