TW202417866A - Inspection socket and inspection device - Google Patents

Inspection socket and inspection device Download PDF

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Publication number
TW202417866A
TW202417866A TW112135172A TW112135172A TW202417866A TW 202417866 A TW202417866 A TW 202417866A TW 112135172 A TW112135172 A TW 112135172A TW 112135172 A TW112135172 A TW 112135172A TW 202417866 A TW202417866 A TW 202417866A
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TW
Taiwan
Prior art keywords
probe
probe needle
end portion
housing
inspection socket
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Application number
TW112135172A
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Chinese (zh)
Inventor
酒井貴浩
笹野直哉
小野山太治
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日商歐姆龍股份有限公司
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Publication of TW202417866A publication Critical patent/TW202417866A/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/364Battery terminal connectors with integrated measuring arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01MPROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00Secondary cells; Manufacture thereof
    • H01M10/42Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H01M10/4285Testing apparatus
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10Energy storage using batteries

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Measuring Leads Or Probes (AREA)
  • Battery Mounting, Suspending (AREA)

Abstract

The utility model provides an inspection socket and an inspection device, which can adapt to batteries with multiple sizes. The inspection socket includes a housing and a plurality of plate-shaped probes housed inside the housing. Each probe has a first end portion provided at one end and a second end portion provided at the other end. The plurality of probes include at least one first probe whose first end portion can be in contact with the positive electrode terminal of the battery, and at least one second probe whose first end portion can be in contact with the edge portion of the battery. A first end portion of the second probe extends in a direction intersecting an outer periphery of the battery when viewed in the first direction. A dimension of a first end portion of the second probe in a second direction intersecting the first direction and a thickness direction of the probe is larger than a dimension of an edge portion of the battery in a radial direction.

Description

檢查插座及檢查裝置Check socket and check device

本揭示是有關於一種檢查插座及檢查裝置。The present disclosure relates to an inspection socket and an inspection device.

專利文獻1中記載了一種二次電池的檢查裝置。 [現有技術文獻] [專利文獻] Patent document 1 describes a secondary battery inspection device. [Prior art document] [Patent document]

[專利文獻1]日本專利特開2000-28692號公報[Patent Document 1] Japanese Patent Publication No. 2000-28692

[發明所欲解決之課題][The problem that the invention wants to solve]

一般而言,在包含專利文獻1的檢查裝置的檢查裝置中,使用圓筒形狀的彈力探針(所謂的彈簧針(Pogo pin))進行檢查。但是,通常,彈簧針由於觸點直徑小,因此有時無法應對多個尺寸的電池的檢查。Generally speaking, in the inspection device including the inspection device of Patent Document 1, a cylindrical spring probe (so-called pogo pin) is used for inspection. However, the pogo pin generally has a small contact diameter and therefore may not be able to handle inspections of batteries of various sizes.

本揭示的目的在於提供一種能夠應對多個尺寸的電池的檢查插座及檢查裝置。 [解決課題之手段] The purpose of this disclosure is to provide an inspection socket and inspection device that can handle batteries of multiple sizes. [Means for solving the problem]

本揭示的一形態的檢查插座用於電池的檢查, 所述電池具有:正極端子,位於軸向上的一端的中央;以及環狀的緣部,相對於所述正極端子位於徑向上的外側並且與負極端子電性連接,所述檢查插座包括: 殼體;以及 多個板狀的探測針,分別具有設置於第一方向上的一端的第一端部、以及設置於所述第一方向上的另一端的第二端部,並收容於所述殼體的內部, 多個所述探測針包含所述第一端部能夠與所述正極端子接觸的至少一個第一探測針、以及所述第一端部能夠與所述緣部接觸的至少一個第二探測針, 在沿著所述第一方向觀察的情況下,所述第一端部沿與所述電池的外周交叉的方向延伸, 與所述第一方向及所述探測針的厚度方向交叉的第二方向上的所述第二探測針的所述第一端部的尺寸大於徑向上的所述緣部的尺寸。 The inspection socket of one form disclosed in the present invention is used for inspecting a battery. The battery has: a positive terminal located at the center of one end in the axial direction; and an annular edge located radially outward relative to the positive terminal and electrically connected to the negative terminal. The inspection socket includes: a housing; and a plurality of plate-shaped probes, each having a first end disposed at one end in a first direction and a second end disposed at the other end in the first direction, and housed in the housing. The plurality of probes include at least one first probe whose first end can contact the positive terminal, and at least one second probe whose first end can contact the edge. When observed along the first direction, the first end extends in a direction intersecting the outer periphery of the battery. The dimension of the first end of the second probe needle in the second direction intersecting the first direction and the thickness direction of the probe needle is greater than the dimension of the edge in the radial direction.

本揭示的一形態的檢查裝置 包括至少一個所述形態的檢查插座。 [發明的效果] The present invention discloses a type of inspection device including at least one inspection socket of the type described above. [Effect of the invention]

藉由本揭示,可提供一種能夠應對多個尺寸的電池的檢查插座及檢查裝置。The present disclosure provides a testing socket and a testing device that can handle batteries of various sizes.

以下,根據隨附圖式對本揭示的一例進行說明。以下的說明本質上僅為例示,並不意圖限制本揭示、本揭示的應用物或本揭示的用途。圖式為示意性者,各尺寸的比率等並不一定與現實者一致。An example of the present disclosure is described below with reference to the accompanying drawings. The following description is merely illustrative in nature and is not intended to limit the present disclosure, the application of the present disclosure, or the use of the present disclosure. The drawings are schematic, and the ratios of the dimensions, etc., are not necessarily consistent with the actual ones.

如圖1所示,本揭示的一實施形態的檢查插座1包括殼體10、以及收容於殼體的內部的多個板狀的探測針20。多個探測針20包含第一探測針21及第二探測針22。As shown in FIG1 , an inspection socket 1 according to an embodiment of the present disclosure includes a housing 10 and a plurality of plate-shaped probe pins 20 received in the housing. The plurality of probe pins 20 include a first probe pin 21 and a second probe pin 22 .

檢查插座1例如構成用於圖2所示的電池100的檢查的檢查裝置的一部分。電池100為大致圓柱形狀,具有:正極端子101,位於軸向(例如,X方向)上的一端的中央;以及環狀的緣部102(參照圖3),相對於正極端子101位於徑向上的外側並且與負極端子電性連接。作為一例,正極端子101具有凸形形狀。電池100例如是電動車(Electric Vehicle,EV)用的鋰離子電池。The inspection socket 1 constitutes, for example, a part of an inspection device for inspecting the battery 100 shown in FIG2 . The battery 100 is roughly cylindrical in shape and has: a positive terminal 101 located at the center of one end in the axial direction (for example, the X direction); and an annular edge 102 (see FIG3 ) located radially outward relative to the positive terminal 101 and electrically connected to the negative terminal. As an example, the positive terminal 101 has a convex shape. The battery 100 is, for example, a lithium-ion battery for an electric vehicle (EV).

