KR870006636A - Heat treatment device for semiconductor substrate - Google Patents

Heat treatment device for semiconductor substrate

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Publication number
KR870006636A
KR870006636A KR860009969A KR860009969A KR870006636A KR 870006636 A KR870006636 A KR 870006636A KR 860009969 A KR860009969 A KR 860009969A KR 860009969 A KR860009969 A KR 860009969A KR 870006636 A KR870006636 A KR 870006636A
Authority
KR
South Korea
Prior art keywords
semiconductor substrate
heat treatment
reaction gas
treatment apparatus
processed
Prior art date
Application number
KR860009969A
Other languages
Korean (ko)
Other versions
KR920000710B1 (en
Inventor
다카마리 사카이
사다오 히라에
유스케 무라오카
히도시 하이바라
Original Assignee
이시다 로쿠지로오
다이닛뽕 스쿠링 세이소오 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 이시다 로쿠지로오, 다이닛뽕 스쿠링 세이소오 가부시키가이샤 filed Critical 이시다 로쿠지로오
Publication of KR870006636A publication Critical patent/KR870006636A/en
Application granted granted Critical
Publication of KR920000710B1 publication Critical patent/KR920000710B1/en

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Abstract

내용 없음.No content.

Description

반도체 기판의 열처리 장치Heat treatment device for semiconductor substrate

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 본 발명에 관련된 반도체 기판의 열처리 장치의 실시예를 모식적으로 나타낸 종단면도.1 is a longitudinal sectional view schematically showing an embodiment of a heat treatment apparatus of a semiconductor substrate according to the present invention.

제2도 내지 제3도는 각각 제1도에 나타낸 웨이퍼 지지부재의 수종의 실시 상태를 나타낸 사시도.2 to 3 are perspective views each showing several implementation states of the wafer support member shown in FIG.

Claims (4)

복수의 반도체 기판에 대해서 열처리를 행하기 위한 장치에 있어서, 그 내부에 피처리 반도체 기판을 수용하고, 이것에 대해서 소망의 열처리를 행하는 노심관-그 일단은 동부에 비해서 세경으로 되어, 여기서 소정의 반응 가스를 그 내부로 도입하며, 또한 그 타단은 뚜껑체에 의해서 밀폐되는-과, 상기 노심관의 외주면에 부설되고, 상기 노심관의 내부를 가열하기 위한 가열 수단과, 상기 노심관내에 복수의 피처리 반도체 기판을 소정의 핏치로 직립시키기 위한 수단과, 노심관내로 도입된 반응가스가 각 반도체 기판의 전면에 대해서 균일하게 접촉하도록 각 반도체 기판의 하방으로 설치된 반응가스 흡기 수단으로 된 것을 특징으로 하는 반도체 기판의 열처리 장치.In the apparatus for performing heat treatment on a plurality of semiconductor substrates, a core tube for accommodating a semiconductor substrate to be processed therein and performing a desired heat treatment on the semiconductor substrate-one end of which is narrower than the eastern part, where a predetermined A reaction gas is introduced into the inside, and the other end thereof is sealed by a lid body; and is attached to an outer circumferential surface of the core pipe, and heating means for heating the inside of the core pipe; Means for uprighting the semiconductor substrate to be processed at a predetermined pitch, and reaction gas intake means provided below each semiconductor substrate so that the reaction gas introduced into the core tube is brought into uniform contact with the front surface of each semiconductor substrate. A heat treatment apparatus for a semiconductor substrate. 제1항에 있어서, 반응 가스 흡기 수단이 중공 부재로 구성됨과 동시에 상기 부재의 피처리 반도체 기판에 대향하는 부위에 개구를 설치하고, 상기 개구 분분에 피처리 반도체 기판을 배치토록된 것을 특징으로 하는 반도체 기판의 열처리 장치.The method of claim 1, wherein the reactive gas intake means is constituted by a hollow member, an opening is provided at a portion of the member facing the semiconductor substrate to be processed, and the processing semiconductor substrate is arranged at the opening portion. Heat treatment apparatus of a semiconductor substrate. 제2항에 있어서, 지지수단이 상기 개구부의 연부에 설치된 절결부에 의해서 구성된 것을 특징으로 하는 반도체 기판의 열처리 장치.The heat treatment apparatus for a semiconductor substrate according to claim 2, wherein the supporting means is formed by a cutout portion provided at an edge of the opening portion. 제1항에 있어서, 반응 가스 흡기수단과 지지수단이 석영에 의해서 성형된 것을 특징으로 하는 반도체 기판의 열처리 장치.The heat treatment apparatus for a semiconductor substrate according to claim 1, wherein the reaction gas intake means and the support means are formed of quartz. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019860009969A 1985-12-04 1986-11-25 Heating treatment apparatus of semiconductor substfrates KR920000710B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP27139285A JPS62131522A (en) 1985-12-04 1985-12-04 Semiconductor heat-treatment apparatus
JP?60-271392 1985-12-04
JP60-271392 1985-12-04

Publications (2)

Publication Number Publication Date
KR870006636A true KR870006636A (en) 1987-07-13
KR920000710B1 KR920000710B1 (en) 1992-01-20

Family

ID=17499426

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019860009969A KR920000710B1 (en) 1985-12-04 1986-11-25 Heating treatment apparatus of semiconductor substfrates

Country Status (2)

Country Link
JP (1) JPS62131522A (en)
KR (1) KR920000710B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100354895B1 (en) * 2001-09-18 2002-10-11 백금성 Rear Door Opening and Closing Device For a Car

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5109376B2 (en) * 2007-01-22 2012-12-26 東京エレクトロン株式会社 Heating device, heating method and storage medium

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100354895B1 (en) * 2001-09-18 2002-10-11 백금성 Rear Door Opening and Closing Device For a Car

Also Published As

Publication number Publication date
JPS62131522A (en) 1987-06-13
KR920000710B1 (en) 1992-01-20

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