KR20250137690A - 이온 밀링 장치 - Google Patents
이온 밀링 장치Info
- Publication number
- KR20250137690A KR20250137690A KR1020257028124A KR20257028124A KR20250137690A KR 20250137690 A KR20250137690 A KR 20250137690A KR 1020257028124 A KR1020257028124 A KR 1020257028124A KR 20257028124 A KR20257028124 A KR 20257028124A KR 20250137690 A KR20250137690 A KR 20250137690A
- Authority
- KR
- South Korea
- Prior art keywords
- power transmission
- stage
- milling device
- transmission unit
- ion milling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Sampling And Sample Adjustment (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/011087 WO2024195024A1 (ja) | 2023-03-22 | 2023-03-22 | イオンミリング装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20250137690A true KR20250137690A (ko) | 2025-09-18 |
Family
ID=92841100
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020257028124A Pending KR20250137690A (ko) | 2023-03-22 | 2023-03-22 | 이온 밀링 장치 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2024195024A1 (https=) |
| KR (1) | KR20250137690A (https=) |
| WO (1) | WO2024195024A1 (https=) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018166042A (ja) | 2017-03-28 | 2018-10-25 | 株式会社日立ハイテクサイエンス | 荷電粒子ビーム装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018013133A (ja) * | 2016-07-19 | 2018-01-25 | 株式会社デンソー | 電磁クラッチ |
-
2023
- 2023-03-22 KR KR1020257028124A patent/KR20250137690A/ko active Pending
- 2023-03-22 WO PCT/JP2023/011087 patent/WO2024195024A1/ja not_active Ceased
- 2023-03-22 JP JP2025507993A patent/JPWO2024195024A1/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018166042A (ja) | 2017-03-28 | 2018-10-25 | 株式会社日立ハイテクサイエンス | 荷電粒子ビーム装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2024195024A1 (https=) | 2024-09-26 |
| WO2024195024A1 (ja) | 2024-09-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| D11 | Substantive examination requested |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D11-EXM-PA0201 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| E13 | Pre-grant limitation requested |
Free format text: ST27 STATUS EVENT CODE: A-2-3-E10-E13-LIM-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| P11 | Amendment of application requested |
Free format text: ST27 STATUS EVENT CODE: A-2-2-P10-P11-NAP-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13 | Application amended |
Free format text: ST27 STATUS EVENT CODE: A-2-2-P10-P13-NAP-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| Q12 | Application published |
Free format text: ST27 STATUS EVENT CODE: A-1-1-Q10-Q12-NAP-PG1501 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |