JP2024060417A - Inspection socket and inspection device - Google Patents

Abstract

To provide an inspection socket and an inspection device, which can adapt to batteries with a plurality of sizes.SOLUTION: An inspection socket comprises a housing and a plurality of plate-shaped probe pins housed inside the housing. Each probe pin has a first end portion provided at one end and a second end portion provided at the other end. The plurality of probe pins includes at least one first probe pin whose first end portion can be in contact with a positive electrode terminal of the battery and at least one second probe pin whose first end portion can be in contact with an edge portion of the battery. The first end portion of the second probe pin extends in a direction intersecting an outer periphery of the battery when viewed in a first direction. A dimension of the first end portion of the second probe pin in a second direction intersecting the first direction and a thickness direction of the probe pin is larger than a dimension of the edge portion of the battery in a radial direction.SELECTED DRAWING: Figure 1

Description

This disclosure relates to an inspection socket and an inspection device.

Patent document 1 describes an inspection device for secondary batteries.

JP 2000-28692 A

In general, inspection devices, including the one described in Patent Document 1, use cylindrical spring probes (so-called pogo pins) to perform inspections. However, pogo pins usually have a small contact diameter, so they may not be able to inspect batteries of multiple sizes.

The present disclosure aims to provide an inspection socket and inspection device that can accommodate batteries of multiple sizes.

According to one aspect of the present disclosure, there is provided a test socket comprising:
1. An inspection socket used for inspecting a battery, the socket having a positive terminal located at the center of one axial end thereof, and an annular edge located radially outward of the positive terminal and electrically connected to a negative terminal,
Housing and
a plurality of plate-shaped probe pins each having a first end provided at one end in a first direction and a second end provided at the other end in the first direction and accommodated inside the housing;
the plurality of probe pins include at least one first probe pin, the first end of which is capable of contacting the positive terminal, and at least one second probe pin, the first end of which is capable of contacting the edge portion;
When viewed along the first direction, the first end extends in a direction intersecting an outer periphery of the battery,
The dimension of the first end of the second probe pin in a second direction intersecting the first direction and the thickness direction of the probe pin is larger than the dimension of the edge in a radial direction.

An inspection apparatus according to an embodiment of the present disclosure includes:
At least one test socket according to the above aspect is provided.

This disclosure provides an inspection socket and inspection device that can accommodate batteries of multiple sizes.

FIG. 2 is a perspective view of a test socket according to one embodiment of the present disclosure; FIG. 2 is an enlarged front view of the inspection socket of FIG. 1 . FIG. 3 is a cross-sectional view taken along line III-III in FIG. 2 . FIG. 4 is a cross-sectional view taken along line IV-IV in FIG. FIG. 2 is a cross-sectional view taken along line V-V in FIG. 1 . FIG. 2 is a cross-sectional view taken along line VI-VI in FIG. FIG. 7 is a cross-sectional view taken along line VII-VII in FIG. FIG. 2 is a perspective view showing a first modified example of the inspection socket of FIG. 1 . FIG. 2 is an enlarged plan view showing a second modified example of the test socket of FIG. 1; FIG. 4 is a perspective view showing a third modified example of the inspection socket of FIG. 1 .

An example of the present disclosure will now be described with reference to the accompanying drawings. The following description is merely exemplary in nature and is not intended to limit the present disclosure, the application of the present disclosure, or the uses of the present disclosure. The drawings are schematic, and the ratios of the dimensions do not necessarily correspond to the real thing.

As shown in FIG. 1, the test socket 1 according to an embodiment of the present disclosure includes a housing 10 and a plurality of plate-shaped probe pins 20 housed inside the housing. The plurality of probe pins 20 include a first probe pin 21 and a second probe pin 22.

The inspection socket 1 constitutes, for example, a part of an inspection device used to inspect the battery 100 shown in FIG. 2. The battery 100 is substantially cylindrical in shape and has a positive electrode terminal 101 located at the center of one end in the axial direction (for example, the X direction), and an annular edge portion 102 (see FIG. 3) located radially outward from the positive electrode terminal 101 and electrically connected to the negative electrode terminal. As an example, the positive electrode terminal 101 has a convex shape. The battery 100 is, for example, a lithium ion battery for an EV (electric vehicle).

In this embodiment, the multiple probe pins 20 include two first probe pins 21 and two second probe pins 22. More specifically, the multiple probe pins 20 include two first probe tweezers 211, 212, each including one first probe pin 21, and two second probe tweezers 221, 222, each including one second probe pin 22. Each probe tweezers is electrically independent from the other. The first probe tweezers 211 and the second probe tweezers 221 function, for example, as sense pins, and the first probe tweezers 212 and the second probe tweezers 222 function, for example, as force pins. Each probe pin 20 is formed of a single part.

As shown in FIG. 1, the housing 10 has, for example, a substantially rectangular prism shape and has a plurality of accommodation sections 13 capable of accommodating at least one probe pin 20 therein (see FIGS. 4 to 7). Each accommodation section 13 is configured to be capable of accommodating a probe pin 20 with a first end 31 and a second end 41 of the probe pin 20, which will be described later, exposed.

In this embodiment, the housing 10 is composed of two members 11 and 12 stacked in a first direction (for example, the X direction) in which the accommodated probe pins 20 extend. One probe pin 20 is accommodated in each accommodation section 13. Each accommodation section 13 is formed so that the thickness direction of the probe pins 20 accommodated in the accommodation section 13 coincides. A substantially circular recess 14 is provided on the surface 111 on which the first end 31 of the probe pin 20 of the member 11 is exposed. Two openings 112 are provided on the bottom surface of the recess 14, from which the first end 31 of the first probe pin 21 is exposed, respectively. The first end 31 of the second probe pin 22 is provided on the radial outside of the recess 14 on the surface 111, from which the first end 31 of the second probe pin 22 is exposed, respectively. A substrate 110 is attached to the surface 121 (see Figures 4 to 7) on which the second end 41 of the probe pin 20 of the member 12 is exposed.

As shown in Figs. 4 to 7, the probe pin 20 has a first end 31 provided at one end in the first direction X and a second end 41 provided at the other end in the first direction X. In this embodiment, the probe pin 20 includes a first contact portion 30 having the first end 31, a second contact portion 40 having the second end 41, and an elastic portion 50 located between the first contact portion 30 and the second contact portion 40 in the first direction X and capable of expanding and contracting along the first direction X. The first contact portion 30 and the second contact portion 40 are located on a virtual straight line L extending along the first direction X and are connected by the elastic portion 50. In other words, the first contact portion 30 and the second contact portion 40 are located at one end of the elastic portion 50 in a second direction (e.g., Y direction) intersecting the first direction X and the thickness direction (e.g., Z direction) of the probe pin 20.

The first contact portion 30 has a generally rectangular plate shape extending along the first direction X. The end of the first contact portion 30 located farther from the second contact portion 40 in the first direction X constitutes the first end portion 31. The elastic portion 50 is connected from the second direction Y to the end of the first contact portion 30 located closer to the second contact portion 40 in the first direction X.

In this embodiment, as shown in FIG. 3, the first end 31 of the second probe pin extends in a direction intersecting the outer periphery 103 of the battery 100 when viewed along the first direction X. The dimension W1 of the first end 31 of the second probe pin 22 in the second direction Y is greater than the dimension W2 of the edge 102 of the battery 100 in the radial direction.

The first end 31 of the first probe pin 21 is configured to be able to contact the positive terminal 101 of the battery 100, and the first end 31 of the second probe pin 22 is configured to be able to contact the edge portion 102 of the battery 100. In detail, as shown in Figs. 4 and 5, the first end 31 of the first probe pin 21 has an inclined surface 32 that inclines in the direction approaching the second contact portion 40 in the first direction X as it moves away from the center line CL of the housing 10 extending in the first direction X in the second direction Y. As shown in Figs. 6 and 7, the first end 31 of the second probe pin 22 has an uneven surface 33 on which multiple unevenness is formed. By configuring the first end 31 in this way, each of the first probe pin 21 and the second probe pin 22 can be made to make point contact with the battery 100.

