KR20240027655A - Test tray of handler for testing electronic devices - Google Patents

Abstract

The present invention relates to a test tray for a handler for testing electronic components.
The test tray of the handler for testing electronic components according to the present invention has an insert installed on a frame that moves circularly, and the insert is moved toward the tester by an external force, so that an appropriate electrical connection between the electronic component and the tester can be made.
According to the present invention, there is an advantage in that the degree of freedom in the degree of coupling between the tester and the handler is improved because the electrical connection between the electronic components and the tester can be properly made regardless of the degree of coupling between the tester and the handler.

Description

Test tray of handler for testing electronic components {TEST TRAY OF HANDLER FOR TESTING ELECTRONIC DEVICES}

The present invention relates to a test tray that moves circularly on a certain circulation path after loading electronic components in an electronic component test handler.

Produced electronic components are tested by testers and then divided into good and defective products, and only good products are shipped.

The electrical connection between the tester and electronic components is made by a handler for testing electronic components (hereinafter abbreviated as 'handler'), and there are various types of handlers depending on the type of electronic component. Among them, the present invention relates to a handler equipped with a test tray that moves circularly.

A conventional test tray related to the present invention is presented in Korean Patent Publication No. 10-1998-030401, etc.

The handler loads electronic components from the loading position onto a test tray and moves the test tray loaded with electronic components to the test location. The handler, which electrically connects the electronic components loaded on the test tray at the test position to the tester coupled to the handler, moves the test tray to the unloading position after the test is completed. Then, the handler who unloads the electronic components from the test tray in the unloading position moves the test tray to the loading position.

In this way, the test tray moves circularly within the handler along a circular path that leads back to the loading position through the loading position, testing position, and unloading position.

Meanwhile, in order to electrically connect an electronic component to a tester at a test location, the electronic component must be pressed toward the test socket of the tester. At this time, the movement of the electronic component in the pressing direction is restricted to the movement of the test tray. Therefore, the test tray's movement range must be secured to ensure that the electronic components and the test socket can make electrical contact.

*However, depending on the structure of the support rail supporting the test tray or the connection structure of the tester, there may be cases where electrical contact between the electronic components and the tester is not guaranteed. Of course, methods such as changing the tester's coupling structure can be taken, but it is realistically difficult to request that the handler company change the tester's coupling structure. Therefore, there is no need to change the structure of the tester, and there is a need to develop technology that can be applied to existing testers.

The present invention provides a method to ensure electrical contact between the electronic components loaded on the test tray and the test socket of the tester even when the moving distance of the test tray cannot ensure electrical contact between the electronic components loaded on the test tray and the test socket of the tester. It provides the technology that can be used.

The test tray of the handler for testing electronic components according to the present invention includes a frame having a plurality of insertion holes arranged in a matrix form; A plurality of inserts installed on the frame, each inserted into the plurality of insertion holes, having a seating groove into which an electronic component can be seated, and exposing terminals of the electronic component seated in the seating groove to the tester side; and positioning members that position the insert disposed in the insertion hole at a designated position; It includes, wherein the positioning members allow the insert to move toward the tester when an external force is applied to the insert toward the tester, and are elastic capable of elastic deformation and restoration so that the insert can be restored to a predetermined position when the external force is removed. It is provided with a material, and the positioning member is installed coupled to the frame and has a support portion for supporting the insert so as to apply a restoring force to the insert when an external force acts on the insert.

The positioning member is a torsion spring, the frame has an installation axis for installing the positioning member, and the positioning member includes: A coupling portion coupled to the installation shaft; and a limiting portion extending to one side of the coupling portion whose displacement is limited by the frame; The support portion extends to the other side of the coupling portion and supports one of the square corners of the insert, thereby continuously supporting the insert while being displaced in response to movement of the insert.

A retaining groove is formed in the insert so that the support portion maintains support of the insert.

The frame has an installation portion for installing the positioning member, and the installation portion is provided outside the insertion hole.

The frame is formed with a separation prevention protrusion protruding toward the insertion hole to prevent the insert from being separated from the insertion hole due to the elastic force of the position member, and a separation prevention protrusion that catches the separation prevention protrusion is formed on the insert. do.

a holding member for maintaining the insert in the insertion hole; It further includes, wherein the holding member has a separation prevention protrusion formed to protrude toward the insertion hole to prevent the insert from being separated from the insertion hole due to the elastic force of the position member, and the insert has the separation prevention protrusion A breakaway bump is formed.

