KR930003150A - Semiconductor memory device with refresh short circuit in data retention mode - Google Patents

Semiconductor memory device with refresh short circuit in data retention mode Download PDF

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Publication number
KR930003150A
KR930003150A KR1019920007670A KR920007670A KR930003150A KR 930003150 A KR930003150 A KR 930003150A KR 1019920007670 A KR1019920007670 A KR 1019920007670A KR 920007670 A KR920007670 A KR 920007670A KR 930003150 A KR930003150 A KR 930003150A
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KR
South Korea
Prior art keywords
inverter
terminal
terminal connected
refresh
gate
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Application number
KR1019920007670A
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Korean (ko)
Other versions
KR950009391B1 (en
Inventor
윤세승
김문곤
Original Assignee
김광호
삼성전자 주식회사
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Publication date
Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019920007670A priority Critical patent/KR950009391B1/en
Priority claimed from KR1019920007670A external-priority patent/KR950009391B1/en
Priority to US07/912,313 priority patent/US5333128A/en
Priority to JP4187986A priority patent/JP2665859B2/en
Publication of KR930003150A publication Critical patent/KR930003150A/en
Application granted granted Critical
Publication of KR950009391B1 publication Critical patent/KR950009391B1/en

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Abstract

내용 없음.No content.

Description

데이터 보유 모드에서의 리프레시 단축회로를 갖춘 반도체 메모리 장치Semiconductor memory device with refresh short circuit in data retention mode

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 이 발명의 실시예에 따른 데이터 보유 모드에서의 리프레시 단축회로를 갖춘 반도체 메모리 장치의 전체 블럭도이고,1 is an overall block diagram of a semiconductor memory device having a refresh short circuit in a data retention mode according to an embodiment of the present invention,

제2도는 데이터 보유 모드에서의 리프레시 사이클을 나타낸 타이밍도이고,2 is a timing diagram showing a refresh cycle in the data retention mode,

제3도는 이 발명의 실시예에 따른 리프레시 사이클 제어부의 상세 회로도이고,3 is a detailed circuit diagram of the refresh cycle control unit according to the embodiment of the present invention,

제4도는 이 발명의 실시예에 따른 워드라인 부스틱레벨 생성부의 상세 회로도이다.4 is a detailed circuit diagram of a word line boost level generator according to an exemplary embodiment of the present invention.

Claims (3)