The second contact portion 40 has a generally rectangular plate shape extending along the first direction X. The length of the second contact portion 40 in the first direction X is smaller than that of the first contact portion 30. The end of the second contact portion 40 located farther from the first contact portion 30 in the first direction X constitutes the second end portion 41. The elastic portion 50 is connected from the second direction Y to the end of the second contact portion 40 located closer to the first contact portion 30 in the first direction X.

In this embodiment, as shown in FIG. 3, multiple second probe pins 22 are accommodated in the accommodation portion 13 of the housing 10 in a state in which they can contact the edge portion 102 of the battery 100.

The second ends 41 of the first probe pin 21 and the second probe pin 22 are configured to be able to contact the terminals of the substrate 110. In particular, as shown in Figures 4 to 7, the second ends 41 of the first probe pin 21 and the second probe pin 22 have an inclined surface 42 that inclines in a direction approaching the first contact portion 30 in the first direction X as it moves away from the center line CL in the second direction Y. By configuring the second ends 41 in this manner, each of the first probe pin 21 and the second probe pin 22 can be brought into point contact with the substrate 110.

The elastic portion 50 has a plurality of first portions 51 and a plurality of second portions 52. The first portions 51 are arranged at intervals along the first direction X, and each extends linearly along the second direction Y. The second portions 52 have an approximately semicircular arc shape extending along the first direction X, and both ends are connected to the ends of the adjacent first portions 51. The first portions 51 located at both ends of the first direction X are connected to the first contact portion 30 and the second contact portion 40 from the same side in the second direction Y. All the first portions 51 and the second portions 52 are located on the same side of the side surface 34 of the first contact portion 30. The side surface 34 is the side surface opposite to the side surface to which the first portions 51 are connected, among a pair of side surfaces of the first contact portion 30 intersecting the second direction Y.

In this embodiment, as shown in Figures 4 and 5, the first probe pin 21 is accommodated in the accommodation portion 13 of the housing 10 so that when the first end 31 is moved toward the second end 41, the first end 31 moves in the second direction Y and in a direction approaching the center of the housing 10. In other words, when the first probe pin 21 is pressed from the first end 31 side toward the second end 41, the first end 31 wipes in a direction toward the center line CL of the housing 10.

6 and 7, the second probe pin 22 is accommodated in the accommodation portion 13 of the housing 10 so that when the first end 31 is brought closer to the second end 41, the first end 31 moves in the second direction Y and in a direction away from the center of the housing 10. In other words, when the second probe pin 22 is pressed from the first end 31 side toward the second end 41, the first end 31 wipes in a direction away from the center line CL of the housing 10.

Test socket 1 can provide the following effects:

The inspection socket 1 includes a housing 10 and a plurality of plate-shaped probe pins 20 housed inside the housing 10. Each probe pin 20 has a first end 31 provided at one end in the first direction and a second end 41 provided at the other end in the first direction. The plurality of probe pins 20 includes at least one first probe pin 21 whose first end 31 can contact the positive terminal 101 of the battery 100, and at least one second probe pin 22 whose first end 31 can contact the edge portion 102 of the battery 100. When viewed along the first direction, the first end 31 of the second probe pin 22 extends in a direction intersecting the outer periphery of the battery 100. The dimension W1 of the first end 31 of the second probe pin 22 in the second direction intersecting the first direction and the thickness direction of the probe pin 20 is larger than the dimension W2 of the edge portion 102 of the battery 100 in the radial direction. With this configuration, an inspection socket 1 that can accommodate batteries of a plurality of sizes can be realized.