The frame is formed with a guide protrusion that protrudes toward the insertion hole to guide the movement of the insert when the insert moves due to an external force applied to the insert.

A movement limiting jaw is formed on the insert to limit excessive movement of the insert toward the tester due to external force, and the movement limiting jaw hangs on the guide protrusion to prevent excessive movement of the insert due to external force.

A plurality of removal prevention protrusions are formed on the insert to prevent the insert from being removed from the insertion hole when an external force is applied in a twisted direction to the insert, and the inner wall forming the insertion hole of the frame corresponds to the removal prevention protrusion. A removal prevention groove is formed.

The insert moves toward the tester so that it protrudes more than the frame.

By circularly moving along a circular path determined by the transfer device of the handler, the insert also circularly moves with the frame, and the insert does not protrude beyond the frame when the insert circularly moves, and only protrudes beyond the frame during testing. It protrudes more.

According to the present invention, by moving the insert to the test socket side to enable position restoration, an appropriate electrical connection can be made between the electronic components and the tester regardless of the degree of coupling between the tester and the handler, thereby improving the degree of freedom in the degree of coupling between the tester and the handler. There is an advantage to this.

1 is a conceptual plan view of a handler for testing electronic components to which a test tray according to the present invention can be applied.
Figure 2 is a partially exploded perspective view of a test tray according to the present invention.
Figure 3 is a bottom perspective view of a portion of the frame applied to the test tray of Figure 2.
Figure 4 is a plan perspective view of the insert applied to the test tray of Figure 2.
Figure 5 is a bottom perspective view of the insert of Figure 4.
Figure 6 is a cross-sectional view of main parts of the test tray of Figure 2.
Figures 7 to 11 are cross-sectional views according to each step of operation to explain the main operation of the test tray of Figure 2.
FIG. 12 is a reference diagram for comparing a conventional test tray with the test tray of FIG. 2.
Figures 13 to 15 are modified examples of the test tray of Figure 2.

Preferred embodiments according to the present invention will be described with reference to the attached drawings, but for brevity of explanation, overlapping descriptions will be omitted or compressed as much as possible.

<A brief configuration description of the handler>

Figure 1 is a conceptual plan view of a handler 100 (hereinafter abbreviated as 'handler') for testing electronic components to which the test tray 110 according to the present invention can be applied.

The handler 100 includes a test tray 110, a loading device 120, a pressurizing device 130, an unloading device 140, and a plurality of transfer devices 151 to 155.

The test tray 110 can be loaded with electronic components and circulates along a designated circulation path (C).

The loading device 120 loads electronic components to be tested onto the test tray 110 at the loading position LP.

The pressurizing device 130 presses the electronic components loaded on the test tray 110 at the test position TP into a test socket (not shown) of a tester (not shown) coupled to the handler 100 below the test position TP. (not working) side so that the electronic components and the test socket can make electrical contact.

The unloading device 140 unloads electronic components from the test tray 110 at the unloading position UP and classifies them by test grade.

A plurality of transfer devices (151 to 155) move the test tray (110) through the loading position (LP), testing position (TP), and unloading position (UP) onto the circulation path (C) leading back to the loading position (LP). Move .

<Composition description of test tray>

Figure 2 is a partially exploded perspective view of the test tray 110 according to the present invention.

The test tray 110 according to the present invention includes a frame 111, a plurality of inserts 112, positioning members 113, and holding members 114.

A plurality of insertion holes (IH) arranged in a row are formed in the frame 111, and four installation grooves (IS) extending from the insertion holes (IH) are formed on the outer square corners of the insertion holes (IH). (see enlarged area A). As this frame 111 moves circularly along the above-described circulation path (C), ultimately, the inserts 112 installed on the frame 111 and the electronic components loaded on the inserts 112 move along the defined circulation path (C). It moves circularly along C).

Meanwhile, looking at the bottom side of the frame 111 with reference to FIG. 3, there is a guide protrusion on the bottom side of the frame 111 to guide the movement of the insert 112 when the insert 112 moves downward (or toward the tester). (GP) is formed to protrude toward the insertion hole (IH).

In addition, four removal prevention grooves a ₁ to a ₄ are formed on the inner wall of the insertion hole IH in the direction of pressing the electronic component (in this embodiment, the 'up and down direction'). Here, the removal prevention groove of symbol a ₁ has a trapezoidal shape in plan.