리프레시 사이클을 필요로 하는 반도체 메모리 장치에 있어서, 로우어드레스 신호와 셀프 리프레시 신호를 입력신호로 하여 입력신호로 부터 데이터 보유 모드에서의 리프레시 실행 회수를 단축시키는 리프레시 사이클 제어수단과, 셀프 리프레시 신호와 클럭 인에이블 신호를 입력신호로 하여 입력신호로 부터 데이터 보유 모드일 때 워드라인외 부스팅 레벨을 높여주는 워드라인 부스팅 레벨 생성수단과, 메모리 셀 어레이 및 주변 회로를 포함한 메모리 수단으로 이루어지는 것을 특징으로 하는 데이터 보유 모드에서의 리프레시 단축 회로를 갖춘 반도체 메모리 장치.A semiconductor memory device requiring a refresh cycle, comprising: a refresh cycle control means for shortening the number of refresh executions in a data retention mode from an input signal using a low address signal and a self refresh signal as input signals, a self refresh signal, and a clock; Data comprising a word line boosting level generating means for increasing the boost level other than the word line in the data holding mode using the enable signal as an input signal, and memory means including a memory cell array and peripheral circuits. A semiconductor memory device having a refresh short circuit in the retention mode. 제1항에 있어서, 상기한 리프레시 사이클 제어 수단은 셀프 리프레시 신호선에 입력 단자가 연결된 제1인버터와, 로우 어드레스의 최상위 비트라인과 제1인버터의 출력 단자에 각각의 입력단자가 연결된 제1NAND계이트와, 로우 어드레스 라인의 상보 최상위 비트라인과 제1인버터의 출력단자에 각각의 입력단자가 연결된 제1NAND게이트와, 제1NAND게이트의 출력단자에 입력단자가 연결된 제2인버터와, 제2NAND게이트의 출력단자에 입력단자가 연결된 제3인버터로 이루어지는 것을 특징으로 하는 데이터 보유 모드에서의 리프레시 단축 회로를 갖춘 반도체 메모리 장치.The refresh cycle control means according to claim 1, wherein the refresh cycle control means comprises: a first inverter having an input terminal connected to a self refresh signal line; And a first NAND gate having respective input terminals connected to the complementary most significant bit line of the row address line and an output terminal of the first inverter, a second inverter having an input terminal connected to the output terminal of the first NAND gate, and an output of the second NAND gate. A semiconductor memory device having a refresh short-circuit circuit in a data retention mode, characterized in that it comprises a third inverter having an input terminal connected to the terminal. 제1항에 있어서, 상기한 워드라인 부스팅레벨 생성수단은, 셀프 리프레시 신호선에 연결된 제4인버터와, 클럭 인에이블 신호선에 연결된 제5인버터와, 제5인버터에 연결된 제6인버터와, 셀프 리프레시 신호선과 제4인버터의 출력단자 사이에 제어단자가 연결된 제6인버터의 출력 단자에 입력단자가 연결된 트랜스미션 게이트와, 제4인버터의 출력단자에 게이트 단자가 연결되고 전원전압에 드레인 단자가 연결되고 트랜스미션 게이트의 출력단자에 소오스 단자가 연결된 제1전계효과 트랜지스터와, 전원전압에 드레인 단자가 연결되고 트랜스미션 게이트의 출력단자에 게이트 단자와 소오스 단자가 연결된 제2전계효과 트랜지스터와, 트랜스미션 게이트의 출력단자에 한쪽단자가 연결된 제1모스 커패시터와, 제6인버터의 출력단자와 제1모스 커패시터의 다른 한쪽단자 사이에 연결된 제2모스 커패시터와, 전원전압에 드레인 단자가 연결되고 프리 차아지 신호선에 게이트 단자가 연결되고 제1, 제2모스 커패시터의 접속점에 소오스 단자가 연결된 제3전계효과 트랜지스터와, 제1 제2모스 커패시터의 접속점에 드레인 단자가 연결되고 전원전압에 소오스 단자가 연결되고 출력 디스에이블 신호선에 게이트 단자가 연결된 제4전계효과 트랜지터로 이루어지는 것을 특징으로 하는 데이터 보유 모드에서의 리프레시 단축 회로를 갖춘 반도체 메모리 장치.The method of claim 1, wherein the word line boosting level generating means comprises: a fourth inverter connected to the self refresh signal line, a fifth inverter connected to the clock enable signal line, a sixth inverter connected to the fifth inverter, and a self refresh signal line A transmission gate having an input terminal connected to an output terminal of a sixth inverter connected to a control terminal between the output terminal of the fourth inverter and a fourth inverter, a gate terminal connected to an output terminal of the fourth inverter, a drain terminal connected to a power supply voltage, and a transmission gate A first field effect transistor having a source terminal connected to the output terminal of the first field effect transistor, a second field effect transistor having a drain terminal connected to the power supply voltage and a gate terminal and a source terminal connected to the output terminal of the transmission gate, and one output terminal of the transmission gate. A first MOS capacitor connected to a terminal, an output terminal of the sixth inverter, and a first MOS capacitor A second MOS capacitor connected between the other terminal, a third field effect transistor having a drain terminal connected to a power supply voltage, a gate terminal connected to a precharge signal line, and a source terminal connected to a connection point of the first and second MOS capacitors; And a fourth field effect transistor having a drain terminal connected to a connection point of the first second MOS capacitor, a source terminal connected to a power supply voltage, and a gate terminal connected to an output disable signal line. Semiconductor memory device with short circuit. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019920007670A 1991-07-16 1992-05-06 Semiconductor memory device with the circuit of refresh-shortened in data retension mode KR950009391B1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1019920007670A KR950009391B1 (en) 1991-07-16 1992-05-06 Semiconductor memory device with the circuit of refresh-shortened in data retension mode
US07/912,313 US5333128A (en) 1991-07-16 1992-07-13 Semiconductor memory device having a circuit for reducing frequency of proceeding refresh in data retention mode
JP4187986A JP2665859B2 (en) 1991-07-16 1992-07-15 Semiconductor memory device having refresh shortening circuit in data holding mode

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR910012172 1991-07-16
KR1019920007670A KR950009391B1 (en) 1991-07-16 1992-05-06 Semiconductor memory device with the circuit of refresh-shortened in data retension mode

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KR930003150A true KR930003150A (en) 1993-02-24
KR950009391B1 KR950009391B1 (en) 1995-08-21

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US5617551A (en) * 1992-09-18 1997-04-01 New Media Corporation Controller for refreshing a PSRAM using individual automatic refresh cycles
US5615328A (en) * 1995-08-30 1997-03-25 International Business Machines Corporation PCMCIA SRAM card function using DRAM technology
JP4152094B2 (en) * 2001-09-03 2008-09-17 エルピーダメモリ株式会社 Semiconductor memory device control method and semiconductor memory device
US6515929B1 (en) * 2001-10-29 2003-02-04 Etron Technology, Inc. Partial refresh feature in pseudo SRAM
JP4416372B2 (en) 2002-02-25 2010-02-17 富士通マイクロエレクトロニクス株式会社 Semiconductor memory device
US7334182B2 (en) * 2004-11-24 2008-02-19 Northrop Grumman Corporation Serial data preservation method
US20080080284A1 (en) * 2006-09-15 2008-04-03 Peter Mayer Method and apparatus for refreshing memory cells of a memory
CN109243513A (en) * 2013-09-01 2019-01-18 英派尔科技开发有限公司 Increased refresh interval and energy efficiency in DRAM
JP6429260B1 (en) 2017-11-09 2018-11-28 華邦電子股▲ふん▼有限公司Winbond Electronics Corp. Pseudo static random access memory and refresh method thereof

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JPS5873096A (en) * 1981-10-27 1983-05-02 Nec Corp Semiconductor memory
JPS6043299A (en) * 1983-08-18 1985-03-07 Fuji Xerox Co Ltd Dynamic memory device
JPS63157397A (en) * 1986-12-22 1988-06-30 Matsushita Electronics Corp Semiconductor memory
JP2928263B2 (en) * 1989-03-20 1999-08-03 株式会社日立製作所 Semiconductor device
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