Cylindrical pogo pins are usually used to inspect EV batteries. However, pogo pins do not have tips with a shape suitable for the contacts of EV batteries, and may cause poor contact during inspection. Pogo pins are usually composed of multiple parts, so inspection sockets using pogo pins do not have stable current characteristics. For this reason, when making inspection sockets smaller or thinner, the probe pins housed in the inspection socket must also be made smaller. However, when the probe pins are made smaller, the conductive path through which the current flows becomes narrower, and the probe pins generate heat when conductive, so there is a demand for improving the heat dissipation of the inspection socket. When the current flowing during inspection is high, for example, it is possible to contact multiple probe pins with the battery. However, since pogo pins usually have a cylindrical shape, when multiple pogo pins are housed in a housing, it may not be possible to reduce the space required for the inspection socket.

In the inspection socket 1, the shape of the first end 31 of the probe pin 20 can be customized to match the shape of the battery 100 (e.g., the shape of the positive terminal 101 and the edge portion 102), thereby reducing the occurrence of poor contact during inspection. In the inspection socket 1, the plate-shaped probe pin 20, which is a single component, is used, so that the current characteristics can be stabilized and the measured value can be stabilized during inspection. For example, by stacking multiple plate-shaped probe pins 20 and arranging them in the same direction, an efficient arrangement can be achieved, thereby saving space in the inspection socket 1. Since the plate-shaped probe pin 20 can have a larger area in contact with air than a pogo pin, the heat dissipation of the inspection socket 1 can be improved and an increase in the resistance value of the probe pin 20 can be suppressed.

The inspection socket 1 can adopt any one or more of the following configurations. In other words, any one or more of the following configurations can be deleted if they were included in the above-mentioned embodiment, and can be added if they were not included in the above-mentioned embodiment. By adopting such a configuration, it is possible to more reliably realize an inspection socket 1 that can accommodate batteries of multiple sizes.

The multiple probe pins 20 include multiple first probe pins 21 and multiple second probe pins 22.

The multiple probe pins 20 include a first probe tweezer 211 having at least one first probe pin 21, and a second probe tweezer 212 that is positioned electrically independent of the first probe tweezer 211 and has at least one first probe pin 21.

A number of second probe pins 22 are accommodated in the housing 10 in a state in which they can contact the edge 102 of the battery 100.

The multiple probe pins 20 are housed in the housing 10 so that their thickness directions are aligned.

The first probe pin 21 is configured to be able to come into contact with the convex positive terminal 101.

The first probe pin 21 is located between the first end 31 and the second end 41 in the first direction and has an elastic portion 50 that is expandable and contractible along the first direction. The first end 31 and the second end 41 are located at one end of the elastic portion 50 in the second direction. The first probe pin 21 is accommodated in the housing 10 such that when the first end 31 is moved toward the second end 41, the first end 31 moves in the second direction and in a direction approaching the center of the housing 10.

The second probe pin 22 is located between the first end 31 and the second end 41 in the first direction and has an elastic portion 50 that is expandable and contractable along the first direction. The first end 31 and the second end 41 are located at one end of the elastic portion 50 in the second direction. The second probe pin 22 is accommodated in the housing 10 such that when the first end 31 is moved toward the second end 41, the first end 31 moves in the second direction and in a direction away from the center of the housing 10.

The inspection device can provide the following benefits:

The inspection device has at least one inspection socket 1. The inspection socket 1 allows for an inspection device that can accommodate batteries of multiple sizes.

Test socket 1 can also be configured as follows:

The shape and configuration of the housing 10 can be changed as desired depending on the design of the inspection socket 1, etc. For example, the shape of the housing 10 is not limited to a substantially rectangular prism shape, but may be a substantially cylindrical shape, or may be a substantially polygonal shape other than a substantially rectangular prism shape. The housing 10 is not limited to being composed of two members 11 and 12, but may be composed of one member, or three or more members.