在本實施形態中,多個探測針20包含兩個第一探測針21及兩個第二探測針22。詳細而言,多個探測針20包含:兩個第一探測針組211、212,分別包含一個第一探測針21;以及兩個第二探測針組221、222,分別包含一個第二探測針22。各探測針組相互電性獨立。第一探測針組211及第二探測針組221例如作為感應針(sense pin)發揮功能,第一探測針組212及第二探測針組222例如作為激勵針(force pin)發揮功能。各探測針20由單一的零件形成。In this embodiment, the plurality of probe needles 20 include two first probe needles 21 and two second probe needles 22. Specifically, the plurality of probe needles 20 include: two first probe needle groups 211, 212, each including a first probe needle 21; and two second probe needle groups 221, 222, each including a second probe needle 22. Each probe needle group is electrically independent of each other. The first probe needle group 211 and the second probe needle group 221 function as sense pins, for example, and the first probe needle group 212 and the second probe needle group 222 function as force pins, for example. Each probe needle 20 is formed by a single part.

如圖1所示,殼體10例如為大致四方柱形狀,在內部具有多個能夠收容至少一個探測針20的收容部13(參照圖4~圖7)。各收容部13構成為能夠在後述的探測針20的第一端部31及第二端部41露出的狀態下收容探測針20。As shown in FIG1 , the housing 10 is, for example, in a substantially square prism shape, and has a plurality of receiving portions 13 (see FIGS. 4 to 7 ) therein capable of receiving at least one probe 20. Each receiving portion 13 is configured to receive a probe 20 with a first end portion 31 and a second end portion 41 of the probe 20 described later being exposed.

在本實施形態中,殼體10包含沿所收容的探測針20延伸的第一方向(例如,X方向)積層的兩個構件11、12。在各收容部13收容有一個探測針20。各收容部13以收容於收容部13中的探測針20的厚度方向一致的方式形成。在構件11的探測針20的第一端部31露出的面111設置有大致圓形的凹部14。在凹部14的底面設置有第一探測針21的第一端部31分別露出的兩個開口部112。在面111的凹部14的徑向上的外側設置有第二探測針22的第一端部31分別露出的兩個開口部113。在構件12的探測針20的第二端部41露出的面121(參照圖4~圖7)安裝有基板110。In the present embodiment, the housing 10 includes two components 11 and 12 stacked along a first direction (e.g., X direction) in which the accommodated probe pin 20 extends. A probe pin 20 is accommodated in each accommodating portion 13. Each accommodating portion 13 is formed in such a manner that the thickness direction of the probe pin 20 accommodated in the accommodating portion 13 is consistent. A substantially circular recess 14 is provided on a surface 111 of the component 11 where the first end 31 of the probe pin 20 is exposed. Two openings 112 are provided on the bottom surface of the recess 14 where the first end 31 of the first probe pin 21 is exposed. Two openings 113 are provided on the radially outer side of the recess 14 of the surface 111 where the first end 31 of the second probe pin 22 is exposed. A substrate 110 is mounted on a surface 121 (see FIGS. 4 to 7 ) where the second end 41 of the probe pin 20 of the component 12 is exposed.

如圖4~圖7所示,探測針20具有設置於第一方向X上的一端的第一端部31、以及設置於第一方向X上的另一端的第二端部41。在本實施形態中,探測針20包含:第一接觸部30,具有第一端部31;第二接觸部40,具有第二端部41;以及彈性部50,位於第一方向X上的第一接觸部30與第二接觸部40之間並且能夠沿著第一方向X伸縮。第一接觸部30及第二接觸部40位於沿著第一方向X延伸的假想直線L上,並藉由彈性部50連接。即,第一接觸部30及第二接觸部40位於與第一方向X及探測針20的厚度方向(例如,Z方向)交叉的第二方向(例如,Y方向)上的彈性部50的一端。As shown in FIGS. 4 to 7 , the probe needle 20 has a first end 31 disposed at one end in the first direction X, and a second end 41 disposed at the other end in the first direction X. In the present embodiment, the probe needle 20 includes: a first contact portion 30 having the first end 31; a second contact portion 40 having the second end 41; and an elastic portion 50 located between the first contact portion 30 and the second contact portion 40 in the first direction X and capable of stretching and contracting along the first direction X. The first contact portion 30 and the second contact portion 40 are located on an imaginary straight line L extending along the first direction X, and are connected by the elastic portion 50. That is, the first contact portion 30 and the second contact portion 40 are located at one end of the elastic portion 50 in a second direction (e.g., Y direction) intersecting the first direction X and the thickness direction (e.g., Z direction) of the probe needle 20.

第一接觸部30具有沿著第一方向X延伸的大致矩形板狀。第一接觸部30的在第一方向X上位於遠離第二接觸部40的位置處的端構成第一端部31。彈性部50自第二方向Y連接於第一接觸部30的在第一方向X上位於第二接觸部40附近的端部。The first contact portion 30 has a substantially rectangular plate shape extending along the first direction X. An end of the first contact portion 30 located away from the second contact portion 40 in the first direction X constitutes a first end portion 31. The elastic portion 50 is connected from the second direction Y to an end of the first contact portion 30 located near the second contact portion 40 in the first direction X.

如圖3所示,在本實施形態中,在沿著第一方向X觀察的情況下,第二探測針的第一端部31沿與電池100的外周103交叉的方向延伸。第二方向Y上的第二探測針22的第一端部31的尺寸W1大於徑向上的電池100的緣部102的尺寸W2。As shown in Fig. 3, in this embodiment, when viewed along the first direction X, the first end 31 of the second probe needle extends in a direction intersecting the outer periphery 103 of the battery 100. The dimension W1 of the first end 31 of the second probe needle 22 in the second direction Y is larger than the dimension W2 of the edge 102 of the battery 100 in the radial direction.

第一探測針21的第一端部31構成為能夠與電池100的正極端子101接觸,第二探測針22的第一端部31構成為能夠與電池100的緣部102接觸。詳細而言,如圖4及圖5所示,第一探測針21的第一端部31具有傾斜面32,所述傾斜面32隨著在第二方向Y上遠離沿第一方向X延伸的殼體10的中心線CL而向在第一方向X上接近第二接觸部40的方向傾斜。如圖6及圖7所示,第二探測針22的第一端部31具有形成有多個凹凸的凹凸面33。藉由如此構成第一端部31,可使第一探測針21及第二探測針22分別相對於電池100進行點接觸。The first end 31 of the first probe needle 21 is configured to be able to contact the positive terminal 101 of the battery 100, and the first end 31 of the second probe needle 22 is configured to be able to contact the edge 102 of the battery 100. In detail, as shown in FIG. 4 and FIG. 5, the first end 31 of the first probe needle 21 has an inclined surface 32, and the inclined surface 32 is inclined in the first direction X as it moves away from the center line CL of the housing 10 extending in the first direction X in the second direction Y and approaches the second contact portion 40. As shown in FIG. 6 and FIG. 7, the first end 31 of the second probe needle 22 has a concave-convex surface 33 formed with a plurality of concave and convex parts. By configuring the first end 31 in this way, the first probe needle 21 and the second probe needle 22 can be respectively made into point contact with the battery 100.

