KR20240054879A - Inspection socket and inspection apparatus - Google Patents

Abstract

To provide an inspection socket and inspection device that can support batteries of multiple sizes.
A test socket includes a housing and a plurality of plate-shaped probe pins accommodated inside the housing. Each probe pin has a first end provided at one end and a second end provided at the other end. The plurality of probe pins includes at least one first probe pin whose first end is capable of contacting a positive electrode terminal of the battery, and at least one second probe pin whose first end is capable of contacting an edge of the battery. When viewed along the first direction, the first end of the second probe pin extends in a direction intersecting the outer periphery of the battery. The dimension of the first end of the second probe pin in the second direction intersecting the first direction and the thickness direction of the probe pin is larger than the dimension of the edge portion of the battery in the radial direction.

Description

INSPECTION SOCKET AND INSPECTION APPARATUS}

This disclosure relates to test sockets and test devices.

Patent Document 1 describes an inspection device for a secondary battery.

Japanese Patent Publication No. 2000-28692

Generally, in inspection devices including the inspection device in Patent Document 1, inspection is performed using a cylindrical spring probe (so-called pogo pin). However, since pogo pins usually have a small contact diameter, there are cases where they cannot support inspection of batteries of multiple sizes.

The purpose of the present disclosure is to provide an inspection socket and an inspection device capable of supporting batteries of multiple sizes.

The test socket of one aspect of the present disclosure includes:

An inspection socket used to inspect a battery having a positive terminal located at the center of one end in the axial direction and an annular edge portion located radially outside the positive terminal and electrically connected to the negative terminal. and

housing,

A plurality of plate-shaped probe pins each having a first end provided at one end in the first direction and a second end provided at the other end in the first direction, and accommodated inside the housing.

Equipped with

The plurality of probe pins include at least one first probe pin whose first end can contact the positive electrode terminal, and at least one second probe pin whose first end can contact the edge portion,

When viewed along the first direction, the first end extends in a direction intersecting the outer periphery of the battery,

A dimension of the first end of the second probe pin in the first direction and a second direction intersecting the thickness direction of the probe pin is larger than a dimension of the edge portion in the radial direction.

The inspection device of one aspect of the present disclosure includes:

and at least one test socket of the above aspect.

According to the present disclosure, an inspection socket and an inspection device capable of supporting batteries of a plurality of sizes can be provided.

1 is a perspective view showing a test socket according to an embodiment of the present disclosure.
Figure 2 is an enlarged front view of the inspection socket of Figure 1;
Figure 3 is a cross-sectional view taken along line III-III in Figure 2.
Figure 4 is a cross-sectional view taken along line IV-IV in Figure 1.
Figure 5 is a cross-sectional view taken along line VV of Figure 1.
Figure 6 is a cross-sectional view taken along line VI-VI in Figure 1.
Figure 7 is a cross-sectional view taken along line VII-VII of Figure 1;
Figure 8 is a perspective view showing a first modified example of the test socket of Figure 1;
Fig. 9 is an enlarged plan view showing a second modification of the test socket of Fig. 1;
Fig. 10 is a perspective view showing a third modification of the test socket of Fig. 1;

Hereinafter, an example of the present disclosure will be described with reference to the accompanying drawings. The following description is illustrative in nature and is not intended to limit the present disclosure, applications of the present disclosure, or uses of the present disclosure. The drawings are schematic, and the ratios of each dimension do not necessarily match those of reality.

As shown in FIG. 1 , the inspection socket 1 of one embodiment of the present disclosure includes a housing 10 and a plurality of plate-shaped probe pins 20 accommodated inside the housing. The plurality of probe pins 20 include a first probe pin 21 and a second probe pin 22.

The inspection socket 1 constitutes a part of an inspection device used to inspect the battery 100 shown in FIG. 2, for example. The battery 100 has a substantially cylindrical shape, with a positive electrode terminal 101 located at the center of one end in the axial direction (e.g., X direction), and located radially outside the positive electrode terminal 101. In addition, it has an annular edge portion 102 (see FIG. 3) electrically connected to the negative electrode terminal. As an example, the positive electrode terminal 101 has a convex shape. The battery 100 is, for example, a lithium ion battery for an EV (Electric Vehicle).

