KR880014570A - Pulse Generator of Semiconductor Memory Device - Google Patents

Pulse Generator of Semiconductor Memory Device Download PDF

Info

Publication number
KR880014570A
KR880014570A KR870004867A KR870004867A KR880014570A KR 880014570 A KR880014570 A KR 880014570A KR 870004867 A KR870004867 A KR 870004867A KR 870004867 A KR870004867 A KR 870004867A KR 880014570 A KR880014570 A KR 880014570A
Authority
KR
South Korea
Prior art keywords
output
address change
pulse
change detector
precharge
Prior art date
Application number
KR870004867A
Other languages
Korean (ko)
Other versions
KR890005161B1 (en
Inventor
정태성
황상기
이정열
박희철
Original Assignee
강진구
삼성반도체통신 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 강진구, 삼성반도체통신 주식회사 filed Critical 강진구
Priority to KR1019870004867A priority Critical patent/KR890005161B1/en
Publication of KR880014570A publication Critical patent/KR880014570A/en
Application granted granted Critical
Publication of KR890005161B1 publication Critical patent/KR890005161B1/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards

Landscapes

  • Static Random-Access Memory (AREA)
  • Read Only Memory (AREA)

Abstract

내용 없음No content

Description

반도체 메모리 장치의 펄스 발생기Pulse Generator of Semiconductor Memory Device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제3도는 본 발명에 따른 프리차이지 펄스 발생기의 회로도, 제4도는 제3도의 각 부분의 타이밍도, 제5(A)-(B)도는 전원 공급전압 Vcc의 변화와 제조공정 상에서 폴리실리콘 폭의 변화에 따른 펄스 폭의 변화.3 is a circuit diagram of a pre-charge pulse generator according to the present invention, FIG. 4 is a timing diagram of each part of FIG. 3, and FIGS. Change in pulse width with change.

Claims (2)

어드레스 변화를 검출하는 어드레스 변화 검출기와 다수의 메모리셀들과 상기 메모리셀들과 접속된 한쌍의 비트라인들과 상기 메모리셀들을 선택하는 다수의 워드라인들과 상기 한쌍의 비트라인의 단부에 접속된 프리차아지 회로를 구비한 반도체 메모리 장치의 프리차아지 펄스 발생 회로에 있어서, 상기 어드레스 변화검출기로부터 출력하는 펄스를 입력하여 반전 출력하는 인버어터 수단과, 상기 인버어터 수단과 접속되며 상기 어드레스 변화 검출기에서 출력하는 펄스의 최초변화 에지에서 즉시 상시 비트라인을 프리차아지하며 상기 펄스의 최초변화 후의 제2에지 변화로부터 소정시간 경과 후 프리차아지 종료를 하는 펄스를 발생하는 지연수단과, 지연수단과 접속되며 상기 지연수단의 출력을 확실하게 출력하도록 해 주는 버어퍼 수단과, 상기 어드레스 변화 검출기의 출력을 입력으로 하여 상기 지연수단을 충전하며 프리차아지 펄스 폭의 오동작을 방지하는 충전수단으로 구성함을 특징으로 하는 회로.An address change detector for detecting an address change, a plurality of memory cells, a pair of bit lines connected to the memory cells, a plurality of word lines for selecting the memory cells, and an end of the pair of bit lines. A precharge pulse generation circuit of a semiconductor memory device having a precharge circuit, comprising: an inverter means for inputting and inverting a pulse output from the address change detector, and the address change detector connected to the inverter means. Delay means for precharging the bit line immediately at the edge of the initial change of the pulse output from the signal and generating a pulse for terminating the precharge after a predetermined time has elapsed from the second edge change after the initial change of the pulse; A buffer means connected to and securely outputting the output of the delay means; And charging means for charging the delay means by inputting the output of the address change detector and preventing malfunction of the precharge pulse width. 상기 제1항에 있어서, 상기 어드레스 변화 검출기 출력신호의 반전 신호단에 워드라인 제조공정시 동일하게 제조되는 폴리실리콘 저항(42)을 연결하고 상기 폴리실리콘 저항(42)와 접지 사이에 캐패시터(44)를 연결하며, 상기 저항(42)와 캐패시터(44)의 접속점 B에 게이트 입력을 상기 어드레스 변화 검출기의 출력신호로 하여 상기 신호의 변화에 따라 트랜지스터의 소오스와 접속된 전원 공급전압을 상기 캐패시터(44)에 충전시켜 주는 모오스 트랜지스터(43)의 드레인과 연결하고, 상기 접속점 B에 출력단이 접속되도록 함을 특징으로 하는 회로.2. The capacitor of claim 1, wherein a polysilicon resistor (42) manufactured in the same manner in a word line manufacturing process is connected to an inverted signal terminal of the address change detector output signal, and a capacitor (44) is connected between the polysilicon resistor (42) and ground. And a power supply voltage connected to a source of a transistor according to the change of the signal by using a gate input as an output signal of the address change detector at a connection point B of the resistor 42 and the capacitor 44. Circuit connected to the drain of the MOS transistor (43) charged to the 44, and the output terminal is connected to the connection point (B). ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019870004867A 1987-05-16 1987-05-16 The pulse generator of semiconductor memory device KR890005161B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019870004867A KR890005161B1 (en) 1987-05-16 1987-05-16 The pulse generator of semiconductor memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019870004867A KR890005161B1 (en) 1987-05-16 1987-05-16 The pulse generator of semiconductor memory device