第二接觸部40具有沿著第一方向X延伸的大致矩形板狀。第二接觸部40的在第一方向X上的長度小於第一接觸部30。第二接觸部40的在第一方向X上位於遠離第一接觸部30的位置處的端構成第二端部41。彈性部50自第二方向Y連接於第二接觸部40的在第一方向X上位於第一接觸部30附近的端。The second contact portion 40 has a substantially rectangular plate shape extending along the first direction X. The length of the second contact portion 40 in the first direction X is shorter than that of the first contact portion 30. The end of the second contact portion 40 located at a position away from the first contact portion 30 in the first direction X constitutes a second end portion 41. The elastic portion 50 is connected from the second direction Y to the end of the second contact portion 40 located near the first contact portion 30 in the first direction X.

在本實施形態中,如圖3所示,多個第二探測針22以能夠與電池100的緣部102接觸的狀態收容於殼體10的收容部13中。In this embodiment, as shown in FIG. 3 , a plurality of second probe needles 22 are housed in the housing 13 of the housing 10 in a state where they can contact the edge 102 of the battery 100 .

第一探測針21及第二探測針22的第二端部41構成為能夠與基板110的端子接觸。詳細而言,如圖4~圖7所示,第一探測針21及第二探測針22的第二端部41具有傾斜面42,所述傾斜面42隨著在第二方向Y上遠離中心線CL而向在第一方向X上接近第一接觸部30的方向傾斜。藉由如此構成第二端部41,可使第一探測針21及第二探測針22分別相對於基板110點接觸。The second end 41 of the first probe needle 21 and the second probe needle 22 is configured to be able to contact the terminal of the substrate 110. In detail, as shown in Figures 4 to 7, the second end 41 of the first probe needle 21 and the second probe needle 22 has an inclined surface 42, and the inclined surface 42 is inclined in the direction of approaching the first contact portion 30 in the first direction X as it moves away from the center line CL in the second direction Y. By configuring the second end 41 in this way, the first probe needle 21 and the second probe needle 22 can be respectively in point contact with respect to the substrate 110.

彈性部50具有多個第一部分51及多個第二部分52。各第一部分51沿著第一方向X隔開間隔地配置,分別沿著第二方向Y直線性地延伸。各第二部分52具有沿著第一方向X延伸的大致半圓弧形狀,兩端分別連接於相鄰的第一部分51的端部。位於第一方向X上的兩端的第一部分51分別自第二方向Y上的相同側連接於第一接觸部30及第二接觸部40。所有的第一部分51及第二部分52相對於第一接觸部30的側面34位於相同的一側。側面34是第一接觸部30的與第二方向Y交叉的一對側面中的、和連接有第一部分51的側面為相反側的側面。The elastic portion 50 has a plurality of first portions 51 and a plurality of second portions 52. The first portions 51 are arranged at intervals along the first direction X and extend linearly along the second direction Y. The second portions 52 have a substantially semicircular arc shape extending along the first direction X, and both ends are connected to the ends of the adjacent first portions 51. The first portions 51 located at both ends in the first direction X are connected to the first contact portion 30 and the second contact portion 40 from the same side in the second direction Y. All the first portions 51 and the second portions 52 are located on the same side relative to the side surface 34 of the first contact portion 30. The side surface 34 is a side surface of a pair of side surfaces of the first contact portion 30 intersecting the second direction Y, which is the side surface opposite to the side surface connected to the first portion 51.

在本實施形態中,如圖4及圖5所示,第一探測針21以在使第一端部31朝向第二端部41接近的情況下,第一端部31向第二方向Y且接近殼體10的中心的方向移動的方式收容於殼體10的收容部13中。換言之,當自第一端部31側朝向第二端部41對第一探測針21進行按壓時,第一端部31沿朝向殼體10的中心線CL的方向摩擦接觸。In the present embodiment, as shown in FIG. 4 and FIG. 5 , the first probe needle 21 is received in the receiving portion 13 of the housing 10 in such a manner that the first end portion 31 moves in the second direction Y and in a direction close to the center of the housing 10 when the first end portion 31 approaches the second end portion 41. In other words, when the first probe needle 21 is pressed from the first end portion 31 side toward the second end portion 41, the first end portion 31 is frictionally contacted in a direction toward the center line CL of the housing 10.

如圖6及圖7所示,第二探測針22以在使第一端部31朝向第二端部41接近的情況下,第一端部31向第二方向Y且遠離殼體10的中心的方向移動的方式收容於殼體10的收容部13中。換言之,當自第一端部31側朝向第二端部41對第二探測針22進行按壓時,第一端部31沿遠離殼體10的中心線CL的方向摩擦接觸。As shown in FIGS. 6 and 7 , the second probe needle 22 is received in the receiving portion 13 of the housing 10 in such a manner that the first end portion 31 moves in the second direction Y and away from the center of the housing 10 when the first end portion 31 approaches the second end portion 41. In other words, when the second probe needle 22 is pressed from the first end portion 31 side toward the second end portion 41, the first end portion 31 is frictionally contacted in a direction away from the center line CL of the housing 10.

檢查插座1可發揮出以下般的效果。Checking socket 1 can produce the following effects.

檢查插座1包括殼體10、以及收容於殼體10的內部的多個板狀的探測針20。各探測針20分別具有設置於第一方向上的一端的第一端部31及設置於第一方向上的另一端的第二端部41。多個探測針20包含第一端部31能夠與電池100的正極端子101接觸的至少一個第一探測針21、及第一端部31能夠與電池100的緣部102接觸的至少一個第二探測針22。在沿著第一方向觀察的情況下,第二探測針22的第一端部31沿與電池100的外周交叉的方向延伸。與第一方向及探測針20的厚度方向交叉的第二方向上的第二探測針22的第一端部31的尺寸W1大於徑向上的電池100的緣部102的尺寸W2。藉由此種結構,可實現能夠應對多個尺寸的電池的檢查插座1。The inspection socket 1 includes a housing 10 and a plurality of plate-shaped probe needles 20 housed inside the housing 10. Each probe needle 20 has a first end 31 disposed at one end in a first direction and a second end 41 disposed at the other end in the first direction. The plurality of probe needles 20 include at least one first probe needle 21 whose first end 31 can contact the positive terminal 101 of the battery 100, and at least one second probe needle 22 whose first end 31 can contact the edge 102 of the battery 100. When viewed along the first direction, the first end 31 of the second probe needle 22 extends in a direction intersecting the outer circumference of the battery 100. The dimension W1 of the first end 31 of the second probe needle 22 in the second direction intersecting the first direction and the thickness direction of the probe needle 20 is larger than the dimension W2 of the edge 102 of the battery 100 in the radial direction. With this structure, a testing socket 1 capable of handling batteries of various sizes can be realized.