In this embodiment, the plurality of probe pins 20 include two first probe pins 21 and two second probe pins 22. In detail, the plurality of probe pins 20 include two first probe tweezers 211 and 212, each of which includes one first probe pin 21, and each of one second probe pin 22. ) and includes two second probe tweezers (221, 222). Each probe tweezers are electrically independent from each other. The first probe tweezers 211 and the second probe tweezers 221 function as sense pins, for example, and the first probe tweezers 212 and the second probe tweezers 222 function as force pins, for example. do. Each probe pin 20 is formed as a single component.

As shown in Fig. 1, the housing 10 has a plurality of accommodating portions 13 capable of accommodating at least one probe pin 20, for example, in a substantially square pillar shape (Figs. 4 to 7). reference). Each accommodating portion 13 is configured to accommodate the probe pin 20 in a state in which the first end 31 and the second end 41 of the probe pin 20, which will be described later, are exposed.

In this embodiment, the housing 10 is composed of two members 11 and 12 stacked in a first direction (eg, X direction) along which the accommodated probe pin 20 extends. One probe pin 20 is accommodated in each accommodating portion 13. Each accommodating portion 13 is formed so that the thickness direction of the probe pins 20 accommodated in the accommodating portion 13 matches each other. A substantially circular concave portion 14 is provided on the surface 111 where the first end 31 of the probe pin 20 of the member 11 is exposed. At the bottom of the concave portion 14, two openings 112 are provided through which the first ends 31 of the first probe pins 21 are respectively exposed. On the radial outer side of the concave portion 14 of the surface 111, two openings 113 through which the first ends 31 of the second probe pins 22 are respectively exposed are provided. A substrate 110 is installed on the surface 121 (see FIGS. 4 to 7) where the second end 41 of the probe pin 20 of the member 12 is exposed.

As shown in FIGS. 4 to 7 , the probe pin 20 has a first end 31 provided at one end in the first direction X, and a second end 41 provided at the other end in the first direction X. . In this embodiment, the probe pin 20 includes a first contact portion 30 having a first end 31, a second contact portion 40 having a second end 41, and It includes an elastic portion 50 that is located between the first contact portion 30 and the second contact portion 40 and is expandable and contractible along the first direction X. The first contact portion 30 and the second contact portion 40 are located on an imaginary straight line L extending along the first direction X, and are connected by an elastic portion 50. That is, the first contact portion 30 and the second contact portion 40 are disposed in a second direction (e.g., Y) that intersects the first direction direction) is located at one end of the elastic portion 50.

The first contact portion 30 has a substantially rectangular plate shape extending along the first direction X. The end of the first contact part 30 located far from the second contact part 40 in the first direction An elastic portion 50 is connected to an end of the first contact portion 30 located near the second contact portion 40 in the first direction X from the second direction Y.

In this embodiment, as shown in FIG. 3, the first end 31 of the second probe pin extends in a direction intersecting the outer periphery 103 of the battery 100 when viewed along the first direction It is done. The dimension W1 of the first end 31 of the second probe pin 22 in the second direction Y is larger than the dimension W2 of the edge portion 102 of the battery 100 in the radial direction.

The first end 31 of the first probe pin 21 is configured to contact the positive terminal 101 of the battery 100, and the first end 31 of the second probe pin 22 is, It is configured to be able to contact the edge portion 102 of the battery 100. In detail, the first end 31 of the first probe pin 21 is located at the center line CL of the housing 10 extending in the first direction X in the second direction Y, as shown in FIGS. 4 and 5. As it moves away from , it has an inclined surface 32 that inclines in the direction approaching the second contact portion 40 in the first direction X. The first end 31 of the second probe pin 22 has an uneven surface 33 on which a plurality of uneven surfaces are formed, as shown in FIGS. 6 and 7 . By configuring the first end 31 in this way, each of the first probe pin 21 and the second probe pin 22 can be brought into point contact with the battery 100 .