And the frame 111 has installation axes 111a for installing the positioning member 114 in the installation groove IS. That is, the installation groove (IS) and the installation shaft 111a function as installation parts for installing the positioning member 114 on the frame 111, and can have various forms depending on the structure of the positioning member 114 to be applied. However, it is preferable to be provided outside the insertion hole (IH).

As shown in the top perspective view of FIG. 4 and the bottom perspective view of FIG. 5, the insert 112 is inserted into the insertion hole (IH) and has a seating groove (RS) into which the electronic component can be seated. This insert 112 may be provided in various structures, but in this embodiment, it is composed of a main body 112a and a support film 112b.

The upper seating groove (RS) is formed in the main body (112a). At the square corner of the bottom of the main body 112a, there are four support portions 113c of the positioning member 113 that support the insert 112 without being separated from the state of supporting the insert 112. A holding groove (SS) is formed. Here, the holding groove SS may be formed in various shapes depending on the structure of the positioning member 113.

Movement limiters LJ are formed on both left and right sides of the main body 112a to limit excessive movement of the insert 112 toward the tester (not shown) due to external force caused by the pressurizing device 130. By engaging the guide protrusion (GP) correspondingly to the movement limit jaw (LJ), excessive movement of the insert (112b) toward the tester is restricted. That is, the guide protrusion (GP) also functions as a movement limiting protrusion to limit excessive movement of the insert 112 toward the tester.

In addition, a departure prevention jaw (BJ) is formed on the upper part of the main body 112a in the front and rear directions.

Additionally, four removal prevention protrusions (PP) are formed on the upper side of the main body 112a. These four removal prevention protrusions (PP) are located to correspond to the four removal prevention grooves (a ₁ to a ₄ ), so that even if the pressing force by the pressing device 130 is applied in a slightly twisted direction in the vertical direction, the insert 112 is prevented from being removed from the insertion hole (IH). Of course, the removal prevention protrusion (PP) and the removal prevention grooves (a ₁ to a ₄ ) also perform the function of guiding the movement of the insert 112 when it is moved. Here, among the four removal prevention protrusions (PP), one corresponding to symbol a ₁ (the removal prevention protrusion on the right front in the drawing) has a trapezoidal shape with a larger planar area than the others. Therefore, reverse insertion can be prevented when placing the insert 112 in the insertion hole IH. Two or more such anti-separation protrusions (PP) are formed on both sides of the insert 112, and if at least one has a different planar area or shape than the others, it can properly perform its function.

The support film 112b supports the electronic components so that they do not escape toward the tester, and has exposure holes (EH) for exposing terminals of the electronic components to the tester.

Four positioning members 113 are provided for each insert 112, and perform the function of positioning the insert 112 placed in the insertion hole (IH) at a designated position. This positioning member 113 allows the insert 112 to move toward the tester when an external force is applied to the insert 112 by the pressurizing device 130, and when the external force is removed, the insert 112 is moved to a predetermined position. It is made of an elastic material capable of elastic deformation and restoration so that it can be restored. In this embodiment, a torsion spring is provided as the positioning member 113. Accordingly, referring again to the enlarged area B of FIG. 2, the positioning member 113 in this example includes a coupling portion 113a, a limiting portion 113b, and a support portion 113c.

The coupling portion 114a has a cylindrical shape and has a structure into which the installation shaft 111a is inserted (see FIG. 3). Therefore, the positioning member 113 can be installed coupled to the frame 111 through the coupling portion 113a.

The limiting portion 113b extends to one side of the coupling portion 113a so that its displacement is limited by the frame 111. For this purpose, the limiting portion 113b is in contact with the frame 111 on the inner wall side forming the installation groove IS, as shown in FIG. 3.

As shown in FIG. 6, the support portion 113c extends to the other side of the coupling portion 113a so that a restoring force can be applied to the insert 112 when an external force is applied to the insert 112 in the direction of the tester. ) supports. This support portion (113c) is located in the holding groove (SS) to continuously maintain the support state of the insert (112). Therefore, the support portion 113c supports one of the square corners of the insert 112. And, in conjunction with the movement of the insert 112, the support portion 113c is also displaced and continuously supports the insert 112, thereby applying a restoring force to the insert 112.