8 shows an example of an inspection socket 1 in which the housing 10 is composed of five members 15, 16, 17, 18, and 19 stacked in the first direction X. In the inspection socket 1 in FIG. 8, the housing 10 has a window portion 61 through which the probe pin 20 housed therein can be seen from the outside of the housing 10, and a guide wall portion 62. A plurality of window portions 61 are provided on the side surface 171 of the member 17 intersecting the thickness direction Z and the side surface 172 of the member 17 intersecting the second direction Y. By providing the window portion 61, the state of the housed probe pin 20 can be confirmed without disassembling the housing 10, and the heat dissipation of the inspection socket 1 can be improved. The guide wall portion 62 is provided on the surface 111 on which the first end portion 31 of the probe pin 20 of the member 15 is exposed, and is configured to be able to guide the battery 100 toward the first end portion 31.

For example, by forming a portion of the housing 10 from a material with high thermal conductivity (e.g., aluminum), the same effect can be obtained as by forming the housing 10 into the window portion 61.

The number of probe pins 20 accommodated in the inspection socket 1 can be changed as desired depending on the design of the inspection socket 1, etc.

For example, the inspection socket 1 in FIG. 8 includes a plurality of probe pins 20 including four first probe pin sets 211, 212, 213, and 214 and four second probe pin sets 221, 222, 223, and 224. Of the four first probe pin sets 211, 212, 213, and 214, the first probe pin set 211 includes one first probe pin 21 and functions, for example, as a sense pin. The remaining three first probe pin sets 212, 213, and 214 include three first probe pins 21 stacked in the thickness direction Z and function, for example, as force pins. Similarly, of the four second probe pin sets 221, 222, 223, and 224, the second probe pin set 221 includes one second probe pin 22 and functions, for example, as a sense pin. The remaining three second probe tweezers 222, 223, 224 include three second probe pins 22 stacked in the thickness direction Z, and function as force pins, for example. The first probe tweezers 211, 212, 213, 214 are located inside the opening 141 of the recess 14 when viewed along the first direction X. Specifically, the first probe tweezers 211, 213 are lined up at equal intervals along the thickness direction Z, and the first probe tweezers 212, 214 are lined up at equal intervals along the thickness direction Z. The first probe tweezers 211, 213 and the first probe tweezers 212, 214 are arranged at intervals in the second direction Y.

For example, the inspection socket 1 in FIG. 9 includes a plurality of probe pins 20 including six first probe tweezers 211, 212, 213, 214, 215, and 216 and four second probe tweezers 221, 222, 223, and 224. Of the six first probe tweezers 211, 212, 213, 214, 215, and 216, two first probe tweezers 211 and 215 include one first probe pin 21 and function as, for example, a sense pin. The remaining four first probe tweezers 212, 213, 214, and 216 include three first probe pins 21 stacked in the thickness direction Z and function as, for example, a force pin. The first probe tweezers 211, 213, and 215 are arranged at equal intervals along the thickness direction Z, and the first probe tweezers 212, 214, and 216 are arranged at equal intervals along the thickness direction Z. The first probe tweezers 211, 213, 215 and the first probe tweezers 212, 214, 216 are arranged at intervals in the second direction Y.

In this way, the number of probe tweezers and the number of probe pins included in one probe tweezers can be changed to any number greater than or equal to 1.

The multiple probe pins 20 may be accommodated in the housing 10 not only in a state where the thickness directions of all the probe pins 20 are aligned, but also in a state where the thickness directions of all the probe pins 20 are not aligned.

In the inspection socket 1 of FIG. 9, a plurality of windows 61 are provided on a surface 151 where the first ends 31 of the probe pins 20 in the member 15 of the housing 10 are exposed. Each window 61 is configured to allow the elastic portions 50 of the three second probe pins 22 included in the second probe tweezers 222, 223, and 224 that function as force pins to be visible from outside the housing 10.