The second contact portion 40 has a substantially rectangular plate shape extending along the first direction X. The length of the second contact portion 40 in the first direction X is smaller than that of the first contact portion 30 . The end located farthest from the first contact part 30 in the first direction The elastic portion 50 is connected from the second direction Y to the end of the second contact portion 40 located near the first contact portion 30 in the first direction X.

In this embodiment, as shown in FIG. 3, the plurality of second probe pins 22 are attached to the receiving portion 13 of the housing 10 in a state in which they can contact the edge portion 102 of the battery 100. It is accepted.

The second ends 41 of the first probe pin 21 and the second probe pin 22 are configured to be able to contact the terminal of the board 110. In detail, the second ends 41 of the first probe pin 21 and the second probe pin 22 move away from the center line CL in the second direction Y, as shown in FIGS. 4 to 7. , It has an inclined surface 42 inclined in the direction approaching the first contact portion 30 in the first direction X. By configuring the second end 41 in this way, each of the first probe pin 21 and the second probe pin 22 can be brought into point contact with the substrate 110 .

The elastic portion 50 has a plurality of first parts 51 and a plurality of second parts 52. Each first portion 51 is arranged at intervals along the first direction X, and each extends linearly along the second direction Y. Each second part 52 has a substantially semicircular arc shape extending along the first direction The first portions 51 located at both ends in the first direction All of the first portions 51 and second portions 52 are located on the same side with respect to the side surface 34 of the first contact portion 30 . The side surface 34 is a side surface opposite to the side to which the first portion 51 is connected, among a pair of sides intersecting the second direction Y of the first contact portion 30.

In this embodiment, as shown in FIGS. 4 and 5, when the first probe pin 21 approaches the first end 31 toward the second end 41, the first end 31 It is accommodated in the receiving portion 13 of the housing 10 so as to move in the second direction Y and in a direction approaching the center of the housing 10. In other words, when the first probe pin 21 is pressed from the first end 31 side toward the second end 41, the first end 31 is wiped in the direction toward the center line CL of the housing 10. do.

As shown in FIGS. 6 and 7 , when the first end 31 of the second probe pin 22 is approached toward the second end 41, the first end 31 moves in the second direction Y. Additionally, it is accommodated in the receiving portion 13 of the housing 10 so as to move in a direction away from the center of the housing 10. In other words, when the second probe pin 22 is pressed from the first end 31 side toward the second end 41, the first end 31 is wiped in a direction away from the center line CL of the housing 10. do.

The inspection socket 1 can exert the following effects.

The test socket 1 includes a housing 10 and a plurality of plate-shaped probe pins 20 accommodated inside the housing 10. Each probe pin 20 has a first end 31 provided at one end in the first direction and a second end 41 provided at the other end in the first direction. A plurality of probe pins 20 include at least one first probe pin 21, the first end 31 of which can contact the positive electrode terminal 101 of the battery 100, and the first end 31 of the battery 100. It includes at least one second probe pin 22 that can contact the edge portion 102 of 100. When viewed along the first direction, the first end 31 of the second probe pin 22 extends in a direction intersecting the outer periphery of the battery 100. The dimension W1 of the first end 31 of the second probe pin 22 in the first direction and the second direction intersecting the thickness direction of the probe pin 20 is the size of the battery 100 in the radial direction. It is larger than the dimension W2 of the edge portion 102. With this configuration, the inspection socket 1 capable of supporting batteries of multiple sizes can be realized.