Referring to Figure 2, two holding members 114 are provided per insert 112. This holding member 114 is coupled to the frame 111 by a bolt (BT) and functions to maintain the insert 112 in the insertion hole (IH). To this end, a separation prevention protrusion (BP) is formed on the holding member 114 to protrude toward the insertion hole (IH) to prevent the insert 112 from being separated from the insertion hole (IH) due to the elastic force of the positioning member 113. It is done. And, the separation prevention protrusion (BP) is caught on the separation prevention jaw (BJ) of the insert 112, so that the insert 112 can be maintained in the insertion hole (IH). For reference, depending on the implementation, the holding member may be formed integrally with the frame, and in this case, the separation prevention protrusion must naturally be formed on the frame.

In the test tray 110 above, the insert 112 does not protrude beyond the frame 111 when the test tray 110 circulates, and only sticks to the frame 111 when an external force from the pressurizing device 130 is applied during testing. ) protrudes more than

Next, the main operation of the present invention will be described with reference to FIG. 7 and below.

<Description of main operations>

As shown in FIG. 7, at the test position (TP), the pusher 131 of the pressurizing device 130 presses the electronic component (D) seated in the seating groove (RS) of the insert 112 toward the test socket (TS) of the tester. Then, the insert 112 moves forward toward the test socket (TS) as shown in FIG. 8. At this time, the movement of the insert 112 is guided by the guiding protrusion (GP) of the frame 111, while the movement of the insert 112 is also guided by the removal prevention protrusions (PP).

Figure 9 shows a state in which the insert 112 has completely moved and the electronic component D loaded on the insert 112 and the test socket TS are in electrical contact.

Meanwhile, in some cases, as shown in FIG. 10, the test socket TS may not be able to enter the inside through the test window TW of the handler 100, but may be provided on the outside of the handler 100. Since this case must also be considered, the insert 112 must have a moving distance at least equal to or longer than the thickness T of the wall W forming the test window TW side. This is because, as shown in FIG. 11, the position where the support rail 160 supporting the test tray 110 can move as much as possible is up to the inner wall (IF) of the wall (W) forming the test window (TW) side, This may vary somewhat depending on the support type of the support rail 160, but the point where the electronic component D loaded on the test tray 110 can move as much as possible with the support rail 160 without moving the insert 112 is within the range. This means up to the wall (IF). Therefore, the distance equal to the thickness (T) of the wall (W) at which the electronic component (D) can electrically contact the test socket (TS) must be compensated for by the movement of the insert (112). do. Therefore, the moving distance of the insert 112 is preferably shorter than the thickness of the frame 111 in the moving direction, and is preferably at least the same or longer than the thickness T of the wall W.

<Comparison with conventional test tray>

In the case of a conventional test tray, when the test tray 100' is viewed from the side as shown schematically in (a) of FIG. 12, the thickness T ₂ is smaller than the thickness T ₁ of the frame 111'. ) The insert 112' is installed in the frame 111' so as to be somewhat flexible. At this time, the possible flow distance of the insert 112' in the thickness direction (up and down direction in FIG. 12) of the frame 111' is within the thickness (T ₁ ) width of the test tray 100' or within the width of the test tray 100'. ) is at a very fine level with almost no protrusion compared to the bottom section of ). Furthermore, when the vertical direction of the test tray 111' is set as shown in (a) of FIG. 12, downward movement of the insert 112' due to external force cannot occur. That is, the moving distance of the insert 112' in the thickness direction of the frame 111' in the conventional test tray 100' is extremely limited. On the other hand, the present invention is a technology that can move a longer distance in the direction of the tester beyond one side of the test tray 100 (the side facing the tester), as shown in (b) of FIG. 12.

Meanwhile, in the case of the thickness of the test window (TW) side wall (W), the thickness of handlers in the past that used thin walls or were only capable of room temperature testing may be around 2 mm. However, the present invention is a test tray 100 that can be applied to a handler that has an outer wall designed to be thicker than the existing one or is capable of at least one of high temperature testing and low temperature testing. That is, the test tray 100 according to the present invention can be appropriately applied when the wall W must have a thickness of at least 3 mm or more (thickness of 3 mm or more is only an example) to enable high strength or insulation. Accordingly, as shown in (b) of FIG. 12, according to the test tray 100 according to the present invention, the insert can be moved to protrude further downward by about 10 mm based on the bottom surface of the frame 111. It is characteristic.