EV用電池的檢查中通常採用圓筒形狀的彈簧針。但是,彈簧針不具有適於EV用電池的觸點的形狀的前端,在檢查時有時會引起接觸不良。由於彈簧針通常包含多個零件,因此在使用彈簧針的檢查插座中,電流特性不穩定。因此,在使檢查用插座小型化或薄型化的情況下,收容於檢查插座內的探測針亦需要小型化,但若使探測針小型化,則流經電流的導通路徑變細,導通時探測針發熱,因此有欲提高檢查插座的散熱性的要求。在檢查時流動的電流為高電流的情況下,例如可考慮使多個探測針與電池接觸。但是,由於彈簧針通常具有圓筒形狀,因此在將多個彈簧針收容於殼體中的情況下,有時無法實現檢查插座的省空間化。Cylindrical spring pins are usually used for testing EV batteries. However, the spring pins do not have a tip shape suitable for the contact point of EV batteries, which may cause poor contact during testing. Since spring pins usually contain multiple parts, the current characteristics are unstable in the testing socket using spring pins. Therefore, when the testing socket is miniaturized or thinned, the probe pin housed in the testing socket also needs to be miniaturized. However, if the probe pin is miniaturized, the conduction path diameter through which the current flows becomes smaller, and the probe pin generates heat when conducting. Therefore, there is a demand to improve the heat dissipation of the testing socket. When the current flowing during testing is a high current, for example, it can be considered to make multiple probe pins contact the battery. However, since the spring pins generally have a cylindrical shape, when a plurality of spring pins are housed in a housing, it is sometimes impossible to save space for the inspection socket.

在檢查插座1中,可根據電池100的形狀(例如,正極端子101及緣部102的形狀)來定製探測針20的第一端部31的形狀,因此可減少檢查時的接觸不良的發生。在檢查插座1中,由於使用了作為單一零件的板狀的探測針20,因此可使電流特性穩定,從而在檢查中使測定值穩定化。板狀的探測針20例如多枚重疊並且沿相同方向排列,藉此成為有效率的排列,可實現檢查插座1的省空間化。板狀的探測針20可較彈簧針增大與空氣接觸的面積,因此可提高檢查插座1的散熱性,抑制探測針20的電阻值的上升。In the test socket 1, the shape of the first end 31 of the probe needle 20 can be customized according to the shape of the battery 100 (for example, the shape of the positive terminal 101 and the edge 102), thereby reducing the occurrence of poor contact during testing. In the test socket 1, since a plate-shaped probe needle 20 is used as a single part, the current characteristics can be stabilized, thereby stabilizing the measured value during the test. For example, a plurality of plate-shaped probe needles 20 are stacked and arranged in the same direction, thereby forming an efficient arrangement, which can realize space saving of the test socket 1. The plate-shaped probe needle 20 can increase the area in contact with the air compared to the spring needle, thereby improving the heat dissipation of the test socket 1 and suppressing the increase in the resistance value of the probe needle 20.

檢查插座1可任意地採用以下所示的多個結構中的任一個或多個結構。即,以下所示的多個結構中的任一個或多個結構可在包含於所述實施形態的情況下任意地刪除,且可在不包含於所述實施形態的情況下任意地附加。藉由採用此種結構,可更確實地實現能夠應對多個尺寸的電池的檢查插座1。The inspection socket 1 can arbitrarily adopt any one or more of the multiple structures shown below. That is, any one or more of the multiple structures shown below can be arbitrarily deleted when included in the embodiment, and can be arbitrarily added when not included in the embodiment. By adopting such a structure, it is possible to more reliably realize an inspection socket 1 that can cope with batteries of multiple sizes.

多個探測針20包含多個第一探測針21及多個第二探測針22。The plurality of probe probes 20 include a plurality of first probe probes 21 and a plurality of second probe probes 22 .

多個探測針20包含:第一探測針組211,具有至少一個第一探測針21;以及第二探測針組221,相對於第一探測針組211相互電性獨立地設置並且具有至少一個第二探測針22。The plurality of probe needles 20 include: a first probe needle group 211 having at least one first probe needle 21 ; and a second probe needle group 221 , which is electrically independent from the first probe needle group 211 and has at least one second probe needle 22 .

多個第二探測針22以能夠與電池100的緣部102接觸的狀態收容於殼體10中。The plurality of second probes 22 are housed in the housing 10 in a state where they can contact the edge 102 of the battery 100.

多個探測針20以厚度方向一致的方式收容於殼體10中。The plurality of probes 20 are received in the housing 10 in a manner that the probes 20 are aligned in the thickness direction.

第一探測針21構成為能夠與凸形形狀的正極端子101接觸。The first probe needle 21 is configured to be able to contact the positive terminal 101 having a convex shape.

第一探測針21具有彈性部50,所述彈性部50位於第一方向上的第一端部31與第二端部41之間並且能夠沿著第一方向伸縮。第一端部31及第二端部41位於彈性部50的第二方向上的一端。第一探測針21以在使第一端部31朝向第二端部41接近的情況下,第一端部31向第二方向且接近殼體10的中心的方向移動的方式收容於殼體10中。The first probe needle 21 has an elastic portion 50, which is located between the first end portion 31 and the second end portion 41 in the first direction and can be extended and retracted along the first direction. The first end portion 31 and the second end portion 41 are located at one end of the elastic portion 50 in the second direction. The first probe needle 21 is accommodated in the housing 10 in such a manner that the first end portion 31 moves in the second direction and in a direction close to the center of the housing 10 when the first end portion 31 is brought close to the second end portion 41.

第二探測針22具有彈性部50,所述彈性部50位於第一方向上的第一端部31與第二端部41之間並且能夠沿著第一方向伸縮。第一端部31及第二端部41位於彈性部50的第二方向上的一端。第二探測針22以在使第一端部31朝向第二端部41接近的情況下,第一端部31向第二方向且遠離殼體10的中心的方向移動的方式收容於殼體10中。The second probe needle 22 has an elastic portion 50, which is located between the first end portion 31 and the second end portion 41 in the first direction and can be extended and retracted along the first direction. The first end portion 31 and the second end portion 41 are located at one end of the elastic portion 50 in the second direction. The second probe needle 22 is accommodated in the housing 10 in such a manner that the first end portion 31 moves in the second direction and away from the center of the housing 10 when the first end portion 31 approaches the second end portion 41.

檢查裝置可發揮出以下般的效果。The inspection device can have the following effects.

檢查裝置包括至少一個檢查插座1。藉由檢查插座1可實現能夠應對多個尺寸的電池的檢查裝置。The inspection device comprises at least one inspection socket 1. The inspection socket 1 can realize an inspection device capable of handling batteries of various sizes.