The shape and configuration of the probe pin 20 can be changed as desired depending on the design of the inspection socket 1, etc. For example, the first end 31 and the second end 41 are not limited to having an inclined surface 32 or an uneven surface 33, and may have other configurations depending on the shape of the inspection object or the board 110, etc. FIG. 10 shows an example of an inspection socket 1 in which the first end 31 of the first probe pin 21 has an uneven surface 33 instead of an inclined surface 32. The elastic portion 50 is not limited to having a first portion 51 and a second portion 52, and may have any configuration that can expand and contract along the first direction X.

Various embodiments of the present disclosure have been described above in detail with reference to the drawings. Finally, various aspects of the present disclosure will be described. In the following description, reference symbols will also be used as examples.

The test socket 1 according to the first aspect of the present disclosure includes:
An inspection socket 1 used for inspecting a battery having a positive electrode terminal located at the center of one axial end and an annular edge portion located radially outward of the positive electrode terminal and electrically connected to a negative electrode terminal,
A housing 10;
a plurality of plate-shaped probe pins (20) each having a first end (31) provided at one end in a first direction and a second end (41) provided at the other end in the first direction and accommodated inside the housing (10);
The plurality of probe pins 20 include at least one first probe pin 21, the first end 31 of which is capable of contacting the positive terminal, and at least one second probe pin 22, the first end 31 of which is capable of contacting the edge portion,
When viewed along the first direction, the first end 31 of the second probe pin 22 extends in a direction intersecting an outer periphery of the battery,
The dimension of the first end 31 of the second probe pin 22 in a second direction intersecting the first direction and the thickness direction of the probe pin 20 is larger than the dimension of the edge portion in a radial direction.

The inspection socket 1 of the second aspect of the present disclosure is the inspection socket 1 of the first aspect,
The plurality of probe pins 20 include a plurality of first probe pins 21 and a plurality of second probe pins 22 .

The inspection socket 1 of the third aspect of the present disclosure is the inspection socket 1 of the second aspect,
The multiple probe pins 20 include a first probe tweezer 211, 212 having at least one of the first probe pins 21, and second probe tweezer 221, 222 positioned electrically independent of each other with respect to the first probe tweezer 211, 212 and having at least one of the second probe pins 22.

The inspection socket 1 of the fourth aspect of the present disclosure is the inspection socket 1 of the second or third aspect,
A plurality of the second probe pins 22 are accommodated in the housing 10 in a state in which they can come into contact with the edge portion.

The inspection socket 1 of a fifth aspect of the present disclosure is the inspection socket 1 of any one of the first to fourth aspects,
The plurality of probe pins 20 are accommodated in the housing 10 so that the thickness directions thereof are aligned.

The inspection socket 1 of a sixth aspect of the present disclosure is the inspection socket 1 of any one of the first to fifth aspects,
The first probe pin 21 is configured to be able to come into contact with the positive electrode terminal having a convex shape.

The seventh aspect of the present disclosure provides an inspection socket 1 according to any one of the first to sixth aspects,
the first probe pin has an elastic portion located between the first end and the second end in the first direction and expandable along the first direction;
The first end 31 and the second end 41 are located at one end of the elastic portion 50 in the second direction,
The first probe pin 21 is accommodated in the housing 10 so that when the first end 31 is moved toward the second end 41, the first end 31 moves in the second direction and in a direction approaching the center of the housing 10.

The inspection socket 1 of an eighth aspect of the present disclosure is the inspection socket 1 of any one of the first to seventh aspects,
the second probe pin has an elastic portion located between the first end and the second end in the first direction and expandable along the first direction;
The first end 31 and the second end 41 are located at one end of the elastic portion 50 in the second direction,
The second probe pin 22 is accommodated in the housing 10 such that when the first end 31 is brought closer toward the second end 41, the first end 31 moves in the second direction and away from the center of the housing 10.

The inspection socket 1 of the ninth aspect of the present disclosure is the inspection socket 1 of the first to eighth aspects,
The housing 10 has a window 61 through which the probe pin 20 housed therein can be seen from the outside.