For inspection of EV batteries, cylindrical pogo pins are usually employed. However, the pogo pin does not have a tip of a shape suitable for the contact point of an EV battery, and may cause contact failure during inspection. Since a pogo pin is usually composed of a plurality of parts, the current characteristics are not stable in an inspection socket using a pogo pin. For this reason, when the inspection socket is miniaturized or thinned, it is necessary to also miniaturize the probe pin accommodated within the inspection socket. However, if the probe pin is miniaturized, the conduction path through which the current flows becomes thinner, and the probe pin generates heat during conduction. Therefore, there is a desire to improve the heat dissipation performance of the inspection socket. When the current flowing during inspection is a high current, for example, it is conceivable to bring a plurality of probe pins into contact with the battery. However, since pogo pins usually have a cylindrical shape, when a plurality of pogo pins are accommodated in a housing, it may not be possible to save space in the inspection socket.

In the test socket 1, the shape of the first end 31 of the probe pin 20 is matched to the shape of the battery 100 (for example, the shape of the positive terminal 101 and the edge portion 102). Since it can be customized, the occurrence of contact defects during inspection can be reduced. In the inspection socket 1, since the plate-shaped probe pin 20, which is a single component, is used, the current characteristics can be stabilized and the measured value during inspection can be stabilized. For example, by arranging a plurality of plate-shaped probe pins 20 in the same direction while overlapping each other, an efficient arrangement can be achieved and space saving of the inspection socket 1 can be achieved. Since the plate-shaped probe pin 20 can enlarge the area in contact with air than the pogo pin, the heat dissipation of the test socket 1 can be improved and an increase in the resistance value of the probe pin 20 can be suppressed.

The test socket 1 can arbitrarily adopt one or more of the configurations shown below. That is, any one or multiple configurations among the plurality of configurations shown below can be arbitrarily deleted if they are included in the above-described embodiment, and can be arbitrarily added if they are not included in the above-described embodiment. By adopting this configuration, the test socket 1 capable of supporting batteries of multiple sizes can be more reliably realized.

The plurality of probe pins 20 includes a plurality of first probe pins 21 and a plurality of second probe pins 22.

The plurality of probe pins 20 are electrically positioned independently of each other and the first probe tweezers 211 having at least one first probe pin 21 and the first probe tweezers 211. It includes a second probe tweezers 221 having a second probe pin 22.

A plurality of second probe pins 22 are accommodated in the housing 10 in a state in which they can contact the edge portion 102 of the battery 100.

The plurality of probe pins 20 are accommodated in the housing 10 so that their thickness directions coincide.

The first probe pin 21 is configured to be able to contact the convex positive terminal 101.

The first probe pin 21 is located between the first end 31 and the second end 41 in the first direction and has an elastic portion 50 that can expand and contract along the first direction. The first end 31 and the second end 41 are located at one end of the elastic portion 50 in the second direction. When the first probe pin 21 approaches the first end 31 toward the second end 41, the first end 31 is in the second direction and approaches the center of the housing 10. It is accommodated in the housing 10 so as to move in one direction.

The second probe pin 22 is located between the first end 31 and the second end 41 in the first direction and has an elastic portion 50 that can expand and contract along the first direction. The first end 31 and the second end 41 are located at one end of the elastic portion 50 in the second direction. When the second probe pin 22 approaches the first end 31 towards the second end 41, the first end 31 is in the second direction and away from the center of the housing 10. It is accommodated in the housing 10 to move to .

The inspection device can exert the following effects.

The inspection device has at least one inspection socket (1). Using the inspection socket 1, an inspection device capable of supporting batteries of multiple sizes can be realized.

The test socket 1 can also be configured as follows.

The housing 10 can arbitrarily change its shape and configuration depending on the design of the inspection socket 1, etc. For example, the shape of the housing 10 is not limited to a substantially rectangular pillar shape, and may be a substantially cylindrical shape, or may be a substantially polygonal shape other than a substantially square pillar shape. The housing 10 is not limited to being composed of two members 11 and 12, and may be composed of one member or three or more members.