檢查插座1亦可以如下方式構成。The inspection socket 1 can also be constructed as follows.

殼體10可根據檢查插座1的設計等任意地變更形狀及結構。例如,殼體10的形狀並不限於大致四角柱形狀,亦可為大致圓柱形狀,亦可為大致四角柱形狀以外的大致多邊形狀。殼體10並不限於包含兩個構件11、12的情況,可包含一個構件,亦可包含三個以上的構件。The shape and structure of the housing 10 can be arbitrarily changed according to the design of the inspection socket 1. For example, the shape of the housing 10 is not limited to a substantially quadrangular prism, but can also be a substantially cylindrical shape, or a substantially polygonal shape other than a substantially quadrangular prism. The housing 10 is not limited to including two components 11 and 12, but can include one component or more than three components.

將殼體10包含沿第一方向X積層的五個構件15、16、17、18、19的檢查插座1的一例示於圖8中。在圖8的檢查插座1中,殼體10具有能夠自殼體10的外部目視確認收容於內部的探測針20的窗部61、及引導壁部62。窗部61在與厚度方向Z交叉的構件17的側面171及與第二方向Y交叉的構件17的側面172設置有多個。藉由設置窗部61,即便不對殼體10進行分解,亦可確認所收容的探測針20的狀態,並且可提高檢查插座1的散熱性。引導壁部62設置於構件15的探測針20的第一端部31露出的面111,構成為能夠將電池100朝向第一端部31引導。An example of an inspection socket 1 in which a housing 10 includes five components 15, 16, 17, 18, and 19 stacked along a first direction X is shown in FIG8 . In the inspection socket 1 of FIG8 , the housing 10 has a window portion 61 and a guide wall portion 62 that enable visual confirmation of the probe pin 20 housed inside from the outside of the housing 10. A plurality of window portions 61 are provided on a side surface 171 of the component 17 intersecting the thickness direction Z and a side surface 172 of the component 17 intersecting the second direction Y. By providing the window portions 61, the state of the housed probe pin 20 can be confirmed even without disassembling the housing 10, and the heat dissipation of the inspection socket 1 can be improved. The guide wall portion 62 is provided on the surface 111 of the component 15 where the first end portion 31 of the probe needle 20 is exposed, and is configured to guide the battery 100 toward the first end portion 31 .

例如,藉由利用熱傳導率高的材料(例如鋁)形成殼體10的一部分,可獲得與在殼體10形成窗部61的情況相同的效果。For example, by forming a part of the housing 10 with a material having high thermal conductivity (such as aluminum), the same effect as the case where the window portion 61 is formed in the housing 10 can be obtained.

收容於檢查插座1中的探測針20的數量可根據檢查插座1的設計等任意變更。The number of the probe pins 20 housed in the inspection socket 1 can be arbitrarily changed according to the design of the inspection socket 1, etc.

例如,圖8的檢查插座1中,多個探測針20包含四個第一探測針組211、212、213、214、及四個第二探測針組221、222、223、224。四個第一探測針組211、212、213、214中的第一探測針組211包含一個第一探測針21,例如作為感應針發揮功能。剩餘的三個第一探測針組212、213、214包含沿厚度方向Z積層的三個第一探測針21,例如作為激勵針發揮功能。同樣地,四個第二探測針組221、222、223、224中的第二探測針組221包含一個第二探測針22,例如作為感應針發揮功能。剩餘的三個第二探測針組222、223、224包含沿厚度方向Z積層的三個第二探測針22,例如作為激勵針發揮功能。第一探測針組211、第一探測針組212、第一探測針組213、第一探測針組214在沿著第一方向X觀察的情況下位於凹部14的開口部141的內側。具體而言,第一探測針組211、第一探測針組213沿著厚度方向Z以等間隔排列,第一探測針組212、第一探測針組214沿著厚度方向Z以等間隔排列。第一探測針組211、第一探測針組213及第一探測針組212、第一探測針組214沿第二方向Y隔開間隔地配置。For example, in the inspection socket 1 of FIG8 , the plurality of probe needles 20 include four first probe needle groups 211, 212, 213, 214, and four second probe needle groups 221, 222, 223, 224. The first probe needle group 211 of the four first probe needle groups 211, 212, 213, 214 includes one first probe needle 21, which functions as a sensing needle, for example. The remaining three first probe needle groups 212, 213, 214 include three first probe needles 21 stacked along the thickness direction Z, which function as excitation needles, for example. Similarly, the second probe needle group 221 of the four second probe needle groups 221, 222, 223, 224 includes one second probe needle 22, which functions as a sensing needle, for example. The remaining three second probe needle groups 222, 223, and 224 include three second probe needles 22 stacked along the thickness direction Z, and function as excitation needles, for example. The first probe needle group 211, the first probe needle group 212, the first probe needle group 213, and the first probe needle group 214 are located on the inner side of the opening 141 of the recess 14 when viewed along the first direction X. Specifically, the first probe needle group 211 and the first probe needle group 213 are arranged at equal intervals along the thickness direction Z, and the first probe needle group 212 and the first probe needle group 214 are arranged at equal intervals along the thickness direction Z. The first probe needle group 211, the first probe needle group 213 and the first probe needle group 212 and the first probe needle group 214 are arranged at intervals along the second direction Y.

例如,圖9的檢查插座1中,多個探測針20包含六個第一探測針組211、212、213、214、215、216、及四個第二探測針組221、222、223、224。六個第一探測針組211、212、213、214、215、216中的兩個第一探測針組211、215包含一個第一探測針21,例如,作為感應針發揮功能。剩餘的四個第一探測針組212、213、214、216包含沿厚度方向Z積層的三個第一探測針21,例如作為激勵針發揮功能。第一探測針組211、第一探測針組213、第一探測針組215沿著厚度方向Z以等間隔排列,第一探測針組212、第一探測針組214、第一探測針組216沿著厚度方向Z以等間隔排列。第一探測針組211、第一探測針組213、第一探測針組215及第一探測針組212、第一探測針組214、第一探測針組216沿第二方向Y隔開間隔地配置。For example, in the inspection socket 1 of FIG9 , the plurality of probe needles 20 include six first probe needle groups 211, 212, 213, 214, 215, 216, and four second probe needle groups 221, 222, 223, 224. Two of the six first probe needle groups 211, 212, 213, 214, 215, 216 include one first probe needle 21, for example, functioning as a sensing needle. The remaining four first probe needle groups 212, 213, 214, 216 include three first probe needles 21 stacked along the thickness direction Z, for example, functioning as an excitation needle. The first probe needle group 211, the first probe needle group 213, and the first probe needle group 215 are arranged at equal intervals along the thickness direction Z, and the first probe needle group 212, the first probe needle group 214, and the first probe needle group 216 are arranged at equal intervals along the thickness direction Z. The first probe needle group 211, the first probe needle group 213, the first probe needle group 215 and the first probe needle group 212, the first probe needle group 214, and the first probe needle group 216 are arranged at intervals along the second direction Y.