Therefore, in a handler with thick walls that require temperature control, the conventional test tray 100' cannot be applied, but the test tray 100 according to the present invention can be applied as many times as desired. Of course, the moving distance of the insert 112 can be adjusted as much as desired depending on the designer's intention, and the thickness of the wall may gradually decrease as technology advances.

Of course, as described above, it is sufficient to introduce a tester into the test window (TW) equal to the thickness of the wall (W). However, since the company that produces or owns the tester is the customer, it is practically impossible to discuss replacement or modification of the tester with the customer who wants to use the existing tester as is.

In addition, it is possible to ensure proper electrical connection between the semiconductor device and the tester by modifying the inside of the handler, but this also requires considerable cost and a complex structure.

However, according to the present invention, the insert of the circulating test tray 100 can be moved enough to overcome the thickness of the wall W, making it possible to solve the above difficulties all at once.

As described above, according to the present invention, when the test tray 100 is viewed from the side, the insert 112 can be moved to protrude more toward the tester than the side of the frame 111 facing the tester, and this is the biggest feature of the present invention. will be.

<Description of variant example>

In the above embodiment, a torsion spring is applied as the positioning member 113, but depending on the implementation, it may be used as a positioning member 113 to position the insert 112 in a predetermined position as shown in FIGS. 13 and 14. A tension spring (example in FIG. 12) or a leaf spring (example in FIG. 13) may be applied.

In addition, as shown in Figure 15, there is a method of using a tension wire whose length can be elastically changed as the positioning member 133 and fixing the tension wire using a compression fixing member (FE, compression bolt, compression pin, etc.). Anything can be considered.

For reference, as shown in FIGS. 2 and 13, the positioning member 113 may be fixed only to the frame 111, and as shown in FIGS. 12 and 14, the positioning member 113 may be attached to the frame 111 and the insert 112. All may be fixed to .

As described above, the specific description of the present invention has been made by way of examples with reference to the accompanying drawings. However, since the above-described embodiments are only explained by referring to preferred examples of the present invention, the present invention is limited to the above-described embodiments. It should not be understood as limited, and the scope of rights of the present invention should be understood as the scope of the claims described later and their equivalents.

110: test tray
111: frame
IH: Insertion hole 111a: Installation axis
IS: Installation groove GP: Guide protrusion
a ₁ to a ₄ : Removal prevention groove
112: insert
RS: Seating groove SS: Holding groove
BJ: Breakaway barrier LJ: Movement limit barrier
PP: Removal prevention protrusion
113: Absence of location
113a: coupling portion 113b: limiting portion
113c: support part
114: holding member
BP: Breakaway prevention protrusion

Claims (6)

As a test tray of a handler for electronic component testing that can be loaded with electronic components and circulates along a designated circulation path,
A frame having a plurality of insertion holes arranged in a matrix form;
A plurality of inserts installed on the frame, each inserted into the plurality of insertion holes, having a seating groove into which an electronic component can be seated, and exposing terminals of the electronic component seated in the seating groove to the tester side; and
positioning members that position the insert disposed in the insertion hole at a designated position; Including,
The positioning members allow the insert to move toward the tester to protrude more than the side of the frame facing the tester when an external force is applied to the insert toward the tester, and when the external force is removed, the insert can be restored to a predetermined position. It is made of an elastic material capable of elastic deformation and restoration.
The positioning member is installed coupled to the frame and has a support portion for supporting the insert so as to apply a restoring force to the insert when an external force acts on the insert,
A test socket (TS) of the tester is provided outside the handler,
The position at which the support rail 160 supporting the test tray can move as much as possible is up to the inner wall (IF) of the wall (W) forming the test window (TW) side of the handler,
The moving distance of the insert is equal to or longer than the thickness (T) of the wall (W).
Test tray of handler for testing electronic components. According to claim 1,
The moving distance of the insert is shorter than the thickness of the frame.
Test tray of handler for testing electronic components According to claim 1,
The position member is provided with a torsion spring.
Test tray of handler for testing electronic components. According to claim 1,
The position member is provided with a tension spring.
Test tray of handler for testing electronic components. According to claim 1,
The position member is provided with a leaf spring.
Test tray of handler for testing electronic components. According to claim 1,
The positioning member is provided with a tension wire whose length can be elastically changed.
Test tray of handler for testing electronic components.

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