An example of the inspection socket 1 in which the housing 10 is composed of five members 15, 16, 17, 18, and 19 stacked in the first direction X is shown in FIG. 8. In the inspection socket 1 of FIG. 8, the housing 10 has a window portion 61 through which the probe pin 20 accommodated therein can be viewed from the outside of the housing 10, and a guide wall portion 62. A plurality of window portions 61 are provided on the side surface 171 of the member 17 that intersects the thickness direction Z and the side surface 172 of the member 17 that intersects the second direction Y. By providing the window portion 61, the state of the stored probe pin 20 can be confirmed without disassembling the housing 10, and the heat dissipation of the test socket 1 can be improved. The guide wall portion 62 is provided on the surface 111 where the first end 31 of the probe pin 20 of the member 15 is exposed to guide the battery 100 toward the first end 31. Consists of.

For example, by forming part of the housing 10 with a material with high thermal conductivity (eg, aluminum), the same effect as forming the window portion 61 in the housing 10 can be obtained.

The number of probe pins 20 accommodated in the test socket 1 can be arbitrarily changed depending on the design of the test socket 1, etc.

For example, the test socket 1 of FIG. 8 includes a plurality of probe pins 20, four first probe tweezers 211, 212, 213, and 214, and four second probe tweezers 221 and 222. , 223, 224). Among the four first probe tweezers 211, 212, 213, and 214, the first probe tweezers 211 includes one first probe pin 21 and functions, for example, as a sense pin. The remaining three first probe tweezers 212, 213, and 214 include three first probe pins 21 stacked in the thickness direction Z, and function as force pins, for example. Likewise, among the four second probe tweezers 221, 222, 223, and 224, the second probe tweezers 221 includes one second probe pin 22 and functions, for example, as a sense pin. The remaining three second probe tweezers 222, 223, and 224 include three second probe pins 22 stacked in the thickness direction Z, and function as force pins, for example. The first probe tweezers 211, 212, 213, and 214 are located inside the opening 141 of the concave portion 14 when viewed along the first direction X. Specifically, the first probe tweezers 211 and 213 are arranged at equal intervals along the thickness direction Z, and the first probe tweezers 212 and 214 are arranged at equal intervals along the thickness direction Z. The first probe tweezers 211 and 213 and the first probe tweezers 212 and 214 are arranged at intervals in the second direction Y.

For example, the test socket 1 of FIG. 9 includes a plurality of probe pins 20, six first probe tweezers 211, 212, 213, 214, 215, and 216, and four second probe tweezers. Includes (221, 222, 223, 224). Among the six first probe tweezers (211, 212, 213, 214, 215, 216), the two first probe tweezers (211, 215) include one first probe pin (21), for example Functions as a sense pin. The remaining four first probe tweezers 212, 213, 214, and 216 include three first probe pins 21 stacked in the thickness direction Z, and function as force pins, for example. The first probe tweezers 211, 213, and 215 are arranged at equal intervals along the thickness direction Z, and the first probe tweezers 212, 214, and 216 are arranged at equal intervals along the thickness direction Z. The first probe tweezers 211, 213, and 215 and the first probe tweezers 212, 214, and 216 are arranged at intervals in the second direction Y.

In this way, the number of probe tweezers and the number of probe pins included in one probe tweezer can be changed to any number greater than 1.

The plurality of probe pins 20 is not limited to the case where the thickness directions of all probe pins 20 are identical and are accommodated in the housing 10, and the thickness directions of all probe pins 20 are not identical. It may be accommodated in the housing 10 as is.

In the test socket 1 of FIG. 9, a plurality of window portions 61 are provided on the surface 151 where the first end 31 of the probe pin 20 of the member 15 of the housing 10 is exposed. It is provided. Each window portion 61 allows the elastic portions 50 of the three second probe pins 22 included in the second probe tweezers 222, 223, and 224, which function as force pins, to be visible from the outside of the housing 10. It is configured as possible.