如此,探測針組的數量及一個探測針組中包含的探測針的數量可變更為1以上的任意的數。In this way, the number of probe needle groups and the number of probe needles included in one probe needle group can be changed to any number greater than 1.

多個探測針20並不限於以所有的探測針20的厚度方向一致的狀態收容於殼體10中的情況,亦可以所有的探測針20的厚度方向不一致的狀態收容於殼體10中。The plurality of probe needles 20 are not limited to being housed in the housing 10 in a state where the thickness directions of all the probe needles 20 are consistent, and the plurality of probe needles 20 may be housed in the housing 10 in a state where the thickness directions of all the probe needles 20 are inconsistent.

在圖9的檢查插座1中,在殼體10的構件15中的探測針20的第一端部31露出的面151設置有多個窗部61。各窗部61構成為能夠自殼體10的外部目視確認作為激勵針發揮功能的第二探測針組222、第二探測針組223、第二探測針組224中包含的三個第二探測針22的彈性部50。In the inspection socket 1 of Fig. 9, a plurality of windows 61 are provided on the surface 151 where the first end 31 of the probe needle 20 is exposed in the member 15 of the housing 10. Each window 61 is configured to be able to visually confirm from the outside of the housing 10 the elastic portion 50 of the three second probe needles 22 included in the second probe needle group 222, the second probe needle group 223, and the second probe needle group 224 that function as the excitation needles.

探測針20的形狀及結構可根據檢查插座1的設計等任意變更。例如,第一端部31及第二端部41並不限於具有傾斜面32或凹凸面33的情況,亦可具有與檢查對象物或基板110的形狀等相應的其他結構。圖10中示出第一探測針21的第一端部31具有凹凸面33而並非傾斜面32的檢查插座1的一例。彈性部50並不限於具有第一部分51及第二部分52的情況,亦可具有能夠沿著第一方向X伸縮的任意的結構。The shape and structure of the probe needle 20 can be arbitrarily changed according to the design of the inspection socket 1. For example, the first end 31 and the second end 41 are not limited to having an inclined surface 32 or a concave-convex surface 33, and may have other structures corresponding to the shape of the inspection object or the substrate 110. FIG. 10 shows an example of an inspection socket 1 in which the first end 31 of the first probe needle 21 has a concave-convex surface 33 instead of an inclined surface 32. The elastic portion 50 is not limited to having a first portion 51 and a second portion 52, and may have an arbitrary structure that can be stretched and contracted along the first direction X.

以上,參照圖式對本揭示中的各種實施形態進行了詳細說明,最後對本揭示的各種形態進行說明。再者,在以下的說明中,作為一例,亦添加參照符號進行記載。In the above, various embodiments of the present disclosure are described in detail with reference to the drawings, and finally various embodiments of the present disclosure are described. In addition, in the following description, reference symbols are also added as an example.

本揭示的第一形態的檢查插座1用於電池的檢查, 所述電池具有:正極端子,位於軸向上的一端的中央;以及環狀的緣部,相對於所述正極端子位於徑向上的外側並且與負極端子電性連接,所述檢查插座1包括: 殼體10;以及 多個板狀的探測針20,分別具有設置於第一方向上的一端的第一端部31、以及設置於所述第一方向上的另一端的第二端部41,並收容於所述殼體10的內部, 多個所述探測針20包含所述第一端部31能夠與所述正極端子接觸的至少一個第一探測針21、以及所述第一端部31能夠與所述緣部接觸的至少一個第二探測針22, 在沿著所述第一方向觀察的情況下,所述第二探測針22的所述第一端部31沿與所述電池的外周交叉的方向延伸, 與所述第一方向及所述探測針20的厚度方向交叉的第二方向上的所述第二探測針22的所述第一端部31的尺寸大於徑向上的所述緣部的尺寸。 The first form of the inspection socket 1 disclosed in the present invention is used for inspecting a battery. The battery has: a positive terminal located at the center of one end in the axial direction; and an annular edge located radially outward relative to the positive terminal and electrically connected to the negative terminal. The inspection socket 1 includes: a housing 10; and a plurality of plate-shaped probes 20, each having a first end 31 disposed at one end in the first direction and a second end 41 disposed at the other end in the first direction, and housed in the housing 10. The plurality of probes 20 include at least one first probe 21 whose first end 31 can contact the positive terminal, and at least one second probe 22 whose first end 31 can contact the edge. When observed along the first direction, the first end 31 of the second probe needle 22 extends in a direction intersecting the periphery of the battery, and the size of the first end 31 of the second probe needle 22 in a second direction intersecting the first direction and the thickness direction of the probe needle 20 is larger than the size of the edge in the radial direction.

本揭示的第二形態的檢查插座1如第一形態的檢查插座1, 多個所述探測針20包含多個所述第一探測針21及多個所述第二探測針22。 The second form of the inspection socket 1 disclosed herein is like the first form of the inspection socket 1, The plurality of the detection needles 20 include a plurality of the first detection needles 21 and a plurality of the second detection needles 22.

本揭示的第三形態的檢查插座1如第二形態的檢查插座1, 多個所述探測針20包含:第一探測針組211、第一探測針組212,具有至少一個所述第一探測針21;以及第二探測針組221、第二探測針組222,相對於所述第一探測針組211、第一探測針組212相互電性獨立地設置並且具有至少一個所述第二探測針22。 The third form of the inspection socket 1 disclosed herein is like the second form of the inspection socket 1, The plurality of the probe needles 20 include: a first probe needle group 211, a first probe needle group 212, having at least one of the first probe needles 21; and a second probe needle group 221, a second probe needle group 222, which are electrically independently arranged relative to the first probe needle group 211, the first probe needle group 212 and have at least one of the second probe needles 22.

本揭示的第四形態的檢查插座1如第二形態或第三形態的檢查插座1, 多個所述第二探測針22以能夠與所述緣部接觸的狀態收容於所述殼體10中。 The fourth form of the inspection socket 1 disclosed herein is like the second form or the third form of the inspection socket 1, The plurality of the second probe needles 22 are housed in the housing 10 in a state where they can contact the edge.

本揭示的第五形態的檢查插座1如第一形態至第四形態中的任一形態的檢查插座1, 多個所述探測針20以所述厚度方向一致的方式收容於所述殼體10中。 The fifth form of the inspection socket 1 disclosed herein is like any form of the inspection socket 1 from the first form to the fourth form, The plurality of probes 20 are accommodated in the housing 10 in a manner consistent with the thickness direction.

本揭示的第六形態的檢查插座1如第一形態至第五形態中的任一形態的檢查插座1, 所述第一探測針21構成為能夠與凸形形狀的所述正極端子接觸。 The sixth form of the inspection socket 1 disclosed herein is like any form of the inspection socket 1 from the first form to the fifth form, The first probe needle 21 is configured to be able to contact the convex positive terminal.