Publications (2)

Publication Number Publication Date
KR880014570A true KR880014570A (en) 1988-12-24
KR890005161B1 KR890005161B1 (en) 1989-12-14

Family

ID=19261475

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019870004867A KR890005161B1 (en) 1987-05-16 1987-05-16 The pulse generator of semiconductor memory device

Country Status (1)

Country Link
KR (1) KR890005161B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100568535B1 (en) * 1999-08-13 2006-04-06 삼성전자주식회사 Pulse generator

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100568535B1 (en) * 1999-08-13 2006-04-06 삼성전자주식회사 Pulse generator

Also Published As

Publication number Publication date
KR890005161B1 (en) 1989-12-14

Similar Documents

Publication Publication Date Title
JPS6437797A (en) Eprom device
KR890010909A (en) Semiconductor memory circuit
KR890001093A (en) Charge and Equalization Circuit of Semiconductor Memory Device
KR870002653A (en) Complementary semiconductor device reduces latch spill
KR920022293A (en) Semiconductor memory device that performs irregular refresh operations
KR960015568A (en) Step-up potential generating circuit
KR890015265A (en) Nonvolatile Memory Circuitry
KR890007288A (en) Dynamic Random Access Memory
US4063118A (en) MIS decoder providing non-floating outputs with short access time
KR870007512A (en) Semiconductor integrated circuit with circuit for detecting address signal change
KR970012753A (en) Semiconductor memory with single-ended sense amplifiers
KR880006698A (en) I / O circuit of SeaMOS semiconductor memory device
KR870006622A (en) Semiconductor memory
KR890012319A (en) Semiconductor integrated circuit device
KR930003150A (en) Semiconductor memory device with refresh short circuit in data retention mode
US4401904A (en) Delay circuit used in semiconductor memory device
KR880014570A (en) Pulse Generator of Semiconductor Memory Device
KR920018754A (en) Semiconductor memory circuit
KR880008527A (en) Pulse Generator of Semiconductor Memory Device
KR900008919B1 (en) Semiconductor memory device
KR940010099A (en) Bit line sensing circuit
JPS5479527A (en) Voltage sense circuit
KR980004998A (en) An initial pre-charge generator of the synchronous DRAM
KR970055367A (en) Precharge Signal Generators in Semiconductor Devices
KR970051375A (en) Flash memory device

Legal Events

Date Code Title Description
A201 Request for examination
N231 Notification of change of applicant
E902 Notification of reason for refusal
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20040331

Year of fee payment: 16

LAPS Lapse due to unpaid annual fee