The shape and configuration of the probe pin 20 can be arbitrarily changed depending on the design of the inspection socket 1, etc. For example, the first end 31 and the second end 41 are not limited to having an inclined surface 32 or an uneven surface 33, and may have other shapes depending on the shape of the inspection object or the substrate 110, etc. You may have a configuration. FIG. 10 shows an example of the inspection socket 1 in which the first end 31 of the first probe pin 21 has an uneven surface 33 instead of an inclined surface 32. The elastic portion 50 is not limited to having the first portion 51 and the second portion 52, and may have any configuration capable of expanding and contracting along the first direction X.

Although various embodiments of the present disclosure have been described in detail with reference to the drawings, finally, various embodiments of the present disclosure will be described. In addition, in the following description, reference numerals are attached and described as examples.

The test socket 1 of the first aspect of the present disclosure,

An inspection socket used to inspect a battery having a positive terminal located at the center of one end in the axial direction and an annular edge portion located radially outside the positive terminal and electrically connected to the negative terminal. (1),

Housing (10),

A plurality of plate-shaped probe pins 20 each have a first end 31 provided at one end in the first direction and a second end 41 provided at the other end in the first direction, and are accommodated inside the housing 10. )second

Equipped with

The plurality of probe pins 20 include at least one first probe pin 21, the first end 31 of which can contact the positive terminal, and the first end 31 of which the first end 31 contacts the edge portion. Possibly comprising at least one second probe pin (22),

When viewed along the first direction, the first end 31 of the second probe pin 22 extends in a direction intersecting the outer periphery of the battery,

The dimension of the first end 31 of the second probe pin 22 in the first direction and the second direction intersecting the thickness direction of the probe pin 20 is the edge in the radial direction. It is larger than the size of the minor.

The test socket 1 of the second aspect of the present disclosure is, in the test socket 1 of the first aspect,

The plurality of probe pins 20 include a plurality of first probe pins 21 and a plurality of second probe pins 22.

The test socket 1 of the third aspect of the present disclosure is the test socket 1 of the second aspect,

The plurality of probe pins 20 are electrically independent of first probe tweezers 211 and 212 having at least one first probe pin 21 and the first probe tweezers 211 and 212. It includes second probe tweezers 221 and 222 located at and having at least one second probe pin 22.

The test socket 1 of the fourth aspect of the present disclosure is the test socket 1 of the second or third aspect,

The plurality of second probe pins 22 are accommodated in the housing 10 in a state in which they can be brought into contact with the edge portion.

The test socket 1 of the fifth aspect of the present disclosure is the test socket 1 of any of the first to fourth aspects,

The plurality of probe pins 20 are accommodated in the housing 10 so that their thickness directions coincide.

The test socket 1 of the sixth aspect of the present disclosure is the test socket 1 of any of the first to fifth aspects,

The first probe pin 21 is configured to be able to contact the convex positive terminal.

The test socket 1 of the seventh aspect of the present disclosure is the test socket 1 of any of the first to sixth aspects,

The first probe pin 21 is located between the first end 31 and the second end 41 in the first direction, and an elastic portion 50 is expandable and contractable along the first direction. ),

The first end 31 and the second end 41 are located at one end of the elastic portion 50 in the second direction,

When the first probe pin 21 approaches the first end 31 toward the second end 41, the first end 31 is in the second direction and the housing 10 ) is accommodated in the housing 10 so as to move in a direction approaching the center.

The test socket 1 of the eighth aspect of the present disclosure is the test socket 1 of any of the first to seventh aspects,

The second probe pin 22 is located between the first end 31 and the second end 41 in the first direction, and an elastic portion 50 is expandable and contractable along the first direction. ),

The first end 31 and the second end 41 are located at one end of the elastic portion 50 in the second direction,

When the second probe pin 22 approaches the first end 31 toward the second end 41, the first end 31 is in the second direction and the housing 10 ) is accommodated in the housing 10 so as to move in a direction away from the center.

The test socket 1 of the ninth aspect of the present disclosure is the test socket 1 of the first to eighth aspects,

The housing 10 has a window 61 through which the probe pin 20 accommodated therein can be viewed from the outside.