本揭示的第七形態的檢查插座1如第一形態至第六形態中的任一形態的檢查插座1, 所述第一探測針21具有彈性部50,所述彈性部50位於所述第一方向上的所述第一端部31與所述第二端部41之間並且能夠沿著所述第一方向伸縮, 所述第一端部31及所述第二端部41位於所述彈性部50的所述第二方向上的一端, 所述第一探測針21以在使所述第一端部31朝向所述第二端部41接近的情況下,所述第一端部31向所述第二方向且接近所述殼體10的中心的方向移動的方式收容於所述殼體10中。 The seventh form of the inspection socket 1 disclosed herein is the inspection socket 1 of any form from the first form to the sixth form, The first probe needle 21 has an elastic portion 50, the elastic portion 50 is located between the first end portion 31 and the second end portion 41 in the first direction and is capable of stretching and contracting along the first direction, The first end portion 31 and the second end portion 41 are located at one end of the elastic portion 50 in the second direction, The first probe needle 21 is accommodated in the housing 10 in such a manner that the first end portion 31 moves in the second direction and in a direction close to the center of the housing 10 when the first end portion 31 approaches the second end portion 41.

本揭示的第八形態的檢查插座1如第一形態至第七形態中的任一形態的檢查插座1, 所述第二探測針22具有彈性部50,所述彈性部50位於所述第一方向上的所述第一端部31與所述第二端部41之間並且能夠沿著所述第一方向伸縮, 所述第一端部31及所述第二端部41位於所述彈性部50的所述第二方向上的一端, 所述第二探測針22以在使所述第一端部31朝向所述第二端部41接近的情況下,所述第一端部31向所述第二方向且遠離所述殼體10的中心的方向移動的方式收容於所述殼體10中。 The eighth form of the inspection socket 1 disclosed herein is the inspection socket 1 of any form from the first form to the seventh form, The second probe needle 22 has an elastic portion 50, the elastic portion 50 is located between the first end portion 31 and the second end portion 41 in the first direction and is capable of stretching and contracting along the first direction, The first end portion 31 and the second end portion 41 are located at one end of the elastic portion 50 in the second direction, The second probe needle 22 is accommodated in the housing 10 in such a manner that the first end portion 31 moves in the second direction and away from the center of the housing 10 when the first end portion 31 approaches the second end portion 41.

本揭示的第九形態的檢查插座1如第一形態至第八形態中的任一形態的檢查插座1, 所述殼體10具有窗部61,所述窗部61能夠自外部目視確認收容於內部的所述探測針20。 The ninth form of the inspection socket 1 disclosed herein is like any form of the inspection socket 1 from the first form to the eighth form, The housing 10 has a window 61, and the window 61 enables visual confirmation of the probe 20 housed inside from the outside.

本揭示的第十形態的檢查裝置 包括至少一個如第一形態至第九形態中的任一形態所述的檢查插座1。 The inspection device of the tenth form disclosed herein includes at least one inspection socket 1 as described in any form from the first form to the ninth form.

藉由將所述各種實施方式或變形例中的任意的實施方式或變形例適當組合,可起到各自具有的效果。而且,可進行實施方式彼此的組合、或實施例彼此的組合、或者實施方式與實施例的組合,並且亦可進行不同的實施方式或實施例中的特徵彼此的組合。By appropriately combining any of the various embodiments or modifications, the effects of each embodiment or modification can be achieved. Moreover, embodiments can be combined with each other, or embodiments can be combined with each other, or embodiments can be combined with each other, and different embodiments or features in embodiments can also be combined with each other.

本揭示已一邊參照隨附圖式一邊關聯於較佳的實施方式而充分記載,但對於熟悉該技術的人們而言,各種變形或修正是顯而易見的。應理解,此種變形或修正只要不脫離基於隨附的申請專利範圍的、本揭示的範圍,則包含於其中。 [產業上的可利用性] This disclosure has been fully described in relation to the preferred embodiment with reference to the accompanying drawings, but various modifications or alterations are obvious to those skilled in the art. It should be understood that such modifications or alterations are included within the scope of this disclosure as long as they do not depart from the scope of the accompanying patent applications. [Industrial Applicability]

本揭示的檢查插座例如可應用於EV用電池的檢查中使用的檢查裝置。The inspection socket disclosed herein can be applied to an inspection device used for inspecting EV batteries, for example.

本揭示的檢查裝置例如可用作EV用電池的檢查裝置。The inspection device disclosed herein can be used, for example, as an inspection device for EV batteries.

1:檢查插座 10:殼體 11、12、15、16、17、18、19:構件 13:收容部 14:凹部 20:探測針 21:第一探測針 22:第二探測針 30:第一接觸部 31:第一端部 32:傾斜面 33:凹凸面 34:側面 40:第二接觸部 41:第二端部 42:傾斜面 50:彈性部 51:第一部分 52:第二部分 61:窗部 62:引導壁部 100:電池 101:正極端子 102:緣部 103:外周 110:基板 111、121、151:面 112、113、141:開口部 171、172:側面 211、212、213、214、215、216:第一探測針組 221、222、223、224:第二探測針組 CL:中心線 L:假想直線 V、IV、VI、VII:線 W1、W2:尺寸 X:第一方向/方向 Y:第二方向/方向 Z:厚度方向/方向 1: Inspection socket 10: Housing 11, 12, 15, 16, 17, 18, 19: Component 13: Accommodation 14: Recess 20: Probe 21: First probe 22: Second probe 30: First contact 31: First end 32: Inclined surface 33: Concave and convex surface 34: Side 40: Second contact 41: Second end 42: Inclined surface 50: Elastic part 51: First part 52: Second part 61: Window 62: Guide wall 100: Battery 101: Positive terminal 102: Edge 103: Periphery 110: Substrate 111, 121, 151: Surface 112, 113, 141: Opening 171, 172: Side 211, 212, 213, 214, 215, 216: First probe needle group 221, 222, 223, 224: Second probe needle group CL: Center line L: Imaginary straight line V, IV, VI, VII: Line W1, W2: Dimension X: First direction/direction Y: Second direction/direction Z: Thickness direction/direction

圖1是表示本揭示的一實施型態的檢查插座的立體圖。 圖2是圖1的檢查插座的放大正面圖。 圖3是沿著圖2的III-III線的剖面圖。 圖4是沿著圖1的IV-IV線的剖面圖。 圖5是沿著圖1的V-V線的剖面圖。 圖6是沿著圖1的VI-VI線的剖面圖。 圖7是沿著圖1的VII-VII線的剖面圖。 圖8是表示圖1的檢查插座的第一變形例的立體圖。 圖9是表示圖1的檢查插座的第二變形例的放大平面圖。 圖10是表示圖1的檢查插座的第三變形例的立體圖。 FIG. 1 is a perspective view of an inspection socket according to an embodiment of the present disclosure. FIG. 2 is an enlarged front view of the inspection socket of FIG. 1. FIG. 3 is a cross-sectional view along line III-III of FIG. 2. FIG. 4 is a cross-sectional view along line IV-IV of FIG. 1. FIG. 5 is a cross-sectional view along line V-V of FIG. 1. FIG. 6 is a cross-sectional view along line VI-VI of FIG. 1. FIG. 7 is a cross-sectional view along line VII-VII of FIG. 1. FIG. 8 is a perspective view of a first variant of the inspection socket of FIG. 1. FIG. 9 is an enlarged plan view of a second variant of the inspection socket of FIG. 1. FIG. 10 is a perspective view of a third variant of the inspection socket of FIG. 1.

