KR20240011782A - 초음파 검사 장치 및 초음파 검사 방법 - Google Patents

초음파 검사 장치 및 초음파 검사 방법 Download PDF

Info

Publication number
KR20240011782A
KR20240011782A KR1020237044296A KR20237044296A KR20240011782A KR 20240011782 A KR20240011782 A KR 20240011782A KR 1020237044296 A KR1020237044296 A KR 1020237044296A KR 20237044296 A KR20237044296 A KR 20237044296A KR 20240011782 A KR20240011782 A KR 20240011782A
Authority
KR
South Korea
Prior art keywords
image
ultrasonic
inspection
reflection intensity
gate
Prior art date
Application number
KR1020237044296A
Other languages
English (en)
Korean (ko)
Inventor
가오루 사까이
시게루 오오노
Original Assignee
가부시키가이샤 히타치 파워 솔루션즈
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 히타치 파워 솔루션즈 filed Critical 가부시키가이샤 히타치 파워 솔루션즈
Publication of KR20240011782A publication Critical patent/KR20240011782A/ko

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/38Detecting the response signal, e.g. electronic circuits specially adapted therefor by time filtering, e.g. using time gates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/06Visualisation of the interior, e.g. acoustic microscopy
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/06Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609Display arrangements, e.g. colour displays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/06Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654Imaging
    • G01N29/069Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/48Processing the detected response signal, e.g. electronic circuits specially adapted therefor by amplitude comparison
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/023Solids
    • G01N2291/0231Composite or layered materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • G01N2291/0289Internal structure, e.g. defects, grain size, texture

Landscapes

  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
KR1020237044296A 2021-07-06 2022-06-28 초음파 검사 장치 및 초음파 검사 방법 KR20240011782A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021112338A JP2023008629A (ja) 2021-07-06 2021-07-06 超音波検査装置及び超音波検査方法
JPJP-P-2021-112338 2021-07-06
PCT/JP2022/025784 WO2023282126A1 (ja) 2021-07-06 2022-06-28 超音波検査装置及び超音波検査方法

Publications (1)

Publication Number Publication Date
KR20240011782A true KR20240011782A (ko) 2024-01-26

Family

ID=84801580

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020237044296A KR20240011782A (ko) 2021-07-06 2022-06-28 초음파 검사 장치 및 초음파 검사 방법

Country Status (5)

Country Link
JP (1) JP2023008629A (ja)
KR (1) KR20240011782A (ja)
CN (1) CN117651863A (ja)
TW (1) TWI824581B (ja)
WO (1) WO2023282126A1 (ja)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007117168A (ja) 2005-10-25 2007-05-17 Aloka Co Ltd 超音波診断装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3747921B2 (ja) * 2003-06-20 2006-02-22 株式会社日立製作所 ガイド波を用いた非破壊検査装置及び非破壊検査方法
GB201314481D0 (en) * 2013-08-13 2013-09-25 Dolphitech As Imaging apparatus
JP6310814B2 (ja) * 2014-08-22 2018-04-11 株式会社日立パワーソリューションズ 画像処理方法並びにそれを用いた超音波検査方法及びその装置
JP6608292B2 (ja) * 2016-01-20 2019-11-20 株式会社日立パワーソリューションズ 超音波検査方法及び装置
JP6518205B2 (ja) * 2016-03-07 2019-05-22 株式会社日立パワーソリューションズ 超音波検査方法及び超音波検査装置
JP7042149B2 (ja) * 2018-04-12 2022-03-25 株式会社日立パワーソリューションズ 超音波検査装置及び超音波検査方法
JP7257290B2 (ja) * 2019-08-27 2023-04-13 株式会社日立パワーソリューションズ 超音波検査装置および超音波検査方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007117168A (ja) 2005-10-25 2007-05-17 Aloka Co Ltd 超音波診断装置

Also Published As

Publication number Publication date
WO2023282126A1 (ja) 2023-01-12
CN117651863A (zh) 2024-03-05
TW202303139A (zh) 2023-01-16
TWI824581B (zh) 2023-12-01
JP2023008629A (ja) 2023-01-19

Similar Documents

Publication Publication Date Title
TWI627405B (zh) 缺陷檢查方法及其裝置
JP6608292B2 (ja) 超音波検査方法及び装置
JP6310814B2 (ja) 画像処理方法並びにそれを用いた超音波検査方法及びその装置
JP5154422B2 (ja) 超音波測定方法及び装置
JP7042149B2 (ja) 超音波検査装置及び超音波検査方法
CN114258488B (zh) 超声波检查装置以及超声波检查方法
US10663433B2 (en) Ultrasound imaging device and method of generating image for ultrasound imaging device
Bazulin Comparison of systems for ultrasonic nondestructive testing using antenna arrays or phased antenna arrays
JP6797646B2 (ja) 超音波検査装置及び超音波検査方法
KR20240011782A (ko) 초음파 검사 장치 및 초음파 검사 방법
JP7508384B2 (ja) 超音波検査装置、超音波検査方法及びプログラム
JP2011085392A (ja) 超音波撮像装置
KR20210126553A (ko) 초음파 검사 장치 및 초음파 검사 방법
JP4787914B2 (ja) 音速測定方法、音速測定装置、及び超音波画像検査装置
JP7420632B2 (ja) 超音波検査装置及び超音波検査方法
JP2016214868A (ja) 超音波診断装置及び画像診断装置