The inspection device of the tenth aspect of the present disclosure,

At least one test socket 1 according to any one of the first to ninth aspects is provided.

By appropriately combining any of the various embodiments or modifications described above, the effects of each can be achieved. In addition, a combination of embodiments, a combination of examples, or a combination of an embodiment and an example is possible, and a combination of features in other embodiments or examples is also possible.

Although the present disclosure has been fully described with respect to preferred embodiments with reference to the accompanying drawings, various variations and modifications will be apparent to those skilled in the art. It should be understood that such changes or modifications are included therein unless they depart from the scope of the present disclosure according to the appended claims.

The inspection socket of the present disclosure can be applied to, for example, an inspection device used to inspect EV batteries.

The inspection device of the present disclosure can be applied, for example, as an inspection device for EV batteries.

1: Inspection socket
10: Housing
11, 12, 15, 16, 17, 18, 19: Absent
13: Receiving part
14: recess
20: Probe pin
21: first probe pin
22: second probe pin
30: first contact portion
31: first end
32: slope
33: uneven surface
34: side
40: second contact portion
41: second end
42: slope
50: elastic part
51: first part
52: second part
61: prostitute
62: Guide wall part
100: Battery
101: Plus terminal
102: Edge part
103: Outsourcing
110: substrate
111, 121, 151: Cotton
112, 113, 141: opening
171, 172: side
211, 212, 213, 214, 215, 216: first probe tweezers
221, 222, 223, 224: second probe tweezers
402: second contact portion

Claims (10)

An inspection socket used to inspect a battery having a positive terminal located at the center of one end in the axial direction and an annular edge portion located radially outside the positive terminal and electrically connected to the negative terminal. and
housing,
A plurality of plate-shaped probe pins each having a first end provided at one end in the first direction and a second end provided at the other end in the first direction, and accommodated inside the housing.
Equipped with
The plurality of probe pins include at least one first probe pin whose first end can contact the positive electrode terminal, and at least one second probe pin whose first end can contact the edge portion,
When viewed along the first direction, the first end of the second probe pin extends in a direction intersecting the outer periphery of the battery,
A test socket, wherein a dimension of the first end of the second probe pin in the first direction and a second direction intersecting the thickness direction of the probe pin is larger than a dimension of the edge portion in the radial direction. According to paragraph 1,
A test socket wherein the plurality of probe pins include a plurality of first probe pins and a plurality of second probe pins. According to paragraph 2,
The plurality of probe pins include a first probe tweezers having at least one first probe pin, a first probe tweezers having at least one second probe pin, and electrically positioned independently from each other with respect to the first probe tweezers. 2 Inspection socket, including probe tweezers. According to paragraph 2,
An inspection socket wherein the plurality of second probe pins are accommodated in the housing in a state capable of contacting the edge portion. According to any one of claims 1 to 4,
An inspection socket wherein the plurality of probe pins are accommodated in the housing so that the thickness directions match. According to any one of claims 1 to 4,
An inspection socket, wherein the first probe pin is configured to be able to contact the convex positive terminal. According to any one of claims 1 to 4,
The first probe pin is located between the first end and the second end in the first direction and has an elastic portion that is expandable and contractable along the first direction,
The first end and the second end are located at one end of the elastic portion in the second direction,
The first probe pin is received in the housing such that when the first end is approached toward the second end, the first end moves in the second direction and toward the center of the housing. A test socket is provided. According to any one of claims 1 to 4,
The second probe pin is located between the first end and the second end in the first direction and has an elastic portion that is expandable and contractable along the first direction,
The first end and the second end are located at one end of the elastic portion in the second direction,
The second probe pin is received in the housing such that when approaching the first end toward the second end, the first end moves in the second direction and away from the center of the housing. There is a test socket. According to any one of claims 1 to 4,
An inspection socket wherein the housing has a window portion through which the probe pin housed therein can be viewed from the outside. An inspection device comprising at least one inspection socket according to any one of claims 1 to 4.