An inspection device according to a tenth aspect of the present disclosure,
The present invention includes at least one test socket 1 according to any one of the first to ninth aspects.

By appropriately combining any of the various embodiments or modifications described above, it is possible to achieve the effects of each. In addition, it is possible to combine embodiments with each other, or to combine examples with each other, and it is also possible to combine features of different embodiments or examples.

Although the present disclosure has been fully described in connection with the preferred embodiments with reference to the accompanying drawings, various modifications and alterations will be apparent to those skilled in the art. Such modifications and alterations are to be understood as being included within the scope of the present disclosure as defined by the appended claims, unless they depart therefrom.

The inspection socket disclosed herein can be applied, for example, to an inspection device used to inspect EV batteries.

The inspection device disclosed herein can be used, for example, as an inspection device for EV batteries.

1 Inspection socket 10 Housing 11, 12, 15, 16, 17, 18, 19 Member 13 Storage portion 14 Recess 20 Probe pin 21 First probe pin 22 Second probe pin 30 First contact portion 31 First end portion 32 Inclined surface 33 Uneven surface 34 Side surface 40 Second contact portion 41 Second end portion 42 Inclined surface 50 Elastic portion 51 First portion 52 Second portion 61 Window portion 62 Guide wall portion 100 Battery 101 Positive electrode terminal 102 Edge portion 103 Outer periphery 110 Substrate 111, 121, 151 Surface 112, 113, 141 Opening 171, 172 Side surface 211, 212, 213, 214, 215, 216 First probe tweezers 221, 222, 223, 224 Second probe tweezers 402 Second contact portion

Claims (10)

1. An inspection socket used for inspecting a battery, the socket having a positive terminal located at the center of one axial end thereof, and an annular edge located radially outward of the positive terminal and electrically connected to a negative terminal,
Housing and
a plurality of plate-shaped probe pins each having a first end provided at one end in a first direction and a second end provided at the other end in the first direction and accommodated inside the housing;
the plurality of probe pins include at least one first probe pin, the first end of which is capable of contacting the positive terminal, and at least one second probe pin, the first end of which is capable of contacting the edge portion;
When viewed along the first direction, the first end of the second probe pin extends in a direction intersecting an outer periphery of the battery,
a dimension of the first end of the second probe pin in a second direction intersecting the first direction and a thickness direction of the probe pin, the dimension of the edge being greater in a radial direction. The test socket of claim 1, wherein the plurality of probe pins includes a plurality of the first probe pins and a plurality of the second probe pins. The test socket according to claim 2, wherein the plurality of probe pins include a first probe pin set having at least one of the first probe pins, and a second probe pin set that is positioned electrically independent of the first probe pin set and has at least one of the second probe pins. The inspection socket according to claim 2, wherein a plurality of the second probe pins are accommodated in the housing in a state in which they can contact the edge portion. The inspection socket according to any one of claims 1 to 4, wherein the multiple probe pins are accommodated in the housing so that the thickness directions are aligned. The inspection socket according to any one of claims 1 to 4, wherein the first probe pin is configured to be able to come into contact with the positive terminal having a convex shape. the first probe pin has an elastic portion located between the first end and the second end in the first direction and expandable and contractible along the first direction;
the first end and the second end are located at one end of the elastic portion in the second direction,
5. The test socket according to claim 1, wherein the first probe pin is accommodated in the housing such that when the first end is moved toward the second end, the first end moves in the second direction and in a direction approaching a center of the housing. the second probe pin has an elastic portion located between the first end and the second end in the first direction and expandable and contractable along the first direction,
the first end and the second end are located at one end of the elastic portion in the second direction,
5. The test socket of claim 1, wherein the second probe pin is accommodated in the housing such that when the first end is moved toward the second end, the first end moves in the second direction and away from the center of the housing. An inspection socket according to any one of claims 1 to 4, wherein the housing has a window through which the probe pin housed inside can be viewed from the outside. An inspection device comprising at least one inspection socket according to any one of claims 1 to 4.

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