1:檢查插座 1: Check the socket

10:殼體 10: Shell

11、12:構件 11, 12: Components

14:凹部 14: Concave part

20:探測針 20: Probe

21:第一探測針 21: First probe needle

22:第二探測針 22: Second probe needle

110:基板 110: Substrate

111:面 111: Noodles

112:開口部 112: Opening

211、212:第一探測針組 211, 212: First probe needle set

221、222:第二探測針組 221, 222: Second probe needle set

V、IV、VI、VII:線 V, IV, VI, VII: lines

X:第一方向/方向 X: First direction/direction

Y:第二方向/方向 Y: Second direction/direction

Z:厚度方向/方向 Z: thickness direction/direction

Claims (10)

一種檢查插座,用於電池的檢查,所述電池具有:正極端子,位於軸向上的一端的中央;以及環狀的緣部,相對於所述正極端子位於徑向上的外側並且與負極端子電性連接,所述檢查插座包括: 殼體;以及 多個板狀的探測針,分別具有設置於第一方向上的一端的第一端部、以及設置於所述第一方向上的另一端的第二端部,並收容於所述殼體的內部, 多個所述探測針包含所述第一端部能夠與所述正極端子接觸的至少一個第一探測針、以及所述第一端部能夠與所述緣部接觸的至少一個第二探測針, 在沿著所述第一方向觀察的情況下,所述第二探測針的所述第一端部沿與所述電池的外周交叉的方向延伸, 與所述第一方向及所述探測針的厚度方向交叉的第二方向上的所述第二探測針的所述第一端部的尺寸大於徑向上的所述緣部的尺寸。 A test socket for testing a battery, the battery having: a positive terminal located at the center of one end in the axial direction; and an annular edge located radially outward relative to the positive terminal and electrically connected to the negative terminal, the test socket comprising: a housing; and a plurality of plate-shaped probes, each having a first end disposed at one end in a first direction and a second end disposed at the other end in the first direction, and housed in the housing, the plurality of probes including at least one first probe whose first end can contact the positive terminal, and at least one second probe whose first end can contact the edge, when observed along the first direction, the first end of the second probe extends in a direction intersecting the periphery of the battery, The dimension of the first end of the second probe needle in the second direction intersecting the first direction and the thickness direction of the probe needle is greater than the dimension of the edge in the radial direction. 如請求項1所述的檢查插座,其中,多個所述探測針包含多個所述第一探測針及多個所述第二探測針。The inspection socket as described in claim 1, wherein the plurality of probe needles include a plurality of the first probe needles and a plurality of the second probe needles. 如請求項2所述的檢查插座,其中,多個所述探測針包含:第一探測針組,具有至少一個所述第一探測針;以及第二探測針組,相對於所述第一探測針組相互電性獨立地設置並且具有至少一個所述第二探測針。The inspection socket as described in claim 2, wherein the plurality of probe needles include: a first probe needle group having at least one first probe needle; and a second probe needle group that is electrically independent of the first probe needle group and has at least one second probe needle. 如請求項2所述的檢查插座,其中,多個所述第二探測針以能夠與所述緣部接觸的狀態收容於所述殼體中。An inspection socket as described in claim 2, wherein a plurality of the second probe needles are housed in the housing in a state capable of contacting the edge portion. 如請求項1至4中任一項所述的檢查插座,其中,多個所述探測針以所述厚度方向一致的方式收容於所述殼體中。An inspection socket as described in any one of claims 1 to 4, wherein a plurality of the probe needles are housed in the housing in a manner consistent with the thickness direction. 如請求項1至4中任一項所述的檢查插座,其中,所述第一探測針構成為能夠與凸形形狀的所述正極端子接觸。An inspection socket as described in any one of claims 1 to 4, wherein the first probe needle is configured to be able to contact the positive terminal of the convex shape. 如請求項1至4中任一項所述的檢查插座,其中,所述第一探測針具有彈性部,所述彈性部位於所述第一方向上的所述第一端部與所述第二端部之間並且能夠沿著所述第一方向伸縮, 所述第一端部及所述第二端部位於所述彈性部的所述第二方向上的一端, 所述第一探測針以在使所述第一端部朝向所述第二端部接近的情況下,所述第一端部向所述第二方向且接近所述殼體的中心的方向移動的方式收容於所述殼體中。 An inspection socket as described in any one of claims 1 to 4, wherein the first probe needle has an elastic portion, the elastic portion is between the first end portion and the second end portion in the first direction and is capable of stretching and contracting along the first direction, the first end portion and the second end portion are located at one end of the elastic portion in the second direction, the first probe needle is accommodated in the housing in such a manner that the first end portion moves in the second direction and in a direction close to the center of the housing when the first end portion approaches the second end portion. 如請求項1至4中任一項所述的檢查插座,其中,所述第二探測針具有彈性部,所述彈性部位於所述第一方向上的所述第一端部與所述第二端部之間並且能夠沿著所述第一方向伸縮, 所述第一端部及所述第二端部位於所述彈性部的所述第二方向上的一端, 所述第二探測針以在使所述第一端部朝向所述第二端部接近的情況下,所述第一端部向所述第二方向且遠離所述殼體的中心的方向移動的方式收容於所述殼體中。 An inspection socket as described in any one of claims 1 to 4, wherein the second probe needle has an elastic portion, the elastic portion is between the first end portion and the second end portion in the first direction and is capable of stretching and contracting along the first direction, the first end portion and the second end portion are located at one end of the elastic portion in the second direction, the second probe needle is accommodated in the housing in such a manner that when the first end portion approaches the second end portion, the first end portion moves in the second direction and away from the center of the housing. 如請求項1至4中任一項所述的檢查插座,其中,所述殼體具有窗部,所述窗部能夠自外部目視確認收容於內部的所述探測針。The inspection socket as described in any one of claims 1 to 4, wherein the housing has a window portion, and the window portion enables visual confirmation of the probe needle accommodated inside from the outside. 一種檢查裝置,包括至少一個如請求項1至4中任一項所述的檢查插座。An inspection device comprises at least one inspection socket as described in any one of claims 1 to 4.
TW112135172A 2022-10-19 2023-09-15 Inspection socket and inspection device TW202417866A (en)

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